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"Defect-Oriented and Time-Constrained Wafer-Level Test-Length Selection for ..."

Sudarshan Bahukudumbi, Krishnendu Chakrabarty (2006)

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DOI: 10.1109/TEST.2006.297646

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Sudarshan Bahukudumbi, Krishnendu Chakrabarty:
Defect-Oriented and Time-Constrained Wafer-Level Test-Length Selection for Core-Based Digital SoCs. ITC 2006: 1-10

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