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Design for Manufacturability and Statistical Design

A Constructive Approach

  • Book
  • © 2008

Overview

  • Unified Treatment of Data Collection, Modeling, and Statistical CAD
  • Covers From Fabrication to Design to CAD
  • Deals With the Extraction of Fab Information into distrubutions for analysis
  • Circuit Structures and Techniques to Reduce On-Chip Variability
  • Using CAD for the Analysis and Optimization of Timing and Power
  • Includes supplementary material: sn.pub/extras

Part of the book series: Integrated Circuits and Systems (ICIR)

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About this book

Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to

  • understanding the causes of variability;
  • design of test structures for variability characterization;
  • statistically rigorous data analysis;
  • techniques of design for manufacturability in lithography and in chemical mechanical polishing;
  • statistical simulation, analysis, and optimization techniques for improving parametric yield.

Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies.  It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits.

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Keywords

Table of contents (13 chapters)

  1. Sources of Variability

  2. Variability Characterization and Analysis

  3. Design Techniques for Systematic Manufacturability Problems

  4. Statistical Circuit Design

Authors and Affiliations

  • The University of Texas at Austin, Austin, USA

    Michael Orshansky

  • IBM Research Laboratories, Austin, USA

    Sani R. Nassif

  • Massachusetts Institute of Technology, Cambridge, USA

    Duane Boning

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