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VTS 2000: Montreal, Canada
- 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. IEEE Computer Society 2000, ISBN 0-7695-0613-5
Microprocessor Test/Validation
- Nandu Tendolkar, Robert F. Molyneaux, Carol Pyron, Rajesh Raina:
At-Speed Testing of Delay Faults for Motorola's MPC7400, a PowerPC(tm) Microprocessor. 3-8 - Narayanan Krishnamurthy, Andrew K. Martin, Magdy S. Abadir, Jacob A. Abraham:
Validation of PowerPC(tm) Custom Memories using Symbolic Simulation. 9-14 - Wei-Cheng Lai, Angela Krstic, Kwang-Ting Cheng:
On Testing the Path Delay Faults of a Microprocessor Using its Instruction Set. 15-22
Low Power BIST and Scan
- Dimitris Gizopoulos, Nektarios Kranitis, Mihalis Psarakis, Antonis M. Paschalis, Yervant Zorian:
Low Power/Energy BIST Scheme for Datapaths. 23-28 - Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda, Giovanni Squillero, Massimo Violante:
Low Power BIST via Non-Linear Hybrid Cellular Automata. 29-34 - Ranganathan Sankaralingam, Rama Rao Oruganti, Nur A. Touba:
Static Compaction Techniques to Control Scan Vector Power Dissipation. 35-42
Technology Trends and Their Impact on Test
- R. Dean Adams, Phil Shephard III:
Silicon-on-Insulator Technology Impacts on SRAM Testing. 43-48 - Byungwoo Choi, D. M. H. Walker:
Timing Analysis of Combinational Circuits Including Capacitive Coupling and Statistical Process Variation. 49-54 - Lorena Anghel
, Michael Nicolaidis, Issam Alzaher-Noufal:
Self-Checking Circuits versus Realistic Faults in Very Deep Submicron. 55-66
Scan Related Approaches
- Frank P. Higgins, Rajagopalan Srinivasan:
BSM2: Next Generation Boundary-Scan Master. 67-72 - Abhijit Jas, Bahram Pouya, Nur A. Touba:
Virtual Scan Chains: A Means for Reducing Scan Length in Cores. 73-78 - Jayabrata Ghosh-Dastidar, Nur A. Touba:
A Rapid and Scalable Diagnosis Scheme for BIST Environments with a Large Number of Scan Chains. 79-88
Defect Driven Techniques
- Hugo Cheung, Sandeep K. Gupta:
A Framework to Minimize Test Escape and Yield Loss during IDDQ Testing: A Case Study. 89-96 - Jing-Jia Liou, Kwang-Ting Cheng, Deb Aditya Mukherjee:
Path Selection for Delay Testing of Deep Sub-Micron Devices Using Statistical Performance Sensitivity Analysis. 97-104 - Chul Young Lee, D. M. H. Walker:
PROBE: A PPSFP Simulator for Resistive Bridging Faults. 105-112
System-on-chip Test Techniques
- Anshuman Chandra, Krishnendu Chakrabarty:
Test Data Compression for System-on-a-Chip Using Golomb Codes. 113-120 - A. Bommireddy, Jitendra Khare, Saghir A. Shaikh, S.-T. Su:
Test and Debug of Networking SoCs: A Case Study. 121-126 - Krishnendu Chakrabarty:
Design of System-on-a-Chip Test Access Architectures using Integer Linear Programming. 127-136
Analog Test Techniques
- Ramakrishna Voorakaranam, Abhijit Chatterjee:
Test Generation for Accurate Prediction of Analog Specifications. 137-142 - Jeongjin Roh, Jacob A. Abraham:
A Comprehensive TDM Comparator Scheme for Effective Analysis of Oscillation-Based Test. 143-148 - Sule Ozev, Alex Orailoglu:
Test Selection Based on High Level Fault Simulation for Mixed-Signal Systems. 149-156
BIST: Arithmetic, Memories and ILAs
- Vivek Chickermane, Scott Richter, Carl Barnhart:
Integrating Logic BIST in VLSI Designs with Embedded Memories. 157-164 - Albrecht P. Stroele:
Synthesis for Arithmetic Built-In Self-Tes. 165-170 - Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu:
General BIST-Amenable Method of Test Generation for Iterative Logic Arrays. 171-178
Embedded Tutorial
- M. S. Huetmaker:
RF/Analog Test of Circuits and Systems. 179-182
Temperature and Process Drift Issues
- Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao, David M. Wu:
Cold Delay Defect Screening. 183-188 - Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys:
Thermal Testing: Fault Location Strategies. 189-194 - Amy Germida, James F. Plusquellic:
Detection of CMOS Defects under Variable Processing Conditions. 195-204
Test Compaction and Design Validation
- Xijiang Lin, Wu-Tung Cheng, Irith Pomeranz, Sudhakar M. Reddy:
SIFAR: Static Test Compaction for Synchronous Sequential Circuits Based on Single Fault Restoration. 205-212 - Markus Seuring, Krishnendu Chakrabarty:
Space Compaction of Test Responses for IP Cores Using Orthogonal Transmission Functions. 213-220 - Hussain Al-Asaad, John P. Hayes:
ESIM: A Multimodel Design Error and Fault Simulator for Logic Circuits. 221-230
Analog BIST
- Seongwon Kim, Mani Soma, Dilip Risbud:
An Effective Defect-Oriented BIST Architecture for High-Speed Phase-Locked Loops. 231-236 - Jan Arild Tofte, Chee-Kian Ong, Jiun-Lang Huang, Kwang-Ting (Tim) Cheng:
Characterization of a Pseudo-Random Testing Technique for Analog and Mixed-Signal Built-in-Self-Test. 237-246 - Michel Renovell, Florence Azaïs, Serge Bernard, Yves Bertrand:
Hardware Resource Minimization for Histogram-Based ADC BIST. 247-254
Functional Test and Verification Issues
- Li Chen, Sujit Dey:
DEFUSE: A Deterministic Functional Self-Test Methodology for Processors. 255-262 - Ankur Jain, Vamsi Boppana, Rajarshi Mukherjee, Jawahar Jain, Masahiro Fujita, Michael S. Hsiao:
Testing, Verification, and Diagnosis in the Presence of Unknowns. 263-270 - Katarzyna Radecka, Zeljko Zilic:
Using Arithmetic Transform for Verification of Datapath Circuits via Error Modeling. 271-280
Memory Test
- Ad J. van de Goor, Zaid Al-Ars:
Functional Memory Faults: A Formal Notation and a Taxonomy. 281-290 - Chi-Feng Wu, Chih-Tsun Huang, Kuo-Liang Cheng, Cheng-Wen Wu:
Simulation-Based Test Algorithm Generation for Random Access Memories. 291-296 - Jun Zhao, V. Swamy Irrinki, Mukesh Puri, Fabrizio Lombardi:
Detection of Inter-Port Faults in Multi-Port Static RAMs. 297-304
Open Defect Detection, Diagnosis and Analog BIS
- Víctor H. Champac, Antonio Zenteno:
Detectability Conditions for Interconnection Open Defect. 305-312 - Srikanth Venkataraman, Scott Brady Drummonds:
A Technique for Logic Fault Diagnosis of Interconnect Open Defects. 313-318 - José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski:
Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations. 319-324
Open Projector
- Thomas W. Williams, Stephen K. Sunter:
How Should Fault Coverage Be Defined? 325-328
Panel
- Bapiraju Vinnakota, André Ivanov:
Biomedical ICs: What is Different about Testing those ICs? 329-332
Delay Test, Diagnosis and BIST
- Manish Sharma, Janak H. Patel:
Bounding Circuit Delay by Testing a Very Small Subset of Paths. 333-342 - Ramesh C. Tekumalla:
On Test Set Generation for Efficient Path Delay Fault Diagnosis. 343-348 - Hans G. Kerkhoff, Mansour Shashaani, Manoj Sachdev:
A Low-Speed BIST Framework for High-Performance Circuit Testing. 349-358
BIST Issues
- Laurent Bréhélin, Olivier Gascuel, Gilles Caraux, Patrick Girard, Christian Landrault:
Hidden Markov and Independence Models with Patterns for Sequential BIST. 359-368 - Ilker Hamzaoglu, Janak H. Patel:
Reducing Test Application Time for Built-in-Self-Test Test Pattern Generators. 369-376 - Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski:
Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators. 377-388
STIL Extension, Jitter, and Crosstalk
- Peter Wohl, Nathan Biggs:
P1450.1: STIL for the Simulation Environmen. 389-394 - Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Toshifumi Watanabe, Tadahiro Ohmi:
Extraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method. 395-402 - Chauchin Su, Yue-Tsang Chen:
Crosstalk Effect Removal for Analog Measurement in Analog Test Bus. 403-410
High Level ATPG and Test Scheduling
- Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero:
High-Level Observability for Effective High-Level ATPG. 411-416 - Valentin Muresan, Xiaojun Wang, Valentina Muresan, Mircea Vladutiu:
The Left Edge Algorithm and the Tree Growing Technique in Block-Test Scheduling under Power Constraints. 417-422 - Fabrizio Ferrandi, G. Fornara, Donatella Sciuto, G. Ferrara, Franco Fummi:
Testability Alternatives Exploration through Functional Testing. 423-430
IDDQ Test
- Claude Thibeault:
Efficient Diagnosis of Single/Double Bridging Faults with Delta Iddq Probabilistic Signatures and Viterbi Algorithm. 431-438 - Theo J. Powell, James R. Pair, Melissa St. John, Doug Counce:
Delta Iddq for Testing Reliability. 439-443 - Sri Jandhyala, Hari Balachandran, Manidip Sengupta, Anura P. Jayasumana:
Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs. 444-452
On-line Testing and Fault Tolerance
- Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey:
Fault Escapes in Duplex Systems. 453-458 - Yiorgos Makris, Ismet Bayraktaroglu, Alex Orailoglu:
Invariance-Based On-Line Test for RTL Controller-Datapath Circuits. 459-464 - Subhasish Mitra, Edward J. McCluskey:
Word Voter: A New Voter Design for Triple Modular Redundant Systems. 465-470
Panels
- Fidel Muradali, André Ivanov:
Do I Need this Tool for My Chips to Work? 471-472 - Melvin A. Breuer:
High End and Low End Applications for Defective Chips: Enhanced Availability and Acceptability. 473-474
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