JP7274525B2 - Cleaning jig - Google Patents

Description

CROSS-REFERENCE TO RELATED APPLICATIONS This application claims priority to Taiwan Patent Application Publication No. 109119762 filed on June 12, 2020, the entire contents of which are hereby incorporated by reference into this application.

The present invention relates to a cleaning jig, and more particularly to a cleaning jig for cleaning test equipment.

Generally speaking, various electronic devices may require routine maintenance management or cleaning after a period of use to ensure that the electronic device can operate properly. In particular, electronic equipment that requires high precision, such as test equipment, requires proper maintenance and cleaning to reduce errors in measurements. Taking the test device for battery detection as an example, the test device first clamps the electrodes of the battery in the test section, and then charges and charges the battery through the test section to confirm whether the battery is working normally. must be discharged. In practice, the electrodes of the battery are often covered with an oxide film when the battery is manufactured, so the test section also needs to scrape off the oxide film while clamping the electrodes. As a result, the surface of each test section can become soiled with oxide or some residue that has been scraped off after a period of use.

It is understood that the oxide film on the surface of each test section can not only affect the efficiency of charging and discharging the battery, but also interfere with the accuracy of detection. In addition, because the test sections have to deliver high currents, any scuffed oxide film or residue on the surface of each test section can also cause smoke or fire hazards. In fact, it is very important to clean the test section of the test device on a regular basis, but cleaning the test section of the test device can also be very laborious. For example, one test apparatus is typically required to test a large number of batteries in batches. Assuming that one electrode of each battery corresponds to one test section, it can be imagined that the test apparatus will have multiple test sections. Cleaning the test sections of the test apparatus one by one can be extremely time consuming and laborious. Accordingly, the industry is rapidly manufacturing multiple test sections of test equipment in batches to reduce test equipment downtime due to cleaning and also to reduce manpower and resources for cleaning the test equipment. There is a need for a new cleaning jig that can be cleaned to

The present invention provides a cleaning jig capable of rapidly and extensively cleaning a plurality of test sections of a test device without stopping the test device, thereby improving the detection efficiency of the test device.

The present invention discloses a cleaning jig for cleaning a plurality of test sections in a test apparatus. The cleaning jig includes a frame and multiple cleaning units. The frame has a first side located at an outer edge of the frame. A plurality of washing units are removably arranged on the first side of the frame. Each of the cleaning units has a cleaning seat, and the cleaning seat of each of the cleaning units extends outwardly from the frame. Each of the cleaning units corresponds to one of the test portions, and each of the test portions simultaneously contacts the first surface and the second surface of the corresponding cleaning sheet.

In some embodiments, each of the cleaning units can have a first locking member, and the first locking member removably secures the first side. Additionally, each of the cleaning units can have a second locking member, and the second locking member removably secures the cleaning sheet. The locking direction of the first locking member can be different than the locking direction of the second locking member. Additionally, the first and second surfaces of the cleaning sheet can be made of sandpaper.

In some embodiments, the test section of the test apparatus is used to test multiple electronic components on a carrier, the frame is defined by a frame length and a frame width, and the frame length is the length of the carrier. length and the frame width can be equal to the width of the carrier. Additionally, the set position of the cleaning unit on the first side may correspond to the placement position of the electronic components on the carrier.

Based on the above, the cleaning jig provided by the present invention can be used to clean the test device, the test sections of the test device can fasten the cleaning sheet, and manually clean the test sections one by one. Scrub away by itself without cleaning. Thereby, the cleaning fixture provided by the present invention provides: Multiple test sections of the test apparatus can be quickly cleaned in batches.

1 is a perspective view of a cleaning jig according to an embodiment of the invention; FIG. 1 is a perspective view of a washing unit according to an embodiment of the invention; FIG. FIG. 3 is a side view of a washing unit according to an embodiment of the invention;

The features, objects and functions of the present invention are further disclosed below. However, that is but a few of the possible embodiments of the invention and the scope of the invention is not limited thereto, i.e. equivalent changes and modifications made in accordance with the claims of the invention are still It is the subject of the present invention. Without departing from the spirit and scope of the invention, this should be considered as a further possible use of the invention.

Please refer to FIG. 1 and FIG. 2 together. 1 is a perspective view of a cleaning jig according to an embodiment of the present invention; FIG. 2 is a perspective view of a cleaning unit according to an embodiment of the invention; FIG. As shown in the figure, the cleaning jig 1 includes a frame 10 and multiple cleaning units 12 . A plurality of cleaning units 12 may be arranged on two sides of the frame 10 , with the cleaning sheet 126 in each cleaning unit facing the outside of the frame 10 or extending toward the outside of the frame 10 . In an example, two sides of the frame 10 may be defined as a first side 100 and a second side 102, respectively, and the plurality of cleaning units 12 may be divided into two groups. One group of cleaning units 12 is arranged on a first side 100 and another group of cleaning units 12 is arranged on a second side 102 . As shown in FIG. 1, the plurality of cleaning units 12 arranged on the first side 100 are arranged in a row, with the cleaning sheet 126 in each cleaning unit 12 facing the outside of the frame 10 at the same angle, for example. oriented generally vertically toward.

The function of the cleaning fixture 1 is to clean the test device, in particular the test section (not shown in FIG. 1) of the test device. In practice, when the test apparatus is in normal operation or in use (eg, during testing), the test section of the test apparatus is used to test electronic components (not shown). In one example, the electronic component may be a battery and the test device is a device used to detect whether the battery is working properly. Those skilled in the art will appreciate that the test portion must be electrically connected to the electrodes in a stationary manner at a first location, after which charge and discharge tests can be performed. Assuming the electronic component is a softpack battery, the electrodes of the softpack battery are sheet-shaped and flexible, so each of the test sections clamps one electrode to prevent accidental dropping. There must be. Of course, this embodiment does not limit the electronic components to soft pack batteries, nor does it limit the electrodes to sheet form. As long as the test section of the test device is electrically connected to the electrodes of the electronic component by clamping the electrodes, it should be within the scope of this embodiment.

To test electronic components in batches, a plurality of electronic components may be placed on a carrier (not shown), with the entire carrier placed in a storage position of the test apparatus, whereby the multiple electronic components are can be tested together. Correspondingly, the test device has a plurality of test portions, whereby each test portion can be electrically connected to one electrode of the electronic component. This embodiment does not limit the position of the electrodes of the electronic component. For example, multiple electronic components may be arranged on two sides of the carrier, and the electrodes of each electronic component may be perpendicular to the outside of the carrier. In fact, the arrangement of the electronic components on the carrier can be similar to the cleaning jig 1 shown in FIG. 1 of this embodiment. For example, the carrier can be compared to the frame 10 of the cleaning jig 1, the electronic component can be compared to the cleaning unit 12 of the cleaning jig 1, and the electrode of the electronic component can be compared to the cleaning sheet 126 of the cleaning unit 12. obtain. At this time, the cleaning fixture 1 does not have a real electronic component (eg, a battery to be tested), but the cleaning fixture 1 can still simulate the appearance of a carrier with multiple electronic components.

To allow the cleaning fixture 1 to be placed in the storage position of the test apparatus, the frame 10 may be defined by a frame length L and a frame width W, both of which are: Less than the length and width of the carrier. To even better simulate a carrier with multiple electronic components, the frame length L can be exactly equal to the carrier length and the frame width W can be exactly equal to the carrier width. . Additionally, the height of the frame 10 can also be defined as the frame height H, which must be less than the carrier height. In one example, the frame height H can also be exactly equal to the carrier height, such that when the frame length L, frame width W and frame height H are equal to the carrier length, width and height, The volume and appearance of the frame 10 should be approximately the same as the carrier.

In this embodiment, the construction of the cleaning unit is described and the manner in which the cleaning unit cleans the test portion is broadly demonstrated. Please refer to FIG. 2 and FIG. 3 together. 2 is a perspective view of a washing unit according to an embodiment of the invention, and FIG. 3 is a side view of the washing unit according to an embodiment of the invention. As shown, FIG. 2 shows the cleaning unit 12 of the cleaning jig 1 . The cleaning unit 12 has a body 120 in which a first locking member 122, a second locking member 124 and a cleaning sheet 126 are arranged. The first locking member 122 can be used to lock the frame 10 of the cleaning jig 1 , for example to lock the first side 100 of the frame 10 . In fact, when the first locking member 122 is locked, the frame 10 and the cleaning unit 12 do not move or rotate relative to each other, so that the cleaning sheet 126 can be kept stable. Once the first locking member 122 is released, the cleaning unit 12 can be separated from the frame 10 so that the cleaning unit 12 can be serviced or replaced.

The body 120 is composed of two similar plate-like structures defined as a first clamping plate 120a and a second clamping plate 120b, and the second locking member 124 comprises the first clamping plate 120a and the second clamping plate 120b. It can be seen from FIG. 2 that it can be used to lock the second clamping plate 120b. Further, in the example shown in FIG. 2, the locking directions of the first locking member 122 and the second locking member 124 are different, e.g. locking directions may be perpendicular to each other. In one example, one end of the cleaning sheet 126 can be sandwiched between the first clamping plate 120a and the second clamping plate 120b, and the other end of the cleaning sheet 126 is exposed for cleaning the test section 2. It is In practice, the cleaning sheet 126 is a double-sided sheet-like element, and both sides (first and second sides) of the cleaning sheet 126 may have a sandpaper-like rough surface. In one example, the cleaning sheet 126 can be a piece of sandpaper folded in half, with the smooth side of the sandpaper folded inward so that the rough side of the sandpaper is exposed. In other words, both the first and second surfaces of cleaning sheet 126 can be the same rough side of the razor. It is worth mentioning that this embodiment does not limit the number of test portions 2 that can clamp one cleaning sheet 126 simultaneously. Although FIG. 3 shows that two test portions 2 can clamp one cleaning sheet 126 at the same time, it is also possible that only one test portion 2 can clamp the cleaning sheet 126 .

To give a practical example, when the test apparatus tests an electronic component, the test section 2 not only tightens the electrode of the electronic component, but also scrapes or rubs the electrode to scrape off the oxide film on the surface of the electrode. Must. After a period of time, it is inevitable that oxide film residue or some dust will adhere to the test section 2, so the test section 2 must be cleaned regularly. In one example, after the tester has tested the electronic component, the electronic component on the carrier can be pulled out of the storage position and the cleaning jig 1 can be placed in the storage position as a replacement. Since the position of the cleaning sheet 126 is the same as the electrode position of the electronic component, the engineer gives the same instruction to the test device, for example, controls the test section 2 of the test device to tighten the electrode of the electronic component. can give instructions. Of course, this embodiment does not limit the instructions received by the tester, and the technician may also issue instructions designed for the self-cleaning process of the tester.

Since the electrode of the electronic component has been replaced with the cleaning sheet 126 in accordance with the above, the test section 2 of the test apparatus clamps the cleaning sheet 126 at the position where the electrode of the electronic component was originally expected to be clamped. Those skilled in the art will know that the residue and dust accumulated on the test portion 2 should be removed from the cleaning sheet 126 to achieve the purpose of cleaning the test portion 2 because the test portion 2 must rub or rub against the cleaning sheet 126 . can be scraped off by the rough surface of the In one example, if the test portion 2 accumulates a lot of dirt, in order to thoroughly clean the test portion 2, the technician may instruct the test portion 2 to squeeze the cleaning sheet 126 several times to improve the cleaning process. In addition, the same instruction can be issued to the tester more than once. It can be seen from the above that the test apparatus may clean itself with the cleaning jig 1 instead of having the cleaning sheet 126 actively rub or rub against the test portion 2 . Thus, the cleaning process may be completed by providing existing instructions, such as instructions for tightening the electrodes.

In addition, to slightly separate the first clamping plate 120a from the second clamping plate 120b when the cleaning sheet 126 reaches the recommended replacement usage (e.g., after many uses), The second locking member 124 can also be released. At this time, the technician can pull the used cleaning sheet 126 out from between the first clamping plate 120a and the second clamping plate 120b and replace it with a new one. Compared to stopping the test apparatus and disassembling and cleaning the test sections 2 one by one, this embodiment has a distinct advantage: the cleaning jig 1 cleans more test sections 2 at a time. can be used to On the other hand, this embodiment only needs to replace the cleaning sheet 126 to clean the test portion 2 in the next retracted position, and the test device does not need to be stopped to clean the test portion 2, This also means that the efficiency of the test equipment can be greatly improved.

In summary, the cleaning fixture provided by the present invention can be used to clean a test device, the test sections of the test device can clamp the cleaning sheet, and manually clean the test sections one by one. It can scrape off the residue by itself. Thereby, the cleaning fixture provided by the present invention can be used to reduce test equipment downtime due to cleaning and also to reduce manpower and resources for cleaning the test equipment. can be quickly cleaned in batches.

REFERENCE SIGNS LIST 1 washing jig 2 testing section 10 frame 12 washing unit 100 first side 102 second side 120 main body 120a first clamping plate 120b second clamping plate 122 first locking member 124 second locking Stopping member 126 Cleaning sheet H Frame height L Frame length W Frame width

Claims (4)

A cleaning jig for cleaning a plurality of test sections in a test apparatus,
a frame having a first side located at an outer edge of the frame;
a plurality of cleaning units removably disposed on a first side of the frame;
each of the cleaning units having a cleaning sheet, and the cleaning sheet of each of the cleaning units extending outwardly from the frame;
each of said cleaning units corresponding to one of said test portions, and each of said test portions simultaneously contacting first and second surfaces of said corresponding cleaning sheet ;
each of the cleaning units having a first locking member, the first locking member configured to secure the cleaning unit to the first side of the frame;
each of the cleaning units has a second locking member, the second locking member is configured such that the cleaning unit sandwiches the cleaning sheet;
The locking direction of the first locking member is different from the locking direction of the second locking member,
cleaning jig. The test section of the test apparatus is used to test a plurality of electronic components on a carrier, the frame being defined by a frame length and a frame width, and the frame length being the length of the carrier. and the frame width is equal to the width of the carrier. 3. The cleaning jig of claim 2 , wherein the set position of the cleaning unit on the first side corresponds to the placement position of the electronic component on the carrier. 2. The cleaning fixture of claim 1, wherein the first surface and the second surface of the cleaning sheet are made of sandpaper.

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