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Chin-Lung Su
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2010 – 2019
- 2015
- [c8]Hao-Yu Yang, Rei-Fu Huang, Chin-Lung Su, Kuan-Hong Lin, Hang-Kaung Shu, Chi-Wei Peng, Mango Chia-Tso Chao:
Testing methods for quaternary content addressable memory using charge-sharing sensing scheme. ITC 2015: 1-10 - 2013
- [j4]Po-Yuan Chen, Chin-Lung Su, Chao-Hsun Chen, Cheng-Wen Wu
:
Generalization of an Enhanced ECC Methodology for Low Power PSRAM. IEEE Trans. Computers 62(7): 1318-1331 (2013) - 2011
- [j3]Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu
A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories. IEEE Trans. Very Large Scale Integr. Syst. 19(12): 2184-2194 (2011) - 2010
- [j2]Chin-Lung Su, Chih-Wea Tsai, Ching-Yi Chen, Wan-Yu Lo, Cheng-Wen Wu
Diagnosis of MRAM Write Disturbance Fault. IEEE Trans. Very Large Scale Integr. Syst. 18(12): 1762-1766 (2010)
2000 – 2009
- 2008
- [j1]Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu
Write Disturbance Modeling and Testing for MRAM. IEEE Trans. Very Large Scale Integr. Syst. 16(3): 277-288 (2008) - [c7]Wan-Yu Lo, Ching-Yi Chen, Chin-Lung Su, Cheng-Wen Wu
Test and Diagnosis Algorithm Generation and Evaluation for MRAM Write Disturbance Fault. ATS 2008: 417-422 - 2007
- [c6]Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu
Diagnosis for MRAM write disturbance fault. ITC 2007: 1-9 - 2006
- [c5]Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu
Testing MRAM for Write Disturbance Fault. ITC 2006: 1-9 - 2005
- [c4]Chin-Lung Su, Yi-Ting Yeh, Cheng-Wen Wu:
An Integrated ECC and Redundancy Repair Scheme for Memory Reliability Enhancement. DFT 2005: 81-92 - 2004
- [c3]Rei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang:
Fail Pattern Identification for Memory Built-In Self-Repair. Asian Test Symposium 2004: 366-371 - [c2]Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu:
MRAM Defect Analysis and Fault Modeli. ITC 2004: 124-133 - 2003
- [c1]Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu
A Processor-Based Built-In Self-Repair Design for Embedded Memories. Asian Test Symposium 2003: 366-371
Coauthor Index
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