Cache Resident Functional Microprocessor Testing: Avoiding High Speed IO Issues. Abstract: A low cost ATE-based cache resident test methodology is presented ...
A low cost ATE-based cache resident test methodology is presented in this paper for testing cores of microprocessor chips with non-deterministic main memory ...
Cache Resident Functional Microprocessor Testing: Avoiding High Speed IO Issues. Abstract: A low cost ATE-based cache resident test methodology is presented ...
A low cost ATE-based cache resident test methodology is presented in this paper for testing cores of microprocessor chips with non-deterministic main memory ...
Bibliographic details on Cache Resident Functional Microprocessor Testing: Avoiding High Speed IO Issues.
Apr 25, 2024 · Cache Resident Functional Microprocessor Testing: Avoiding High Speed IO Issues. ITC 2006: 1-7. [+][–]. Coauthor network. maximize. Note that ...
Cache resident functional microprocessor testing: Avoiding high speed io issues. I Bayraktaroglu, J Hunt, D Watkins. 2006 IEEE International Test Conference ...
Oct 22, 2024 · Nowadays, on-line testing is essential for modern high-density microprocessors to detect either latent hardware defects or new defects ...
Cache resident functional microprocessor testing: Avoiding high speed io issues. I Bayraktaroglu, J Hunt, D Watkins. 2006 IEEE International Test Conference ...
Watkins, "Cache Resident Functional Microprocessor Testing: Avoiding High Speed IO Issues", in Proc. IEEE Intl. Test. Conf., paper 27.2, 2006. Google ...