JP2020504302A - Inspection probe and socket - Google Patents

Abstract

An inspection probe for an object to be inspected having a curved cylindrical contact terminal to be inspected is provided. The inspection probe is provided in a V shape, and has a contact portion having a pair of contact surfaces that respectively contact the mutually separated positions of the contact terminals to be inspected, and are integrally formed rearward from the contact portion along the length direction. A first contact member having an extension that extends. ADVANTAGE OF THE INVENTION According to the probe for an inspection of this invention, it can contact a to-be-inspected contact terminal of a partial curved surface of an object to be inspected like a micro camera module for smart phones, and can prevent an inspection error.

Description

  The present invention relates to an inspection probe and an inspection socket for inspecting an object to be inspected having a curved terminal to be inspected, such as a micro camera module applied to a small mobile device such as a smartphone.

  As shown in FIG. 9, the camera module 10 includes a contact terminal 12 to be inspected having a partially curved cylindrical shape. The inspection contact terminal 12 of the camera module 10 is formed by bending a metal strip into a partially curved cylindrical shape. Such an inspection of the camera module 10 is performed by bringing a plunger 22 of a general pogo pin 20 into contact with the contact terminal 12 to be inspected. The plunger 22 of the pogo pin 20 has one or more tips 24 that are pointed to allow bumps made of lead to be bumped during testing. At the time of inspection, the sharp tip 24 of the plunger 22 comes into contact with the contact terminal to be inspected 12 having a partially curved cylindrical shape.

  The contact terminals 12 to be inspected of the camera module 10 are usually made of hard metal, unlike bump terminals made of lead. Therefore, when the tip 24 of the plunger 22 comes into contact with the contact terminal 12 to be inspected which has a curved surface, the tip 24 slips off. Such a contact error due to slippage causes an inspection error. Inspection errors occur more frequently due to various tolerances and alignment errors. In addition, a large number of repetitive tests cause an impurity transfer phenomenon, and as a result, a normal camera module may be erroneously recognized as defective. Such unstable contact between the probe and the terminal of the camera module causes stoppage of equipment, cleaning work, misreading, and the like, which adversely affects the mass production yield.

  An object of the present invention is to solve the conventional problem described above, and an inspection probe suitable for stably inspecting an inspected object having an inspected contact terminal having a partially curved cylindrical shape such as a camera module. To provide an inspection socket.

  An inspection probe for an object to be inspected having a curved contact surface to be inspected for solving the above problem is provided. The inspection probe is provided in a V-shape, and has a contact portion having a pair of contact surfaces that respectively contact the mutually separated positions of the contact terminals to be inspected, and are integrally formed rearward from the contact portion along the length direction. A first contact member having an extending extension. According to this, since the contact is made at two contact points while being in contact while surrounding the terminal to be inspected having a curved cylindrical shape, it is possible to prevent a contact failure and to prevent an increase in contact resistance due to foreign matter contamination.

  An inspection probe is disposed between the first contact member and the second contact member, the second contact member being in contact with an inspection contact of an inspection circuit, and at least one of the first contact member and the second contact member. And an elastic body for urging one.

  An inspection probe is disposed between the second contact member that contacts an inspection contact of an inspection circuit, a third contact member that contacts a lower end of the first contact member, and the second contact member and the third contact member. The apparatus may further include a probe having an elastic body for urging at least one of the second contact member and the third contact member.

  An inspection probe socket according to an embodiment of the present invention is provided with a contact member supporting a first contact member provided in a V-shape and having a pair of contact surfaces respectively in contact with mutually separated positions of the contact terminals to be inspected. A body, a second contact member that contacts an inspection contact of an inspection circuit, a third contact member that contacts a lower end of the first contact member, and the second contact member is disposed between the second contact member and the third contact member; A probe support that supports a probe having an elastic body that biases at least one of the second contact member and the third contact member.

  The contact member support is detachably supported by the probe support, and can effectively deal with operations such as maintenance of equipment due to contamination, cleaning, and misreading.

  ADVANTAGE OF THE INVENTION According to the test probe and probe socket which concern on this invention, since a contact terminal to be inspected of a curved surface cylindrical shape makes a probe contact at two points by a V-shaped contact part, in addition to being able to prevent poor contact, the V-shaped contact part Accumulation of foreign matter transferred to the contact point can be reduced, and an increase in contact resistance due to contamination can be prevented.

FIG. 2 is a perspective view of the inspection probe socket according to the embodiment of the present invention. FIG. 2 is an exploded perspective view of the inspection probe socket according to the embodiment of the present invention. FIG. 2 is a partial cross-sectional view of the inspection probe socket according to the embodiment of the present invention. FIG. 6 is a partial cross-sectional view of an inspection probe socket according to another embodiment of the present invention. It is a perspective view which shows the shape of various contact members. It is a perspective view which shows the shape of various contact members. It is a perspective view which shows the shape of various contact members. FIG. 6 is a partial cross-sectional view of an inspection probe socket according to another embodiment of the present invention. It is a partial sectional view of the conventional inspection probe socket.

  Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings.

  1 to 3 are a perspective view, an exploded perspective view, and a partial cross-sectional view, respectively, showing an inspection probe socket 1 according to an embodiment of the present invention. As shown, the probe socket 1 includes a contact member support 100 that accommodates and supports a large number of contact members 110, a housing 300 that accommodates and supports the contact member support 100 in a floating state, and a lower portion of the housing 300. And a probe support 400 for supporting a plurality of probes 200 disposed at positions corresponding to the plurality of contact members 110.

  For example, a test object 10 such as a camera module has a test terminal 12 having a partially curved cylindrical shape obtained by bending a metal plate into a “U” shape.

  As shown in FIGS. 1 and 3, the contact member 110 has a contact portion 111 having a pair of contact surfaces 112 and 114 provided in a V shape, and extends radially from the contact portion 111 to extend rearward. The extension 113 is provided. Here, when the pair of contact surfaces 112 and 114 receive and make contact with the terminal to be inspected 12 having a partially curved cylindrical shape, for example, a “U” shape, the terminal to be inspected 12 is separated at two points P1 and P2. Contact with. As a result, the contact member 110 can reliably achieve contact with the terminal under test 12 even if a positional error between the two contact points P1 and P2 due to the alignment error and the tolerance occurs to some extent. Further, even if foreign matter, for example, tin moves to the contact surfaces 112 and 114 by the repeated test, the foreign matter moved at the time of contact is pushed down and accumulated in the V-shaped groove along the inclined surface, and is accumulated at the contact points P1 and P2. No need to accumulate. Here, the contact member 110 may be the plunger itself of the probe. Normally, the device under test 10 is arranged such that the pitches of a large number of terminals to be tested are very narrow. Therefore, the contact portion 111 has a first plate portion 115 formed with a narrow width in consideration of the pitch of the plurality of terminals under test 12 and a second plate portion formed with a wider width than the first plate portion 115 for improving strength. A plate 116 is provided. The contact member 110 may be manufactured in the form of a plate having the same thickness as a whole. However, since the strength and durability are low, the first plate portion has a length enough to avoid contact with an adjacent terminal to be inspected. 115, and the remainder is preferably processed as the second plate portion 116 or the extended portion 113 having a wider width.

  The contact member support 100 includes a first contact member support 120 that is inserted so that the contact portion 111 partially projects, and a second contact member support 130 that is disposed below the first contact member support 120. Prepare. The first contact member support 120 has a first opening 122 into which the contact portion 111 is inserted. The second contact member support 130 has a second opening 132 into which the extension 113 is inserted. The contact member support 100 is floatingly supported in the first housing portion 302 of the housing 300 by four springs 320. Here, the first contact member support 120 and the second contact member support 130 may be integrally formed.

  The housing 300 is provided with a first housing portion 302 for housing the contact member support 100 at an upper portion, and a second housing portion for housing the probe support 400 at a lower portion. A third opening 330 for accommodating a first plunger 210 of the probe 200 described below is disposed between the first accommodation section 302 and the second accommodation section.

  The probe 200 has a cylindrical barrel 220, one end of which is partially housed in one side of the barrel 220 and the other end of which is partially inserted into the other side of the barrel 220, the first plunger 210 which contacts the lower end of the contact member 110. The second plunger 230 and the first plunger 210 and the second plunger 230 are interposed between the first plunger 210 and the second plunger 230 in the barrel 220 to urge the first plunger 210 and the second plunger 230 away from each other. A spring 240 is provided.

  The probe support 400 has a fourth opening 430 for receiving and inserting the probe 200 such that the second plunger 230 partially protrudes to the outside. The probe support 400 is fixed to a lower portion of the housing 300 by a fixing pin 410.

  As shown in FIG. 2, the contact member support 100 that supports the contact member 110 is removably inserted and supported in the first housing portion 302 of the housing 300. Therefore, when the contact member 110 is defective or its life has expired, the probe 200 can be left as it is, and only the contact member 110 can be easily replaced.

  FIG. 3 shows a state where the test object 10 is pressurized for the test, and the spring 240 is in a compressed state. When the test is completed and the pressing of the test object 10 is interrupted, the contact member 110 is pushed up while the first plunger 240 projects upward by the spring 240. As a result, when the test is completed, the contact portion 111 of the contact member 110 projects outside from the first contact member support 120.

  FIG. 4 is a partial sectional view showing a probe socket 1 according to another embodiment of the present invention. As shown, the first plunger 210 'is partially inserted into one side of the barrel 220. The first plunger 210 'includes a contact portion 211 having a pair of V-shaped contact surfaces 212 and 214, and an extension portion 216 that extends radially from the contact portion 211 and extends rearward. Here, when the pair of contact surfaces 212 and 214 receive and contact the terminal 12 to be inspected having a partially curved cylindrical shape, they come into contact at two separated points P1 and P2. The contact portion 211 extends radially from the first plate portion 215 and extends rearward from the first plate portion 215 formed with a narrow width in consideration of the pitch of the plurality of terminals to be inspected 12 and the strength. The expansion unit 216 is provided. The first plunger 210 ′ may be made of a plate material having the same thickness as a whole. However, in order to improve strength and durability, the first plate portion 215 makes contact with adjacent terminals to be inspected. It is formed in a plate shape with a narrow width that can be avoided, and the expanded portion 216 is formed in a column shape that is expanded in the radial direction from the first plate portion 215. One side of the second plunger 230 is partially inserted into the other side of the barrel 220, and the second plunger 230 contacts a pad terminal (not shown) of the inspection circuit. A spring 240 is interposed between the first plunger 210 'and the second plunger 230 in the barrel 220. The spring 240 biases the first plunger 210 'and the second plunger 230 away from each other.

  FIG. 5 shows a contact member 510 according to another embodiment of the present invention. Here, the contact member 510 is separately manufactured separately, and contacts the first plunger 210 of the probe 200 as shown in FIG. The contact member 510 may be applied as a part of the first plunger 210 'as shown in FIG. The contact member 510 includes a main body 511, a flange 512 extending radially from the main body 511, a first plate 514 having a contact 516 having a V-shaped contact surface, and a first plate 514 and a flange. A second plate portion 513 having a width wider than the first plate portion 514 between the first plate portion 514 and the second plate portion 514 is provided. The main body 511 has a columnar shape and has at least one flat portion 515 that is flattened in the length direction. The flat part 515 allows the plurality of first plate parts 514 to be arranged in parallel and uniformly when the plurality of contact members 510 are arranged. The first plate portion 514 is formed to avoid interference between the terminals under test 12 that are adjacent at a narrow pitch. The flange portion 512 may be omitted. The main body 511 can be replaced with a second plate 513. Similarly, the second plate portion 513 can be replaced with a first plate portion 514. That is, the first plate portion 514 may be directly extended from the flange portion 512 or the main body portion 511. However, if the first plate portion 514 having a small width is long, the durability may be reduced or distorted if the length is long, and thus the first plate portion 514 can be applied only to a terminal to be inspected having a large pitch.

  FIG. 6 shows a contact member 610 according to still another embodiment of the present invention. Here, the contact member 610 is separately manufactured separately, and contacts the first plunger 210 of the probe 200 as shown in FIG. The contact member 610 may be applied as a part of the first plunger 210 'as shown in FIG. The contact member 610 includes a cylindrical main body 611, a flange 612 extending in a radial direction from the main body 611, a first plate 614 on which a contact 616 having a V-shaped contact surface is formed, and a first plate 614. A second plate portion 613 having a wider width than the first plate portion 614 is provided between the first plate portion 614 and the main body portion 611. The flange portion 612 extends in the radial direction around the main body portion 611. The flange portion 612 has the shape of a quadrangular prism. The flange part 612 allows a plurality of first plate parts 614 to be arranged in a certain direction in parallel when a plurality of contact members 610 are arranged. The first plate portion 614 is formed with a narrow width in order to avoid interference between the terminals under test 12 that are adjacent at a very narrow pitch.

  FIG. 7 shows a contact member according to still another embodiment of the present invention. Here, the contact member 710 is separately manufactured separately and comes into contact with the first plunger 210 of the probe 200 as shown in FIG. The contact member 710 may be applied as a part of the first plunger 210 'as shown in FIG. The contact member 710 includes a quadrangular prism-shaped main body portion 711, a flange portion 712 extending radially from the main body portion 711, a first plate portion 714 having a contact portion 716 having a V-shaped contact surface, and a first plate portion 714. A second plate portion 713 having a wider width than the first plate portion 714 is provided between the first plate portion 714 and the main body portion 711. The flange portion 712 extends in the width direction around the main body portion 711. Flange portion 712 has the shape of a square pole. The flange part 712 allows a plurality of first plate parts 714 to be arranged in parallel and arranged in the same direction when a plurality of contact members 710 are arranged. The first plate portion 714 is formed with a narrow width in order to avoid interference with adjacent terminals to be inspected 12 having a small pitch.

  FIG. 8 is a partial sectional view of an inspection probe socket according to another embodiment. As shown, in addition to the contact member 110 and the first probe 200 that are in contact with the partially curved cylindrical portion of the terminal under test 12, a second probe 800 that is in contact with the plane portion of the terminal under test 12 is provided. The second probe 800 can be in the shape of a non-limiting pogo pin. The simultaneous application of the contact member 110 and the first probe 200 and the second probe 800 is to improve the reliability of the inspection.

  As described above, the present invention has been described with reference to the limited exemplary embodiments and the drawings. However, the present invention is not limited to the above-described exemplary embodiments, and is generally used in the field to which the present invention pertains. Various modifications and variations are possible from the above description for those skilled in the art.

  Therefore, the scope of the present invention should not be limited to the described illustrative embodiments, but should be defined by the appended claims and equivalents thereof.

1: Probe socket 100: First contact member support 110, 510, 610, 710: Contact member 120: Second contact member support 200: Probe 210: First plunger 220: Barrel 230: Second plunger 240: Spring 300: Housing 400: Probe support

Claims (5)

An inspection probe for an object to be inspected having a contact terminal to be inspected having a curved surface,
A contact portion provided in a V-shape and having a pair of contact surfaces respectively in contact with mutually separated positions of the contact terminals to be inspected, and an extension portion integrally extending rearward along the length direction from the contact portion; An inspection probe, comprising: a first contact member having: A second contact member that contacts a test contact of the test circuit;
An elastic body disposed between the first contact member and the second contact member, for urging at least one of the first contact member and the second contact member;
The inspection probe according to claim 1, further comprising:   A second contact member that contacts an inspection contact of an inspection circuit, a third contact member that contacts a lower end of the first contact member, and the second contact member that is disposed between the second contact member and the third contact member; The inspection probe according to claim 1, further comprising a probe having an elastic body for urging at least one of the contact member and the third contact member. A probe socket for supporting a probe for inspection of an object to be inspected having a curved contact terminal to be inspected,
A contact member support that is provided in a V-shape and supports a first contact member having a pair of contact surfaces that respectively contact the mutually separated positions of the contact terminals to be inspected;
A second contact member that contacts an inspection contact of an inspection circuit; a third contact member that contacts a lower end of the first contact member; and a second contact member that is disposed between the second contact member and the third contact member. A probe support that supports a member and a probe having an elastic body that biases at least one of the third contact members;
An inspection probe socket, comprising:   The probe socket for inspection according to claim 4, wherein the contact member support is detachably supported by the probe support.

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