default search action

combined dblp search
author search
venue search
publication search

ask others

"A Framework to Minimize Test Escape and Yield Loss during IDDQ Testing: A ..."

Hugo Cheung, Sandeep K. Gupta (2000)

> Home

Details and statistics

DOI: 10.1109/VTEST.2000.843831

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-22

- view
  authority control:
- export record
  dblp key:
  - conf/vts/CheungG00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vts/CheungG00
Hugo Cheung, Sandeep K. Gupta:
A Framework to Minimize Test Escape and Yield Loss during IDDQ Testing: A Case Study. VTS 2000: 89-96

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.