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Fault-test analysis techniques based on logic simulation

Published: 26 June 1972 Publication History

Abstract

In Part I of this paper we describe FANSSIM, a logic simulator whose primary use is fault analysis, i.e., fault test verification. The main feature of FANSSIM, aside from precise timing simulation, is high-speed/low-cost performance. The performance achieved ranges from 10,000 to 80,000 signals per dollar for typical simulations. Techniques contributing to this performance are: exclusive simulation of activity; a table-driven method for individual element simulation; an event-scheduling mechanism which remains economical for large, active networks; a three-state simulation method operating at high speed for 0-1 and 1-0 signals; and implementation of the central simulator subroutine in 360-Assembly Language. Additional FANSSIM capabilities not generally available in other simulators are the capability to define and use a large variety of nonprimitive logic elements without sacrificing speed or space, an oscillation-safe technique for network initialization, dynamic and accumulated activity reporting in terms of element transitions, and the transmission of nonbinary messages through a logic network.
In Part II of this paper we describe three techniques for fault-test analysis. The first is a simple, economical “sensitive-state-detection” technique which determines for every element whether faults are transferred from inputs to output. This technique quickly predicts whether a given fault-test pattern is potentially successful and should be analyzed in more detail.
The second fault-test analysis technique, which is used only if sensitive-state-detection promises success is an optimized single-fault-injection-and-simulation technique similar to generally known methods. This technique, although basically slow, is economically acceptable if it is used in conjunction with sensitive-state-detection and a fast simulator such as FANSSIM.
The third technique is a highly economical fault propagation method based on the simultaneous simulation of the unfaulted and many single-fault machines. Economy is achieved by splitting off faulty machine simulations only if faulty machine activity diverges from good machine activity, and by recombining simulations when activity converges. For small networks this technique achieves its full potential and completes all faulty-machine simulations during a single pass.

References

[1]
E. G. Ulrich, "Time-sequenced Logical Simulation Based on Circuit Delay and Selective Tracing of Active Network Paths," Proceedings ACM 20th National Conference, 1965.
[2]
E. G. Ulrich, "Exclusive Simulation of Activity in Digital Networks," ACM Communications, February 1969.
[3]
L. R. Williams, "SLAM II." Digital network simulation program developed at TRW Systems, 1967.
[4]
J. Koford and R. Walker, FAIRSIM II User's Manual, Fairchild Semiconductor, 1969.
[5]
D. L. Harmer and D. L. Lacy, "SIMSTRAN." Digital network simulation program developed at Autonetics, NAR, 1969.
[6]
D. Schuler, "NANDSIM." Digital network simulation program developed at Litton Systems, Inc., 1969.
[7]
L. R. Williams and E. G. Ulrich, "LOGIX." Digital network simulation program developed at Viatron Computer Systems, 1970.
[8]
D. Goldberg et al., "SLS." Digital network simulation program developed at Sylvania Electronic Systems, 1970.
[9]
S. A. Szygenda, D. Rouse, and E. Thompson, "A Model and Implementation of a Universal Time Delay Simulator for Large Digital Nets," Proceedings SJCC, 1970.
[10]
T. B. Yeager, "Automation of Test Specification for N/C Printed Circuit Boards," Design Automation Workshop, 1970.
[11]
P. W. Case et al., "Solid Logic Design Automation," IBM Journal, April 1964.
[12]
D. B. Armstrong, "A Deductive Method for Simulating Faults in Logic Circuits." To appear in IEEE Trans. on Electronic Components.
[13]
A. Friedes, "The Propagation of Fault-Lists Through Combinational or Sequential Circuits," Workshop on Fault Detection, Lehigh University, December 1970.

Cited By

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  • (2019)Hiding a fault enabled virus through code constructionJournal of Computer Virology and Hacking Techniques10.1007/s11416-019-00340-z16:2(103-124)Online publication date: 24-Oct-2019
  • (2019)When Fault Injection Collides with Hardware ComplexityFoundations and Practice of Security10.1007/978-3-030-18419-3_16(243-256)Online publication date: 14-Apr-2019
  • (2006)RFSIMIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.1987.12702846:3(392-402)Online publication date: 1-Nov-2006
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        cover image ACM Conferences
        DAC '72: Proceedings of the 9th Design Automation Workshop
        June 1972
        406 pages
        Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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        Published: 26 June 1972

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        View all
        • (2019)Hiding a fault enabled virus through code constructionJournal of Computer Virology and Hacking Techniques10.1007/s11416-019-00340-z16:2(103-124)Online publication date: 24-Oct-2019
        • (2019)When Fault Injection Collides with Hardware ComplexityFoundations and Practice of Security10.1007/978-3-030-18419-3_16(243-256)Online publication date: 14-Apr-2019
        • (2006)RFSIMIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.1987.12702846:3(392-402)Online publication date: 1-Nov-2006
        • (2006)Experiences with concurrent fault simulation of diagnostic programsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/43.551929:6(621-628)Online publication date: 1-Nov-2006
        • (2006)TRIMIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/43.31287:1(38-49)Online publication date: 1-Nov-2006
        • (1994)PRISC software acceleration techniquesProceedings 1994 IEEE International Conference on Computer Design: VLSI in Computers and Processors10.1109/ICCD.1994.331875(145-149)Online publication date: 1994
        • (1994)Multi-Domain Concurrent and Comparative SimulationConcurrent and Comparative Discrete Event Simulation10.1007/978-1-4615-2738-1_7(81-94)Online publication date: 1994
        • (1994)History and Background: Digital Logic and Fault SimulationConcurrent and Comparative Discrete Event Simulation10.1007/978-1-4615-2738-1_3(35-56)Online publication date: 1994
        • (1994)Introduction and OverviewConcurrent and Comparative Discrete Event Simulation10.1007/978-1-4615-2738-1_1(1-22)Online publication date: 1994
        • (1992)REFERENCESReliable Computer Systems10.1016/B978-1-55558-075-9.50025-9(845-884)Online publication date: 1992
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