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High-speed concurrent fault simulation with vectors and scalars

Published: 23 June 1980 Publication History

Abstract

Basic goals for logic and fault simulation are accuracy, execution speed, and modeling ease. Accuracy means that adequate state and timing detail must be maintained, and that good and faulted networks must be simulated with equal accuracy. High speed simulation is desirable to perform massive fault simulations of large networks, and modeling ease is desirable to build models easily and quickly.
It should be observed that some of the above goals are in mutual conflict. For example, modeling ease and high execution speed are normally only achievable by a sacrifice in accuracy, and high accuracy is only possible by more elaborate modeling efforts or slower execution speeds, or both. As a consequence it becomes important to achieve a balance between these goals. The balance achieved here, in part dictated by the demands of fault simulation, emphasizes execution speed, adequate accuracy, and a simple modeling method.
A new logic and fault simulator, VOTE (Verification of Test Effectiveness) is described. The specifics to be described here fall into two categories: those which are of general interest, and those which are strictly implementation items.

References

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N. Abramovici, M.A. Breuer, and K. Kumar, "Concurrent Fault Simulation and Functional Level Modeling". 14th Design Automation Conference Proceedings, pp. 128-137 (June 1977).
[2]
M. Breuer and A. Friedman, "Diagnosis & Reliable Design of Digital Systems", Computer Science Press, (1976).
[3]
P.L. Flake, G. Musgrave, and I.J. White, "A Digital Systems Systems Simulator - HILO", Digital Processes, 1 (1975).
[4]
N. Phillips and J. Tellier, "Efficient Event Manipulation - The Key to Large Scale Simulation", Semiconductor Test Conference Proceedings (October 1978).
[5]
D.M. Schuler et al, "A Computer Program for Logic Simulation, Fault Simulation, and the Generation of Tests for Digital Circuits", Simulation of Systems, North-Holland Publishing Co., pp. 453-459 (1976).
[6]
D.M. Schuler et al, "A Program for the Simulation and Concurrent Fault Simulation of Digital Circuits Described with Gate and Functional Models", Test Conference Proceedings, pp. 203-207 (1979).
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E.G. Ulrich, "Exclusive Simulation of Activity in Digital Networks", ACM Communications, pp. 102-110 (February 1969).
[8]
E. G. Ulrich, T. Baker, and L.R. Williams, "Fault-Test Analysis Techniques based on Logic Simulation", Design Automation Workshop Proceedings, pp. 111-115, (June 1972).
[9]
E. G. Ulrich, and T Baker, "The Concurrent Simulation of Nearly Identical Digital Networks", Design Automation Workshop Proceedings, pp. 145-150, (June 1973), and IEEE Computer (April 1974).
[10]
E.G. Ulrich, "Event Manipulation for Discrete Simulations Requiring Large Numbers of Events", ACM Communications, pp. 777-785 (September 1978).
[11]
E.G. Ulrich, "Table-Lookup Techniques for Fast and Flexible Digital Logic Simulation", Design Automation Conference Proceedings (June 1980).
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P. Wilcox, "Digital Logic Simulation at the Gate and Functional Level", Design Automation Conference Proceedings, pp. 242-248 (June 1979).

Cited By

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  • (2006)Concurrent Hierarchical Fault SimulationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.1987.12703286:5(848-862)Online publication date: 1-Nov-2006
  • (1994)Simulation on MultiprocessorsConcurrent and Comparative Discrete Event Simulation10.1007/978-1-4615-2738-1_12(151-177)Online publication date: 1994
  • (1994)Introduction and OverviewConcurrent and Comparative Discrete Event Simulation10.1007/978-1-4615-2738-1_1(1-22)Online publication date: 1994
  • Show More Cited By

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cover image ACM Conferences
DAC '80: Proceedings of the 17th Design Automation Conference
June 1980
642 pages
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 23 June 1980

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Cited By

View all
  • (2006)Concurrent Hierarchical Fault SimulationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.1987.12703286:5(848-862)Online publication date: 1-Nov-2006
  • (1994)Simulation on MultiprocessorsConcurrent and Comparative Discrete Event Simulation10.1007/978-1-4615-2738-1_12(151-177)Online publication date: 1994
  • (1994)Introduction and OverviewConcurrent and Comparative Discrete Event Simulation10.1007/978-1-4615-2738-1_1(1-22)Online publication date: 1994
  • (1992)Concurrent fault simulation of logic gates and memory blocks on message passing multicomputersProceedings of the 29th ACM/IEEE Design Automation Conference10.5555/113938.149479(332-335)Online publication date: 1-Jul-1992
  • (1992)Concurrent fault simulation of logic gates and memory blocks on message passing multicomputers[1992] Proceedings 29th ACM/IEEE Design Automation Conference10.1109/DAC.1992.227783(332-335)Online publication date: 1992
  • (1992)The comparative and concurrent simulation of discrete-event experimentsJournal of Electronic Testing: Theory and Applications10.1007/BF001372483:2(107-118)Online publication date: 1-May-1992
  • (1990)Evaluation of a fan out stem based fault simulation in sequential circuitsMathematical and Computer Modelling: An International Journal10.5555/2259362.225964414(365-371)Online publication date: 1-Jan-1990
  • (1990)Dynamic two-dimensional parallel simulation technique for high-speed fault simulation on a vector processorIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/43.577859:8(868-875)Online publication date: Jan-1990
  • (1989)An interactive sequential test pattern generation systemProceedings. 'Meeting the Tests of Time'., International Test Conference10.1109/TEST.1989.82275(38-46)Online publication date: 1989
  • (1988)The architecture of a highly integrated simulation systemProceedings of the 25th ACM/IEEE Design Automation Conference10.5555/285730.285833(617-621)Online publication date: 1-Jun-1988
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