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Duane S. Boning
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- affiliation: Massachusetts Institute of Technology, Cambridge, USA
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2020 – today
- 2024
- [c45]Zhengqi Gao, Dinghuai Zhang, Luca Daniel, Duane S. Boning:
NOFIS: Normalizing Flow for Rare Circuit Failure Analysis. DAC 2024: 279:1-279:6 - [i21]Pingchuan Ma, Haoyu Yang, Zhengqi Gao, Duane S. Boning, Jiaqi Gu:
PIC2O-Sim: A Physics-Inspired Causality-Aware Dynamic Convolutional Neural Operator for Ultra-Fast Photonic Device FDTD Simulation. CoRR abs/2406.17810 (2024) - 2023
- [c44]Emmanuel Bender
, Joseph B. Bernstein, Duane S. Boning:
The Effects of Process Variations and BTI in Packaged FinFET Devices. IRPS 2023: 1-5 - [c43]Chih-Yu Lai, Fan-Keng Sun, Zhengqi Gao, Jeffrey H. Lang, Duane S. Boning:
Nominality Score Conditioned Time Series Anomaly Detection by Point/Sequential Reconstruction. NeurIPS 2023 - [c42]Zhengxing Zhang, Milica Notaros, Zhengqi Gao, Uttara Chakraborty, Jelena Notaros, Duane S. Boning:
Impact of Spatial Variations on Splitter-Tree-Based Integrated Optical Phased Arrays. OFC 2023: 1-3 - [i20]Zhengqi Gao, Xiangfeng Chen, Zhengxing Zhang, Chih-Yu Lai, Uttara Chakraborty, Wim Bogaerts, Duane S. Boning:
Provable Routing Analysis of Programmable Photonics. CoRR abs/2306.12607 (2023) - [i19]Chih-Yu Lai, Fan-Keng Sun, Zhengqi Gao, Jeffrey H. Lang, Duane S. Boning:
Nominality Score Conditioned Time Series Anomaly Detection by Point/Sequential Reconstruction. CoRR abs/2310.15416 (2023) - [i18]Zhengqi Gao, Fan-Keng Sun, Duane S. Boning:
KirchhoffNet: A Circuit Bridging Message Passing and Continuous-Depth Models. CoRR abs/2310.15872 (2023) - [i17]Zhengqi Gao, Dinghuai Zhang, Luca Daniel, Duane S. Boning:
Rare Event Probability Learning by Normalizing Flows. CoRR abs/2310.19167 (2023) - 2022
- [c41]Zhengqi Gao, Fan-Keng Sun, Mingran Yang
Learning from Multiple Annotator Noisy Labels via Sample-Wise Label Fusion. ECCV (24) 2022: 407-422 - [c40]Jiaqi Gu, Zhengqi Gao, Chenghao Feng, Hanqing Zhu, Ray T. Chen, Duane S. Boning, David Z. Pan:
NeurOLight: A Physics-Agnostic Neural Operator Enabling Parametric Photonic Device Simulation. NeurIPS 2022 - [c39]Zhiding Liang
Variational Quantum Pulse Learning. QCE 2022: 556-565 - [i16]Fan-Keng Sun, Duane S. Boning:
FreDo: Frequency Domain-based Long-Term Time Series Forecasting. CoRR abs/2205.12301 (2022) - [i15]Zhengqi Gao, Fan-Keng Sun, Mingran Yang, Sucheng Ren, Zikai Xiong, Marc Engeler, Antonio Burazer, Linda Wildling, Luca Daniel, Duane S. Boning:
Learning from Multiple Annotator Noisy Labels via Sample-wise Label Fusion. CoRR abs/2207.11327 (2022) - [i14]Zhengqi Gao, Xiangfeng Chen, Zhengxing Zhang, Uttara Chakraborty, Wim Bogaerts, Duane S. Boning:
Automatic Synthesis of Light Processing Functions for Programmable Photonics: Theory and Realization. CoRR abs/2208.14453 (2022) - [i13]Jiaqi Gu, Zhengqi Gao, Chenghao Feng, Hanqing Zhu, Ray T. Chen, Duane S. Boning, David Z. Pan:
NeurOLight: A Physics-Agnostic Neural Operator Enabling Parametric Photonic Device Simulation. CoRR abs/2209.10098 (2022) - 2021
- [j11]Kyongmin Yeo
Variational Inference Formulation for a Model-Free Simulation of a Dynamical System with Unknown Parameters by a Recurrent Neural Network. SIAM J. Sci. Comput. 43(2): A1305-A1335 (2021) - [c38]Huan Zhang, Hongge Chen, Duane S. Boning, Cho-Jui Hsieh:
Robust Reinforcement Learning on State Observations with Learned Optimal Adversary. ICLR 2021 - [c37]Fan-Keng Sun, Christopher I. Lang, Duane S. Boning:
Adjusting for Autocorrelated Errors in Neural Networks for Time Series. NeurIPS 2021: 29806-29819 - [c36]Duane S. Boning, Sally I. El-Henawy, Zhengxing Zhang:
Process Variation-Aware Photonic Design. OFC 2021: 1-3 - [i12]Huan Zhang, Hongge Chen, Duane S. Boning, Cho-Jui Hsieh:
Robust Reinforcement Learning on State Observations with Learned Optimal Adversary. CoRR abs/2101.08452 (2021) - [i11]Fan-Keng Sun, Christopher I. Lang, Duane S. Boning:
Adjusting for Autocorrelated Errors in Neural Networks for Time Series Regression and Forecasting. CoRR abs/2101.12578 (2021) - 2020
- [c35]Mohamed Baker Alawieh, Duane S. Boning, David Z. Pan:
Wafer Map Defect Patterns Classification using Deep Selective Learning. DAC 2020: 1-6 - [c34]Huan Zhang, Hongge Chen, Chaowei Xiao, Sven Gowal, Robert Stanforth, Bo Li, Duane S. Boning, Cho-Jui Hsieh:
Towards Stable and Efficient Training of Verifiably Robust Neural Networks. ICLR 2020 - [c33]Yihan Wang, Huan Zhang, Hongge Chen, Duane S. Boning, Cho-Jui Hsieh:
On Lp-norm Robustness of Ensemble Decision Stumps and Trees. ICML 2020: 10104-10114 - [c32]Huan Zhang, Hongge Chen, Chaowei Xiao, Bo Li, Mingyan Liu, Duane S. Boning, Cho-Jui Hsieh:
Robust Deep Reinforcement Learning against Adversarial Perturbations on State Observations. NeurIPS 2020 - [c31]Hongge Chen, Si Si, Yang Li, Ciprian Chelba, Sanjiv Kumar, Duane S. Boning, Cho-Jui Hsieh:
Multi-Stage Influence Function. NeurIPS 2020 - [i10]Kyongmin Yeo, Dylan E. C. Grullon, Fan-Keng Sun, Duane S. Boning, Jayant R. Kalagnanam:
Variational inference formulation for a model-free simulation of a dynamical system with unknown parameters by a recurrent neural network. CoRR abs/2003.01184 (2020) - [i9]Huan Zhang, Hongge Chen, Chaowei Xiao, Bo Li, Duane S. Boning, Cho-Jui Hsieh:
Robust Deep Reinforcement Learning against Adversarial Perturbations on Observations. CoRR abs/2003.08938 (2020) - [i8]Hongge Chen, Si Si, Yang Li, Ciprian Chelba, Sanjiv Kumar, Duane S. Boning, Cho-Jui Hsieh:
Multi-Stage Influence Function. CoRR abs/2007.09081 (2020) - [i7]Yihan Wang, Huan Zhang, Hongge Chen, Duane S. Boning, Cho-Jui Hsieh:
On 𝓁p-norm Robustness of Ensemble Stumps and Trees. CoRR abs/2008.08755 (2020)
2010 – 2019
- 2019
- [c30]Huan Zhang, Hongge Chen, Zhao Song, Duane S. Boning, Inderjit S. Dhillon, Cho-Jui Hsieh:
The Limitations of Adversarial Training and the Blind-Spot Attack. ICLR (Poster) 2019 - [c29]Hongge Chen, Huan Zhang, Duane S. Boning, Cho-Jui Hsieh:
Robust Decision Trees Against Adversarial Examples. ICML 2019: 1122-1131 - [c28]Hongge Chen, Huan Zhang, Si Si, Yang Li, Duane S. Boning, Cho-Jui Hsieh:
Robustness Verification of Tree-based Models. NeurIPS 2019: 12317-12328 - [i6]Huan Zhang, Hongge Chen, Zhao Song, Duane S. Boning, Inderjit S. Dhillon, Cho-Jui Hsieh:
The Limitations of Adversarial Training and the Blind-Spot Attack. CoRR abs/1901.04684 (2019) - [i5]Hongge Chen, Huan Zhang, Duane S. Boning, Cho-Jui Hsieh:
Robust Decision Trees Against Adversarial Examples. CoRR abs/1902.10660 (2019) - [i4]Hongge Chen, Huan Zhang, Si Si, Yang Li, Duane S. Boning, Cho-Jui Hsieh:
Robustness Verification of Tree-based Models. CoRR abs/1906.03849 (2019) - [i3]Huan Zhang, Hongge Chen, Chaowei Xiao, Bo Li, Duane S. Boning, Cho-Jui Hsieh:
Towards Stable and Efficient Training of Verifiably Robust Neural Networks. CoRR abs/1906.06316 (2019) - 2018
- [c27]Tsui-Wei Weng, Huan Zhang, Hongge Chen, Zhao Song, Cho-Jui Hsieh, Luca Daniel, Duane S. Boning, Inderjit S. Dhillon:
Towards Fast Computation of Certified Robustness for ReLU Networks. ICML 2018: 5273-5282 - [i2]Tsui-Wei Weng, Huan Zhang, Hongge Chen, Zhao Song, Cho-Jui Hsieh, Duane S. Boning, Inderjit S. Dhillon, Luca Daniel:
Towards Fast Computation of Certified Robustness for ReLU Networks. CoRR abs/1804.09699 (2018) - 2017
- [c26]Hongge Chen, Duane S. Boning:
Online and incremental machine learning approaches for IC yield improvement. ICCAD 2017: 786-793 - [i1]Hongge Chen, Duane S. Boning, Zheng Zhang:
Efficient Spatial Variation Characterization via Matrix Completion. CoRR abs/1703.09876 (2017) - 2016
- [j10]Li Yu, Sharad Saxena, Christopher Hess, Ibrahim Abe M. Elfadel
Compact Model Parameter Extraction Using Bayesian Inference, Incomplete New Measurements, and Optimal Bias Selection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(7): 1138-1150 (2016) - 2015
- [j9]Hyun Ho Boo, Duane S. Boning, Hae-Seung Lee:
A 12b 250 MS/s Pipelined ADC With Virtual Ground Reference Buffers. IEEE J. Solid State Circuits 50(12): 2912-2921 (2015) - [c25]Li Yu, Sharad Saxena, Christopher Hess, Ibrahim M. Elfadel, Dimitri A. Antoniadis, Duane S. Boning:
Statistical library characterization using belief propagation across multiple technology nodes. DATE 2015: 1383-1388 - [c24]Hyun Ho Boo, Duane S. Boning, Hae-Seung Lee:
15.6 12b 250MS/S pipelined ADC with virtual ground reference buffers. ISSCC 2015: 1-3 - 2014
- [c23]Li Yu, Sharad Saxena, Christopher Hess, Ibrahim Abe M. Elfadel
Remembrance of Transistors Past: Compact Model Parameter Extraction Using Bayesian Inference and Incomplete New Measurements. DAC 2014: 30:1-30:6 - [c22]Li Yu, Sharad Saxena, Christopher Hess, Ibrahim M. Elfadel, Dimitri A. Antoniadis, Duane S. Boning:
Efficient performance estimation with very small sample size via physical subspace projection and maximum a posteriori estimation. DATE 2014: 1-6 - 2013
- [j8]Wangyang Zhang, Karthik Balakrishnan, Xin Li, Duane S. Boning, Sharad Saxena, Andrzej J. Strojwas, Rob A. Rutenbar
Efficient Spatial Pattern Analysis for Variation Decomposition Via Robust Sparse Regression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(7): 1072-1085 (2013) - [c21]Li Yu, Omar Mysore, Lan Wei, Luca Daniel, Dimitri A. Antoniadis, Ibrahim M. Elfadel
An ultra-compact virtual source FET model for deeply-scaled devices: Parameter extraction and validation for standard cell libraries and digital circuits. ASP-DAC 2013: 521-526 - [c20]Li Yu, Lan Wei, Dimitri A. Antoniadis, Ibrahim M. Elfadel, Duane S. Boning:
Statistical modeling with the virtual source MOSFET model. DATE 2013: 1454-1457 - [c19]Albert H. Chang, Hae-Seung Lee, Duane S. Boning:
A 12b 50MS/s 2.1mW SAR ADC with redundancy and digital background calibration. ESSCIRC 2013: 109-112 - [c18]Temesghen Tekeste, Ayman Shabra, Duane S. Boning, Ibrahim M. Elfadel
Variability analysis of a 28nm near-threshold synchronous voltage converter. ICECS 2013: 723-726 - 2012
- [c17]Wangyang Zhang, Karthik Balakrishnan, Xin Li, Duane S. Boning, Emrah Acar, Frank Liu, Rob A. Rutenbar
Spatial variation decomposition via sparse regression. ICICDT 2012: 1-4 - [c16]Albert H. Chang, Kewei Zuo, Jean Wang, Douglas Yu, Duane S. Boning:
Test structure, circuits and extraction methods to determine the radius of infuence of STI and polysilicon pattern density. ISQED 2012: 185-192 - [c15]Li Yu, Wen-Yao Chang, Kewei Zuo, Jean Wang, Douglas Yu, Duane S. Boning:
Methodology for analysis of TSV stress induced transistor variation and circuit performance. ISQED 2012: 216-222 - 2011
- [j7]Nigel Drego, Anantha P. Chandrakasan, Duane S. Boning, Devavrat Shah:
Reduction of Variation-Induced Energy Overhead in Multi-Core Processors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(6): 891-904 (2011) - [c14]Albert H. Chang, Hae-Seung Lee, Duane S. Boning:
Redundancy in SAR ADCs. ACM Great Lakes Symposium on VLSI 2011: 283-288 - [c13]Wangyang Zhang, Karthik Balakrishnan, Xin Li, Duane S. Boning, Rob A. Rutenbar
Toward efficient spatial variation decomposition via sparse regression. ICCAD 2011: 162-169 - [c12]Karthik Balakrishnan, Keith A. Jenkins, Duane S. Boning:
A simple array-based test structure for the AC variability characterization of MOSFETs. ISQED 2011: 539-544 - 2010
- [j6]Nigel Drego, Anantha P. Chandrakasan, Duane S. Boning:
All-Digital Circuits for Measurement of Spatial Variation in Digital Circuits. IEEE J. Solid State Circuits 45(3): 640-651 (2010)
2000 – 2009
- 2009
- [c11]Karthik Balakrishnan, Duane S. Boning:
Measurement and analysis of contact plug resistance variability. CICC 2009: 415-422 - 2008
- [b2]Michael Orshansky, Sani R. Nassif, Duane S. Boning:
Design for Manufacturability and Statistical Design - A Constructive Approach. Series on integrated circuits and systems, Springer 2008, ISBN 978-0-387-30928-6, pp. I-XIV, 1-310 - 2007
- [c10]Duane S. Boning, Karthik Balakrishnan, Hong Cai, Nigel Drego, Ali Farahanchi, Karen Gettings, Daihyun Lim, Ajay Somani, Hayden Taylor, Daniel Truque, Xiaolin Xie:
Variation. ISQED 2007: 15-20 - [c9]Nigel Drego, Anantha P. Chandrakasan, Duane S. Boning:
A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays. ISQED 2007: 281-286 - [c8]Daihyun Lim, Jonghae Kim, Jean-Olivier Plouchart, Choongyeun Cho, Daeik D. Kim, Robert Trzcinski, Duane S. Boning:
Performance Variability of a 90GHz Static CML Frequency Divider in 65nm SOI CMOS. ISSCC 2007: 542-621 - 2005
- [c7]James D. Ma, Claire Fang Fang, Rob A. Rutenbar
Interval-valued statistical modeling of oxide chemical-mechanical polishing. ICCAD 2005: 141-148 - 2004
- [c6]Sani R. Nassif, Duane S. Boning, Nagib Hakim:
The care and feeding of your statistical static timer. ICCAD 2004: 138-139 - 2003
- [c5]Duane S. Boning:
Test Structures for Circuit Yield Assessment and Modeling. ISQED 2003: 8 - 2002
- [c4]Duane S. Boning, Joseph Panganiban, Karen Gonzalez-Valentin, Sani R. Nassif, Chandler McDowell, Anne E. Gattiker, Frank Liu:
Test structures for delay variability. Timing Issues in the Specification and Synthesis of Digital Systems 2002: 109 - 2000
- [c3]Vikas Mehrotra, Shiou Lin Sam, Duane S. Boning, Anantha P. Chandrakasan, Rakesh Vallishayee, Sani R. Nassif:
A methodology for modeling the effects of systematic within-die interconnect and device variation on circuit performance. DAC 2000: 172-175
1990 – 1999
- 1997
- [j5]Taber H. Smith, Aaron E. Gower, Duane S. Boning:
A Matrix Math Library for Java. Concurr. Pract. Exp. 9(11): 1127-1137 (1997) - 1994
- [j4]Martin D. Giles, Duane S. Boning, Goodwin R. Chin, Walter C. Dietrich Jr., Michael S. Karasick, Mark E. Law, Purnendu K. Mozumder, Lee R. Nackman, V. T. Rajan, Duncan M. Hank Walker, Robert H. Wang, Alexander S. Wong:
Semiconductor wafer representation for TCAD. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 13(1): 82-95 (1994) - 1993
- [j3]K. S. V. Gopalarao, Purnendu K. Mozumder, Duane S. Boning:
An integrated technology CAD system for process and device designers. IEEE Trans. Very Large Scale Integr. Syst. 1(4): 482-490 (1993) - [c2]K. S. V. Gopalarao, Uttiya Dasgupta, Rajeev Jain, Duane S. Boning, Purnendu K. Mozumder, V. Chandramouli:
An Integrated Technology CAD System for Process and Device Designers. VLSI Design 1993: 287-292 - 1991
- [b1]Duane S. Boning:
Semiconductor process design: representations, tools, and methodologies. Massachusetts Institute of Technology, Cambridge, MA, USA, 1991 - [j2]Duane S. Boning, Michael L. Heytens, Alexander S. Wong:
The intertool profile interchange format: an object-oriented approach [semiconductor technology CAD/CAM]. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(9): 1150-1156 (1991) - [c1]Goodwin R. Chin, Walter C. Dietrich Jr., Duane S. Boning, Alexander S. Wong, Andrew R. Neureuther, Robert W. Dutton:
Linking TCAD to EDA - Benefits and Issues. DAC 1991: 573-578
1980 – 1989
- 1988
- [j1]Duane S. Boning, Dimitri A. Antoniadis:
A workstation approach to IC process and device design. IEEE Des. Test 5(2): 36-47 (1988)
Coauthor Index
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