CN107209609A - 包括在传输面板上方和内部投射和检测光束的装置的光学触摸系统 - Google Patents
包括在传输面板上方和内部投射和检测光束的装置的光学触摸系统 Download PDFInfo
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Abstract
本发明的实施方式提供了一种触摸感测设备,其包括:光传输元件(10),其限定触摸表面;发射器组(30a),其围绕触摸表面的外围布置,以将光束发射到光传输元件中,其中,光束的第一部分(50)在照射触摸表面的同时在光传输元件内部传播,使得对象触摸该触摸表面引起传播光的衰减,并且其中,光束的第二部分(90)从光传输元件传递出去并被反射为在触摸表面上方行进;光检测器组(30b),其围绕触摸表面的外围布置,以从传输元件和触摸表面上方接收来自发射器组的光,其中,每个光检测器被布置为接收来自多于一个的发射器的光。
Description
技术领域
本发明一般涉及在光学触摸感测系统的触摸表面上的改进的触摸确定,并且具体地与基于FTIR(受抑全内反射)的触摸系统相关。
背景技术
在已知为“表面上方光学触摸系统(above surface optical touch system)”并且从例如US4459476已知的一类触摸敏感型面板中,多个光学发射器和光学接收器围绕触摸表面的外围布置,以在触摸表面上方创建交叉光路网格。每个光路在各个发射器/接收器对之间延伸。触摸该触摸表面的对象将阻断光路中的某些光路。基于检测到阻断的光路的接收器的标识,处理器能够确定阻断的光路之间的拦截位置。该类型的系统仅能够检测一个对象的位置(单触摸检测)。此外,随着触摸面板的表面面积和/或空间分辨率的增加,所需要的发射器和接收器的数量迅速增加,并从而成本和复杂性迅速增加。
在诸如WO2006/095320中示出的变体中,每个光学发射器发射光束,该光束穿过触摸表面发散,并且每个波束由围绕触摸表面的外围定位的多于一个的光学接收器检测。因此,每个发射器创建穿过触摸表面的多于一个的光路。通过顺序地激活围绕触摸表面的外围的不同发射器并检测由多个光学接收器从每个发射器接收的光来创建大量光路。由此,可以减少用于给定表面面积或空间分辨率的发射器和接收器的数量,或者实现多于一个触摸对象的同步位置检测(多触摸检测)。
如果显示屏幕被例如指纹弄脏,则光学传输路径会变得被不期望地中断并且从系统中检索的信息因为弄脏的表面变得对于触摸不敏感而错误或不完整。如果污染物被聚集在发射器或检测器中的一个前方,将一直存在被阻断或阻隔的光路。
现在描述并且也从例如US8581884中知道被称为“玻璃内光学系统(in-glassoptical system)”的另一类触摸敏感型面板。
图1示出了基于FTIR(受抑全内反射)的概念的触摸敏感型设备100(也表示为“FTIR系统”)的实例。该设备通过在传输面板10内部将来自光发射器30a的光传输至光传感器或检测器30b,以便从传输面板10内照射触摸表面20来操作。传输面板10由一个或多个层中的固态材料制成并且可具有任意形状。传输面板10限定内部辐射传播通道,在该通道中,光通过内反射传播。
在图1的实例中,传播通道被限定在传输面板10的触摸表面20与底部表面25之间,其中,触摸表面20允许传播的光与触摸对象60交互并从而限定触摸表面20。这通过经由耦合元件40将光注入到传输面板10使得在光通过传输面板10传播时光通过触摸表面20中的全内反射(TIR)反射来实现。光可以通过底部表面25上的TIR或相对于其上的反射涂层被反射。在到达在面板的远侧的耦合元件40时,光被耦合出传输面板10并且耦合到检测器30b上。触摸敏感型设备100可被设计为覆盖在显示装置或监控器上或者被集成到显示装置或监控器。
US8553014描述了将表面上方光学系统与上述玻璃内光学系统结合的尝试。US8553014描述了用于将光同时引入传输面板和传输面板上方的光学耦合技术。然而,在US8553014的图126中示出的耦合入部件(in-coupling component)是复杂的棱镜,并且看起来依赖全内反射和衍射来耦合触摸表面上方的光。这种布置将是高度容差敏感的,使得光学信号对例如触摸表面上的负载、用于将棱镜安装到传输面板的工艺的容差以及传输面板和棱镜两者的制造是高度敏感的。此外,光在平行于传输面板的平面中的散布被限于小于80度的范围,因为在该范围之外的光将被衍射到面板上方并且远离面板。这种系统最适合于诸如上文在US4459476中描述的检测线的矩形网格。此外,如在US8553014中描述的复杂棱镜的制造将是昂贵的并且体积大,占用传输面板下面和侧面的宝贵的空间。
发明概述
至少部分地克服现有技术中的上述确定的限制中的一个或多个是本发明的目标。
至少部分地通过根据独立权利要求、由从属权利要求限定的其实施方式的用于数据处理的方法、计算机可读介质、用于数据处理的装置以及触摸感测设备来实现这些目标中的一个或多个以及可从以下描述中显现的其他目标。
本发明的实施方式提供了一种触摸感测设备,其包括:光传输元件,其限定触摸表面;发射器组,其围绕触摸表面的外围布置,以将光束发射到光传输元件中,其中,光束的第一部分在照射触摸表面的同时在光传输元件内部传播,使得对象触摸该触摸表面引起传播光的衰减,并且其中,光束的第二部分从光传输元件传递出去并被反射为在触摸表面上方行进;光检测器组,其围绕触摸表面的外围布置,以从传输元件以及触摸表面上方接收来自发射器组的光,其中,每个光检测器被布置为接收来自多于一个的发射器的光;处理元件,其被配置为基于光检测器的输出信号确定每个光路的光能值(light energy value),并且被配置为基于光能值生成每个光路的传输值,以及配置成对由此生成的传输值的至少部分运行图像重构算法,以便确定对象在触摸表面上的位置。
附图简述
现在将参照所附的示意性附图来详细描述本发明的实施方式。
图1示出了根据现有技术的基于FTIR的触摸敏感型设备的横截面。
图2是基于FTIR的触摸敏感型设备的俯视图。
图3示出了根据本发明的实施方式的扩展FTIR触摸系统的截面视图。
图4示出了根据本发明的实施方式的扩展FTIR触摸系统的俯视平面图。
图5示出了在传输面板10内的窄检测线。
图6示出了在传输面板10上方的宽检测线。
图7示出了检测线95和检测线96的信号轮廓。
图8示出了其中触摸表面弯曲的本发明的实施方式。
图9示出了其中偏转器从激活区域(active area)的边缘向后设置的本发明的实施方式。
图10示出了具有防尘罩的本发明的实施方式。
图11示出了具有用于将光投射到传输面板10上方的第一发射器和检测器组以及用于将光投射到传输面板10中的第二发射器和检测器组的本发明的实施方式。
图12示出了图11的俯视平面图。
图13示出了图11的变体,在该变体中,发射器被配置为同时将光投射到传输面板10上方和传输面板10中。
图14示出了图11的变体,在该变体中,检测器被配置为同时接收来自传输面板10上方以及传输面板10内的光。
实施方式的描述
在描述本发明的实施方式之前,将给出几个定义。
“触摸对象(touch object)”或“触摸的对象(touching object)”是触摸或被带入足够接近触摸表面以便由触摸系统中的一个或多个传感器检测的物理对象。物理对象可以是有生命的或无生命的。
在触摸对象影响由传感器测量的参数时出现“交互”。
“触摸”表示如在交互图案中看到的交互点。
贯穿以下描述,相同的参考标号用于识别对应的元件。
主要实施方式
图2示出了在基于FTIR的概念的触摸敏感型设备100的实例中的图1的俯视平面图。发射器30a围绕触摸表面20的外围分布,以将光投射到传输面板10中,使得至少一部分的光被捕获在传输面板10内部,用于在传播通道中通过内反射的传播。检测器30b围绕触摸表面20的外围分布,以接收部分传播光。来自每个发射器30a的光将因此通过多个光路D在传输面板10内部传播到多个不同的检测器30b。
虽然光路D对应于在面板1内部通过内反射传播的光,如图2所示,光路D可概念性地被表示为在多对发射器30a与检测器30b之间跨越触摸表面20延伸至触摸表面20的外围的“检测线”。因此,检测线D对应于光路D到触摸表面20上的投影。从而,如在俯视平面图中看到的,发射器30a和检测器30b共同限定在触摸表面20上的检测线D的网格(“检测网格”)。在检测网格中的交叉点的间隔限定触摸敏感型设备100的空间分辨率,即,能够在触摸表面20上检测到的最小对象。检测线的宽度是发射器与对应的检测器的宽度的函数。从宽发射器检测光的宽检测器提供了具有较广表面覆盖的宽检测线,从而最小化检测线之间的空间,其不提供触摸覆盖。宽检测线的缺点可能是降低的触摸精度以及较低的信噪比。
如在本文中使用的,发射器30a可以是能够发射在期望波长范围内的辐射的任意类型的装置,例如,二极管激光器、VCSEL(垂直腔面发射激光器)、LED(发光二极管)、白炽灯、卤素灯等。发射器30a也可由光纤的端部形成。发射器30a可生成在任意波长范围内的光。以下实例假定光在红外(IR)中生成,即,以约750nm以上的波长。类似地,检测器30b可以是能够将(在相同波长范围内的)光转换成电信号的任意装置,诸如光检测器、CCD器件、CMOS器件等。
检测器30b共同地提供输出信号,输出信号由信号处理器130接收和采样。输出信号包含多个子信号(也表示为“投射信号(projection signal)”),每个子信号表示由光检测器30b中的一个从光发射器30a中的一个接收的光能。根据实现,信号处理器130可能需要处理输出信号,用于各个投射信号的分离。投射信号表示由检测器30b在各个检测线D上接收的光的能量、强度或功率。无论何时对象触摸检测线D,在该检测线上的接收能量被降低或“衰减”。
信号处理器130可被配置为处理投射信号,以便确定触摸对象的性质,诸如位置(例如,在x,y坐标系中)、形状或面积。该确定可涉及例如在US7432893和WO2010/015408中公开的基于衰减检测线的前向三角测量(straight-forward triangulation)或者更加先进的处理,以重建跨越触摸表面20的衰减值的分布(为了简洁,称为“衰减图案”),其中,每个衰减值表示光衰减的局部程度。衰减图案可以由信号处理器130或由单独的装置(未示出)进一步处理,用于触摸对象的位置、形状或面积的确定。衰减图案可例如基于投射信号值由用于图像重构的任意可用的算法(包括诸如滤波反投影的断层重构方法、基于FFT的算法、ART(代数重构技术)、SART(同步代数重构技术)等)来生成。可替代地,可通过调整一个或多个基函数和/或通过诸如贝叶斯反演的统计方法来生成衰减图案。在WO2009/077962、WO2011/049511、WO2011/139213、WO2012/050510和WO2013/062471(其全部内容通过引用并入本文)中找到了被设计用于触摸确定的这种重构函数的实例。
在示出的实例中,设备100还包括控制器120,连接控制器120以选择性地控制发射器30a的激活以及可能的数据从检测器30b的读取。根据实现,发射器30a和/或检测器30b可被依次或同时激活,例如在US8581884中公开的。信号处理器130和控制器120可被配置为单独的单元,或者它们可结合在单个单元中。可至少部分地通过由处理单元140执行的软件来实现信号处理器130和控制器120中的一个或两者。
图3示出了将图1的FTIR系统扩展为包括触摸表面20上方的触摸检测线的本发明的实施方式。
如同图1,图3示出了其中光在传输面板10内部从光发射器30a行进到检测器30b以便从传输面板10内部照射触摸表面20的本发明的实施方式。传输面板10由一个或多个层中的固态材料制成并且可具有任意形状。传输面板10限定其中光束50通过内反射传播的内部辐射传播通道。在图3中,传播通道限定在传输面板10的触摸表面20与底部表面25之间,其中,触摸表面20允许传播光束50与触摸对象60交互并且从而限定触摸表面20。这通过将光经由耦合元件40注入到传输面板10中使得在光通过传输面板10传播时通过触摸表面20中的全内反射(TIR)反射来实现。光束50可以通过底部表面25上的TIR或相对于其上的反射涂层被反射。在到达在面板的远侧的耦合元件40时,光被耦合出传输面板10并耦合到检测器30b上。触摸敏感型设备100可被设计为覆盖在显示装置或监控器上或者被集成到显示装置或监控器。
图3进一步示出了由发射器30a发射的一部分光,其以不会引起光在传输面板10内进行TIR的方式通过传输面板10来传输。而是光通过触摸表面20离开传输面板10并被边缘反射器70的反射器表面80反射,以在平行于触摸表面20的平面中沿着路径90a行进。光随后将继续直至被在传输面板10的相对边缘处的边缘反射器70的反射器表面80偏转,其中,光将向下往回偏转通过传输面板10并到检测器30b上。相比由现有技术呈现的解决方案,将来自发射器30a的光经由传输面板10传输到反射器表面80的特征具有多个优点。尤其是,触摸敏感型设备100的制造变得便宜很多。该特征允许其中没有东西与传输面板10的边缘接触的布置,从而允许避免调节玻璃的边缘的昂贵修整(其中传输面板10由玻璃形成)。此外,简化了部件到传输面板10的固紧并且改善了光学容差。
图4示出了图3的实施方式的俯视平面图。如从上面看到的,行进通过传输面板10的光束50起源于光在耦合入点45处通过耦合元件40耦合至传输面板10中的地方。在触摸表面20上方(沿着路径90a、路径90b)行进的光束90起源于反射器表面80的反射器表面焦点80a,其中,跨越触摸表面20反射从发射器30a发射的并已经穿过传输面板10的光。(非准直)光从发射器30a到反射器表面焦点80a行进的距离大于光从发射器30a到耦合入点45行进的距离。因此,从反射器表面焦点80a反射的光的发散范围比在耦合入点45处进入传输面板10的光的发散范围更宽。由此产生的效果等同于使用比在玻璃内部行进的光束50的发射器更宽的发射器来发射表面上方光束90的效果。对应的效果出现在检测器端,其中,将经由表面上方路线到达检测器30b处的光从比耦合入点45的区域更宽的区域反射到检测器30b上,从而提供更宽的检测器30b的等同效果。
结果是源于光束90的检测线比源于光束50的检测线更宽。图5和图6示出了源于在玻璃内部行进的光的检测线95与源于在触摸表面上方行进的光的检测线96的差别。在图5中,检测线95具有与从发射器30a行进到耦合入点45的短距离对应的宽度。在图6中,检测线96具有与从发射器30a行进到反射器表面焦点80a的额外距离对应的宽度。
触控笔和手指可具有非常大的尺寸(或如从检测线的透视图中看到的宽度)差别。触控笔可通常提供2mm到5mm的宽度,而手指可提供5mm到15mm的宽度。然而,解码的触摸的尺寸将取决于检测线与对象的卷积。优选的是在玻璃上方具有更宽的检测线,以提供对触摸表面20更好的覆盖并获得加宽的触控笔交互,因为这可增加分辨率。然而,检测线的加宽将降低将两个间距小的触摸对象分开的能力(多触摸系统的潜在的关键要求)。
因此,需要在玻璃上方和内部具有不同检测线宽度的解决方案。图7示出了覆盖在宽检测线上的窄检测线的信号轮廓。窄检测线95具有与信号轮廓150对应的信号轮廓,且宽检测线96具有与信号轮廓160对应的信号轮廓。
由于触控笔将通常被用作单个触摸对象,因此较宽的检测线是可能的。具有大于4mm并可能高达20mm的宽度的宽检测线96是有利的,然而4mm-6mm是优选的。
对于为分析的诸如手指的多个触摸对象设计的窄检测线95,加宽必须被限制在小于触摸对象或与触摸对象可比较的尺寸。窄检测线95的宽度还通常被发射器30a和检测器30b的宽度限制。窄检测线95在宽度上应小于5mm。在优选的实施方式中,检测线95在2mm与3mm宽之间。
在一个实施方式中,反射器表面80是漫反射表面。在优选的实施方式中,反射器表面80是优选地提供大于90%的散射的朗伯漫反射表面。用于反射器表面80的合适材料可包括二氧化钛颜料或微孔发泡反射器MCPET。使用漫反射表面的优点是与镜面反射器或透镜相比它使得光学系统对生产、安装和负载容差更不敏感。这允许触摸敏感型设备100更便宜并且更容易生产。此外,漫反射器表面80还允许更宽的和重叠的检测线。
可通过调整反射器表面80的尺寸来控制由反射器表面80反射的光量。具有较小表面面积的反射器表面80将反射少量的光。可替代地,颜料或喷雾涂层可被选择以减少反射,并且可以以特定图案应用至表面,以用于精确控制反射率。
在一个实施方式中,在每个检测器30b处接收的经由玻璃内路线的光(在图中示出为光束50)的量大于或等于在每个检测器30b处接收的经由表面上方路线的光(在图中示出为光束90)的量。在优选的实施方式中,在每个检测器30b处接收的经由玻璃内路线的光的比例比在每个检测器30b处接收的经由表面上方路线的光量大10倍。该特征是有利的,因为它允许由于FTIR引起的光学信号的衰减在重构阶段容易地与由于表面上方光的阻隔引起的光学信号的衰减进行比较,即使后者通常明显大于前者。
在图3示出的实施方式中,反射器表面80被配置为通过反射离开触摸表面20并从检测器耦合出来将光束90的一部分反射为沿着路径90a行进并将光束90的一部分反射为沿着路径90b行进。这有利地导致光束90的较大部分被检测器30b检测到。此外,使用路径90b允许改善触摸敏感型设备100的负载容差。在触摸表面20上的重的负载会使面板变形并且使路径90a偏离对准。然而,路径90b将较少地受到所述变形的影响,从而允许检测器30b继续接收到足够的信号。
在图8示出的本发明的实施方式中,传输面板10被弯曲以形成凹形表面。在该实施方式中,反射器表面80被配置为使光束90的一部分多次反射离开触摸表面20,以跟随图8中示出的路径90c。类似于上述实施方式,即使对于弯曲的面板,该特征允许对信噪比的进一步增强。
在图9中示出的本发明的实施方式中,边缘反射器70与在先前实施方式中相比从触摸表面20的外围更向后设置。边缘反射器70从触摸表面20的外围更向后的定位提供了从发射器30a到反射器表面80的更长的距离,从而允许表面上方检测线更加宽。此外,边缘反射器70向后设置的额外距离提供了在触摸表面20的外围区域中的宽检测线96之间的更大重叠,从而导致在区域中的改善的精度。这在窄检测线95提供受限覆盖范围时特别有利。在优选的实施方式中,边缘反射器70被定位成使得反射器表面80从耦合入点45向后设置10mm。
图10示出了以防尘罩110为特征的本发明的实施方式。表面上方触摸系统的已知问题是在传感器区域或者其中发射光信号以跨越触摸面板行进的区域周围的灰尘和污染物的累积。在该点处累积的灰尘或其他污染物将阻断光信号并严重地劣化触摸系统确定触摸的能力。对于如在图3中呈现的实施方式的系统,在反射器表面80成角度以形成突出部(overhang)的情况下会增加污染物的累积。该突出部形成用于累积污染物的天然遮盖物,从而导致进一步的触摸信号劣化。在图10中呈现的解决方案是形成防止灰尘到达反射器表面80的物理屏障并包括光信号通过其可不受阻碍地传递的透明窗115的防尘罩110的解决方案。优选地,防尘罩110形成倾斜边缘,其从与触摸表面20接触的内部边缘向外倾斜至边缘反射器70的顶表面。这允许有效地清理干净防尘罩110。
在优选的实施方式中,透明窗115包括被配置为仅允许IR或近IR光穿过的涂层材料。该特征提供了改善的环境光噪声降低,因为来自人工照明的光或日光在到达检测器30b之前被过滤掉。
在优选的实施方式中,防尘罩110被配置有从边缘反射器70朝向触摸表面20延伸的较长尺寸,并且配置有提供遮光板效果的内部顶表面,以便提供用于通过透明窗115进入的光的角度过滤器(angular filter)。这对于减少环境噪声是有利的,因为以错误角度进入的光被吸收到防尘罩110的顶部。此外,当与来自图8的实施方式结合时,可限制在面板上方行进的光路的角度,从而可抑制在玻璃90a上方非常高的检测线。
图11示出了图3中示出的实施方式的替代实施方式。在图11中,设备100被配置为将来自第一发射器组31a的光在传输面板10内部传输至第一检测器组31b,以便从传输面板10内部照射触摸表面20。设备100还被配置为将来自第二发射器组32a的光传输至第二检测器组32b,使得光由发射器32a发射、通过触摸表面20离开传输面板10并且被边缘反射器70的反射器表面80反射以在平行于触摸表面20的平面中沿着路径90a行进。光随后将继续直至由在传输面板10的相对边缘处的边缘反射器70的反射器表面80偏转,其中,光将通过传输面板10向下往回偏转并到检测器32b上。与对于表面上方和FTIR光路两者使用单个发射器和检测器组相比,通过对于表面上方和FTIR光路两者使用两个单独的发射和检测系统可获得重大的优点。尝试将沿着触摸表面上方的路径行进的光的衰减与经由FTIR沿着在面板内部的路径行进的光的衰减进行区分的重要问题是,典型的手指触摸可能产生的面板上方的光的衰减比经由FTIR在面板内部行进的光的衰减大多至50倍。这导致在面板中行进的光的衰减信号,难以将其从相对于在面板上方行进的光的衰减信号的噪声区分开。对于诸如触控笔末端的对象,信号强度的这个相对差异可以甚至更大。因此,对于面板上方的光路(表面上方系统)以及经由FTIR的面板内部的光路(FTIR系统)两者使用单独的发射和检测系统允许每个系统针对相应信噪比被恰当地配置。单独产生的信号随后能够被结合以提供一个系统,该系统提供以下特征:
-在触摸表面上的油或水污染物对于FTIR系统可呈现为衰减表面区域并生成错误的触摸。然而,在以上实施方式中,可将FTIR系统的触摸输出与表面上方系统的触摸输出进行比较,以识别在表面上方系统的触摸输出中不出现的FTIR系统的触摸。这将指示识别的触摸并不对应于触摸表面上方的实际对象,而仅仅是对应于表面上的污染物。然后能够抑制识别的触摸的输出。
-与以上类似,当用户将他们的手指从触摸表面抬起时,应从触摸输出中移除先前识别的触摸。然而,有时来自皮肤的手指油脂残留在触摸表面上,并且FTIR系统继续检测并报告触摸。在以上实施方式中,当现在已经移除触摸对象时,表面上方系统的输出可被用于识别FTIR系统的触摸。然后能够抑制识别的触摸的输出。
-某些对象类型(例如,诸如触控笔末端的硬对象)在与触摸表面接触时产生非常小的FTIR光的衰减。在表面上方系统记录对象而FTIR系统未记录时,能够确定对象可能是与来自手指的正常触摸相对的‘硬对象’。硬和软表面对象之间的区分可允许例如笔与手指之间的区分。被配置为区分触控笔与手指末端的触摸系统可根据触摸该触摸表面的识别的对象生成不同的UI输出。
-表面上方系统的一个问题是触摸该触摸表面的对象可能完全阻隔表面上方系统的一个或多个光路。在将大量触摸同时施加至触摸表面时,触摸表面的某些部分可能变得从表面上方系统的光路严重屏蔽,从而导致在屏蔽部分中很少或无触摸信号。在以上实施方式中,FTIR可继续提供在阻隔区域内的触摸信号,因为由于触摸引起的FTIR光路的衰减相对很小并且未阻隔。
在图11的实施方式中,由第一发射器组31a发射并由第一检测器组31b检测的光的第一波长可不同于由第二发射器组32a发射并由第二检测器组32b检测的光的第二波长。这允许光从第一发射器组31a中的一个与第二发射器组32a中的一个同时发射,并且由第一检测器组31b和第二检测器组32b无共同干扰(co-interference)地检测。在其中环境光包括比具有第二波长的光更多的具有第一波长的光或反之亦然的环境下,这也可允许改善的环境光噪声降低。例如,其中,第一波长和第二波长都是近IR波长。
在图11的实施方式中,可选择被用于激活第一和第二发射器组中的发射器的时间顺序,以确保对第一发射器组中的发射器的激活不会与对第二发射器组中的发射器的激活在时间顺序上重叠。这允许最小化潜在的共同干扰。
图12示出了图11的俯视平面图。在该实施方式中,在传输面板10的外围边缘周围,发射器31a与发射器32a在空间上交错,使得第一组的发射器31a位于相邻的第二组的发射器32a之间。类似地,在传输面板10的外围边缘周围,检测器31b与检测器32b在空间上交错,使得第一组的检测器31b位于相邻的第二组的发射器32b之间。这具有提高触摸表面的覆盖范围的优点,其中,表面上方系统的检测路径覆盖在FTIR系统的检测路径之间的间隙,并且反之亦然。
在一个实施方式中,发射器31a和检测器31b仅沿着触摸表面的外围的子部分定位。在该实施方式中,发射器31a和检测器31b沿着定位的触摸表面的外围的部分小于发射器31a和检测器31b沿着定位的触摸表面的外围的部分。在一个实施例中,发射器31a和检测器31b仅沿着矩形触摸表面的两个相对的边缘定位。在可替代实施方式中,发射器31a沿着矩形触摸表面的一个边缘放置,并且检测器31b沿着触摸表面的相对边缘定位。可替代地,发射器31a和检测器31b可在拐角处沿着矩形触摸表面的外围的L形部分定位。在一个实施方式中,发射器31a和检测器31b的数量分别少于发射器32a和检测器32b的数量。这会导致FTIR系统具有比表面上方系统更低的分辨率。可替代地,对于以上所有的布置,发射器31a和检测器31b可与发射器32a和检测器32b交换,使得FTIR系统具有比表面上方系统更高的分辨率和/或覆盖范围。这些布置允许完整的表面上方系统或FTIR系统的优点分别与受限FTIR系统或受限表面上方系统的优点相补充,而无需这两个系统的完整版本。这将允许制造成本、电力使用以及甚至触摸框架的物理尺寸的显著降低。例如,当高精度压力检测需要被添加至表面上方系统时,可将被配置为检测压力的仅具有多达精确检测压力所需的发射器和检测器的受限FTIR系统(如在本领域已知的)添加至表面上方系统。在一个实例中,受限系统仅包括完整系统的发射器和检测器的数量的25%。
在一个实施方式中,设置其中仅表面上方系统被供电的低功率模式。当由表面上方系统检测到触摸时,激活全功率模式并向FTIR系统供电。这具有如下优点:在表面上方系统未检测到触摸的时间段期间保存能量,同时一旦需要FTIR系统则启用FTIR系统的特征。可替代地,提供了其中在低功率模式下仅向FTIR系统供电并且仅当需要时向表面上方系统供电的实施方式。这可包括其中仅周期性地或者响应于由FTIR系统检测的触摸可能是由于污染物引起的错误触摸的确定而激活表面上方系统的系统。
图13示出了图11的变体,其中,发射器31a被配置为同时将光投射到传输面板10上方和传输面板10中,而其中,单独的检测器31b和32b被用于提供单独的表面上方和FTIR类型触摸信号。这有利地允许使用单个发射器的两种信号的同时发射,从而允许低能耗和更便宜的制造成本,同时实现上述特征。
图14示出了对于图13的替代,其中,检测器31b被配置为同时接收来自传输面板10上方和内部的光,而其中,单独的发射器31a和32a被用于提供单独的表面上方和FTIR类型触摸信号。该配置有利地允许对从发射器31a和32a发射的光的光强度的单独控制,以考虑环境光噪声或者其中需要单独改变光级的其他情形,同时还允许低能耗和更便宜的制造成本。
对于所有以上实施方式,根据现有技术中已知的技术,可采用用于将光耦合入和耦合出传输面板10的替代耦合入和耦合出解决方案,例如,将光耦合到面板的边缘内而不是从面板的边缘下方耦合光。
此外,根据现有技术中已知的技术,可采用用于将来自发射器32a的光传递至平行于触摸表面20的平面并回到检测器32b的替代波导、透镜和反射表面配置,例如,用于在面板的边缘周围而不是穿过面板来传递光的配置。
参考符号列表
A.触摸敏感型设备100
B.传输面板10
C.触摸表面20
D.底部表面25
E.发射器30a
F.检测器30b
G.耦合元件40
H.耦合入点45
I.光束50
J.触摸对象60
K.边缘反射器70
L.反射器表面80
M.反射器表面焦点80a
N.光束90
O.路径90a
P.路径90b
Q.路径90C
R.检测线95
S.检测线96
T.防尘罩110
U.透明窗115
V.光路D
W.控制器120
X.信号处理器130
Y.处理单元140
Z.信号轮廓150
AA.信号轮廓160
权利要求书(按照条约第19条的修改)
1.一种触摸感测设备,包括:
光传输元件,所述光传输元件限定触摸表面;
第一发射器组,所述第一发射器组围绕所述触摸表面的外围的第一部分布置,以将第一光束发射到所述光传输元件中,其中,所述第一光束在照射所述触摸表面的同时在所述光传输元件内部传播,
第二发射器组,所述第二发射器组围绕所述触摸表面的外围的第二部分布置,以发射第二光束,其中,所述第二光束被反射为在所述触摸表面上方行进,
第一光检测器组,所述第一光检测器组围绕所述触摸表面的外围的第三部分布置,以从所述传输元件接收来自所述第一发射器组的光,
第二光检测器组,所述第二光检测器组围绕所述触摸表面的外围的第四部分布置,以从所述触摸表面上方接收来自所述第二发射器组的光,
其中,每个光检测器被布置为接收来自多于一个的发射器的光;
处理元件,所述处理元件被配置为基于所述第一光检测器组和所述第二光检测器组的输出信号来确定对象在所述触摸表面上的位置。
2.根据权利要求1所述的触摸感测设备,其中,所述第一发射器组和所述第二发射器组包括至少一个公共发射器。
3.根据权利要求1所述的触摸感测设备,其中,所述第一检测器组和所述第二检测器组包括至少一个公共检测器。
4.根据任一前述权利要求所述的触摸感测系统,其中,所述处理元件被配置为基于所述第一光检测器组的信号执行第一触摸确定并基于所述第二光检测器组的信号执行第二触摸确定,并且其中,根据所述第一触摸确定和所述第二触摸确定来确定对象在所述触摸表面上的位置。
5.根据权利要求4所述的触摸感测系统,其中,所述处理元件被配置为当所述第一触摸确定指示所述对象的存在而所述第二触摸确定指示所述对象的不存在时确定所述对象未触摸所述触摸表面。
6.根据权利要求4所述的触摸感测系统,其中,所述处理元件被配置为当所述第一触摸确定指示所述对象的不存在而所述第二触摸确定指示所述对象的存在时确定所述对象具有第一对象类型。
7.根据权利要求4所述的触摸感测系统,其中,所述处理元件被配置为当对象与所述第二光束被阻隔时仅根据所述第一触摸确定来确定所述对象在所述触摸表面上的位置。
8.根据权利要求1所述的触摸感测系统,其中,所述第一发射器组被配置为发射第一波长的光并且所述第一检测器组被配置为检测所述第一波长的光,并且其中,所述第二发射器组被配置为发射第二波长的光并且所述第二检测器组被配置为检测所述第二波长的光。
9.根据权利要求1所述的触摸感测系统,其中,所述触摸感测系统被配置为在非重叠的时间激活所述第一发射器组和所述第二发射器组。
10.根据权利要求1所述的触摸感测设备,其中,所述触摸感测系统被配置为以低功率模式运行,在所述低功率模式下,仅所述第二发射器组被供电,并且其中,当所述处理元件从所述第二光检测器组确定对象在所述触摸表面上的存在时进入较高功率模式,在所述较高功率模式下,所述第一发射器组和所述第二发射器组被供电。
11.根据权利要求1所述的触摸感测设备,其中,所述触摸感测系统被配置为以低功率模式运行,在所述低功率模式下,仅所述第一发射器组被供电,并且其中,当所述处理元件从所述第一光检测器组确定对象在所述触摸表面上的存在时进入较高功率模式,在所述较高功率模式下,所述第一发射器组被供电并且所述第二发射器组被至少间歇性地供电。
12.根据任一前述权利要求所述的触摸感测设备,其中,所述第一部分和/或所述第三部分大于所述第二部分和/或所述第四部分。
13.根据权利要求1所述的触摸感测设备,其中,所述第一发射器组和/或所述第一检测器组的数量大于所述第二发射器组和/或所述第二检测器组的数量。
14.根据权利要求13所述的触摸感测设备,其中,所述第一发射器组和/或所述第一检测器组的数量与所述第二发射器组和/或所述第二检测器组的数量的比例为4:1。
15.根据权利要求1所述的触摸感测设备,其中,所述第一发射器组和所述第二发射器组沿着所述触摸表面的外围在空间上交错。
Claims (15)
1.一种触摸感测设备,包括:
光传输元件,所述光传输元件限定触摸表面;
第一发射器组,所述第一发射器组围绕所述触摸表面的外围的第一部分布置,以将第一光束发射到所述光传输元件中,其中,所述第一光束在照射所述触摸表面的同时在所述光传输元件内部传播,
第二发射器组,所述第二发射器组围绕所述触摸表面的外围的第二部分布置,以发射第二光束,其中,所述第二光束被反射为在所述触摸表面上方行进,
第一光检测器组,所述第一光检测器组围绕所述触摸表面的外围的第三部分布置,以从所述传输元件接收来自所述第一发射器组的光,
第二光检测器组,所述第二光检测器组围绕所述触摸表面的外围的第四部分布置,以从所述触摸表面上方接收来自所述第二发射器组的光,
其中,每个光检测器被布置为接收来自多于一个的发射器的光;
处理元件,所述处理元件被配置为基于所述第一光检测器组和所述第二光检测器组的输出信号来确定对象在所述触摸表面上的位置。
2.根据权利要求1所述的触摸感测设备,其中,所述第一发射器组和所述第二发射器组包括至少一个公共发射器。
3.根据权利要求1所述的触摸感测设备,其中,所述第一检测器组和所述第二检测器组包括至少一个公共检测器。
4.根据任一前述权利要求所述的触摸感测系统,其中,所述处理元件被配置为基于所述第一光检测器组的信号执行第一触摸确定并基于所述第二光检测器组的信号执行第二触摸确定,并且其中,根据所述第一触摸确定和所述第二触摸确定来确定对象在所述触摸表面上的位置。
5.根据权利要求4所述的触摸感测系统,其中,所述处理元件被配置为当所述第一触摸确定指示所述对象的存在而所述第二触摸确定指示所述对象的不存在时确定所述对象未触摸所述触摸表面。
6.根据权利要求4所述的触摸感测系统,其中,所述处理元件被配置为当所述第一触摸确定指示所述对象的不存在而所述第二触摸确定指示所述对象的存在时确定所述对象具有第一对象类型。
7.根据权利要求4所述的触摸感测系统,其中,所述处理元件被配置为当对象与所述第二光束被阻隔时仅根据所述第一触摸确定来确定所述对象在所述触摸表面上的位置。
8.根据任一前述权利要求所述的触摸感测系统,其中,所述第一发射器组被配置为发射第一波长的光并且所述第一发射器组被配置为检测所述第一波长的光,并且其中,所述第二发射器组被配置为发射第二波长的光并且所述第二发射器组被配置为检测所述第二波长的光。
9.根据任一前述权利要求所述的触摸感测系统,其中,所述触摸感测系统被配置为在非重叠的时间激活所述第一发射器组和所述第二发射器组。
10.根据任一前述权利要求所述的触摸感测设备,其中,所述触摸感测系统被配置为以低功率模式运行,在所述低功率模式下,仅所述第二发射器组被供电,并且其中,当所述处理元件从所述第二光检测器组确定对象在所述触摸表面上的存在时进入较高功率模式,在所述较高功率模式下,所述第一发射器组和所述第二发射器组被供电。
11.根据权利要求1-9所述的触摸感测设备,其中,所述触摸感测系统被配置为以低功率模式运行,在所述低功率模式下,仅所述第一发射器组被供电,并且其中,当所述处理元件从所述第一光检测器组确定对象在所述触摸表面上的存在时进入较高功率模式,在所述较高功率模式下,所述第一发射器组被供电并且所述第二发射器组被至少间歇性地供电。
12.根据任一前述权利要求所述的触摸感测设备,其中,所述第一部分和/或所述第三部分大于所述第二部分和/或所述第四部分。
13.根据任一前述权利要求所述的触摸感测设备,其中,所述第一发射器组和/或所述第一检测器组的数量大于所述第二发射器组和/或所述第二检测器组的数量。
14.根据权利要求11所述的触摸感测设备,其中,所述第一发射器组和/或所述第一检测器组的数量与所述第二发射器组和/或所述第二检测器组的数量的比例为4:1。
15.根据任一前述权利要求所述的触摸感测设备,其中,所述第一发射器组和所述第二发射器组沿着所述触摸表面的外围在空间上交错。
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WO2016130074A1 (en) | 2016-08-18 |
US20200201479A1 (en) | 2020-06-25 |
EP3256936A1 (en) | 2017-12-20 |
EP3537269A1 (en) | 2019-09-11 |
US10496227B2 (en) | 2019-12-03 |
WO2016130074A4 (en) | 2016-10-13 |
US11029783B2 (en) | 2021-06-08 |
US20180267672A1 (en) | 2018-09-20 |
EP3256936A4 (en) | 2018-10-17 |
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