CN102305906B - Chip testing method and device - Google Patents
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- CN102305906B CN102305906B CN201110138808.2A CN201110138808A CN102305906B CN 102305906 B CN102305906 B CN 102305906B CN 201110138808 A CN201110138808 A CN 201110138808A CN 102305906 B CN102305906 B CN 102305906B
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Abstract
The embodiment of the invention discloses a chip testing method and a chip testing device, which relate to the field of testing of terminals and can test various chips and modules under a testing environment so as to fulfill the aim of unified management of testing of various chips. The method comprises the following steps of: detecting whether external equipment accesses a boot module or not; if the condition that the external equipment accesses the boot module is detected, detecting whether data is input into the boot module; if the condition that the data is input into the boot module is detected, reading the input data, and judging whether the input data is a chip testing mode starting command or not; and if the input data is the chip testing mode starting command, entering a chip testing mode interface, receiving a chip testing command input by a user, correspondingly testing the chips according to the chip testing command, and outputting a chip testing result. The method and the device which are provided by the embodiment of the invention are mainly applied in the chip testing process of a terminal product.
Description
Technical field
The present invention relates to terminal test field, relate in particular to a kind of chip detecting method and device.
Background technology
In process of producing product, it is a very important job that the software and hardware of product detects.After the hardware circuit board of product posts, need certain methods to go the working condition of the detection various chips on circuit board that are attached to whether normal, such as various sensor chips, communication module and various storeies etc.; In test, because the test event of each chip and module and method of testing are not identical, the test environment of each chip and module can not be unified, be often difficult to unified management.
Summary of the invention
Embodiments of the invention provide a kind of chip detecting method and device, can under a test environment, realize the test of various chips and module, reach the object of the various chip testings of unified management.
For achieving the above object, embodiments of the invention adopt following technical scheme:
A chip detecting method, comprising:
Detect and whether have external equipment access boot module, described external equipment is different chips or module to be tested on end product;
If external equipment detected, access described boot module, detect and whether have data to input described boot module;
If data detected, input described boot module, read the data of input, and judge whether the data of described input are chip testing pattern startup command;
If the data of described input are chip testing pattern startup command, enter chip testing mode interface, receive the chip testing order of user's input, according to the corresponding chip testing of described chip testing command execution, and chip testing result is exported.
An apparatus for testing chip, comprising:
The first detecting unit, for detection of whether having external equipment access boot module, described external equipment is different chips or module to be tested on end product;
Whether the second detecting unit, while accessing described boot module for external equipment having been detected at described the first detecting unit, detect and have data to input described boot module;
Data capture unit, while inputting described boot module for data having been detected at described the second detecting unit, reads the data of input;
Judging unit, for judging whether the data of the described input that described data capture unit obtains are chip testing pattern startup command;
Start unit, during as chip testing pattern startup command, enters chip testing mode interface for the data of judging described input at described judging unit;
Command operation unit, for receiving the chip testing order of user's input, according to the corresponding chip testing of described chip testing command execution;
Result output unit, for exporting chip testing result.
The technical scheme that the embodiment of the present invention provides, by different test environments, test and compare with module from each chip in prior art, chip or the module of needs test are connected with boot module, when determining when chip or module are tested, enter chip testing mode interface, receive the chip testing order of user's input, according to the corresponding chip testing of described chip testing command execution, make to realize the test of various chips and module under a test environment, reach the object of the various chip testings of unified management.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, to the accompanying drawing of required use in embodiment or description of the Prior Art be briefly described below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skills, do not paying under the prerequisite of creative work, can also obtain according to these accompanying drawings other accompanying drawing.
Fig. 1 is the process flow diagram of the embodiment of the present invention 1 chips method of testing;
Fig. 2 is the process flow diagram of the embodiment of the present invention 2 chips method of testings;
Fig. 3 is the embodiment of the present invention 2 chips test pattern menu schematic diagram;
Fig. 4 is the process flow diagram of the embodiment of the present invention 2 chips test result output intents;
Fig. 5 is the composition frame chart of a kind of apparatus for testing chip in the embodiment of the present invention 3;
Fig. 6 is the composition frame chart of another kind of apparatus for testing chip in the embodiment of the present invention 3;
Fig. 7 is the composition frame chart of another kind of apparatus for testing chip in the embodiment of the present invention 3;
Fig. 8 is the composition frame chart of another kind of apparatus for testing chip in the embodiment of the present invention 3.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is only the present invention's part embodiment, rather than whole embodiment.Embodiment based in the present invention, those of ordinary skills, not making the every other embodiment obtaining under creative work prerequisite, belong to the scope of protection of the invention.
The embodiment of the present invention provides a kind of chip detecting method, and as shown in Figure 1, the method comprises:
101, detect whether there is external equipment access boot module.Wherein, this external equipment can be chip to be tested on end product.
Wherein, during external equipment access boot module, need to utilize the external interface of connecting line access boot module, thus detect whether there is external equipment access boot module, can by but be not limited to following methods and realize, the method comprises:
The first, detects the value of zone bit of the corresponding register of external interface of described boot module, has determined whether external equipment access boot module.It should be noted that, the external interface of boot module is corresponding registers all generally, data for temporary external equipment input, and be generally this register a zone bit is set, for sign, whether there is external equipment access, when this external interface has external equipment access, this port can be known immediately, and revise this zone bit.For example, it is 0 that this sign place value is set, and representative does not have external equipment to access this external interface; It is 1 that this sign place value is set; representative has external equipment to access this external interface; certainly; setting to this zone bit value; as long as can distinguish external interface, have or not external equipment access; the embodiment of the present invention does not limit this, and any method to set up all belongs to the scope of embodiment of the present invention protection.
The second, the level of relevant stitch that detects the external interface of described boot module changes, and has determined whether external equipment access boot module.It should be noted that, it is different that the relevant stitch of the external interface of boot module is worked as the expression that has external equipment access and do not have external equipment to access its level.For example, set while not having external equipment to access this external interface, the level of the relevant stitch of its external interface is high level; When being set with external equipment and accessing this external interface, the relevant stitch level of its external interface is low level, when the relevant stitch level of external interface has high level to become low level, shows to have external equipment to access the external interface of this boot module; Certainly the setting of the relevant stitch level of this external interface is also not only confined to foregoing description, and any method that can identify the relevant stitch level of external interface, all belongs to the scope that the embodiment of the present invention is protected.
Wherein, the external interface of described boot module can be serial ports, but the embodiment of the present invention does not limit this.When the external interface of boot module is serial ports, the connecting line that connects boot module and external equipment can turn Serial Port Line for USB, be that interface on the chip to be tested on counterpart terminal product (external equipment) is USB interface, the external access of boot module is serial ports, certainly the embodiment of the present invention does not limit the interface of external equipment, it can also be the interface of other types, but due to USB (universal serial bus) (Universal Serial BUS, USB) interface has advantages of plug and play, preferably USB interface.
If 102 have detected external equipment, access described boot module, detect and whether have data to input described boot module.
Whether wherein, detecting has data to input described boot module, can by but be not limited to detect in corresponding register whether store data, determined whether that data input described boot module; If store data in corresponding register, define data and input this boot module, if do not store data in corresponding register, determine and do not have data to input this boot module.
If 103 have detected data, input described boot module, read the data of input, and judge whether the data of described input are chip testing pattern startup command.
Wherein, after reading the data of input, whether the data that judge described input are chip testing pattern startup command, can by but be not limited to following methods and realize, the method is: the data of described input and the chip testing pattern startup command pre-seting are compared, if the data of this input are consistent with the chip testing pattern startup command pre-seting, determine that the data of input are chip testing pattern startup command; If the data of this input are inconsistent with the chip testing pattern startup command pre-seting, the data of determining input are not chip testing pattern startup command.
If the data of 104 described inputs are chip testing pattern startup command, enter chip testing mode interface, receive the chip testing order of user's input, according to the corresponding chip testing of described chip testing command execution, and chip testing result is exported.
In the embodiment of the present invention, chip or the module of needs test are connected with boot module, when determining when chip or module are tested, enter chip testing mode interface, receive the chip testing order of user's input, according to the corresponding chip testing of described chip testing command execution, make to realize the test of various chips and module under a test environment, reach the object of the various chip testings of unified management.
The embodiment of the present invention provides a kind of chip detecting method, and the embodiment of the present invention be take the external interface of boot module and as serial ports as example, set forth this chip detecting method, and as shown in Figure 2, the method comprises:
201,, when boot module starts, first detect whether there is external equipment access boot module; If external equipment detected, access described boot module, perform step 202; If detect, do not have external equipment to access described boot module, perform step 207.
Wherein, detect the specific descriptions whether there is external equipment access boot module, the corresponding description in can reference example 1 step 101, the embodiment of the present invention will repeat no more herein.
202, detect and whether have data to input described boot module; If data detected, input described boot module, perform step 203; If detect, do not have data to input described boot module, perform step 207.
Whether wherein, detecting has data to input the specific descriptions of described boot module, the corresponding description in can reference example 1 step 102, and the embodiment of the present invention will repeat no more herein.
In addition, in boot, realize the read-write of serial ports, two kinds of situations of read operation of serial ports, comprising: obstructive type and unblock type.This obstructive type read operation is exactly only from serial ports, to read input data and enter key detected to press, and one time read procedure has just completed, otherwise serial ports can be always in waiting for the state of user's input; And for the read operation of unblock type, no matter whether serial ports has data, read procedure all can return immediately.
203, read the data of input, and judge whether the data of described input are chip testing pattern startup command; If the data of described input are chip testing pattern startup command, perform step 204; If the data of described input are not chip testing pattern startup command, perform step 203.
Wherein, after reading the data of input, judge whether the data of described input are the specific descriptions of chip testing pattern startup command, the corresponding description in can reference example 1 step 103, the embodiment of the present invention will repeat no more herein.
204, predefined chip testing pattern menu is shown, described chip testing pattern menu comprises the numbering of chip testing pattern and described chip testing pattern, so that user chooses corresponding chip testing pattern according to described chip testing pattern menu.
Wherein, this chip testing pattern menu as shown in Figure 3, has been enumerated the chip testing pattern of likely testing, and for example, is numbered 1 Bluetooth test pattern, the Compass pattern that label is 2.This chip testing pattern menu can be according to the demand editor of end product test.User, when carrying out the input of chip testing pattern, does not need to be grasped too many professional knowledge, just can input the numbering of corresponding chip testing pattern according to the record of menu, represents the corresponding chip testing pattern of input, makes to operate fairly simple.
205, the chip testing pattern numbering that receives user's input, enters with described chip testing pattern and numbers corresponding chip testing process.
For example, as shown in Figure 3, user inputs numbering 2, determines that user need to test electronic compass chip, enters electronic compass chip testing process.
206, the chip testing order under this chip testing pattern of reception user input, according to the corresponding chip testing of described chip testing command execution, and by the output of chip testing result, finishes chip testing flow process this time.
207, boot module is according to common flow startup.
Further, for the ease of the management of test result, the embodiment of the present invention also comprises following method, and as shown in Figure 4, the method comprises:
301, determine in described test chip, whether there is storage card; If there is described storage card in described test chip, perform step 302; If there is not described storage card in described test chip, perform step 303.
Wherein, determine in described test chip, whether there is memory card, can by but be not limited to and drive the mode of storage card to determine, in any definite test chip, whether exist memory card all to belong to the scope of embodiment of the present invention protection; When determining by the mode of driving storage card, comprising: if drive storage card success, determine in test chip and have storage card, otherwise, so for not having storage card to insert in this test chip.
In addition, described memory card can be safe digital card (Secure Digital Memory Card, SD card), can be also TF (TransFLash) card, can also be other storage cards that can keep in storage data, the embodiment of the present invention limit this.
302, chip testing result is shown and exports and be kept in described storage card.
303, chip testing result is shown to output.
Whether it should be noted that, determine and in described test chip, exist the step of storage card behind bootrom test pattern interface, to carry out, can before by the output of chip testing result, determine, the embodiment of the present invention does not limit this yet.But during the test result in reading and saving in storage card, must transplant source item EFSL file system to boot module, after the success of this document system transplantation, can by conventional file directory form, remove to access the file of reading and writing memory card, obtain the test result of chip.
In the embodiment of the present invention, chip or the module of needs test are connected with boot module, when determining when chip or module are tested, enter chip testing mode interface, receive the chip testing order of user's input, according to the corresponding chip testing of described chip testing command execution, make to realize the test of various chips and module under a test environment, reach the object of the various chip testings of unified management.
And, in the embodiment of the present invention, after entering chip testing mode interface, predefined chip testing pattern menu is shown, described chip testing pattern menu comprises the numbering of chip testing pattern and described chip testing pattern, user is when input operation order, can choose corresponding chip testing pattern according to the numbering of recording in chip testing pattern menu, make the input of operational order simple, make tester without the need for very strong professional knowledge, expand the crowd that can carry out chip testing operation, saved the testing cost of company.And under this pattern, tester can select institute's test chip item, inputs the operations such as test instruction of this chip, avoided producing software and system software is separated and the shortcoming of various chips test and management confusion.
Further, in the embodiment of the present invention, after obtaining chip testing result, if test chip exists storage card, when chip testing result being shown to output, be kept in this storage card, facilitated the follow-up chip testing result of checking.
The embodiment of the present invention provides a kind of apparatus for testing chip, and as shown in Figure 5, this device comprises: the first detecting unit 41, the second detecting unit 42, data capture unit 43, judging unit 44, start unit 45, command operation unit 46, result output unit 47.
Whether the first detecting unit 41, for detection of having external equipment to access boot module.
Whether the second detecting unit 42, while accessing described boot module for external equipment having been detected at described the first detecting unit, detect and have data to input described boot module; Wherein, whether described the second detecting unit 42 detects while having data to input described boot module, can by but be not limited to detect in corresponding register whether store data, determined whether that data input described boot module; If store data in corresponding register, define data and input this boot module, if do not store data in corresponding register, determine and do not have data to input this boot module.
Judging unit 44, for judging whether the data of the described input that described data capture unit 43 obtains are chip testing pattern startup command; Wherein, judging unit 44 judges whether the data of the described input that described data capture unit 43 obtains are that chip testing pattern startup command can realize by following mode, be specially: the data of described input and the chip testing pattern startup command pre-seting are compared, if the data of this input are consistent with the chip testing pattern startup command pre-seting, determine that the data of input are chip testing pattern startup command; If the data of this input are inconsistent with the chip testing pattern startup command pre-seting, the data of determining input are not chip testing pattern startup command.
Further alternative, as shown in Figure 6, this apparatus for testing chip, also comprises: display unit 48.
Described command operation unit 46 also for, receive the chip testing pattern numbering of user's input, enter with described chip testing pattern and number corresponding chip testing process; Chip testing order under this chip testing pattern of reception user input, according to the corresponding chip testing of described chip testing command execution.
For the ease of the management of test result, further alternative, as shown in Figure 7, this apparatus for testing chip, also comprises: determining unit 49.
Determining unit 49, for determining whether described test chip exists storage card; Wherein, determining unit 49 determines in described test chip whether have memory card, can by but be not limited to and drive the mode of storage card to determine, in any definite test chip, whether exist memory card all to belong to the scope of embodiment of the present invention protection; When determining by the mode of driving storage card, comprising: if drive storage card success, determine in test chip and have storage card, otherwise, so for not having storage card to insert in this test chip.In addition, described memory card can be SD card, can be also TF card, can also be other storage cards that can keep in storage data, and the embodiment of the present invention does not limit this.
Described result output unit 47 also for, while there is described storage card in described determining unit 49 is determined described test chip, chip testing result is shown and exports and be kept in described storage card.It should be noted that, during test result in reading and saving in storage card, must transplant source item EFSL file system to boo t module, after the success of this document system transplantation, can by conventional file directory form, remove to access the file of reading and writing memory card, obtain the test result of chip.
Described result output unit 47 also for, while there is not described storage card in described determining unit 49 is determined described test chip, described chip testing result is shown to output.
Further alternative, as shown in Figure 8, described the first detecting unit 41 comprises: first detection module 411 and/or the second detection module 412
The second detection module 412, changes for detection of the level of the relevant stitch of the external interface of described boot module, has determined whether external equipment access boot module.It should be noted that, the relevant stitch of the external interface of boot module when with external equipment access and there is no that external equipment accesses its level represent it is different.For example, set while not having external equipment to access this external interface, the level of the relevant stitch of its external interface is high level; When being set with external equipment and accessing this external interface, the relevant stitch level of its external interface is low level, when the relevant stitch level of external interface has high level to become low level, shows to have external equipment to access the external interface of this boo t module; Certainly the setting of the relevant stitch level of this external interface is also not only confined to foregoing description, and any method that can identify the relevant stitch level of external interface, all belongs to the scope that the embodiment of the present invention is protected.
Wherein, the external interface of described boot module can be serial ports, but the embodiment of the present invention does not limit this.When the external interface of boot module is serial ports, the connecting line that connects boot module and external equipment can turn Serial Port Line for USB, be that interface on the chip to be tested on counterpart terminal product (external equipment) is USB interface, the external access of boot module is serial ports, certainly the embodiment of the present invention does not limit the interface of external equipment, can also be the interface of other types, but because USB interface has advantages of plug and play, preferred USB interface.
In the embodiment of the present invention, chip or the module of needs test are connected with boot module, when determining when chip or module are tested, enter chip testing mode interface, receive the chip testing order of user's input, according to the corresponding chip testing of described chip testing command execution, make to realize the test of various chips and module under a test environment, reach the object of the various chip testings of unified management.
And, in the embodiment of the present invention, after entering chip testing mode interface, predefined chip testing pattern menu is shown, described chip testing pattern menu comprises the numbering of chip testing pattern and described chip testing pattern, user is when input operation order, can choose corresponding chip testing pattern according to the numbering of recording in chip testing pattern menu, make the input of operational order simple, make tester without the need for very strong professional knowledge, expand the crowd that can carry out chip testing operation, saved the testing cost of company.And under this pattern, tester can select institute's test chip item, inputs the operations such as test instruction of this chip, avoided producing software and system software is separated and the shortcoming of various chips test and management confusion.
Further, in the embodiment of the present invention, after obtaining chip testing result, if test chip exists storage card, when chip testing result being shown to output, be kept in this storage card, facilitated the follow-up chip testing result of checking.
Through the above description of the embodiments, those skilled in the art can be well understood to the mode that the present invention can add essential common hardware by software and realize, and can certainly pass through hardware, but in a lot of situation, the former is better embodiment.Understanding based on such, the part that technical scheme of the present invention contributes to prior art in essence in other words can embody with the form of software product, this computer software product is stored in the storage medium can read, as the floppy disk of computing machine, hard disk or CD etc., comprise some instructions with so that computer equipment (can be personal computer, server, or the network equipment etc.) carry out the method described in each embodiment of the present invention.
The above; be only the specific embodiment of the present invention, but protection scope of the present invention is not limited to this, is anyly familiar with those skilled in the art in the technical scope that the present invention discloses; can expect easily changing or replacing, within all should being encompassed in protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain of described claim.
Claims (10)
1. a chip detecting method, is characterized in that, comprising:
Detect and whether have external equipment access boot module, described external equipment is different chips to be tested on end product;
If external equipment detected, access described boot module, detect and whether have data to input described boot module;
If data detected, input described boot module, read the data of input, and judge whether the data of described input are chip testing pattern startup command;
If the data of described input are chip testing pattern startup command, enter chip testing mode interface, receive the chip testing order of user's input, according to the corresponding chip testing of described chip testing command execution, and chip testing result is exported.
2. chip detecting method according to claim 1, is characterized in that, after entering chip testing mode interface, also comprises:
Predefined chip testing pattern menu is shown, described chip testing pattern menu comprises the numbering of chip testing pattern and described chip testing pattern, so that user chooses corresponding chip testing pattern according to described chip testing pattern menu;
The chip testing pattern numbering that receives user's input, enters with described chip testing pattern and numbers corresponding chip testing process;
The chip testing order of described reception user input, according to described chip testing command execution, corresponding chip testing is: the chip testing order under this chip testing pattern of reception user input, according to the corresponding chip testing of described chip testing command execution.
3. chip detecting method according to claim 1, is characterized in that, also comprises:
Determine and in described chip, whether have storage card;
Described chip testing result is output as: if there is described storage card in described chip, chip testing result is shown and exports and be kept in described storage card; If there is not described storage card in described chip, chip testing result is shown to output.
4. according to the chip detecting method described in any one in claim 1-3, it is characterized in that, whether described detection has external equipment access boot module to comprise:
The value of zone bit that detects the corresponding register of external interface of described boot module, has determined whether external equipment access boot module; Or
The level of relevant stitch that detects the external interface of described boot module changes, and has determined whether external equipment access boot module.
5. chip detecting method according to claim 4, is characterized in that, the external interface of described boot module is serial ports.
6. an apparatus for testing chip, is characterized in that, comprising:
The first detecting unit, for detection of whether having external equipment access boot module, described external equipment is different chips to be tested on end product;
Whether the second detecting unit, while accessing described boot module for external equipment having been detected at described the first detecting unit, detect and have data to input described boot module;
Data capture unit, while inputting described boot module for data having been detected at described the second detecting unit, reads the data of input;
Judging unit, for judging whether the data of the described input that described data capture unit obtains are chip testing pattern startup command;
Start unit, during as chip testing pattern startup command, enters chip testing mode interface for the data of judging described input at described judging unit;
Command operation unit, for receiving the chip testing order of user's input, according to the corresponding chip testing of described chip testing command execution;
Result output unit, for exporting chip testing result.
7. apparatus for testing chip according to claim 6, is characterized in that, also comprises:
Display unit, for after entering chip testing mode interface, predefined chip testing pattern menu is shown, described chip testing pattern menu comprises the numbering of chip testing pattern and described chip testing pattern, so that user chooses corresponding chip testing pattern according to described chip testing pattern menu;
Described command operation unit also for, receive the chip testing pattern numbering of user's input, enter with described chip testing pattern and number corresponding chip testing process; Chip testing order under this chip testing pattern of reception user input, according to the corresponding chip testing of described chip testing command execution.
8. apparatus for testing chip according to claim 6, is characterized in that, also comprises:
Determining unit, for determining whether described chip exists storage card;
Described result output unit also for, in described determining unit, determine while there is described storage card in described chip, chip testing result is shown and exports and be kept in described storage card;
Described result output unit also for, in described determining unit, determine while there is not described storage card in described chip, described chip testing result is shown to output.
9. according to the apparatus for testing chip described in any one in claim 6-8, it is characterized in that, described the first detecting unit comprises:
First detection module, the value for detection of the zone bit of the corresponding register of the external interface of described boot module, has determined whether external equipment access boot module; Or
The second detection module, changes for detection of the level of the relevant stitch of the external interface of described boot module, has determined whether external equipment access boot module.
10. apparatus for testing chip according to claim 9, is characterized in that, the external interface of described boot module is serial ports.
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| CN103530575A (en) * | 2012-07-04 | 2014-01-22 | 北京中电华大电子设计有限责任公司 | Protection method for chip testing mode |
| CN103424687B (en) * | 2013-07-29 | 2016-06-01 | 北京华大信安科技有限公司 | The device of test chip |
| CN110597675B (en) * | 2019-08-09 | 2023-07-07 | 珠海泰芯半导体有限公司 | Chip testing method, device, storage medium and burner |
| CN112698876A (en) * | 2019-10-21 | 2021-04-23 | 上海博泰悦臻电子设备制造有限公司 | Vehicle-mounted terminal engineering mode entering method and system, storage medium and vehicle-mounted terminal |
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| CN101226224A (en) * | 2008-01-16 | 2008-07-23 | 深圳国人通信有限公司 | Test system and method for circuit board |
| CN201364360Y (en) * | 2009-02-26 | 2009-12-16 | 青岛海信电器股份有限公司 | Circuit voltage testing device |
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| US7552371B2 (en) * | 2007-02-15 | 2009-06-23 | Inventec Corporation | Method and system for automatically diagnosing disability of computer peripheral devices |
| CN101252726A (en) * | 2008-03-29 | 2008-08-27 | 青岛海信移动通信技术股份有限公司 | Method for starting up mobile terminal |
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| CN101226224A (en) * | 2008-01-16 | 2008-07-23 | 深圳国人通信有限公司 | Test system and method for circuit board |
| CN201364360Y (en) * | 2009-02-26 | 2009-12-16 | 青岛海信电器股份有限公司 | Circuit voltage testing device |
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