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Serge Bernard
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2020 – today
- 2024
- [c54]Stéphane Pitou, Florence Azaïs, Serge Bernard, Tristan Rouyer, Fabien Soulier, Vincent Kerzerho:
Low-Resource Fully-Digital BPSK Demodulation Technique for Intra-Body Wireless Sensor Networks. I2MTC 2024: 1-6 - [i1]Pierre Gogendeau, Sylvain Bonhommeau, Hassen Fourati, Mohan Julien, Matteo Contini
, Thomas Chevrier, Anne Elise Nieblas, Serge Bernard:
An open-source Autonomous Surface Vehicle for Acoustic Tracking, Bathymetric and Photogrammetric Surveys. CoRR abs/2406.18760 (2024) - 2023
- [j28]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. J. Electron. Test. 39(2): 155-170 (2023) - [c53]Stéphane Pitou, Tristan Rouyer, Sylvain Bonhommeau, Serge Bernard, Fabien Soulier, Vincent Kerzerho:
First Step Towards a Fully-Miniaturized Intra-body Communication Transceiver Based on Galvanic Coupling. FICC (1) 2023: 107-119 - 2022
- [j27]Alexia Bailleul
Bioimpedance Spectroscopy Helps Monitor the Impact of Electrical Stimulation on Muscle Cells. IEEE Access 10: 131430-131441 (2022) - 2021
- [j26]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit. J. Electron. Test. 37(2): 225-242 (2021) - [c52]Alexia Bailleul, Julien Claudel
In vitro impedance spectroscopy: A MEA-based measurement bench for myoblasts cultures monitoring. DCIS 2021: 1-6 - [c51]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, François Lefèvre:
Exploring on-line RF performance monitoring based on the indirect test strategy. LATS 2021: 1-7 - 2020
- [j25]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits. J. Electron. Test. 36(2): 189-203 (2020) - [c50]Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. IOLTS 2020: 1-4 - [c49]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, Francois Lefevre, I. Gorenflot:
Implementing indirect test of RF circuits without compromising test quality: a practical case study. LATS 2020: 1-6
2010 – 2019
- 2019
- [j24]Mohan Julien, Serge Bernard
Breaking the speed-power-accuracy trade-off in current mirror with non-linear CCII feedback. Microelectron. J. 83: 77-85 (2019) - [j23]Fabien Soulier
Very Low Resource Digital Implementation of Bioimpedance Analysis. Sensors 19(15): 3381 (2019) - [c48]Hassan El Badawi, Florence Azaïs, Serge Bernard
Use of ensemble methods for indirect test of RF circuits: can it bring benefits? LATS 2019: 1-6 - [c47]Hassan El Badawi, Mariane Comte, Florence Azaïs, Vincent Kerzèrho, Serge Bernard, François Lefevre:
Which metrics to use for RF indirect test strategy? SMACD 2019: 73-76 - 2018
- [j22]Stephane David-Grignot, Achraf Lamlih, Mohamed Moez Belhaj, Vincent Kerzerho, Florence Azaïs, Fabien Soulier
On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints. J. Electron. Test. 34(3): 281-290 (2018) - [c46]Mohan Julien, Serge Bernard
Improvement of Active-Input Current Mirrors Using Adaptive Biasing Technique. DCIS 2018: 1-4 - [c45]Fabien Soulier
A Multitone Analysis for Bioimpedance Spectroscopy using Minimal Digital Ressource. ICST 2018: 315-318 - [c44]Achraf Lamlih, Philippe Freitas, Stephane David-Grignot, Jérémie Salles, Vincent Kerzèrho, Fabien Soulier
Wideband Fully Differential Current Driver with Optimized Output Impedance for Bioimpedance Measurements. ISCAS 2018: 1-5 - [c43]Achraf Lamlih, Philippe Freitas, Mohamed Moez Belhaj, Jérémie Salles, Vincent Kerzerho, Fabien Soulier
A Hybrid Bioimpedance Spectroscopy Architecture for a Wide Frequency Exploration of Tissue Electrical Properties. VLSI-SoC 2018: 168-171 - 2017
- [j21]Anthony Deluthault, Vincent Kerzerho, Serge Bernard
New Calibration Technique of Contact-less Resonant Biosensor. J. Electron. Test. 33(3): 365-375 (2017) - [j20]Anthony Deluthault, Luc Mezenge, Philippe Cauvet, Vincent Kerzerho, Fabien Soulier
Efficient Objective Metric Tool for Medical Electrical Device Development: Eye Phantom for Glaucoma Diagnosis Device. J. Sensors 2017: 8436123:1-8436123:9 (2017) - [c42]Mohan Julien, Serge Bernard
Formal analysis of bandwidth enhancement for high-performance active-input current mirror. DTIS 2017: 1-6 - [c41]Mohan Julien, Serge Bernard
Formal analysis of high-performance stabilized active-input current mirror. ISCAS 2017: 1-4 - 2016
- [j19]Olivier Rossel
A phantom axon setup for validating models of action potential recordings. Medical Biol. Eng. Comput. 54(8): 1257-1267 (2016) - 2015
- [j18]Syhem Larguech, Florence Azaïs, Serge Bernard
Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies. Microelectron. J. 46(11): 1091-1102 (2015) - [c40]Noëlle Lewis, Cyril Lahuec, Sylvie Renaud, Eric McAdams, Paco Bogónez-Franco
Relevance of impedance spectroscopy for the monitoring of implant-induced fibrosis: A preliminary study. BioCAS 2015: 1-4 - [c39]Olivier Rossel, Fabien Soulier
In-silico Phantom Axon: Emulation of an Action Potential Propagating Along Artificial Nerve Fiber. ISVLSI 2015: 228-230 - [c38]Syhem Larguech, Florence Azaïs, Serge Bernard
A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy. ISVLSI 2015: 621-626 - [c37]Vincent Kerzerho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, Serge Bernard
Toward Adaptation of ADCs to Operating Conditions through On-chip Correction. ISVLSI 2015: 634-639 - [c36]Mariam Abdallah
Exploring the limit of ENG spatio-temporal filtering for velocity-selectivity. NER 2015: 585-588 - 2014
- [j17]Haithem Ayari, Florence Azaïs, Serge Bernard
Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements. Microelectron. J. 45(3): 336-344 (2014) - [j16]Serge Bernard
Editorial. Microelectron. J. 45(10): 1233 (2014) - [c35]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell:
New implementions of predictive alternate analog/RF test with augmented model redundancy. DATE 2014: 1-4 - [c34]Martin Andraud
Solutions for the self-adaptation of communicating systems in operation. IOLTS 2014: 234-239 - [c33]Syhem Larguech, Florence Azaïs, Serge Bernard
Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing. LATW 2014: 1-6 - 2013
- [j15]Vincent Kerzerho, Serge Bernard
A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC. Microelectron. J. 44(9): 840-843 (2013) - [j14]Serge Bernard
Joint special Issue from best papers of DTIS'10 and DTIS'11. Microelectron. J. 44(12): 1051 (2013) - [c32]Edith Beigné, Alexandre Valentian, Bastien Giraud, Olivier Thomas, Thomas Benoist, Yvain Thonnart, Serge Bernard, Guillaume Moritz, Olivier Billoint, Y. Maneglia, Philippe Flatresse, Jean-Philippe Noel, Fady Abouzeid
Ultra-wide voltage range designs in fully-depleted silicon-on-insulator FETs. DATE 2013: 613-618 - [c31]Haithem Ayari, Florence Azaïs, Serge Bernard
Implementing model redundancy in predictive alternate test to improve test confidence. ETS 2013: 1 - [c30]Mouhamadou Dieng, Mariane Comte, Serge Bernard
Accurate and efficient analytical electrical model of antenna for NFC applications. NEWCAS 2013: 1-4 - 2012
- [c29]Jonathan Coulombe, Olivier Rossel, Serge Bernard
A new shared-input amplifier architecture with enhanced noise-power efficiency for parallel biosignal recordings. ISCAS 2012: 846-849 - [c28]Haithem Ayari, Florence Azaïs, Serge Bernard
Making predictive analog/RF alternate test strategy independent of training set size. ITC 2012: 1-9 - [c27]Haithem Ayari, Florence Azaïs, Serge Bernard
Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS 2012: 19-24 - 2011
- [j13]Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. J. Electron. Test. 27(3): 335-350 (2011) - [j12]Vincent Kerzerho, Vincent Fresnaud, Dominique Dallet, Serge Bernard
Fast Digital Post-Processing Technique for Integral Nonlinearity Correction of Analog-to-Digital Converters: Validation on a 12-Bit Folding-and-Interpolating Analog-to-Digital Converter. IEEE Trans. Instrum. Meas. 60(3): 768-775 (2011) - [c26]Olivier Rossel, Fabien Soulier
Fascicle-selective multi-contact cuff electrode. EMBC 2011: 2989-2992 - [c25]Olivier Rossel, Fabien Soulier
Sensitivity of a frequency-selective electrode based on spatial spectral properties of the extracellular AP of myelinated nerve fibers. EMBC 2011: 5843-5846
2000 – 2009
- 2009
- [c24]Vincent Kerzerho, Philippe Cauvet, Serge Bernard
A multi-converter DFT technique for complex SIP: Concepts and validation. ECCTD 2009: 747-750 - 2008
- [j11]Vincent Kerzerho, Philippe Cauvet, Serge Bernard
ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design 2008: 482159:1-482159:8 (2008) - [c23]Fabien Soulier
Multipolar Electrode and Preamplifier Design for ENG-Signal Acquisition. BIOSTEC (Selected Papers) 2008: 148-159 - [c22]Fabien Soulier, Lionel Gouyet, Guy Cathébras, Serge Bernard, David Guiraud, Yves Bertrand:
Considerations on Improving the Design of CUFF Electrode for ENG Recording - Geometrical Approach, Dedicated IC, Sensitivity, Noise Rejection. BIODEVICES (2) 2008: 180-185 - [c21]Fabien Soulier, Jean-Baptiste Lerat, Lionel Gouyet, Serge Bernard
A Neural Stimulator Output Stage for Dodecapolar Electrodes. ISVLSI 2008: 487-490 - [c20]Ziad Noun, Philippe Cauvet, Marie-Lise Flottes, David Andreu
Wireless Test Structure for Integrated Systems. ITC 2008: 1 - 2007
- [j10]Vincent Kerzerho, Philippe Cauvet, Serge Bernard
Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. IET Comput. Digit. Tech. 1(3): 146-153 (2007) - [c19]Philippe Cauvet, Serge Bernard
System-in-Package, a Combination of Challenges and Solutions. ETS 2007: 193-199 - [c18]Vincent Kerzerho, Philippe Cauvet, Serge Bernard
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS 2007: 211-216 - [c17]Serge Bernard
Low-noise ASIC and New Layout of Multipolar Electrode for both High ENG Selectivity and Parasitic Signal Rejection. ICECS 2007: 74-77 - 2006
- [j9]Vincent Kerzerho, Philippe Cauvet, Serge Bernard
A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Des. Test Comput. 23(3): 234-243 (2006) - [j8]Vincent Kerzerho, Serge Bernard
A First Step for an INL Spectral-Based BIST: The Memory Optimization. J. Electron. Test. 22(4-6): 351-357 (2006) - [c16]Vincent Kerzerho, Philippe Cauvet, Serge Bernard
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS 2006: 159-164 - [c15]Vincent Fresnaud, Lilian Bossuet, Dominique Dallet, Serge Bernard
A Low Cost Alternative Method for Harmonics Estimation in a BIST Context. ETS 2006: 193-198 - 2005
- [j7]Florence Azaïs, Serge Bernard
Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. J. Electron. Test. 21(3): 291-298 (2005) - 2004
- [j6]Serge Bernard
Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors. J. Electron. Test. 20(3): 257-267 (2004) - [j5]Florence Azaïs, Serge Bernard
Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. J. Electron. Test. 20(4): 375-387 (2004) - [c14]Jean-Denis Techer, Serge Bernard, Yves Bertrand, Guy Cathébras, David Guiraud:
New implantable stimulator for the FES of paralyzed muscles. ESSCIRC 2004: 455-458 - 2003
- [j4]Serge Bernard
On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. J. Electron. Test. 19(4): 469-479 (2003) - [j3]Florence Azaïs, Serge Bernard
A-to-D converters static error detection from dynamic parameter measurement. Microelectron. J. 34(10): 945-953 (2003) - [c13]Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell:
A New Methodology For ADC Test Flow Optimization. ITC 2003: 201-209 - 2002
- [c12]Yves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard
European Network for Test Education. DELTA 2002: 230-234 - [c11]Serge Bernard
A high accuracy triangle-wave signal generator for on-chip ADC testing. ETW 2002: 89-94 - [c10]Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell, Marcelo Lubaszewski:
Estimating Static Parameters of A-to-D Converters from Spectral Analysis. LATW 2002: 174-179 - 2001
- [j2]Florence Azaïs, Serge Bernard
A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs. J. Electron. Test. 17(2): 139-147 (2001) - [j1]Florence Azaïs, Serge Bernard
Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST. J. Electron. Test. 17(3-4): 255-266 (2001) - [c9]Florence Azaïs, Serge Bernard
Implementation of a linear histogram BIST for ADCs. DATE 2001: 590-595 - [c8]Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell:
Analog BIST Generator for ADC Testing. DFT 2001: 338-346 - [c7]Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell:
On-chip Generator of a Saw-Tooth Test Stimulus for ADC BIST. VLSI-SOC 2001: 425-436 - [c6]Michel Renovell, Jean Marc Gallière, Florence Azaïs, Serge Bernard, Yves Bertrand:
Boolean and current detection of MOS transistor with gate oxide short. ITC 2001: 1039-1048 - [c5]Florence Azaïs, Serge Bernard, Yves Bertrand, Xavier Michel, Michel Renovell:
On-Chip Generation of High-Quality Ramp Stimulus With Minimal Silicon Area. LATW 2001: 112-117 - [c4]Florence Azaïs, Serge Bernard, Yves Bertrand, Xavier Michel, Michel Renovell:
A Low-Cost Adaptive Ramp Generator for Analog BIST Applications. VTS 2001: 266-271 - 2000
- [c3]Florence Azaïs, Serge Bernard, Y. Betrand, Michel Renovell:
Towards an ADC BIST scheme using the histogram test technique. ETW 2000: 53-58 - [c2]Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell:
Minimizing the Hardware Overhead of a Histogram-Based BIST Scheme for Analog-to-Digital Converters. LATW 2000: 118-122 - [c1]Michel Renovell, Florence Azaïs, Serge Bernard, Yves Bertrand:
Hardware Resource Minimization for Histogram-Based ADC BIST. VTS 2000: 247-254
Coauthor Index
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last updated on 2024-10-07 21:21 CEST by the dblp team
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