TWI749588B - Cleaning system - Google Patents
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- TWI749588B TWI749588B TW109119762A TW109119762A TWI749588B TW I749588 B TWI749588 B TW I749588B TW 109119762 A TW109119762 A TW 109119762A TW 109119762 A TW109119762 A TW 109119762A TW I749588 B TWI749588 B TW I749588B
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- 238000004140 cleaning Methods 0.000 title claims abstract description 142
- 238000012360 testing method Methods 0.000 claims abstract description 118
- 238000009434 installation Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 6
- 238000001514 detection method Methods 0.000 description 4
- 239000000428 dust Substances 0.000 description 3
- 238000012423 maintenance Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 206010000369 Accident Diseases 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004070 electrodeposition Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- RSMUVYRMZCOLBH-UHFFFAOYSA-N metsulfuron methyl Chemical compound COC(=O)C1=CC=CC=C1S(=O)(=O)NC(=O)NC1=NC(C)=NC(OC)=N1 RSMUVYRMZCOLBH-UHFFFAOYSA-N 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000004576 sand Substances 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- 239000000779 smoke Substances 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
- 238000009834 vaporization Methods 0.000 description 1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/10—Cleaning by methods involving the use of tools characterised by the type of cleaning tool
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- Cleaning In General (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
Description
本發明係關於一種清潔治具,特別是關於一種用來清潔測試設備的清潔治具。 The invention relates to a cleaning jig, in particular to a cleaning jig used to clean test equipment.
一般來說,各種電子設備在一段時間的使用後,都需要進行例行性的保養或清潔,以確保電子設備能夠繼續正常地運作。特別是,對於精密度要求較高的電子設備,例如各種測試設備,正確地進行保養或清潔也能減少量測數據時產生的誤差。以電池的檢測為例,測試設備需要先用測試部夾穩電池的電極,再經過測試部對電池充電與放電,以檢測電池是否正常工作。實務上,由於電池出廠時,電池的電極往往會包覆著氧化膜,測試部夾住電極的同時還必須負責刮除氧化膜。如此一來,在一段時間的使用後,測試部的表面可能會沾附少量刮除下來的氧化膜,或者說測試部的表面可能會有一些氧化膜的殘渣。 Generally speaking, after a period of use of various electronic devices, routine maintenance or cleaning is required to ensure that the electronic devices can continue to operate normally. In particular, for electronic equipment that requires high precision, such as various test equipment, correct maintenance or cleaning can also reduce errors in measurement data. Taking battery testing as an example, the testing equipment needs to first clamp the electrodes of the battery with the testing part, and then charge and discharge the battery through the testing part to detect whether the battery is working normally. In practice, since the electrodes of the battery are often covered with an oxide film when the battery leaves the factory, the test department must be responsible for scraping off the oxide film while clamping the electrode. As a result, after a period of use, a small amount of scraped oxide film may be attached to the surface of the test part, or there may be some oxide film residue on the surface of the test part.
可以理解的是,測試部表面上的氧化膜除了可能影響測試部對電池充電與放電的效率之外,也可能會干擾檢測的正確性。此外,因為測試部需要承載大電流,非預期的氧化膜殘渣還可能會導致起煙或起火的意外。實務上,定時清潔測試設備的測試部十分重要,然而清潔測試設備的測試部卻也十分麻煩。舉例來說,測試設備一般都需要批次地檢測大量的電池,假設每個電池的電極對應到一個測試部,可以想像測試設備將有數量龐大的測試部,而將測試設備的測試部逐一刷洗清潔必然十分耗時費力。據此,業界需要一種新的清潔治具,要能 夠快速地、批次地清潔測試設備的多個測試部,從而能夠減少測試設備的停機清潔時間,也能夠減少清潔測試設備的人力與物力。 It is understandable that the oxide film on the surface of the test part may not only affect the charging and discharging efficiency of the battery, but also may interfere with the accuracy of the test. In addition, because the test part needs to carry a large current, unexpected oxide film residue may also cause smoke or fire accidents. In practice, it is very important to clean the test department of the test equipment regularly, but it is also very troublesome to clean the test department of the test equipment. For example, test equipment generally needs to test a large number of batteries in batches. Assuming that the electrode of each battery corresponds to a test part, it can be imagined that the test equipment will have a large number of test parts, and the test parts of the test equipment will be scrubbed one by one. Cleaning must be very time-consuming and laborious. According to this, the industry needs a new kind of cleaning fixture that can The multiple test parts of the test equipment can be cleaned quickly and in batches, thereby reducing the downtime and cleaning time of the test equipment, and also reducing the manpower and material resources for cleaning the test equipment.
本發明提供一種清潔治具,可以在測試設備不停機的情況下,快速且大量的清潔測試設備的多個測試部,從而可以提升測試設備的檢測效率。 The invention provides a cleaning jig, which can quickly and massively clean a plurality of test parts of the test equipment without stopping the test equipment, thereby improving the detection efficiency of the test equipment.
本發明提出一種清潔治具,用以清潔測試設備中的多個測試部,所述清潔治具包含框架以及多個清潔單元。所述框架具有第一側,第一側位於框架的外緣。所述多個清潔單元可拆卸地設置於框架的第一側,每一個清潔單元上具有清潔片,且每一個清潔單元的清潔片朝向框架外。其中,每一個清潔單元對應所述多個測試部其中之一,且每一個測試部同時接觸對應的清潔片的第一面與第二面。 The present invention provides a cleaning jig for cleaning a plurality of test parts in a testing device. The cleaning jig includes a frame and a plurality of cleaning units. The frame has a first side, and the first side is located at the outer edge of the frame. The plurality of cleaning units are detachably arranged on the first side of the frame, each cleaning unit has a cleaning sheet, and the cleaning sheet of each cleaning unit faces out of the frame. Wherein, each cleaning unit corresponds to one of the multiple test portions, and each test portion contacts the first surface and the second surface of the corresponding cleaning sheet at the same time.
於一些實施例中,每一個清潔單元上可以具有第一鎖固件,第一鎖固件可拆卸地固定第一側。此外,每一個清潔單元上可以具有第二鎖固件,第二鎖固件可拆卸地固定清潔片。另外,第一鎖固件的鎖固方向可以相異於第二鎖固件的鎖固方向。以及,清潔片的第一面與第二面可以為砂紙。 In some embodiments, each cleaning unit may have a first locking member, and the first locking member detachably fixes the first side. In addition, each cleaning unit may have a second locking member, and the second locking member detachably fixes the cleaning sheet. In addition, the locking direction of the first fastener may be different from the locking direction of the second fastener. And, the first side and the second side of the cleaning sheet may be sandpaper.
於一些實施例中,測試設備的所述多個測試部用以載盤上的多個電子元件,框架定義有框架長度與框架寬度,框架長度可以等於載盤的長度,框架寬度可以等於載盤的寬度。此外,所述多個清潔單元於第一側的設置位置,可以對應所述多個電子元件於載盤的放置位置。 In some embodiments, the plurality of test parts of the test equipment are used to carry a plurality of electronic components on the disc, and the frame is defined with a frame length and a frame width. The frame length may be equal to the length of the carrier disc, and the frame width may be equal to the carrier disc. The width. In addition, the placement positions of the plurality of cleaning units on the first side may correspond to the placement positions of the plurality of electronic components on the tray.
綜上所述,本發明提供的清潔治具可以用於清潔測試設備,且測試設備的測試部可以自行夾緊清潔片並磨去髒汙,而不需要用人工逐個清洗測 試部。藉此,本發明提供的清潔治具能夠批次地完成清潔測試設備中多個測試部的工作,減少了測試設備停機清潔的時間,從而提升了測試設備的檢測效率。 In summary, the cleaning jig provided by the present invention can be used to clean the test equipment, and the test part of the test equipment can clamp the cleaning sheet and grind away the dirt by itself, instead of manually cleaning the test equipment one by one. Test department. Thereby, the cleaning jig provided by the present invention can complete the work of cleaning multiple test parts in the test equipment in batches, which reduces the time for the test equipment to stop for cleaning, thereby improving the detection efficiency of the test equipment.
1:清潔治具 1: Clean fixture
10:框架 10: Frame
100:第一側 100: first side
102:第二側 102: second side
12:清潔單元 12: Cleaning unit
120:本體 120: body
120a:第一夾板 120a: first splint
120b:第二夾板 120b: second splint
122:第一鎖固件 122: The first lock firmware
124:第二鎖固件 124: The second lock firmware
126:清潔片 126: cleaning sheet
2:測試部 2: Testing Department
L:框架長度 L: Frame length
W:框架寬度 W: frame width
H:框架高度 H: frame height
圖1係繪示依據本發明一實施例之清潔治具的立體示意圖。 FIG. 1 is a three-dimensional schematic diagram of a cleaning jig according to an embodiment of the present invention.
圖2係繪示依據本發明一實施例之清潔單元的立體示意圖。 FIG. 2 is a three-dimensional schematic diagram of a cleaning unit according to an embodiment of the present invention.
圖3係繪示依據本發明一實施例之清潔單元的側視圖。 Fig. 3 is a side view of a cleaning unit according to an embodiment of the present invention.
下文將進一步揭露本發明之特徵、目的及功能。然而,以下所述者,僅為本發明之實施例,當不能以之限制本發明之範圍,即但凡依本發明申請專利範圍所作之均等變化及修飾,仍將不失為本發明之要意所在,亦不脫離本發明之精神和範圍,故應將視為本發明的進一步實施態樣。 The features, objectives and functions of the present invention will be further disclosed below. However, the following are only examples of the present invention, and should not be used to limit the scope of the present invention, that is, all equivalent changes and modifications made in accordance with the scope of the patent application of the present invention will still be the essence of the present invention. Without departing from the spirit and scope of the present invention, it should be regarded as a further implementation aspect of the present invention.
請一併參閱圖1與圖2,圖1係繪示依據本發明一實施例之清潔治具的立體示意圖,圖2係繪示依據本發明一實施例之清潔單元的立體示意圖。如圖所示,清潔治具1包含框架10以及多個清潔單元12,多個清潔單元12可以排列於框架10的兩側,並且每個清潔單元中的清潔片126會朝向框架10外。於一個例子中,框架10的兩側可以分別定義為第一側100與第二側102,且多個清潔單元12可以分別成兩個群組,一個群組的清潔單元12設置於第一側100,而另一個群組的清潔單元12設置於第二側102。如圖1所示,設置於第一側100的多個清潔單元12會排列成一排,並且每個清潔單元中的清潔片126大致朝向同一個角度,例如垂直地朝向框架10外。
Please refer to FIGS. 1 and 2 together. FIG. 1 is a three-dimensional schematic diagram of a cleaning jig according to an embodiment of the present invention, and FIG. 2 is a three-dimensional schematic diagram of a cleaning unit according to an embodiment of the present invention. As shown in the figure, the
此外,清潔治具1的功能是用來清潔測試設備,特別是清潔治具1可以用來清潔測試設備中的測試部(未示於圖1)。實務上,測試設備於正常操作
或使用時(例如於測試中),測試設備的測試部可以用來測試電子元件(圖未示)。於一個例子中,電子元件可以是一種電池,而測試設備是一種用來檢測電池是否正常工作的設備。於所屬技術領域具有通常知識者可以理解,在測試電池的過程中,測試部需要穩固地電性連接電池的電極,才能對電池進行充放電測試或者量測電池內部的電壓。假設電子元件是一種軟包電池,由於軟包電池的電極成片狀且具有一定的可撓程度,從而測試部則必須夾緊電極以防脫落導致意外。當然,本實施例並不限制電子元件一定要是軟包電池,也不限制電極成片狀,只要測試設備的測試部是用夾緊電極的方式電性連接電子元件的電極,都應屬於本實施例描述電子元件的範疇。
In addition, the function of the
為了批次地測試電子元件,多個電子元件可以先放置在載盤(圖未示)上,再將整個載盤放入測試設備中的庫位,讓多個電子元件可以一起進行測試。相對地,測試設備會具有多個測試部,讓每一個測試部都能夠電性連接到其中一個電子元件的電極。本實施例在此不限制電子元件電極的位置,例如多個電子元件可以排列於載盤的兩側,並且每一個電子元件的電極可以垂直地朝向載盤外。實務上,多個電子元件在載盤中的擺放方式可以類似本實施例圖1示範的清潔治具1,例如載盤可以對比成清潔治具1的框架10,電子元件可以對比成清潔治具1的清潔單元12,而電子元件的電極可以對比成清潔單元12的清潔片126。此時,清潔治具1雖然不具備實際上的電子元件(例如待測的電池),但外觀上可以模擬多個電子元件放置在載盤的情況。
In order to test electronic components in batches, multiple electronic components can be placed on a carrier disk (not shown), and then the entire carrier disk is placed in a storage location in the test equipment, so that multiple electronic components can be tested together. In contrast, the test equipment will have multiple test parts, so that each test part can be electrically connected to the electrode of one of the electronic components. This embodiment does not limit the position of the electrode of the electronic component. For example, a plurality of electronic components can be arranged on both sides of the carrier, and the electrode of each electronic component can be perpendicular to the outside of the carrier. In practice, the placement of multiple electronic components in the tray can be similar to the
為了讓清潔治具1也可以放入測試設備中的庫位,框架10可以定義有框架長度L與框架寬度W,且框架長度L與框架寬度W都要小於載盤的長度與寬度。當然,為了更好地模擬多個電子元件放置在載盤的情況,框架長度L還可
以恰好等於所述載盤的長度,且框架寬度W同樣可以恰好等於所述載盤的寬度。此外,框架10的高度也可以被定義為框架高度H,框架高度H應當要小於載盤的高度。於一個例子中,框架高度H也可以恰好等於載盤的高度,從而當框架長度L、框架寬度W與框架高度H和載盤的長度、寬度與高度都相同的情況下,框架10在外觀上的體積也應大致上等於載盤的體積。
In order to allow the
本實施例接下來說明清潔單元的結構,並大致示範利用清潔單元清潔測試部的方式。請一併參閱圖2與圖3,圖2係繪示依據本發明一實施例之清潔單元的立體示意圖,圖3係繪示依據本發明一實施例之清潔單元與測試部的立體示意圖。如圖所示,圖2繪示了清潔治具1的清潔單元12,清潔單元12具有一個本體120,本體120上設第一鎖固件122、第二鎖固件124以及清潔片126。第一鎖固件122可以用來鎖固於清潔治具1的框架10,例如鎖固在框架10的第一側100。實務上,當第一鎖固件122鎖緊時,框架10和清潔單元12不會相對運動或轉動,從而能讓清潔片126保持穩定。當第一鎖固件122鬆開時,清潔單元12可以從框架10上拆卸下來,從而便於進行清潔單元12的保養或更換。
In this embodiment, the structure of the cleaning unit is described next, and the method of cleaning the test part by the cleaning unit is roughly demonstrated. Please refer to FIGS. 2 and 3 together. FIG. 2 is a three-dimensional schematic diagram of a cleaning unit according to an embodiment of the present invention, and FIG. 3 is a three-dimensional schematic diagram of a cleaning unit and a testing part according to an embodiment of the present invention. As shown in the figure, FIG. 2 shows the
由圖2可以看出,本體120係由兩個相似的板狀結構組成,在此定義為第一夾板120a與第二夾板120b,且第一夾板120a與第二夾板120b係利用第二鎖固件124鎖緊。並且,圖2繪示的例子中,第一鎖固件122和第二鎖固件124的鎖固方向不同,例如第一鎖固件122和第二鎖固件124的鎖固方向可以是互相垂直的。於一個例子中,清潔片126的一端可以被第一夾板120a與第二夾板120b夾著,而讓清潔片126的另一端露出,並且可以用來清潔測試部2。實務上,清潔片126是一個雙面的片狀元件,而清潔片126的兩面(第一面與第二面)可以都具有砂紙般粗糙的表面。於一個例子中,清潔片126也有可能是一片對折後的砂紙,而砂
紙光滑的表面被折在內側,而砂紙粗糙的表面被折在外側。也就是說,清潔片126的第一面與第二面可以都是砂紙粗糙的表面。值得一提的是,本實施例並不限制一個清潔片126能同時被多少個測試部2夾住,雖然圖3繪示了兩個測試部2同時夾著一個清潔片126,但清潔片126也有可能只對應一個測試部2。
It can be seen from Figure 2 that the
以實際的例子來說,測試設備在檢測完電子元件時,測試部2不僅要夾住電子元件的電極,還會在抵壓電極表面時稍微移動,藉以刮除電極表面上的氣化膜。一段時間之後,測試部2上難免會黏著氣化膜的殘渣或者沾附一些灰塵,從而必須定期清潔測試部2。於一個例子中,測試設備在檢測完電子元件後,可以將裝有電子元件的載盤從庫位中抽出,並將清潔治具1放入庫位中。由於清潔片126的位置和電子元件的電極位置相同,工程師可以下達相同的指令給測試設備,例如控制測試設備的測試部2夾著電子元件的電極。當然,本實施例並不限制測試設備收到的指令,例如工程師也有可能下達專用於自我清潔的指令給測試設備。
Taking a practical example, when the testing device finishes testing the electronic component, the
承接上述,由於電子元件的電極已經被替換成了清潔片126,測試設備的測試部2在原本預計夾到電子元件的電極的位置上,會改成夾到清潔片126。於所屬技術領域具有通常知識者可以理解,因為測試部2同樣有抵壓清潔片126並稍微移動的動作,原本積累測試部2上的殘渣與灰塵便可以被清潔片126的粗糙表面磨去,從而達到清潔測試部2的目的。於一個例子中,如果測試部2積累的髒污較多,工程師可以多下達幾次重複的指令給測試設備,例如控制測試設備的測試部2多夾幾次清潔片126,以達到加強清潔測試部2的目的。由上述可知,實際上測試設備是利用清潔治具1達到自我清潔的效果,例如可以利用既有的指
令達到清潔,而並非是清潔治具1利用清潔片126主動去刷除測試部2上的殘渣與灰塵。
Following the above, since the electrode of the electronic component has been replaced with the
此外,當清潔片126達到使用極限後(例如使用多次之後),也可以將第二鎖固件124鬆開,讓第一夾板120a與第二夾板120b稍微分離。此時,工程師便可以從第一夾板120a與第二夾板120b之間將使用過的清潔片126抽出,並更換成新的清潔片126。相對於將測試設備停機,並逐一將測試部2拆卸並清潔,本實施例有明顯的好處,即可以利用清潔治具1一次性地清潔更多數量的測試部2。另一方面,本實施例只要更換清潔片126便可以清潔下一個庫位中的測試部2,並且測試設備不需要因為清潔測試部2而停機,也意味著檢測效率可以大幅提高。
In addition, when the
綜上所述,本發明提供的清潔治具可以用於清潔測試設備,且測試設備的測試部可以自行夾緊清潔片並磨去髒汙,而不需要用人工逐個清洗測試部。藉此,本發明提供的清潔治具能夠批次地完成清潔測試設備中多個測試部的工作,減少了測試設備停機清潔的時間,從而提升了測試設備的檢測效率。 In summary, the cleaning jig provided by the present invention can be used to clean the test equipment, and the test part of the test equipment can clamp the cleaning sheet and grind away dirt by itself, without manually cleaning the test parts one by one. Thereby, the cleaning jig provided by the present invention can complete the work of cleaning multiple test parts in the test equipment in batches, which reduces the time for the test equipment to stop for cleaning, thereby improving the detection efficiency of the test equipment.
1:清潔治具 1: Clean fixture
10:框架 10: Frame
100:第一側 100: first side
102:第二側 102: second side
12:清潔單元 12: Cleaning unit
126:清潔片 126: cleaning sheet
L:框架長度 L: Frame length
W:框架寬度 W: frame width
H:框架高度 H: frame height
Claims (7)
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TW109119762A TWI749588B (en) | 2020-06-12 | 2020-06-12 | Cleaning system |
EP21178866.6A EP3922366B1 (en) | 2020-06-12 | 2021-06-10 | Cleaning jig |
JP2021097716A JP7274525B2 (en) | 2020-06-12 | 2021-06-11 | Cleaning jig |
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TWM546863U (en) * | 2017-04-21 | 2017-08-11 | ye-qing Zhang | Cement hole brush and cleaning component thereof |
CN210098330U (en) * | 2019-05-20 | 2020-02-21 | 河南久之盛智能科技有限公司 | Electronic component surface cleaning device |
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JP2004031358A (en) | 2003-07-25 | 2004-01-29 | Renesas Technology Corp | Manufacturing method of semiconductor device and foreign matter removing sheet |
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KR101527200B1 (en) * | 2012-08-28 | 2015-06-09 | (주)에이티테크놀러지 | Apparatus for cleaning test jig for testing electrical condition of electronic component and apparatus for testing electronic component having the same |
JP6244738B2 (en) | 2013-08-19 | 2017-12-13 | 株式会社富士通テレコムネットワークス福島 | Automatic cleaning unit and charge / discharge test system |
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TWI668460B (en) | 2018-06-12 | 2019-08-11 | 致茂電子股份有限公司 | Clipped testing device |
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TWM546863U (en) * | 2017-04-21 | 2017-08-11 | ye-qing Zhang | Cement hole brush and cleaning component thereof |
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JP7274525B2 (en) | 2023-05-16 |
EP3922366A1 (en) | 2021-12-15 |
EP3922366B1 (en) | 2023-07-26 |
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TW202146124A (en) | 2021-12-16 |
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