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TWI749588B - Cleaning system - Google Patents

Cleaning system Download PDF

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Publication number
TWI749588B
TWI749588B TW109119762A TW109119762A TWI749588B TW I749588 B TWI749588 B TW I749588B TW 109119762 A TW109119762 A TW 109119762A TW 109119762 A TW109119762 A TW 109119762A TW I749588 B TWI749588 B TW I749588B
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TW
Taiwan
Prior art keywords
cleaning
frame
test
sheet
test equipment
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TW109119762A
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Chinese (zh)
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TW202146124A (en
Inventor
李日新
王裕廣
莊明儒
張文銓
Original Assignee
致茂電子股份有限公司
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Application filed by 致茂電子股份有限公司 filed Critical 致茂電子股份有限公司
Priority to TW109119762A priority Critical patent/TWI749588B/en
Priority to EP21178866.6A priority patent/EP3922366B1/en
Priority to JP2021097716A priority patent/JP7274525B2/en
Application granted granted Critical
Publication of TWI749588B publication Critical patent/TWI749588B/en
Publication of TW202146124A publication Critical patent/TW202146124A/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00Cleaning by methods involving the use of tools
    • B08B1/10Cleaning by methods involving the use of tools characterised by the type of cleaning tool

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  • Cleaning In General (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention discloses a cleaning jig for cleaning a plurality of testers in a testing device. The cleaning jig includes a frame and a plurality of cleaning units. The frame has a first side, and the first side is located at an outer edge of the frame. The plurality of cleaning units are detachably disposed on the first side of the frame. Each cleaning unit has a cleaning sheet thereon, and the cleaning sheet of each cleaning unit faces outside the frame. Wherein each cleaning unit corresponds to one of the plurality of testers, and each tester simultaneously contacts a first surface and a second surface of a corresponding cleaning sheet.

Description

清潔系統 Cleaning system

本發明係關於一種清潔治具,特別是關於一種用來清潔測試設備的清潔治具。 The invention relates to a cleaning jig, in particular to a cleaning jig used to clean test equipment.

一般來說,各種電子設備在一段時間的使用後,都需要進行例行性的保養或清潔,以確保電子設備能夠繼續正常地運作。特別是,對於精密度要求較高的電子設備,例如各種測試設備,正確地進行保養或清潔也能減少量測數據時產生的誤差。以電池的檢測為例,測試設備需要先用測試部夾穩電池的電極,再經過測試部對電池充電與放電,以檢測電池是否正常工作。實務上,由於電池出廠時,電池的電極往往會包覆著氧化膜,測試部夾住電極的同時還必須負責刮除氧化膜。如此一來,在一段時間的使用後,測試部的表面可能會沾附少量刮除下來的氧化膜,或者說測試部的表面可能會有一些氧化膜的殘渣。 Generally speaking, after a period of use of various electronic devices, routine maintenance or cleaning is required to ensure that the electronic devices can continue to operate normally. In particular, for electronic equipment that requires high precision, such as various test equipment, correct maintenance or cleaning can also reduce errors in measurement data. Taking battery testing as an example, the testing equipment needs to first clamp the electrodes of the battery with the testing part, and then charge and discharge the battery through the testing part to detect whether the battery is working normally. In practice, since the electrodes of the battery are often covered with an oxide film when the battery leaves the factory, the test department must be responsible for scraping off the oxide film while clamping the electrode. As a result, after a period of use, a small amount of scraped oxide film may be attached to the surface of the test part, or there may be some oxide film residue on the surface of the test part.

可以理解的是,測試部表面上的氧化膜除了可能影響測試部對電池充電與放電的效率之外,也可能會干擾檢測的正確性。此外,因為測試部需要承載大電流,非預期的氧化膜殘渣還可能會導致起煙或起火的意外。實務上,定時清潔測試設備的測試部十分重要,然而清潔測試設備的測試部卻也十分麻煩。舉例來說,測試設備一般都需要批次地檢測大量的電池,假設每個電池的電極對應到一個測試部,可以想像測試設備將有數量龐大的測試部,而將測試設備的測試部逐一刷洗清潔必然十分耗時費力。據此,業界需要一種新的清潔治具,要能 夠快速地、批次地清潔測試設備的多個測試部,從而能夠減少測試設備的停機清潔時間,也能夠減少清潔測試設備的人力與物力。 It is understandable that the oxide film on the surface of the test part may not only affect the charging and discharging efficiency of the battery, but also may interfere with the accuracy of the test. In addition, because the test part needs to carry a large current, unexpected oxide film residue may also cause smoke or fire accidents. In practice, it is very important to clean the test department of the test equipment regularly, but it is also very troublesome to clean the test department of the test equipment. For example, test equipment generally needs to test a large number of batteries in batches. Assuming that the electrode of each battery corresponds to a test part, it can be imagined that the test equipment will have a large number of test parts, and the test parts of the test equipment will be scrubbed one by one. Cleaning must be very time-consuming and laborious. According to this, the industry needs a new kind of cleaning fixture that can The multiple test parts of the test equipment can be cleaned quickly and in batches, thereby reducing the downtime and cleaning time of the test equipment, and also reducing the manpower and material resources for cleaning the test equipment.

本發明提供一種清潔治具,可以在測試設備不停機的情況下,快速且大量的清潔測試設備的多個測試部,從而可以提升測試設備的檢測效率。 The invention provides a cleaning jig, which can quickly and massively clean a plurality of test parts of the test equipment without stopping the test equipment, thereby improving the detection efficiency of the test equipment.

本發明提出一種清潔治具,用以清潔測試設備中的多個測試部,所述清潔治具包含框架以及多個清潔單元。所述框架具有第一側,第一側位於框架的外緣。所述多個清潔單元可拆卸地設置於框架的第一側,每一個清潔單元上具有清潔片,且每一個清潔單元的清潔片朝向框架外。其中,每一個清潔單元對應所述多個測試部其中之一,且每一個測試部同時接觸對應的清潔片的第一面與第二面。 The present invention provides a cleaning jig for cleaning a plurality of test parts in a testing device. The cleaning jig includes a frame and a plurality of cleaning units. The frame has a first side, and the first side is located at the outer edge of the frame. The plurality of cleaning units are detachably arranged on the first side of the frame, each cleaning unit has a cleaning sheet, and the cleaning sheet of each cleaning unit faces out of the frame. Wherein, each cleaning unit corresponds to one of the multiple test portions, and each test portion contacts the first surface and the second surface of the corresponding cleaning sheet at the same time.

於一些實施例中,每一個清潔單元上可以具有第一鎖固件,第一鎖固件可拆卸地固定第一側。此外,每一個清潔單元上可以具有第二鎖固件,第二鎖固件可拆卸地固定清潔片。另外,第一鎖固件的鎖固方向可以相異於第二鎖固件的鎖固方向。以及,清潔片的第一面與第二面可以為砂紙。 In some embodiments, each cleaning unit may have a first locking member, and the first locking member detachably fixes the first side. In addition, each cleaning unit may have a second locking member, and the second locking member detachably fixes the cleaning sheet. In addition, the locking direction of the first fastener may be different from the locking direction of the second fastener. And, the first side and the second side of the cleaning sheet may be sandpaper.

於一些實施例中,測試設備的所述多個測試部用以載盤上的多個電子元件,框架定義有框架長度與框架寬度,框架長度可以等於載盤的長度,框架寬度可以等於載盤的寬度。此外,所述多個清潔單元於第一側的設置位置,可以對應所述多個電子元件於載盤的放置位置。 In some embodiments, the plurality of test parts of the test equipment are used to carry a plurality of electronic components on the disc, and the frame is defined with a frame length and a frame width. The frame length may be equal to the length of the carrier disc, and the frame width may be equal to the carrier disc. The width. In addition, the placement positions of the plurality of cleaning units on the first side may correspond to the placement positions of the plurality of electronic components on the tray.

綜上所述,本發明提供的清潔治具可以用於清潔測試設備,且測試設備的測試部可以自行夾緊清潔片並磨去髒汙,而不需要用人工逐個清洗測 試部。藉此,本發明提供的清潔治具能夠批次地完成清潔測試設備中多個測試部的工作,減少了測試設備停機清潔的時間,從而提升了測試設備的檢測效率。 In summary, the cleaning jig provided by the present invention can be used to clean the test equipment, and the test part of the test equipment can clamp the cleaning sheet and grind away the dirt by itself, instead of manually cleaning the test equipment one by one. Test department. Thereby, the cleaning jig provided by the present invention can complete the work of cleaning multiple test parts in the test equipment in batches, which reduces the time for the test equipment to stop for cleaning, thereby improving the detection efficiency of the test equipment.

1:清潔治具 1: Clean fixture

10:框架 10: Frame

100:第一側 100: first side

102:第二側 102: second side

12:清潔單元 12: Cleaning unit

120:本體 120: body

120a:第一夾板 120a: first splint

120b:第二夾板 120b: second splint

122:第一鎖固件 122: The first lock firmware

124:第二鎖固件 124: The second lock firmware

126:清潔片 126: cleaning sheet

2:測試部 2: Testing Department

L:框架長度 L: Frame length

W:框架寬度 W: frame width

H:框架高度 H: frame height

圖1係繪示依據本發明一實施例之清潔治具的立體示意圖。 FIG. 1 is a three-dimensional schematic diagram of a cleaning jig according to an embodiment of the present invention.

圖2係繪示依據本發明一實施例之清潔單元的立體示意圖。 FIG. 2 is a three-dimensional schematic diagram of a cleaning unit according to an embodiment of the present invention.

圖3係繪示依據本發明一實施例之清潔單元的側視圖。 Fig. 3 is a side view of a cleaning unit according to an embodiment of the present invention.

下文將進一步揭露本發明之特徵、目的及功能。然而,以下所述者,僅為本發明之實施例,當不能以之限制本發明之範圍,即但凡依本發明申請專利範圍所作之均等變化及修飾,仍將不失為本發明之要意所在,亦不脫離本發明之精神和範圍,故應將視為本發明的進一步實施態樣。 The features, objectives and functions of the present invention will be further disclosed below. However, the following are only examples of the present invention, and should not be used to limit the scope of the present invention, that is, all equivalent changes and modifications made in accordance with the scope of the patent application of the present invention will still be the essence of the present invention. Without departing from the spirit and scope of the present invention, it should be regarded as a further implementation aspect of the present invention.

請一併參閱圖1與圖2,圖1係繪示依據本發明一實施例之清潔治具的立體示意圖,圖2係繪示依據本發明一實施例之清潔單元的立體示意圖。如圖所示,清潔治具1包含框架10以及多個清潔單元12,多個清潔單元12可以排列於框架10的兩側,並且每個清潔單元中的清潔片126會朝向框架10外。於一個例子中,框架10的兩側可以分別定義為第一側100與第二側102,且多個清潔單元12可以分別成兩個群組,一個群組的清潔單元12設置於第一側100,而另一個群組的清潔單元12設置於第二側102。如圖1所示,設置於第一側100的多個清潔單元12會排列成一排,並且每個清潔單元中的清潔片126大致朝向同一個角度,例如垂直地朝向框架10外。 Please refer to FIGS. 1 and 2 together. FIG. 1 is a three-dimensional schematic diagram of a cleaning jig according to an embodiment of the present invention, and FIG. 2 is a three-dimensional schematic diagram of a cleaning unit according to an embodiment of the present invention. As shown in the figure, the cleaning jig 1 includes a frame 10 and a plurality of cleaning units 12. The plurality of cleaning units 12 can be arranged on both sides of the frame 10, and the cleaning sheet 126 in each cleaning unit faces the outside of the frame 10. In an example, the two sides of the frame 10 can be defined as a first side 100 and a second side 102, respectively, and a plurality of cleaning units 12 can be divided into two groups, and one group of cleaning units 12 is arranged on the first side. 100, and another group of cleaning units 12 are arranged on the second side 102. As shown in FIG. 1, a plurality of cleaning units 12 arranged on the first side 100 are arranged in a row, and the cleaning sheets 126 in each cleaning unit are generally oriented at the same angle, for example, vertically toward the outside of the frame 10.

此外,清潔治具1的功能是用來清潔測試設備,特別是清潔治具1可以用來清潔測試設備中的測試部(未示於圖1)。實務上,測試設備於正常操作 或使用時(例如於測試中),測試設備的測試部可以用來測試電子元件(圖未示)。於一個例子中,電子元件可以是一種電池,而測試設備是一種用來檢測電池是否正常工作的設備。於所屬技術領域具有通常知識者可以理解,在測試電池的過程中,測試部需要穩固地電性連接電池的電極,才能對電池進行充放電測試或者量測電池內部的電壓。假設電子元件是一種軟包電池,由於軟包電池的電極成片狀且具有一定的可撓程度,從而測試部則必須夾緊電極以防脫落導致意外。當然,本實施例並不限制電子元件一定要是軟包電池,也不限制電極成片狀,只要測試設備的測試部是用夾緊電極的方式電性連接電子元件的電極,都應屬於本實施例描述電子元件的範疇。 In addition, the function of the cleaning jig 1 is to clean the test equipment, and in particular, the cleaning jig 1 can be used to clean the test part of the test equipment (not shown in FIG. 1). In practice, the test equipment is in normal operation Or when in use (for example, during testing), the test section of the test equipment can be used to test electronic components (not shown). In one example, the electronic component may be a battery, and the test device is a device used to detect whether the battery is working normally. Those with ordinary knowledge in the relevant technical field can understand that in the process of testing the battery, the testing part needs to be firmly electrically connected to the electrodes of the battery in order to perform charge and discharge tests on the battery or measure the internal voltage of the battery. Assuming that the electronic component is a soft-packed battery, since the electrodes of the soft-packed battery are sheet-shaped and have a certain degree of flexibility, the test part must clamp the electrodes to prevent accidents caused by falling off. Of course, this embodiment does not limit the electronic component to be a soft-pack battery, nor does it limit the electrode to be sheet-shaped. As long as the test part of the test device is electrically connected to the electrode of the electronic component by clamping the electrode, it should belong to this embodiment. The example describes the category of electronic components.

為了批次地測試電子元件,多個電子元件可以先放置在載盤(圖未示)上,再將整個載盤放入測試設備中的庫位,讓多個電子元件可以一起進行測試。相對地,測試設備會具有多個測試部,讓每一個測試部都能夠電性連接到其中一個電子元件的電極。本實施例在此不限制電子元件電極的位置,例如多個電子元件可以排列於載盤的兩側,並且每一個電子元件的電極可以垂直地朝向載盤外。實務上,多個電子元件在載盤中的擺放方式可以類似本實施例圖1示範的清潔治具1,例如載盤可以對比成清潔治具1的框架10,電子元件可以對比成清潔治具1的清潔單元12,而電子元件的電極可以對比成清潔單元12的清潔片126。此時,清潔治具1雖然不具備實際上的電子元件(例如待測的電池),但外觀上可以模擬多個電子元件放置在載盤的情況。 In order to test electronic components in batches, multiple electronic components can be placed on a carrier disk (not shown), and then the entire carrier disk is placed in a storage location in the test equipment, so that multiple electronic components can be tested together. In contrast, the test equipment will have multiple test parts, so that each test part can be electrically connected to the electrode of one of the electronic components. This embodiment does not limit the position of the electrode of the electronic component. For example, a plurality of electronic components can be arranged on both sides of the carrier, and the electrode of each electronic component can be perpendicular to the outside of the carrier. In practice, the placement of multiple electronic components in the tray can be similar to the cleaning fixture 1 shown in Figure 1 of this embodiment. For example, the tray can be compared to the frame 10 of the cleaning fixture 1, and the electronic components can be compared to the cleaning fixture. The cleaning unit 12 is equipped with 1, and the electrode of the electronic component can be compared to the cleaning sheet 126 of the cleaning unit 12. At this time, although the cleaning jig 1 does not have actual electronic components (for example, a battery to be tested), the appearance can simulate a situation in which multiple electronic components are placed on a carrier.

為了讓清潔治具1也可以放入測試設備中的庫位,框架10可以定義有框架長度L與框架寬度W,且框架長度L與框架寬度W都要小於載盤的長度與寬度。當然,為了更好地模擬多個電子元件放置在載盤的情況,框架長度L還可 以恰好等於所述載盤的長度,且框架寬度W同樣可以恰好等於所述載盤的寬度。此外,框架10的高度也可以被定義為框架高度H,框架高度H應當要小於載盤的高度。於一個例子中,框架高度H也可以恰好等於載盤的高度,從而當框架長度L、框架寬度W與框架高度H和載盤的長度、寬度與高度都相同的情況下,框架10在外觀上的體積也應大致上等於載盤的體積。 In order to allow the cleaning jig 1 to be placed in the storage location of the test equipment, the frame 10 may be defined with a frame length L and a frame width W, and the frame length L and the frame width W are both smaller than the length and width of the tray. Of course, in order to better simulate the situation where multiple electronic components are placed on the carrier, the frame length L can also be It can be exactly equal to the length of the carrier plate, and the frame width W can also be exactly equal to the width of the carrier plate. In addition, the height of the frame 10 can also be defined as the frame height H, and the frame height H should be smaller than the height of the tray. In one example, the frame height H can also be exactly equal to the height of the tray, so that when the frame length L, the frame width W, and the frame height H, and the length, width, and height of the tray are the same, the frame 10 appears in appearance The volume should also be roughly equal to the volume of the tray.

本實施例接下來說明清潔單元的結構,並大致示範利用清潔單元清潔測試部的方式。請一併參閱圖2與圖3,圖2係繪示依據本發明一實施例之清潔單元的立體示意圖,圖3係繪示依據本發明一實施例之清潔單元與測試部的立體示意圖。如圖所示,圖2繪示了清潔治具1的清潔單元12,清潔單元12具有一個本體120,本體120上設第一鎖固件122、第二鎖固件124以及清潔片126。第一鎖固件122可以用來鎖固於清潔治具1的框架10,例如鎖固在框架10的第一側100。實務上,當第一鎖固件122鎖緊時,框架10和清潔單元12不會相對運動或轉動,從而能讓清潔片126保持穩定。當第一鎖固件122鬆開時,清潔單元12可以從框架10上拆卸下來,從而便於進行清潔單元12的保養或更換。 In this embodiment, the structure of the cleaning unit is described next, and the method of cleaning the test part by the cleaning unit is roughly demonstrated. Please refer to FIGS. 2 and 3 together. FIG. 2 is a three-dimensional schematic diagram of a cleaning unit according to an embodiment of the present invention, and FIG. 3 is a three-dimensional schematic diagram of a cleaning unit and a testing part according to an embodiment of the present invention. As shown in the figure, FIG. 2 shows the cleaning unit 12 of the cleaning jig 1. The cleaning unit 12 has a body 120 on which a first locking member 122, a second locking member 124 and a cleaning sheet 126 are provided. The first locking member 122 can be used to lock the frame 10 of the cleaning fixture 1, for example, to the first side 100 of the frame 10. In practice, when the first locking member 122 is locked, the frame 10 and the cleaning unit 12 will not move or rotate relative to each other, so that the cleaning sheet 126 can be kept stable. When the first locking member 122 is released, the cleaning unit 12 can be detached from the frame 10 so as to facilitate maintenance or replacement of the cleaning unit 12.

由圖2可以看出,本體120係由兩個相似的板狀結構組成,在此定義為第一夾板120a與第二夾板120b,且第一夾板120a與第二夾板120b係利用第二鎖固件124鎖緊。並且,圖2繪示的例子中,第一鎖固件122和第二鎖固件124的鎖固方向不同,例如第一鎖固件122和第二鎖固件124的鎖固方向可以是互相垂直的。於一個例子中,清潔片126的一端可以被第一夾板120a與第二夾板120b夾著,而讓清潔片126的另一端露出,並且可以用來清潔測試部2。實務上,清潔片126是一個雙面的片狀元件,而清潔片126的兩面(第一面與第二面)可以都具有砂紙般粗糙的表面。於一個例子中,清潔片126也有可能是一片對折後的砂紙,而砂 紙光滑的表面被折在內側,而砂紙粗糙的表面被折在外側。也就是說,清潔片126的第一面與第二面可以都是砂紙粗糙的表面。值得一提的是,本實施例並不限制一個清潔片126能同時被多少個測試部2夾住,雖然圖3繪示了兩個測試部2同時夾著一個清潔片126,但清潔片126也有可能只對應一個測試部2。 It can be seen from Figure 2 that the main body 120 is composed of two similar plate-like structures, which are defined here as the first splint 120a and the second splint 120b, and the first splint 120a and the second splint 120b use the second locking member 124 lock tightly. Moreover, in the example shown in FIG. 2, the locking directions of the first locking member 122 and the second locking member 124 are different, for example, the locking directions of the first locking member 122 and the second locking member 124 may be perpendicular to each other. In one example, one end of the cleaning sheet 126 can be sandwiched between the first clamping plate 120a and the second clamping plate 120b, while the other end of the cleaning sheet 126 is exposed, and can be used to clean the test part 2. In practice, the cleaning sheet 126 is a double-sided sheet-like element, and both sides (the first side and the second side) of the cleaning sheet 126 may have sandpaper-like rough surfaces. In one example, the cleaning sheet 126 may also be a piece of sandpaper folded in half, and the sand The smooth surface of the paper is folded on the inside, while the rough surface of the sandpaper is folded on the outside. In other words, the first surface and the second surface of the cleaning sheet 126 may both be roughened with sandpaper. It is worth mentioning that this embodiment does not limit how many test parts 2 can clamp a cleaning sheet 126 at the same time. Although FIG. 3 shows that two test parts 2 clamp a cleaning sheet 126 at the same time, the cleaning sheet 126 is It may also correspond to only one test section 2.

以實際的例子來說,測試設備在檢測完電子元件時,測試部2不僅要夾住電子元件的電極,還會在抵壓電極表面時稍微移動,藉以刮除電極表面上的氣化膜。一段時間之後,測試部2上難免會黏著氣化膜的殘渣或者沾附一些灰塵,從而必須定期清潔測試部2。於一個例子中,測試設備在檢測完電子元件後,可以將裝有電子元件的載盤從庫位中抽出,並將清潔治具1放入庫位中。由於清潔片126的位置和電子元件的電極位置相同,工程師可以下達相同的指令給測試設備,例如控制測試設備的測試部2夾著電子元件的電極。當然,本實施例並不限制測試設備收到的指令,例如工程師也有可能下達專用於自我清潔的指令給測試設備。 Taking a practical example, when the testing device finishes testing the electronic component, the testing part 2 not only clamps the electrode of the electronic component, but also moves slightly when pressing the electrode surface to scrape the vaporized film on the electrode surface. After a period of time, the residue of the vaporization film or some dust will inevitably adhere to the test part 2, so the test part 2 must be cleaned regularly. In one example, after the testing equipment has inspected the electronic components, it can pull out the carrier plate containing the electronic components from the storage location, and put the cleaning jig 1 into the storage location. Since the position of the cleaning sheet 126 is the same as the electrode position of the electronic component, the engineer can issue the same instruction to the test equipment, for example, control the test part 2 of the test equipment to clamp the electrode of the electronic component. Of course, this embodiment does not limit the instructions received by the test equipment. For example, it is also possible for an engineer to issue instructions dedicated to self-cleaning to the test equipment.

承接上述,由於電子元件的電極已經被替換成了清潔片126,測試設備的測試部2在原本預計夾到電子元件的電極的位置上,會改成夾到清潔片126。於所屬技術領域具有通常知識者可以理解,因為測試部2同樣有抵壓清潔片126並稍微移動的動作,原本積累測試部2上的殘渣與灰塵便可以被清潔片126的粗糙表面磨去,從而達到清潔測試部2的目的。於一個例子中,如果測試部2積累的髒污較多,工程師可以多下達幾次重複的指令給測試設備,例如控制測試設備的測試部2多夾幾次清潔片126,以達到加強清潔測試部2的目的。由上述可知,實際上測試設備是利用清潔治具1達到自我清潔的效果,例如可以利用既有的指 令達到清潔,而並非是清潔治具1利用清潔片126主動去刷除測試部2上的殘渣與灰塵。 Following the above, since the electrode of the electronic component has been replaced with the cleaning sheet 126, the test part 2 of the test equipment will clamp the cleaning sheet 126 at the position where the electrode of the electronic component was originally expected to be clamped. Those with ordinary knowledge in the technical field can understand that because the test part 2 also has the action of pressing the cleaning sheet 126 and moving slightly, the residue and dust accumulated on the test part 2 can be rubbed off by the rough surface of the cleaning sheet 126. So as to achieve the purpose of cleaning the test part 2. In one example, if the test part 2 accumulates a lot of dirt, the engineer can issue more repeated instructions to the test equipment. For example, the test part 2 that controls the test equipment clamps the cleaning sheet 126 several times to strengthen the cleaning test. Purpose of Part 2. It can be seen from the above that, in fact, the test equipment uses the cleaning fixture 1 to achieve the self-cleaning effect, for example, it can use the existing indicators. To achieve cleanliness, it is not that the cleaning jig 1 uses the cleaning sheet 126 to actively brush off the residue and dust on the test part 2.

此外,當清潔片126達到使用極限後(例如使用多次之後),也可以將第二鎖固件124鬆開,讓第一夾板120a與第二夾板120b稍微分離。此時,工程師便可以從第一夾板120a與第二夾板120b之間將使用過的清潔片126抽出,並更換成新的清潔片126。相對於將測試設備停機,並逐一將測試部2拆卸並清潔,本實施例有明顯的好處,即可以利用清潔治具1一次性地清潔更多數量的測試部2。另一方面,本實施例只要更換清潔片126便可以清潔下一個庫位中的測試部2,並且測試設備不需要因為清潔測試部2而停機,也意味著檢測效率可以大幅提高。 In addition, when the cleaning sheet 126 reaches the limit of use (for example, after multiple uses), the second locking member 124 can also be released, so that the first clamping plate 120a and the second clamping plate 120b are slightly separated. At this time, the engineer can withdraw the used cleaning sheet 126 from between the first splint 120a and the second splint 120b and replace it with a new one. Compared with shutting down the testing equipment and disassembling and cleaning the testing parts 2 one by one, this embodiment has obvious advantages, that is, a cleaning jig 1 can be used to clean a larger number of testing parts 2 at one time. On the other hand, in this embodiment, the test part 2 in the next storage location can be cleaned only by replacing the cleaning sheet 126, and the test equipment does not need to be shut down for cleaning the test part 2, which also means that the detection efficiency can be greatly improved.

綜上所述,本發明提供的清潔治具可以用於清潔測試設備,且測試設備的測試部可以自行夾緊清潔片並磨去髒汙,而不需要用人工逐個清洗測試部。藉此,本發明提供的清潔治具能夠批次地完成清潔測試設備中多個測試部的工作,減少了測試設備停機清潔的時間,從而提升了測試設備的檢測效率。 In summary, the cleaning jig provided by the present invention can be used to clean the test equipment, and the test part of the test equipment can clamp the cleaning sheet and grind away dirt by itself, without manually cleaning the test parts one by one. Thereby, the cleaning jig provided by the present invention can complete the work of cleaning multiple test parts in the test equipment in batches, which reduces the time for the test equipment to stop for cleaning, thereby improving the detection efficiency of the test equipment.

1:清潔治具 1: Clean fixture

10:框架 10: Frame

100:第一側 100: first side

102:第二側 102: second side

12:清潔單元 12: Cleaning unit

126:清潔片 126: cleaning sheet

L:框架長度 L: Frame length

W:框架寬度 W: frame width

H:框架高度 H: frame height

Claims (7)

一種清潔系統,包含:一測試設備,具有多個測試部,該些測試部用以測試多個電子元件;以及一清潔治具,包含:一框架,具有一第一側,該第一側位於該框架的一外緣;以及多個清潔單元,可拆卸地設置於該框架的一第一側,每一該清潔單元上具有一清潔片,且每一該清潔單元的該清潔片朝向該框架外;其中每一該清潔單元對應該些測試部其中之一,且每一該測試部同時接觸對應的該清潔片的一第一面與一第二面。 A cleaning system includes: a test device having a plurality of test parts, the test parts are used to test a plurality of electronic components; and a cleaning jig, including: a frame having a first side, the first side is located An outer edge of the frame; and a plurality of cleaning units are detachably arranged on a first side of the frame, each of the cleaning units has a cleaning sheet, and the cleaning sheet of each of the cleaning units faces the frame Outside; where each of the cleaning units corresponds to one of the test portions, and each of the test portions is in contact with a first surface and a second surface of the corresponding cleaning sheet at the same time. 如請求項1所述之清潔系統,其中每一該清潔單元上具有一第一鎖固件,該第一鎖固件可拆卸地固定該第一側。 The cleaning system according to claim 1, wherein each of the cleaning units has a first locking member, and the first locking member detachably fixes the first side. 如請求項2所述之清潔系統,其中每一該清潔單元上具有一第二鎖固件,該第二鎖固件可拆卸地固定該清潔片。 The cleaning system according to claim 2, wherein each of the cleaning units has a second locking member, and the second locking member detachably fixes the cleaning sheet. 如請求項3所述之清潔系統,其中該第一鎖固件的鎖固方向相異於該第二鎖固件的鎖固方向。 The cleaning system according to claim 3, wherein the locking direction of the first fastener is different from the locking direction of the second fastener. 如請求項1所述之清潔系統,其中該些電子元件容置於一載盤,該框架定義有一框架長度與一框架寬度,該框架長度等於該載盤的長度,該框架寬度等於該載盤的寬度。 The cleaning system according to claim 1, wherein the electronic components are accommodated in a carrier, the frame is defined with a frame length and a frame width, the frame length is equal to the length of the carrier, and the frame width is equal to the carrier The width. 如請求項5所述之清潔系統,其中該些清潔單元於該第一側的設置位置,對應該些電子元件於該載盤的放置位置。 The cleaning system according to claim 5, wherein the installation positions of the cleaning units on the first side correspond to the placement positions of the electronic components on the tray. 如請求項1所述之清潔系統,其中該清潔片的該第一面與該第二面為砂紙。 The cleaning system according to claim 1, wherein the first surface and the second surface of the cleaning sheet are sandpaper.
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