TWI714138B - Clip-formed testing device and conducting module - Google Patents

Abstract

The invention discloses a clip-formed testing device and a conducting module. The conducting module comprises a body and a first conducting unit. The body has a first positioning socket. The first conducting unit, detachably installed in the first positioning socket, comprises a plurality of first conducting parts and a first connecting part. The plurality of first conducting parts extend from the first connecting part. Wherein the plurality of first conducting parts are arranged in comb-shaped, and an end, away from the first connecting part, of each first conducting part bends toward the body.

Description

Clip-on test device and conductive module

The invention relates to a clip-type testing device and a conductive module, and more particularly to a clip-type testing device and a conductive module with comb-shaped conductive units.

With the development of electric vehicles, it provides people with the option of long-distance travel using pure electric energy without using fossil fuels. In order to increase the driving distance of electric vehicles, more and higher-capacity batteries are often required. However, how to ensure that these batteries are stable, safe and reliable has become an important issue and highlights the importance of testing battery quality.

At present, when testing the battery quality, it is possible to perform charging and discharging tests for the battery, so that the voltage and current characteristics of the battery can be accurately measured, which is an important key to evaluating the battery quality. However, when the battery is manufactured, in order to avoid oxidation or damage to the electrode, a protective film will be covered on the electrode surface. If the protective film cannot be effectively scraped off, the test connector cannot be directly contacted with the battery electrode, resulting in the inability to accurately measure the battery. Voltage and current characteristics. In practice, it is not easy to remove the protective film and may damage the electrode. For example, it is possible that excessive force or deviation of the angle of force may leave too deep scratches on the electrode, which will make the electrode a defective product.

In addition, the test fixture may use various shapes of conductive members to contact the electrodes of the battery, and the conductive members are usually fixedly arranged on the surface of the fixture. However, if a certain conductive element is damaged, because the conductive element cannot be disassembled, it is inevitable to replace the entire fixture directly, which obviously causes unnecessary waste. Therefore, the industry needs a testing device that can scrape off the protective film and protect the electrodes when testing batteries, so as to more quickly and accurately measure the voltage and current characteristics of the battery. In addition, the test device should be able to replace the conductive parts therein to reduce maintenance costs.

The present invention provides a clamp-type test device, which can directly detect the voltage and current characteristics of the battery in addition to scraping off the protective film with a conductive unit when clamping an object to be tested. In addition, the clip-on test device can replace the conductive unit therein to reduce maintenance costs.

The present invention provides a clamp-type testing device, which includes a first clamp and a second clamp. The first clamping member defines a first surface, a first end and a second end. The first clamping member has a conductive module. The conductive module is arranged on the first surface. The conductive module includes a base and a first conductive unit. The base has a first positioning slot, and the first conductive unit is pluggably accommodated in the first positioning slot. The first conductive unit includes a plurality of first conductive members and first connecting members arranged in parallel, each first conductive member is connected to the first connecting member, and each first conductive member has a first conductive member extending from the first connecting member A cantilever and the first bending part. The second clamping piece is defined with a third end and a fourth end, the fourth end is connected to the second end, the third end is separated from the first end by a first distance, and the first surface of the first clamping piece faces the second clamp Holder. The first bending portion is connected to the first cantilever, the first cantilever is exposed in the first positioning groove, and the first bending portion is bent toward the first surface at a first angle.

In some embodiments, the base body may further have a second positioning groove, and the conductive module further includes a second conductive unit, which is pluggably received in the second positioning groove. Here, the second conductive unit may include a plurality of second conductive members and second connecting members arranged in parallel, each second conductive member is connected to the second connecting member, and the second connecting member is parallel to the first connecting member. In addition, each of the second conductive members may have a second cantilever extending from the second connecting member and a second bending portion, the second bending portion is connected to the second cantilever, and the second cantilever is exposed in the second positioning groove, and The second bending portion is bent toward the first surface at a first angle. In addition, the first cantilever of each first conductive member may face the second positioning groove, and the second cantilever of each second conductive member may face the first positioning groove.

In some embodiments, the plurality of first conductive members may be connected to the first connecting member separately from each other, and there is a second distance between adjacent first conductive members. Here, the plurality of first conductive members and the first connecting member may be integrally formed, and the conductive module may be detachably locked on the first surface. In addition, the clip-on test device may further include a conductive bottom plate to connect the first conductive unit and the second conductive unit respectively. Here, the conductive bottom plate, the plurality of first conductive members, the first connecting member, the plurality of second conductive members and the second connecting member may be integrally formed.

The invention provides a conductive module with a detachable first conductive unit, and the first conductive unit with a comb-shaped first conductive member can be used to scrape the protective film of the electrode and can reduce the scratches on the electrode.

The present invention provides a conductive module including a base and a first conductive unit. The base has a first positioning groove. The first conductive unit is pluggably accommodated in the first positioning slot, the first conductive unit includes a plurality of first conductive members and a first connecting member, and the plurality of first conductive members extend from the first connecting member . The plurality of first conductive members are arranged in a comb shape, and an end of each first conductive member away from the first connecting member is bent toward the base.

In some embodiments, the seat body may further have a second positioning groove, and the second positioning groove is parallel to the first positioning groove. The conductive module may further include a second conductive unit, the second conductive unit is pluggably received in the second positioning groove, and the second conductive unit may include a plurality of second conductive members and second connecting members. A second conductive member extends from the second connecting member. In addition, the plurality of second conductive members may be arranged in a comb shape, and an end of each second conductive member away from the second connecting member is bent toward the base. In addition, each first conductive member may also be bent toward the second conductive unit, and each second conductive member may also be bent toward the first conductive unit. In addition, the conductive module may also include a conductive bottom plate, the conductive bottom plate is respectively connected to the first conductive unit and the second conductive unit, and the conductive bottom plate, the first conductive unit and the second conductive unit are integrally formed.

In summary, the clip-on test device provided by the present invention can directly use the comb-shaped conductive member in the conductive module to scrape off the protective film layer on the electrode when clamping the electrode, so that no additional step of tearing off the protective film layer is required . In addition, different from the traditional conductive elements that are separated from each other, this embodiment connects multiple conductive elements in the conductive module to the same connector, so that the conductive elements can be quickly replaced in batches, and maintenance can be reduced. time.

The features, objectives and functions of the present invention will be further disclosed below. However, the following are only examples of the present invention, and should not be used to limit the scope of the present invention, that is, all equivalent changes and modifications made in accordance with the scope of the patent application of the present invention will still be the essence of the present invention. Without departing from the spirit and scope of the present invention, it should be regarded as a further embodiment of the present invention.

Please refer to FIG. 1. FIG. 1 is a three-dimensional schematic diagram of a clip-on testing device according to an embodiment of the present invention. As shown in FIG. 1, the clamp-type testing device 1 has a first clamp 10 and a second clamp 12, one end 10a (first end) of the first clamp 10 and one end 12a of the second clamp 12 (The third end) is separated, but there may be a certain distance (first distance). At this time, the other end 10b (second end) of the first clamping member 10 and the other end 12b (fourth end) of the second clamping member 12 are joined together to form a clip-shaped structure. In practice, the outer sides (for example, upper and lower sides) of the first clamping member 10 and the second clamping member 12 may be provided with stoppers, and the stoppers may abut the first clamping member 10 and the second clamping member from the outside. Piece 12.

For example, the stopper can move back and forth in one direction. Since the first clamping member 10 is not parallel to the direction of movement of the stopper, when the stopper is subjected to an external force, it moves from the other end 10b to the one end 10a. At this time, the first clamping member 10 can be driven to squeeze the second clamping member 12. In the same way, the second clamping member 12 is also not parallel to the moving direction of the stopper. Therefore, when the stopper is moved by the external force from the other end 12b to the one end 12a, the second clamping member 12 can be driven toward the first end. The clamp 10 is squeezed. Therefore, the first clamping member 10 and the second clamping member 12 can be pushed closer to each other to clamp the object. When the block is removed, the first clamping member 10 and the second clamping member 10 The piece 12 can be returned to the original position. This embodiment does not limit what kind of objects the clamp-type testing device 1 is used to clamp, as long as the object needs to be electrically tested, the object belongs to the category that the clamp-type testing device 1 is suitable for clamping.

In one example, the first clamping member 10 and the second clamping member 12 can clamp electrodes in sheet, plate, cylindrical or other shapes. In appearance, the one end 10a of the first clamping member 10 and the one end 12a of the second clamping member 12 may be separated by a predetermined distance (first distance) before being clamped. When the stopper moves from the outside to the clamping position, the end 10a of the first clamping member 10 and the end 12a of the second clamping member 12 can be designed to be as close as possible or slightly smaller than the thickness of the electrode, namely It has the effect of stably clamping the electrode. This embodiment also does not limit the appearance and shape of the first clamping member 10 and the second clamping member 12. For example, the first clamping member 10 and the second clamping member 12 shown in FIG. 1 can be used to clamp the object under test. For the sheet-shaped or plate-shaped parts, the appearance structure of the first clamping member 10 and the second clamping member 12 can also be adjusted, so as to be more suitable for clamping objects of other shapes. For example, the object to be tested may be an electrode of a battery, which is not limited in this implementation.

In addition, the clip-type testing device 1 has a conductive module 14, which is disposed on the first surface 10c of the first clamping member 10, that is, the conductive module 14 can protrude from the first surface 10c of the first clamping member 10. Surface 10c. Here, the first surface 10c of the first clamping member 10 is defined as the surface facing the second clamping member 12, that is to say, the conductive module 14 can be installed on the first clamping member 10 and the second clamping member 10. Between pieces of 12. In one example, the conductive module 14 is disposed at one end 10a close to the first clamping member 10. In order to stably dispose the conductive module 14, several screws can be used to lock the conductive module 14 on the first clamping member 10.的第一surface 10c. Of course, there are many ways to stably dispose the conductive module 14 on the first surface 10c of the first clamping member 10, for example, snapping, adsorption or bonding can be used, which is not limited in this embodiment.

In a practical example, the object to be tested can be a battery, and the clip-on test device 1 can be connected to an external power supply (not shown), and the battery to be tested can be charged through the power supply. In practice, the power supply can feed current from the other end 10b of the first clamping member 10, and the fed current can pass through the first clamping member 10 and the conductive module 14 to the battery electrode, thereby charging the battery under test . In addition, the clamp-type testing device 1 may further have a voltage detecting element 16, and another conductive module 160 may be provided on the voltage detecting element 16 to detect voltage changes in the battery to prevent battery overcharging or other The voltage is abnormal due to the cause. In one example, the first clamping member 10 and the voltage detecting member 16 are not electrically connected together, which can avoid that when the power supply feeds current from the first clamping member 10, the fed current interferes with the voltage detection The test piece 16 detects the voltage change in the battery.

In practice, the conductive module 160 can be similar in structure and function to the conductive module 14, but the function of the voltage detecting element 16 is to measure the voltage of the object under test. The size of the conductive module 160 provided on the voltage detecting element 16 is The upper surface may be smaller than the conductive module 14 provided on the first clamping member 10. Different from the first clamping member 10 which may need to carry a larger current, the area of the first clamping member 10 may be larger than the voltage detecting member 16 to reduce the resistance in the first clamping member 10 and facilitate heat dissipation.

In order to describe the structure and function of the conductive module 14 in detail, please refer to FIGS. 1 and 2 together. FIG. 2 is a three-dimensional schematic diagram of the conductive module according to an embodiment of the present invention. As shown in the figure, the conductive module 14 may have a base 140, a first conductive unit 142 and a second conductive unit 144, and the first conductive unit 142 and the second conductive unit 144 may be respectively disposed in the first positioning groove of the base 140 1400 and the second positioning groove 1402. In an example, the base 140 may be assembled from multiple components, so that the first positioning groove 1400 and the second positioning groove 1402 may be a gap between the components. Of course, this embodiment does not limit the shape and structure of the first positioning groove 1400 and the second positioning groove 1402, as long as the first conductive unit 142 and the second conductive unit 144 are pluggably disposed in the base 140.

It can be seen from the figure that the conductive module 14 is located between the first clamping member 10 and the second clamping member 12. When the object to be tested is tested, the first conductive unit 142 and the second conductive unit 144 of the conductive module 14 meet Touch the object to be tested, and it will squeeze the surface of the object to be tested. At this time, the first conductive unit 142 and the second conductive unit 144 of the conductive module 14 can cause slight scratches on the surface of the object to be tested, for example, the film can be scraped off. For example, when the electrode of the battery is firmly clamped by the clamp-type testing device 1, the first conductive unit 142 and the second conductive unit 144 in the conductive module 14 can contact the electrode of the battery at the same time, dispersing the stress when contacting the electrode , To avoid excessive force when scraping off the protective film. In addition, the first conductive unit 142 and the second conductive unit 144 can have elasticity. When the clamp-type testing device 1 clamps the electrode of the battery, the first conductive unit 142 and the second conductive unit 144 can be slightly deformed and can also be dispersed. The stress when touching the electrode. Here, the deformation should not damage the structure of the first conductive unit 142 and the second conductive unit 144, so that the first conductive unit 142 and the second conductive unit 144 can be used repeatedly.

It is worth mentioning that although the first conductive unit 142 and the second conductive unit 144 are shown in FIG. 2, in practice, the first conductive unit 142 and the second conductive unit 144 may have a symmetrical structure, and a second conductive unit is not necessarily required. Conductive unit 144. In other words, even if only the first conductive unit 142 can realize the function of the conductive module 14, the first conductive unit 142 is used for description in this embodiment below.

In order to explain the structure of the first conductive unit 142 in the conductive module 14 more clearly, please refer to FIGS. 3 and 4 together. FIG. 3 is a perspective view of the first conductive unit according to an embodiment of the present invention. Series 4 shows a side view of the first conductive unit according to an embodiment of the invention. As shown in the figure, the first conductive unit 142 includes a plurality of first conductive members 1420 and first connecting members 1422 arranged regularly, and each first conductive member 1420 is connected to the first connecting member 1422. In practice, the plurality of first conductive elements 1420 can be arranged parallel to each other at equal intervals, and the first connecting element 1422 can have one or more locking holes 1422a for locking the first conductive unit 142 to the base body 140 in the first positioning slot 1400. This embodiment only demonstrates a method of disposing the first conductive unit 142 in the first positioning groove 1400, and does not limit the number and size of the locking holes 1422a. Of course, in practice, means such as snapping, adsorption or bonding can also be used, which will not be repeated in this embodiment.

As can be seen from the figure, since the plurality of first conductive members 1420 are arranged in parallel and regularly (for example, at equal intervals), and one end 1420a of each first conductive member 1420 extends from the first connecting member 1422, the appearance can be Ratio is a comb-like structure. This embodiment does not limit the separation distance (the second distance) between adjacent first conductive members 1420, but since the first conductive members 1420 need to carry current, the distance between adjacent first conductive members 1420 is designed When the separation distance, it should be able to meet the safety regulations under the rated current of the first conductive member 1420. In addition, since one end 1420a of the first conductive member 1420 is connected to the first connecting member 1422, and the other end 1420b is suspended, the first conductive member 1420 should have certain flexibility. In this embodiment, for the convenience of description, the first conductive member 1420 is divided into a first cantilever 1424 and a first bending portion 1426. In practice, the first cantilever 1424 and the first bending portion 1426 are both a part of the first conductive member 1420, and there is not necessarily a clear dividing line in structure.

In an example, the first bending portion 1426 may be defined as a bending portion adjacent to one end 1420 b of the first conductive member 1420. When the first conductive unit 142 is installed on the base 140, the first bending portion 1426 can bend one end 1420 b of the first conductive member 1420 toward the base 140. The first cantilever 1424 can be defined as a structure from the first bent portion 1426 to the end 1420 a of the first conductive member 1420. It is worth mentioning that in addition to the first bending portion 1426, the first conductive member 1420 may also have other bending structures, but the present embodiment does not particularly limit the position or number of the bending positions, for example, as shown in FIG. 4 The first cantilever 1424 may be bent in some or several places. In practice, increasing the bent portion of the first cantilever 1424 may increase the overall elasticity of the first conductive member 1420, and may also prevent the first conductive member 1420 from being damaged by extrusion. This embodiment does not limit the bending angle of the first cantilever 1424 here, and those with ordinary knowledge in the art can adjust it by themselves.

Continuing the above, the first cantilever 1424 of each first conductive member 1420 can be seen as extending from the first connecting member 1422 and bends toward the base 140 at a position close to the end of the first conductive member 1420 (that is, as defined above The first bending part 1426). In other words, the end of each first conductive element 1420 in the first conductive unit 142 is not facing the outside, but facing the base 140. Referring to FIG. 2, the first bending portion 1426 of the first conductive member 1420 should be the structure most protruding from the base 140, so that the first bending portion 1426 should also be the first bending portion 1426 when clamping the object to be tested. Touch the surface of the object to be tested. In one example, since the first bending portion 1426 is the structure most protruding from the base 140, and the first bending portion 1426 is used to contact and rub the object under test with the surface, the end of the first conductive member 1420 is not used. The sharper edge scratches the object under test, so it can avoid leaving deep scratches on the object under test.

Similarly, the second conductive unit 144 may also have a plurality of second conductive members (not shown) and second connecting members (not shown), and the plurality of second conductive members may also be arranged at equal intervals to form a comb. shape. In addition, one end of each second conductive member may also extend from the second connecting member, and the second conductive member may be divided into a second cantilever (not shown) and a second bent portion (not shown). As mentioned above, because the first conductive unit 142 and the second conductive unit 144 can have a symmetrical structure, the difference is that the first cantilever 1424 of the first conductive unit 142 is bent toward the second conductive unit 144, and the second conductive unit The second cantilever of 144 faces the first conductive unit 142. Therefore, the structure of the second conductive unit 144 is not specifically described in this embodiment.

Please continue to refer to FIG. 2, FIG. 3, and FIG. 4. In detail, the first cantilever 1424 can be seen as extending from the inside of the first positioning slot 1400 of the base 140 and bends toward the second conductive unit 144. A bending portion 1426 also bends in toward the base 140. It can be seen from the figure that the first cantilever 1424 protrudes from the seat body 140, but is not perpendicular to the upper surface 140a of the seat body 140, but has an angle with the upper surface 140a of the seat body 140. The angle may be an acute angle (0 Between degrees and 90 degrees), such as 15 degrees, 30 degrees, 45 degrees, 60 degrees, or 75 degrees. On the contrary, the second conductive unit 144 can also have the same angle with the upper surface 140a, so that the first conductive unit 142 and the second conductive unit 144 can have a symmetrical structure in appearance.

In addition, the first bending portion 1426 is bent toward the first surface 10c at a fixed angle θ1 (first angle). In practice, since the base 140 is substantially a rectangular entity, the upper surface 140a is substantially parallel to the first surface 10c. Therefore, the first bending portion 1426 can also be regarded as being bent toward the upper surface 140a at an angle θ1. Of course, this embodiment does not limit the shape and appearance of the seat body 140. For example, the upper surface 140a may not be flat, or the upper surface 140a may not be parallel to the first surface 10c. In an example, the angle θ1 can be a right angle (approximately 90 degrees) or an obtuse angle (between 90 degrees and 180 degrees), such as 105 degrees, 120 degrees, 135 degrees, 150 degrees, or 165 degrees, which is not included in this embodiment. limit. If the angle θ1 is an acute angle, it may leave a deep scratch on the object to be tested, but in practice, the angle θ1 can be determined based on the surface hardness and film thickness of the object to be tested. In other words, the angle θ1 in this embodiment may also be an acute angle, and the angle θ1 is not limited to a right angle or an obtuse angle. In addition, the first bending portion 1426 may be bent toward the upper surface 140a, but preferably, one end 1420b of the first conductive member 1420 does not abut on the upper surface 140a, so that the first conductive member 1420 (or the first The cantilever 1424) can retain better elasticity.

In one example, the first conductive unit 142 may be integrally formed, and a material with high conductive efficiency, such as a copper material, may be used. For example, the copper plate may be cut into a plurality of first conductive members 1420 and the first connecting member 1422 in a planar shape, and then the copper plate may be bent to form the first cantilever 1424 and the first bent portion 1426 of each first conductive member 1420. In other words, the thickness of the plurality of first conductive members 1420 and the first connecting member 1422 may be the same. Similarly, the second conductive unit 144 may also be integrally formed, which will not be repeated in this embodiment.

Take a practical example, when the first clamping member 10 and the second clamping member 12 are ready to clamp the object to be tested, the first bending portion 1426 in the first conductive member 1420 will gradually touch the object to be tested Surface (e.g. battery electrode). As the first clamping member 10 and the second clamping member 12 get closer and closer, each first bending portion 1426 that contacts the object to be tested will be squeezed by an external force, thereby causing some deformation and slippage. Thereby, while the first bending portion 1426 is deformed and slipped, the protective film layer on the object to be tested can be scraped off. In addition, since the first bending portion 1426 is bent toward the first surface 10c (or the upper surface 140a), the smoother (for example, curved) side can be used to contact the object under test, instead of directly using the first conductive The end edge of the unit 142 is scraped off the protective film layer on the electrode, which can avoid leaving a deep scratch on the electrode. In addition, the magnitude of the current that each first conductive element 1420 can carry is related to the thickness of the copper plate used to manufacture the first conductive unit 142, and is also related to the width or cross-sectional area of each first conductive element 1420. For example, assuming that each first conductive element 1420 can carry 3 amperes of current, a suitable thickness of the copper plate of the first conductive unit 142 should be selected, and the first conductive element 1420 should be cut into a suitable width so that each first conductive element 1420 The component 1420 complies with the safety requirement for carrying a current of 3 amperes, which is not repeated in this embodiment.

In addition, in order to prevent the first clamping member 10 and the second clamping member 12 from excessively squeezing the object to be tested, a plurality of supporting members 146 may be designed on the base 140 of the conductive module 14. The supporting member 146 may be a part of the base 140 or additionally assembled on the upper surface 140a of the base 140, and this embodiment is not limited herein. The supporting member 146 can be used to resist the second clamping member 12 to prevent the second clamping member 12 from being too close to the first clamping member 10. In practice, the top surfaces of the multiple support members 146 can jointly form a support surface. When the first conductive unit 142 is not squeezed by an external force (for example, it is not in contact with the object to be tested), the first bending portion 1426 can slightly protrude于Support surface. When the first conductive unit 142 is squeezed by an external force (for example, clamping the object to be tested), the supporting member 146 can resist the second clamping member 12, so that each first conductive member 1420 only receives an external force above the supporting surface. It is avoided that each first conductive member 1420 is unrestrictedly pressed against the second clamping member 12 to damage or damage the object to be tested. Here, the present embodiment does not limit the height of the support 146 protruding from the upper surface 140a, nor does it limit the width or position of the support 146. Those with ordinary knowledge in the technical field should understand that the height of the supporting member 146 (that is, the height of the supporting surface exceeding the upper surface 140a) may depend on the elasticity of the first conductive member 1420. When the elasticity of the first conductive member 1420 is better, The height of the support 146 protruding from the upper surface 140a may be lower. In addition, as long as the supporting member 146 can resist the second clamping member 12, the width of the supporting member 146 or the position of the supporting member 146 on the upper surface 140a can be freely designed. Taking the multiple support members 146 shown in FIG. 2 as an example, the multiple support members 146 are regularly arranged on the base 140. This embodiment does not limit the number of the support members 146, as long as the support members 146 can The protection of the first conductive member 1420 from excessive extrusion is in line with the scope of the supporting member 146 of the present embodiment.

In one example, when the clamp-type testing device 1 is connected to an external power supply, the charging current may only flow through the first clamp 10. For example, in FIG. 1, between the other end 10b (second end) of the first clamping member 10 and the other end 12b (fourth end) of the second clamping member 12, an insulating member 18 may also be provided to block and not directly contact. , So that the current only flows through the first clamp 10. In an example, the insulating member 18 may be an insulating material of various shapes, such as non-conductive resin or rubber. At the same time, the surface of the second clamping member 12 facing the first clamping member 10 may be provided with an insulating plate (not shown). In other words, the second clamping member 12 and the first clamping member 10 can be insulated from each other, and the function of the second clamping member 12 is only to abut one side of the object to be tested (such as an electrode) by the first clamping The component 10 performs a process of scraping off the protective film, charging or electrical testing. In practice, when the clamp-type testing device 1 further has a voltage detecting member 16, by means of the second clamping member 12 abutting one side of the electrode, the voltage detecting member 16 can perform scraping off the protective film, measuring voltage, etc. jobs. At the same time, it can also prevent the charging current from entering from the second clamping member 12, which interferes with the accuracy of the measured voltage. In other words, the area of the second clamping member 12 may be substantially equal to the sum of the first clamping member 10 and the voltage detecting member 16, which is not limited in this embodiment.

Different from the aforementioned first conductive unit 142 and second conductive unit 144 separately installed in the first positioning groove 1400 and the second positioning groove 1402 on both sides of the base 140, the present invention also provides an integrated first The conductive unit 142 and the second conductive unit 144. Please refer to FIG. 5. FIG. 5 is a perspective view of a first conductive unit and a second conductive unit according to another embodiment of the present invention. The same as the previous embodiment, the first conductive unit 20a and the second conductive unit 22a, the first conductive unit 20b and the second conductive unit 22b in the conductive module can still have a symmetrical structure. Taking one of the first conductive units 20a as an example, the first conductive unit 20a may also have a first conductive member, and distinguish a first cantilever and a first bending portion. Since the structure is the same as the previous embodiment, this embodiment will not be repeated.

The difference from the previous embodiment is that the first conductive unit 142 of the previous embodiment is longer. In this embodiment, the first conductive unit 142 is further divided into two sections, the first conductive unit 20a and the first conductive unit 20b. In practice, if a few of the first conductive elements are damaged, only the first conductive unit 20a or the first conductive unit 20b that has damaged the first conductive element can be replaced. In practical terms, if only one first conductive element is damaged, all the first conductive units 142 need to be replaced in the previous embodiment. Although the first conductive unit 142 can be quickly removed and replaced, the cost is relatively high. In contrast, since this embodiment divides the first conductive unit 142 of the previous embodiment into smaller segments, if only one first conductive element is damaged, only the corresponding small segment of the first conductive unit 20a or the first conductive unit 20a can be replaced. Conductive unit 20b. In other words, in this embodiment, the first conductive unit 20a or the first conductive unit 20b can also be quickly removed and replaced, but the cost is much lower than that of the previous embodiment.

In addition, in order to further increase the speed of repairing the conductive module, the first conductive unit 20a and the second conductive unit 22a can be connected together via the conductive bottom plate 24a, and the first conductive unit 20b and the second conductive unit 22b can be connected via the conductive bottom plate 24b. Connected together. At this time, the first conductive unit 20a and the second conductive unit 22a can be regarded as a group of conductive units, and the first conductive unit 20b and the second conductive unit 22b can be regarded as another group of conductive units, which will be completely conductive when replaced. The unit group is replaced at the same time. In one example, the conductive base plate 24a can not only connect the first conductive unit 20a and the second conductive unit 22a respectively, but the conductive base plate 24a, the first conductive unit 20a and the second conductive unit 22a can also be an integral structure.

In summary, the clip-on test device provided by the present invention can directly use the comb-shaped conductive member in the conductive module to scrape off the protective film layer on the electrode when clamping the electrode, so that no additional step of tearing off the protective film layer is required . In addition, different from the traditional conductive elements that are separated from each other, this embodiment connects multiple conductive elements in the conductive module to the same connector, so that the conductive elements can be quickly replaced in batches, and maintenance can be reduced. time.

1: Clip-on test device 10: The first clamping piece 10a: first end 10b: second end 10c: first surface 12: The second clamping piece 12a: third end 12b: Fourth end 14: Conductive module 140: Seat 140a: The upper surface of the seat 1400: The first positioning slot 1402: second positioning slot 142: The first conductive unit 1420: The first conductive piece 1420a: One end of the first conductive member 1420b: the other end of the first conductive member 1422: The first connector 1422a: Locking hole 1424: first cantilever 1426: The first bending part 144: second conductive unit 146: Support 16: Voltage detection device 160: conductive module 18: Insulation θ1: Angle 20a, 20b: the first conductive unit 22a, 22b: second conductive unit 24a, 24b: conductive bottom plate

FIG. 1 is a three-dimensional schematic diagram of a clip-on testing device according to an embodiment of the invention.

FIG. 2 is a three-dimensional schematic diagram of a conductive module according to an embodiment of the invention.

FIG. 3 is a three-dimensional schematic diagram of a first conductive unit according to an embodiment of the invention.

FIG. 4 is a side view of the first conductive unit according to an embodiment of the invention.

FIG. 5 is a perspective view of a first conductive unit and a second conductive unit according to another embodiment of the invention.

no

14: Conductive module

140: Seat

140a: The upper surface of the seat

1400: The first positioning slot

1402: second positioning slot

142: The first conductive unit

144: second conductive unit

146: Support

Claims (8)

A clamp-type testing device, comprising: a first clamping member, defining a first surface, a first end and a second end, and the first clamping member has a conductive module, the conductive module being arranged on On the first surface, the conductive module includes: a base body with a first positioning groove and a second positioning groove; a first conductive unit detachably received in the first positioning groove, the first The conductive unit includes a plurality of first conductive members and a first connecting member arranged in parallel, each of the first conductive members is connected to the first connecting member, and each of the first conductive members has a shape extending from the first connecting member A first cantilever and a first bending portion; and a second conductive unit that is pluggably received in the second positioning slot, and the second conductive unit includes a plurality of second conductive members arranged in parallel And a second connecting member, each of the second conductive members is connected to the second connecting member, the second connecting member is parallel to the first connecting member, and each of the second conductive members has an extension from the second connecting member And a second cantilever and a second bending portion; and a second clamping member, defining a third end and a fourth end, the fourth end is connected to the second end, and the third end is The first end is separated by a first distance, and the first surface of the first clamping member faces the second clamping member; wherein the first bent portion is connected to the first cantilever, and the first cantilever is exposed to the A first positioning groove, and the first bending portion is bent toward the first surface at a first angle; wherein the second bending portion is connected to the second cantilever, and the second cantilever is exposed from the second positioning groove, And the second bending portion is bent toward the first surface at the first angle; The first cantilever of each first conductive element faces the second positioning slot, and the second cantilever of each second conductive element faces the first positioning slot. The clip-on test device according to claim 1, wherein the first conductive members are connected to the first connecting member separately from each other, and there is a second distance between the adjacent first conductive members. The clip-type testing device according to claim 1, wherein the first conductive members and the first connecting member are integrally formed. The clip-on test device according to claim 1, further comprising a conductive base plate, respectively connecting the first conductive unit and the second conductive unit. The clip-type test device according to claim 4, wherein the conductive base plate, the first conductive members, the first connecting member, the second conductive members, and the second connecting member are integrally formed. The clip-on test device according to claim 1, wherein the conductive module is detachably locked to the first surface. A conductive module includes: a base body with a first positioning slot and a second positioning slot, the second positioning slot is parallel to the first positioning slot; a first conductive unit is pluggably accommodated in the In the first positioning slot, the first conductive unit includes a plurality of first conductive members and a first connecting member, the first conductive members extend from the first connecting member; and a second conductive unit that can be inserted The second conductive unit includes a plurality of second conductive members and a second connecting member, and the second conductive members extend from the second connecting member; The first conductive members are arranged in a comb shape, and the end of each first conductive member away from the first connecting member is bent toward the base; wherein the second conductive members are arranged in a comb shape, and each The end of the second conductive member away from the second connecting member is bent toward the base; wherein each of the first conductive members is bent toward the second conductive unit, and each of the second conductive members is bent toward the first conductive unit. The conductive module according to claim 7, further comprising a conductive base plate, respectively connecting the first conductive unit and the second conductive unit, and the conductive base plate, the first conductive unit and the second conductive unit are integrally formed .

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