CN103366830A - Testing device of memory card - Google Patents
Testing device of memory card Download PDFInfo
- Publication number
- CN103366830A CN103366830A CN2012100902340A CN201210090234A CN103366830A CN 103366830 A CN103366830 A CN 103366830A CN 2012100902340 A CN2012100902340 A CN 2012100902340A CN 201210090234 A CN201210090234 A CN 201210090234A CN 103366830 A CN103366830 A CN 103366830A
- Authority
- CN
- China
- Prior art keywords
- storage card
- host side
- card
- test
- card reader
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
The invention provides a testing device of a memory card for testing a memory card. The testing device of the memory card comprises a card reader and a host terminal, wherein the card reader is connected with the memory card; the host terminal is coupled with the card reader through a universal serial bus interface, and writes in command through the transmission of the card reader and the memory card so as to write data in the memory card. The memory card transmits the read-out result to the host terminal through the card reader; the host terminal judges whether the memory card is damaged through the write-in command and the read-out result.
Description
Technical field
The invention relates to a kind of proving installation of storage card.
Background technology
Storage card (memory card) is a kind of storage device that utilizes flash memory (flash memory) module to form.In the common multiple consumption type electronic apparatus that is applied to be convenient for carrying of this storage card, such as digital camera, music player and notebook computer etc.On the market, this storage card can be divided into a lot of forms again, wherein common are safe digital card (Secure Digital, SD), flash memory (Compact Flash, CF) and memory stick (Memory Stick, MS) etc.
Usually have the control circuit of access flash memory and one or more flash memory module (its quantity look storage card capacity decide) in this storage card.In the production procedure of storage card, whether flash memory module and control circuit in the storage card that installs for test pack can work normally, the normal test job with finish specially storage card for the designed tester table of storage card test of deviser.The operation of this tester table must have the Test Engineer of specialty to use usually, yet, and be not easy to be used.And the cost of this tester table itself is very high, and is not to be easy to be obtained.This is all so that the relative raising of the cost of the test job of storage card and difficulty.
Summary of the invention
The invention provides a kind of proving installation of storage card, can directly utilize card reader that storage card is tested.
The present invention proposes a kind of proving installation of storage card, in order to the test storage card, comprises card reader and host side.Card reader connects storage card.Host side couples card reader by USB (universal serial bus), and transmits by card reader and storage card and to write instruction and write so that storage card is carried out data.Storage card also transmits by card reader and to read the result to host side, and host side is according to writing instruction and reading the result and judge whether storage card is damaged.
In one embodiment of this invention, above-mentioned storage card has control circuit and at least one flash memory module.
In one embodiment of this invention, above-mentioned host side transmits by card reader and writes instruction to control circuit, and makes control circuit carry out write activity to flash memory module.
In one embodiment of this invention, above-mentioned control circuit is read action to flash memory module, and reads the result to host side by the card reader transmission.
In one embodiment of this invention, above-mentioned host side also comprises by card reader transmission firmware program to the control circuit of storage card.
In one embodiment of this invention, above-mentioned host side writes the test data writing by writing instruction to the tested address of storage card, and the tested address of reading storage card is to obtain the test sense data.Whether host side contrastive test data writing and test sense data are also used the tested address of judging storage card and are damaged.
In one embodiment of this invention, the above-mentioned instruction that writes comprises logical address and the test data writing that writes order, tested address.
In one embodiment of this invention, the above-mentioned result that reads comprises the logical address of sense command, tested address and tests sense data.
Based on above-mentioned, the present invention utilizes the card reader of commercially available general requirements, reaches the purpose that storage card is tested.So that need not arresting limit again, the test of storage card must use special tester table.So that the test of storage card is more simple, and effectively reduce the testing cost of storage card.
For above-mentioned feature and advantage of the present invention can be become apparent, embodiment cited below particularly, and accompanying drawing is described in detail below shown in cooperating.
Description of drawings
Fig. 1 illustrates the proving installation of the storage card of one embodiment of the invention;
The proving installation of the storage card of the another embodiment of the present invention that Fig. 2 illustrates;
Fig. 3 illustrates the process flow diagram of the storage card test of the embodiment of the invention.
Description of reference numerals:
100,200: proving installation;
110,210: host side;
120,220: card reader;
170,270,280: storage card;
271: control circuit;
2761～2763: flash memory module;
CN1: serial bus interface;
S310, S320, S330, S370: testing procedure.
Embodiment
Please refer to Fig. 1, Fig. 1 illustrates the proving installation of the storage card of one embodiment of the invention.Storage card test device 100 is in order to test storage card 170, comprising card reader 120 and host side 110.Host side 110 connects card reader 120 by USB (universal serial bus) CN1.120 of card reader couple storage card 170 (namely storage card 170 being inserted in the set slot of card reader 120).
When the test of storage card 170 will be carried out, at first, host side 110 write instruction by transmission between card reader 120 and the storage card 170 and writes so that storage card 170 is carried out data.And after finishing the data write activity of storage card 170, host side 110 is by transmitting sense order so that storage card 170 is carried out data reading between card reader 120 and the storage card 170.The sense order that 170 responses of storage card are reached by card reader 120 also spreads out of and reads the result to host side 110.Host side 110 is after having obtained to read the result, and then foundation writes instruction and reads the result and compare, and uses the test action of finishing storage card 170.
Note that above-mentioned writing comprised writing outside the order that order card reader 120 carries out that data write in the instruction, also comprise the logical address that will write storage card 170 and test data writing.Wherein, namely this writes the tested address of the storage card 170 that instruction will test to write logical address included in the instruction.Read that the result then comprises sense order, the test sense data that reads and this test sense data from the logical address of storage card 170.
In addition, when host side 110 is carried out the test of storage card 170, can write and at once same tested address be read for single tested address.So, just can know at once the state of this tested address of storage card 170.Certainly, host side 110 also can be divided into repeatedly for a plurality of different tested address in the storage card 170 and writing, and all tested addresses all finish write after, carry out one by one respectively data reading for these tested addresses again.Certainly, such practice will make host side 110 have a plurality of test data writings and be transferred to storage card 170 or obtain a plurality of test sense datas.Therefore, testing compare when action of sense data with the test data writing when host side 110, each writes instruction and the tested address of reading among the result also will to attach comparison.And only compare for the identical test sense data in tested address and test data writing, with each tested address of learning storage card 170 normally whether.
And when testing for a plurality of different address of storage card 170, tested address can change with the mode of increasing or decreasing, can certainly discontinuously change in the mode of jumping.Under the framework of the present embodiment, the order of tested address is not limited.And the same tested address of storage card 170 also can be tested by the continuous test data writing with identical or not identical.That is to say, reaching in the situation of the highest wrong coverage rate (fault coverage), the framework of the embodiment of the invention can provide for tested address and test data writing and carry out the variation of the different test modes of multiple types.
In order to be described in more detail embodiments of the present invention.Below please refer to the proving installation of the storage card of the another embodiment of the present invention that Fig. 2 illustrates.In the present embodiment, the storage card 270 in the proving installation 200 comprises control circuit 271 and the flash memory module of at least one 2761～2763.Wherein, control circuit 271 is coupled to all flash memory module 2761～2763, and uses access flash memory module 2761～2763.
In the time will carrying out the test of storage card 270, host side 210 transmits writes instruction, is actually by card reader 220 to be sent in the control circuit 271 in the storage card 270.Owing to writing and comprising in the instruction and write order, test data writing and tested address, therefore control circuit 271 can be effectively according to writing order, write with testing data writing that logical address equals in the memory block of tested address in the flash memory module 2761～2763.Behind the write activity of finishing the test data writing, this control circuit 271 can come the memory block of tested address is read and use acquisition test sense data according to the sense command that is sent by host side 210 that transmits by card reader 220.Control circuit 271 is also read Data Integration with sense command, tested address and the test of reading and is become and read the result, and this is read the result sends back to host side 210 by card reader 220.
Subsidiary one carry be, host side 210 can be the relevant devices with arithmetic capability such as computer or server, host side 210 then is just can reach by so-called USB (universal serial bus) CN1 with being connected of card reader 220.In other words, card reader 220 does not need through special design, and so long as general commercially available storage card card reader just can be implemented the present embodiment.
In addition, because card reader 220 can have the function that once connects many storage cards.Therefore, the proving installation 200 of the storage card of the present embodiment can also be tested for another storage card 280 that is connected in card reader 220.Wherein the mode of test is identical with the related description of testing for storage card 270 with principle, does not give unnecessary details for this reason at this.And the form of storage card 270 and storage card 280 might not identical (also can be identical), and for example storage card 270 is storage cards of SD pattern, and storage card 280 is storage cards of CF pattern.
In the proving installation 200 of the storage card of the present embodiment, host side 210 also can write firmware program in the control circuit 271 of storage card 270 by card reader 220, carries out this firmware program so that control circuit 271 to be provided.
Below please refer to Fig. 3, Fig. 3 illustrates the process flow diagram of the storage card test of the embodiment of the invention.After test action begins, at first judge to carry out be storage card write or read action (step S310).If when carrying out the write activity of storage card, then provided by host side and write instruction to storage card (step S320).Note that action that provides of instruction is provided for this, is to finish by the card reader that is connected with host side.And writing instruction comprises and writes order, tested address and test data writing.
If be when action of reading that to carry out storage card when step S310 judges, then provided by storage card and read the result to host side (step S330).Be same as step S320, storage card provides to be read the result and also finishes by card reader to host side.Read the result and then comprise sense command, tested address and test sense data.
When reading after the result is provided to host side, host side can be compared for test data writing and the test sense data of identical tested address, with the memory block of judging this tested address whether impaired phenomenon (step S370) is arranged.And after all address of storage card was all tested, whether host side then can be judged this tested storage card was good storage card.
In sum, the present invention utilizes commercially available card reader, and cooperating for example is the host side of PC, reaches the test action to storage card.That is to say, the present invention proposes the simplest a kind of mode, effectively makes originally complicated and expensive storage card test action, and can be transformed into by the testing factory of specialty for example is that simple office finishes.And, do not need specialty and expensive tester table, effectively reduce the cost of test and the threshold of measuring technology.
It should be noted that at last: above each embodiment is not intended to limit only in order to technical scheme of the present invention to be described; Although with reference to aforementioned each embodiment the present invention is had been described in detail, those of ordinary skill in the art is to be understood that: it still can be made amendment to the technical scheme that aforementioned each embodiment puts down in writing, and perhaps some or all of technical characterictic wherein is equal to replacement; And these modifications or replacement do not make the essence of appropriate technical solution break away from the scope of various embodiments of the present invention technical scheme.
Claims (8)
1. the proving installation of a storage card in order to test a storage card, is characterized in that, comprising:
One card reader connects this storage card; And
One host side, couple this card reader by a USB (universal serial bus), and transmit one by this card reader and this storage card and write instruction and write so that this storage card is carried out data, this storage card also transmits one by this card reader and reads the result to this host side, and this host side writes instruction and this according to this and reads the result and judge whether this storage card is damaged.
2. the proving installation of storage card according to claim 1, wherein this storage card has a control circuit and at least one flash memory module.
3. the proving installation of storage card according to claim 2, wherein this host side transmits this by this card reader and writes instruction to this control circuit, and makes this control circuit carry out write activity to this flash memory module.
4. the proving installation of storage card according to claim 2, wherein this control circuit is read action to this flash memory module, and transmits this by this card reader and read the result to host side.
5. the proving installation of storage card according to claim 2, wherein this host side also comprises by this card reader and transmits a firmware program to this control circuit of this storage card.
6. the proving installation of storage card according to claim 1, wherein this host side writes instruction by this one tested address of this storage card is write a test data writing, and this tested address of reading this storage card to be to obtain a test sense data, and whether this host side is compared this test data writing and this test sense data and used this tested address of judging this storage card and damage.
7. the proving installation of storage card according to claim 6, wherein this writes instruction and comprises that one writes logical address and this test data writing of order, this tested address.
8. the proving installation of storage card according to claim 6, wherein this reads logical address and this test sense data that the result comprises a sense command, this tested address.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100902340A CN103366830A (en) | 2012-03-30 | 2012-03-30 | Testing device of memory card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100902340A CN103366830A (en) | 2012-03-30 | 2012-03-30 | Testing device of memory card |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103366830A true CN103366830A (en) | 2013-10-23 |
Family
ID=49367991
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012100902340A Pending CN103366830A (en) | 2012-03-30 | 2012-03-30 | Testing device of memory card |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103366830A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017024459A1 (en) * | 2015-08-10 | 2017-02-16 | 华为技术有限公司 | Memory card authentication method and mobile terminal thereof, and terminal device |
| WO2020134034A1 (en) * | 2018-12-26 | 2020-07-02 | 华为技术有限公司 | Test system for memory card |
| WO2020134036A1 (en) * | 2018-12-26 | 2020-07-02 | 深圳市江波龙电子股份有限公司 | Test board for testing memory card, and test device |
| CN114550809A (en) * | 2022-01-20 | 2022-05-27 | 深圳宏芯宇电子股份有限公司 | Multi-memory card testing method and device, computer equipment and storage medium |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1525330A (en) * | 2003-02-27 | 2004-09-01 | 义隆电子股份有限公司 | Method for testing storage unit having universal serial bus interface and storage unit |
| US7788553B2 (en) * | 2000-01-06 | 2010-08-31 | Super Talent Electronics, Inc. | Mass production testing of USB flash cards with various flash memory cells |
| CN101923504A (en) * | 2009-06-16 | 2010-12-22 | 鸿富锦精密工业（深圳）有限公司 | Card reader testing tool and card reader testing method |
-
2012
- 2012-03-30 CN CN2012100902340A patent/CN103366830A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7788553B2 (en) * | 2000-01-06 | 2010-08-31 | Super Talent Electronics, Inc. | Mass production testing of USB flash cards with various flash memory cells |
| CN1525330A (en) * | 2003-02-27 | 2004-09-01 | 义隆电子股份有限公司 | Method for testing storage unit having universal serial bus interface and storage unit |
| CN101923504A (en) * | 2009-06-16 | 2010-12-22 | 鸿富锦精密工业（深圳）有限公司 | Card reader testing tool and card reader testing method |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017024459A1 (en) * | 2015-08-10 | 2017-02-16 | 华为技术有限公司 | Memory card authentication method and mobile terminal thereof, and terminal device |
| WO2020134034A1 (en) * | 2018-12-26 | 2020-07-02 | 华为技术有限公司 | Test system for memory card |
| WO2020134036A1 (en) * | 2018-12-26 | 2020-07-02 | 深圳市江波龙电子股份有限公司 | Test board for testing memory card, and test device |
| US12038470B2 (en) | 2018-12-26 | 2024-07-16 | Huawei Technologies Co., Ltd. | Test system for memory card |
| CN114550809A (en) * | 2022-01-20 | 2022-05-27 | 深圳宏芯宇电子股份有限公司 | Multi-memory card testing method and device, computer equipment and storage medium |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN112331253B (en) | Chip testing method, terminal and storage medium | |
| US9159451B2 (en) | Testing system and testing method thereof | |
| US9026870B2 (en) | Memory module and a memory test system for testing the same | |
| CN102999097A (en) | Expansion card and mainboard supporting expansion card | |
| CN109298266B (en) | Test system, test method, test apparatus, and storage medium | |
| CN116913368B (en) | Test system and test method for memory chip | |
| US20150067223A1 (en) | Hot swappable memory motherboard | |
| CN105701044A (en) | Electronic device | |
| CN108074624B (en) | Memory card testing apparatus and method, computer device, and storage medium | |
| CN103366830A (en) | Testing device of memory card | |
| CN112053738A (en) | eMMC chip test system and power-on and power-off test method | |
| CN101354673B (en) | SPD chip error information simulation apparatus of memory | |
| CN102455965A (en) | Electronic device test system and method | |
| US9158609B2 (en) | Universal serial bus testing device | |
| CN102305906B (en) | Chip testing method and device | |
| CN105825898B (en) | Dynamic memory testing device and testing method thereof | |
| CN103164313A (en) | Debugging system and debugging method | |
| CN104598415A (en) | Universal serial bus (USB) test fixture | |
| CN102750230A (en) | Access control system and method of universal serial bus (USB) storage equipment | |
| CN101071394A (en) | Inter-board transparent transmission bus test device and method | |
| CN117637012B (en) | Detection system and detection method for memory chip | |
| CN105760325A (en) | System and method for supporting hot swapping of USB (universal serial bus) storage device under DOS (disk operating system) | |
| CN117690475B (en) | Detection system and detection method for memory chip | |
| CN209980793U (en) | Durability testing device | |
| CN111984491B (en) | Virtual storage device for prototype verification |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20131023 |