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ITC 2006: Santa Clara, California, USA
- Scott Davidson, Anne Gattiker:
2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. IEEE Computer Society 2006, ISBN 1-4244-0292-1 - Lee Whetsel:
A High Speed Reduced Pin Count JTAG Interface. 1-10 - Jeff Rearick, Aaron Volz:
A Case Study of Using IEEE P1687 (IJTAG) for High-Speed Serial I/O Characterization and Testing. 1-8 - Hung-chi Lihn:
Reusable, Low-cost, and Flexible Multidrop System JTAG Architecture. 1-10 - Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Yasuyuki Noduyama, Yasuo Sato:
Recognition of Sensitized Longest Paths in Transition Delay Test. 1-6 - Nandu Tendolkar, Dawit Belete, Bill Schwarz, Bob Podnar, Akshay Gupta, Steve Karako, Wu-Tung Cheng, Alex Babin, Kun-Han Tsai, Nagesh Tamarapalli, Greg Aldrich:
Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis. 1-9 - Wangqi Qiu, D. M. H. Walker, Neil Simpson, Divya Reddy, Anthony Moore:
Comparison of Delay Tests on Silicon. 1-10 - Franco Stellari, Peilin Song, Tim Diemoz, Alan J. Weger, Tami Vogel, Steven C. Wilson, John Pennings, Richard F. Rizzolo:
High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images. 1-10 - Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski:
Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology. 1-10 - Rao Desineni, Osei Poku, Ronald D. Blanton:
A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior. 1-10 - Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen:
Testing of Precision DACs Using Low-Resolution ADCs with Dithering. 1-10 - Joseph Kwan, Qing Zhao:
A Novel Ganged DAC Solution for Multi-Site Testing. 1-6 - Fang Xu:
Perfect data reconstruction algorithm of time interleaved ADCs. 1-6 - Toai Vo, Zhiyuan Wang, Ted Eaton, Pradipta Ghosh, Huai Li, Young Lee, Weili Wang, Hong Shin Jun, Rong Fang, Dan Singletary, Xinli Gu:
Design for Board and System Level Structural Test and Diagnosis. 1-10 - Hyunbean Yi, Jaehoon Song, Sungju Park:
Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains. 1-7 - Frans G. M. de Jong, Alex S. Biewenga:
SiP-TAP: JTAG for SiP. 1-10 - Mahmut Yilmaz, Derek Hower, Sule Ozev, Daniel J. Sorin:
Self-Checking and Self-Diagnosing 32-bit Microprocessor Multiplier. 1-10 - Arthur Pereira Frantz, Fernanda Lima Kastensmidt
, Luigi Carro
Dependable Network-on-Chip Router Able to Simultaneously Tolerate Soft Errors and Crosstalk. 1-9 - Shideh Shahidi, Sandeep K. Gupta:
Estimating Error Rate during Self-Test via One's Counting. 1-9 - P. J. Tan, Tung Le, Keng-Hian Ng, Prasad Mantri, James Westfall:
Testing of UltraSPARC T1 Microprocessor and its Challenges. 1-10 - Teresa L. McLaurin:
The Challenge of Testing the ARM CORTEX-A8TM Microprocessor Core. 1-10 - Tung Pham, Brian Koehler, Daniel Young, Louis Bushard:
Test Structure and Testing of the Microsoft XBOX 360TM Processor High Speed Front Side Bus. 1-6 - Benjamin N. Lee, Li-C. Wang
Issues on Test Optimization with Known Good Dies and Known Defective Dies - A Statistical Perspective. 1-10 - Hiroshi Furukawa, Xiaoqing Wen, Laung-Terng Wang, Boryau Sheu, Zhigang Jiang, Shianling Wu:
A Novel and Practical Control Scheme for Inter-Clock At-Speed Testing. 1-10 - Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger:
Power Supply Noise in Delay Testing. 1-10 - Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee, Mark Kassab:
X-Press Compactor for 1000x Reduction of Test Data. 1-10 - Yung-Chieh Lin, Kwang-Ting Cheng
A Unified Approach to Test Generation and Test Data Volume Reduction. 1-10 - Mehdi Baradaran Tahoori, Subhasish Mitra:
Test Compression for FPGAs. 1-9 - Sudarshan Bahukudumbi, Krishnendu Chakrabarty
Defect-Oriented and Time-Constrained Wafer-Level Test-Length Selection for Core-Based Digital SoCs. 1-10 - Naresh K. Bhatti, Ronald D. Blanton:
Diagnostic Test Generation for Arbitrary Faults. 1-9 - Soumitra Bose, Vishwani D. Agrawal:
Fault Coverage Estimation for Non-Random Functional Input Sequences. 1-10 - Robert Edmondson, Gregory Iovino, Richard Kacprowicz:
Optimizing the Cost of Test at Intel Using per Device Data. 1-8 - Sylvain Tourangeau, Bill Eklow:
Test Economics - What can a Board/System Test Engineer do to Influence Supply Operation Metrics. 1-9 - Scott Davidson, Anthony P. Ambler, Helen Davidson:
Behavioral Test Economics. 1-9 - Stefan Vock, Markus Schmid, Hans Martin von Staudt:
Test Software Generation Productivity and Code Quality Improvement by applying Software Engineering Techniques. 1-8 - Eric Liau Chee Hong, Manfred Menke, Thomas Janik, Doris Schmitt-Landsiedel:
Pattern Pruner: Automatic Pattern Size Reduction Method that Uses Computational Intelligence-Based Testing. 1-10 - Takahiro J. Yamaguchi, Satoshi Iwamoto, Masahiro Ishida, Mani Soma:
A Study of Per-Pin Timing Jitter Scope. 1-7 - Venkat Kalyanaraman, Bruce C. Kim, Pramodchandran N. Variyam, Sasikumar Cherubal:
DIBPro: Automatic Diagnostic Program Generation Tool. 1-8 - Zahi S. Abuhamdeh, Philip Pears, Jeff Remmers, Alfred L. Crouch, Bob Hannagan:
Characterize Predicted vs Actual IR Drop in a Chip Using Scan Clocks. 1-8 - David E. Lackey:
Efficient Latch and Clock Structures for System-on-Chip Test Flexibility. 1-7 - Irith Pomeranz, Sudhakar M. Reddy:
Fault Detection by Output Response Comparison of Identical Circuits Using Half-Frequency Compatible Sequences. 1-10 - Yu-Long Kao, Wei-Shun Chuang, James Chien-Mo Li:
Jump Simulation: A Technique for Fast and Precise Scan Chain Fault Diagnosis. 1-9 - Yu Huang, Wu-Tung Cheng, Nagesh Tamarapalli, Janusz Rajski, Randy Klingenberg, Will Hsu, Yuan-Shih Chen:
Diagnosis with Limited Failure Information. 1-10 - M. Enamul Amyeen, Debashis Nayak, Srikanth Venkataraman:
Improving Precision Using Mixed-level Fault Diagnosis. 1-10 - Avijit Dutta, Nur A. Touba:
Using Limited Dependence Sequential Expansion for Decompressing Test Vectors. 1-9 - Shih Ping Lin, Chung-Len Lee, Jwu E. Chen, Ji-Jan Chen, Kun-Lun Luo, Wen Ching Wu:
A Multilayer Data Copy Scheme for Low Cost Test with Controlled Scan-In Power for Multiple Scan Chain Designs. 1-8 - Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo:
Test Data Compression of 100x for Scan-Based BIST. 1-10 - Jen-Chieh Ou, Daniel G. Saab, Jacob A. Abraham:
HDL Program Slicing to Reduce Bounded Model Checking Search Overhead. 1-7 - Xiaoding Chen, Michael S. Hsiao:
Characteristic States and Cooperative Game Based Search for Efficient Sequential ATPG and Design Validation. 1-10 - Manan Syal, Kameshwar Chandrasekar, Vishnu C. Vimjam, Michael S. Hsiao, Yi-Shing Chang, Sreejit Chakravarty:
A Study of Implication Based Pseudo Functional Testing. 1-10 - Hiren D. Thacker, James D. Meindl:
Prospects for Wafer-Level Testing of Gigascale Chips with Electrical and Optical I/O Interconnects. 1-7 - A. M. Majid, David C. Keezer
Multi-Gigahertz Testing of Wafer-Level Packaged Devices. 1-10 - Fengming Zhang, Warren Necoechea:
ISI Injection Filter Designs Using PIN and Varactor Diodes for SerDes Testing on ATE. 1-7 - Mack W. Riley, Nathan Chelstrom, Mike Genden, Shoji Sawamura:
Debug of the CELL Processor: Moving the Lab into Silicon. 1-9 - Davide Appello
Embedded Memory Diagnosis: An Industrial Workflow. 1-9 - Jitendra Khare, Amit B. Shah, Ashok Raman, Girish Rayas:
Embedded Memory Field Returns - Trials and Tribulations. 1-6 - Sungchul Park, Li Chen, Praveen Parvathala, Srinivas Patil, Irith Pomeranz:
A Functional Coverage Metric for Estimating the Gate-Level Fault Coverage of Functional Tests. 1-10 - Ismet Bayraktaroglu, Jim Hunt, Daniel Watkins:
Cache Resident Functional Microprocessor Testing: Avoiding High Speed IO Issues. 1-7 - Sankar Gurumurthy, Shobha Vasudevan, Jacob A. Abraham:
Automatic generation of instruction sequences targeting hard-to-detect structural faults in a processor. 1-9 - Sadok Aouini, Gordon W. Roberts:
A Predictable Robust Fully Programmable Analog Gaussian Noise Source for Mixed-Signal/Digital ATE. 1-10 - Hongjoong Shin, Joonsung Park, Jacob A. Abraham:
Built-in Fault Diagnosis for Tunable Analog Systems Using an Ensemble Method. 1-10 - Le Jin, Degang Chen, Randall L. Geiger:
Linearity Test of Analog-to-Digital Converters Using Kalman Filtering. 1-9 - Chong Zhao, Sujit Dey:
Evaluating and Improving Transient Error Tolerance of CMOS Digital VLSI Circuits. 1-10 - Subhasish Mitra, Ming Zhang, Saad Waqas, Norbert Seifert, Balkaran S. Gill, Kee Sup Kim:
Combinational Logic Soft Error Correction. 1-9 - Sobeeh Almukhaizim, Yiorgos Makris
Seamless Integration of SER in Rewiring-Based Design Space Exploration. 1-9 - Seiji Kajihara, Shohei Morishima, Akane Takuma, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato:
A Framework of High-quality Transition Fault ATPG for Scan Circuits. 1-6 - Leonard Lee, Li-C. Wang
An Efficient Pruning Method to Guide the Search of Precision Tests in Statistical Timing Space. 1-10 - Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas, Sreejit Chakravarty, Rathish Jayabharathi:
Exact At-speed Delay Fault Grading in Sequential Circuits. 1-10 - Vikram Iyengar, Toshihiko Yokota, Kazuhiro Yamada, Theo Anemikos, Bob Bassett, Mike Degregorio, Rudy Farmer, Gary Grise, Mark Johnson, Dave Milton, Mark Taylor, Frank Woytowich:
At-Speed Structural Test For High-Performance ASICs. 1-10 - Sanjay K. Thakur, Rubin A. Parekhji, Arun N. Chandorkar:
On-chip Test and Repair of Memories for Static and Dynamic Faults. 1-10 - Tsu-Wei Tseng, Jin-Fu Li, Chih-Chiang Hsu, Alex Pao, Kevin Chiu, Eliot Chen:
A Reconfigurable Built-In Self-Repair Scheme for Multiple Repairable RAMs in SOCs. 1-9 - Po-Yuan Chen, Yi-Ting Yeh, Chao-Hsun Chen, Jen-Chieh Yeh, Cheng-Wen Wu
An Enhanced EDAC Methodology for Low Power PSRAM. 1-10 - Jeffrey L. Roehr:
Very-Low Voltage (VLV) and VLV Ratio (VLVR) Testing for Quality, Reliability, and Outlier Detection. 1-6 - Liquan Fang, Mohammed Lemnawar, Yizi Xing:
Cost Effective Outliers Screening with Moving Limits and Correlation Testing for Analogue ICs. 1-10 - Doug Heaberlin:
The Power of Exhaustive Bridge Diagnosis using IDDQ Speed, Confidence, and Resolution. 1-10 - Soheil Samii, Erik Larsson
Cycle-Accurate Test Power Modeling and its Application to SoC Test Scheduling. 1-10 - Santiago Remersaro, Xijiang Lin, Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski:
Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs. 1-10 - Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mäding, Jens Leenstra:
BIST Power Reduction Using Scan-Chain Disable in the Cell Processor. 1-8 - Erdem Serkan Erdogan, Sule Ozev:
A Robust, Self-Tuning CMOS Circuit for Built-in Go/No-Go Testing of Synthesizer Phase Noise. 1-10 - N. Vijayaraghavan, Balwant Singh, Saurabh Singh, Vishal Srivastava:
Novel Architecture for On-Chip AC Characterization of I/Os. 1-10 - Mitchell Lin, Kwang-Ting Cheng
Testable Design for Adaptive Linear Equalizer in High-Speed Serial Links. 1-10 - Wei Pei, Wen-Ben Jone, Yiming Hu:
Fault Modeling and Detection for Drowsy SRAM Caches. 1-10 - Rahul Nadkarni, Igor Arsovski, Reid Wistort, Valerie Chickanosky:
Improved Match-Line Test and Repair Methodology Including Power-Supply Noise Testing for Content-Addressable Memories. 1-9 - Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor, Georgi Gaydadjiev
DRAM-Specific Space of Memory Tests. 1-10 - Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu
Testing MRAM for Write Disturbance Fault. 1-9 - Martin Dresler:
Technique to Detect RF Interface and Contact Issues During Production Testing. 1-6 - Frank Demmerle:
Integrated RF-CMOS Transceivers challenge RF Test. 1-8 - Sofiane Ellouz, Patrice Gamand, Christophe Kelma, Bertrand Vandewiele, Bruno Allard:
Combining Internal Probing with Artificial Neural Networks for Optimal RFIC Testing. 1-9 - Selim Sermet Akbay, Jose L. Torres, Julie M. Rumer, Abhijit Chatterjee, Joel Amtsfield:
Alternate Test of RF Front Ends with IP Constraints: Frequency Domain Test Generation and Validation. 1-10 - Heiko Ehrenberg:
IEEE P1581 - Getting More Board Test Out of Boundary Scan. 1-10 - Bambang Suparjo, Adam W. Ley, Adam Cron, Heiko Ehrenberg:
Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test. 1-9 - Rosa D. Reinosa:
Lead Free Through Hole Technology (THT) and Contact Repeatability in In-Circuit Test. 1-10 - Madhavan Doraiswamy, James J. Grealish:
Implementation of Solder-bead Probing in High Volume Manufacturing. 1-10 - Kazuhiro Yamamoto, Masakatsu Suda, Toshiyuki Okayasu, Hirokatsu Niijima, Koichi Tanaka:
Multi Strobe Circuit for 2.133GHz Memory Test System. 1-9 - Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma:
A Real-Time Delta-Time-to-Voltage Converter for Clock Jitter Measurement. 1-8 - Jochen Rivoir:
Fully-Digital Time-To-Digital Converter for ATE with Autonomous Calibration. 1-10 - Lucy Liu, Eddie Lew:
Periodic Jitter Amplitude Calibration with Walking Strobe. 1-8 - Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware:
A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. 1-10 - Mehrdad Nourani, Arun Radhakrishnan:
Modeling and Testing Process Variation in Nanometer CMOS. 1-10 - Thomas Nirmaier, Wolfgang Spirkl, Eric Liau Chee Hong:
Fully automated semiconductor operating condition testing. 1-9 - Ajay Khoche, Domenico Chindamo, Michael Braun, Martin Fischer:
Selective and Accurate Fail Data Capture in Compression Environment for Volume Diagnostics. 1-10 - Nishant Patil, Subhasish Mitra, Steven S. Lumetta:
Signature Analyzer Design for Yield Learning Support. 1-10 - Wu-Tung Cheng, Manish Sharma, Thomas Rinderknecht, Liyang Lai, Chris Hill:
Signature Based Diagnosis for Logic BIST. 1-9 - Yongquan Fan, Yi Cai, Liming Fang, Anant Verma, William Burchanowski, Zeljko Zilic, Sandeep Kumar:
An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and 3GB/S Serial-ATA. 1-10 - Mohamed Hafed, Daniel Watkins, Clarence Tam, Bardia Pishdad:
Massively Parallel Validation of High-Speed Serial Interfaces using Compact Instrument Modules. 1-10 - Dongwoo Hong, Kwang-Ting Cheng
Bit Error Rate Estimation for Improving Jitter Testing of High-Speed Serial Links. 1-10 - Stephen K. Sunter, Aubin Roy:
Structural Tests for Jitter Tolerance in SerDes Receivers. 1-10 - Peter C. Maxwell:
The Design, Implementation and Analysis of Test Experiments. 1-9 - François-Fabien Ferhani, Edward J. McCluskey:
Classifying Bad Chips and Ordering Test Sets. 1-10 - Eric Johnson:
Structural Testing of High-Speed Serial Buses: A Case Study Analysis. 1-9 - Jeff Rearick:
A Survey of Test Problems and Solutions. 1-10 - Chris Allsup:
The Economics of Implementing Scan Compression to Reduce Test Data Volume and Test Application Time. 1-9 - Roger Nicholson, Cathy Kardach, Bruce Cory:
The Role of ATPG Fault Diagnostics in Driving Physical Analysis. 1-7 - Rajesh Raina:
What is DFM & DFY and Why Should I Care ? 1-9 - Robert C. Aitken:
The Design and Validation of IP for DFM/DFY Assurance. 1-7 - Anne Gattiker, Manjul Bhushan, Mark B. Ketchen:
Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment. 1-10 - Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote:
IEEE P1687: Toward Standardized Access of Embedded Instrumentation. 1-8 - Ilka Reis, Peter Collins, Marc van Houcke:
On-line Boundary-Scan Testing in Service of Extended Products. 1-10 - Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie:
OCI: Open Compression Interface. 1-4
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