WO2015122472A1

WO2015122472A1 - Probe unit

Info

Publication number: WO2015122472A1
Application number: PCT/JP2015/053867
Authority: WO
Inventors: 山田　佳男; 浩平広中; 一也相馬; 雅宏高橋
Original assignee: 日本発條株式会社
Priority date: 2014-02-13
Filing date: 2015-02-12
Publication date: 2015-08-20
Also published as: TW201531712A; SG11201606516RA; JPWO2015122472A1; TWI554762B; JP6367249B2

Abstract

A contact probe according to the present invention is provided with: a base portion; an inclined portion having a first inclined surface that inclines with respect to the longitudinal direction of the base portion; an extension portion having a flat portion that forms a flat surface parallel to the longitudinal direction of the base portion; and a contact portion having a second inclined surface having an inclination angle with respect to the longitudinal direction of the base portion equal to that of the first inclined surface and having a tip to contact an electrode to be contacted. Formed on a probe holder are a plurality of holder holes for holding a plurality of contact probes and an elongated hole which has an opening on an upper end surface of the probe holder and communicates with one end of each of the plurality of holder bores, said elongated hole causing the plurality of contact probes to be arranged along the inner wall surface thereof by supporting the flat portions on the inner wall surface.

Description

Probe unit

The present invention relates to a probe unit used for a conduction state inspection or an operation characteristic inspection of an inspection target such as a semiconductor integrated circuit or a liquid crystal panel.

Conventionally, when conducting a conduction state inspection or an operation characteristic inspection of an inspection target such as a semiconductor integrated circuit or a liquid crystal panel, an electrical connection is made between the inspection target and a signal processing device that outputs an inspection signal. A probe unit that accommodates a plurality of contact probes is used. The probe unit can be applied to highly integrated and miniaturized inspection objects by narrowing the pitch between contact probes with the progress of high integration and miniaturization of semiconductor integrated circuits and liquid crystal panels in recent years. Possible technologies are progressing.

A four-terminal measurement method can be cited as a conduction state inspection and an operation characteristic inspection for inspection targets such as semiconductor integrated circuits and liquid crystal panels. As a probe unit using this four-terminal measurement method, a pair of contact probes (probe group) held by a probe holder is used to measure the electrical characteristics by bringing the tip of each contact probe into contact with a contact target (object to be measured). A technique is disclosed (for example, see Patent Document 1). The probe unit disclosed in Patent Document 1 includes a contact probe having a tip portion obtained by cutting a part of a side surface of a cylinder into a flat shape, and holding the contact probe and bringing the tip portion and an inner wall surface into contact with each other. And a probe holder in which a holder hole (holding portion) for positioning the contact probe is formed.

JP 2012-112709 A

However, in the technique disclosed in Patent Document 1, the distance between the contact probes in the probe group depends on the formation interval of the holder holes that respectively hold the contact probes and the formation accuracy of the tip portion of the contact probes. For this reason, in the technique disclosed in Patent Document 1, it is necessary to process the holder hole and the contact probe with high accuracy. On the other hand, there has been a demand for a configuration of a holding portion that can be easily manufactured and can maintain the positioning accuracy of the contact probe.

The present invention has been made in view of the above, and an object of the present invention is to provide a probe unit that can be easily manufactured while maintaining the positioning accuracy of the contact probe in the probe group.

In order to solve the above-described problems and achieve the object, a probe unit according to the present invention includes a probe group including two contact probes that respectively contact one electrode to be contacted on one end side in the longitudinal direction. A probe unit including a plurality of probe holders for holding the contact probes, wherein each contact probe is in contact with a different electrode on the substrate on the other end side, and the contact probes extend in a columnar shape. A base part, an inclined part extending from the base part and having a first inclined surface inclined with respect to a longitudinal direction of the base part, and an end part extending from a side different from a side connected to the base part of the inclined part; An extending portion having a plane portion that forms a plane parallel to the direction, and an end portion that is different from the end of the extending portion that is connected to the inclined portion. Both of them have a second inclined surface whose inclination angle with respect to the longitudinal direction of the base portion is equal to the inclination angle of the first inclined surface, and a contact portion that comes into contact with one electrode to be contacted at the tip. The probe holder has a plurality of holder holes for holding the plurality of contact probes, an opening at the upper end surface of the probe holder, communicates with one end of the plurality of holder holes, and the inner wall surface A long hole is formed, which supports a flat portion and arranges the plurality of contact probes along the inner wall surface.

In the probe unit according to the present invention as set forth in the invention described above, the contact portion is formed at the tip, and has a plurality of sharp ends each having a tapered shape, and is adjacent to the plurality of sharp ends. The angle formed by the opposing wall surfaces of the two sharp ends is twice the inclination angle of the first inclined surface.

In the probe unit according to the present invention, in the above invention, the long hole is parallel to the arrangement direction of the probe group, and is orthogonal to the direction in which the contact probes constituting the probe group face each other. It extends in the direction.

In the probe unit according to the present invention, in the above invention, the contact probe extends from an end different from the side connected to the inclined portion of the base, and has a flange portion having a diameter larger than the diameter of the base. And the flange portion is held by the probe holder by contacting the probe holder.

In the probe unit according to the present invention, in the above invention, the contact probe includes a first plunger having the base portion, the inclined portion, the extending portion, and the contact portion, and a first plunger in contact with the electrode of the substrate. Two plungers and a coil spring provided between the first and second plungers to connect the first and second plungers in a telescopic manner. The probe holder has the elongated hole formed therein. And a first member that holds the first plunger, and a second member that holds the second plunger and the coil spring and is detachable from the first member.

According to the present invention, the contact probe has a base portion, an inclined portion having a first inclined surface inclined with respect to the longitudinal direction of the base portion, and an extended plane portion forming a plane parallel to the longitudinal direction of the base portion. And a contact portion that has a second inclined surface whose inclination angle with respect to the longitudinal direction of the base portion is equal to the inclination angle of the first inclined surface, and contacts with one electrode to be contacted at the tip, The probe holder has a plurality of holder holes for holding the plurality of contact probes, an opening at the upper end surface of the probe holder, communicates with one end of the plurality of holder holes, and supports a flat portion by an inner wall surface. Since the long holes for arranging the plurality of contact probes along the inner wall surface are formed, the positioning accuracy of the contact probes in the probe group can be maintained and can be easily manufactured. The effect say.

FIG. 1 is a perspective view showing the configuration of the probe unit according to the first embodiment of the present invention. FIG. 2 is a partial cross-sectional view showing a configuration of a main part of the probe unit according to the first embodiment of the present invention. FIG. 3 is a partial cross-sectional view illustrating a configuration of a main part of the probe unit according to the first embodiment of the present invention. FIG. 4 is a diagram illustrating a configuration of a main part of the probe unit according to the first embodiment of the present invention. FIG. 5 is a partial cross-sectional view showing a configuration of a main part of the probe unit at the time of inspection of the semiconductor integrated circuit according to the first embodiment of the present invention. FIG. 6 is a diagram illustrating a method for manufacturing the plunger of the probe unit according to the first embodiment of the present invention. FIG. 7 is a diagram for explaining a method of manufacturing the plunger of the probe unit according to the first embodiment of the present invention. FIG. 8 is a diagram illustrating a method for manufacturing the plunger of the probe unit according to the first embodiment of the present invention. FIG. 9 is a diagram illustrating a configuration of the plunger of the probe unit according to the modification of the first embodiment of the present invention. FIG. 10 is a partial cross-sectional view showing the configuration of the main part of the probe unit according to the second embodiment of the present invention. FIG. 11 is a partial cross-sectional view illustrating a configuration of a main part of a probe unit according to a modification of the second embodiment of the present invention.

Hereinafter, embodiments for carrying out the present invention will be described in detail with reference to the drawings. In addition, this invention is not limited by the following embodiment. The drawings referred to in the following description only schematically show the shape, size, and positional relationship so that the contents of the present invention can be understood. That is, the present invention is not limited only to the shape, size, and positional relationship illustrated in each drawing.

(Embodiment 1)
FIG. 1 is a perspective view showing the configuration of the probe unit according to the first embodiment of the present invention. A probe unit 1 shown in FIG. 1 is an apparatus used when performing an electrical characteristic test on a semiconductor integrated circuit, which is an object to be inspected. This is an apparatus for electrically connecting the circuit board 200 that outputs a test signal. The connection electrode of the semiconductor package 100 is the lead 101 shown in FIG. 1 and is connected to the semiconductor integrated circuit.

The probe unit 1 is in contact with one connection electrode (lead 101) of the semiconductor package 100, which is a contact object, on one end side in the longitudinal direction, and different electrodes on the circuit board 200 on the other end side. A probe holder 3 that includes a plurality of probe groups 2 including two contact probes 2a (hereinafter simply referred to as “probes 2a”) that are in contact with each other, and that accommodates and holds the plurality of probe groups 2 according to a predetermined pattern; 3, and a holder member 4 that suppresses the occurrence of displacement of the semiconductor package 100 that contacts the plurality of probe groups 2 during inspection.

FIG. 2 is a partial cross-sectional view showing a detailed configuration of the probe group 2 accommodated in the probe holder 3, and is a cross section with a plane in a direction orthogonal to the arrangement direction of the probe group 2 as a cut surface. FIG. 3 is a partial cross-sectional view showing a detailed configuration of the probe group 2 accommodated in the probe holder 3, and is a cross section having a plane parallel to the arrangement direction of the probe group 2 as a cut surface. The probe group 2 shown in FIGS. 2 and 3 is formed by arranging two probes 2a formed using a conductive material in parallel so as to have the same height. Each probe group 2 is arranged in a direction orthogonal to the arrangement direction of the probes 2a.

The probe 2a includes a first plunger 21 that contacts the lead 101 of the semiconductor package 100 when inspecting the semiconductor integrated circuit, a second plunger 22 that contacts an electrode of the circuit board 200 provided with the inspection circuit, and a first plunger. A coil spring 23 is provided between the plunger 21 and the second plunger 22 so as to connect the two first plungers 21 and the second plunger 22 in a telescopic manner. The first plunger 21 and the second plunger 22 and the coil spring 23 constituting the probe 2a have the same axis. When the probe 2a is brought into contact with the semiconductor package 100, the coil spring 23 expands and contracts in the axial direction, so that the impact on the connection electrode of the semiconductor package 100 is reduced and a load is applied to the semiconductor package 100 and the circuit board 200. .

The first plunger 21 includes a distal end portion 21a having a tapered distal end shape, a flange portion 21b extending from the proximal end side of the distal end portion 21a and having a diameter larger than the diameter of the distal end portion 21a, and the distal end of the flange portion 21b. The boss 21c extends from an end different from the side connected to the portion 21a and has a smaller diameter than the diameter of the flange 21b, and the boss 21c extends from an end different from the side connected to the flange 21b of the boss 21c. And a base end portion 21d having a diameter substantially the same as the diameter of the first axis. Further, the base end portion 21d has a shape with a chamfered tip.

The distal end portion 21a extends from an end portion of the flange portion 21b that is substantially cylindrical from an end portion that is different from the side that is continuous with the boss portion 21c, and extends from an end portion that is different from the end portion of the base portion 211 that is continuous to the flange portion 21b. An inclined portion 212 having an inclined surface 212a (first inclined surface) formed by obliquely cutting the longitudinal direction of the base portion 211, an extending portion 213 extending from an end portion different from the side connected to the base portion 211 of the inclined portion 212, and The extending portion 213 has an inclined surface 214a (second inclined surface) that extends from an end different from the side connected to the inclined portion 212 and is obliquely cut with respect to the longitudinal direction of the extending portion 213. And a contact portion 214 that contacts the lead 101 of the semiconductor package 100.

The extending portion 213 has a flat surface portion 213a formed by cutting a part of the side surface of the cylinder in a planar shape along the longitudinal direction, and a cross section having a plane perpendicular to the longitudinal direction as a cut surface has a D-shape. .

The second plunger 22 has a distal end portion 22a having a tapered distal end shape, a flange portion 22b extending from the proximal end side of the distal end portion 22a and having a diameter larger than the diameter of the distal end portion 22a, and the distal end of the flange portion 22b. The boss portion 22c extends from an end different from the side connected to the portion 22a, has a diameter substantially the same as the diameter of the boss portion 21c, and extends from an end different from the side connected to the flange portion 22b of the boss portion 22c. A base end portion 22d having a diameter substantially the same as the diameter of 22c is coaxially provided. The second plunger 22 can move in the axial direction by the expansion and contraction action of the coil spring 23, is urged toward the circuit board 200 by the elastic force of the coil spring 23, and contacts the electrode of the circuit board 200. The second contact portion corresponds to the tip portion 22a and the flange portion 22b.

The coil spring 23 is a tightly wound portion 23a wound on the first plunger 21 side with an inner diameter substantially the same as the diameter of the boss portion 21c, while the second plunger 22 side has an inner diameter equal to or larger than the diameter of the base end portion 22d and a predetermined pitch. It is the rough winding part 23b wound around. For example, when the inner diameter of the tightly wound portion 23a is substantially equal to the boss portion 21c, the end portion is pressed into the boss portion 21c and is in contact with the flange portion 21b. On the other hand, the end of the rough winding portion 23b is press-fitted into the boss portion 22c and is in contact with the flange portion 22b. In addition, as for the coil spring 23, it is preferable that the internal diameter of the close_contact | adherence winding part 23a and the rough winding part 23b is wound by the same internal diameter. At this time, the first plunger 21 and the second plunger 22 and the coil spring 23 may be joined by soldering.

The wire rod used for the coil spring 23 has a base end portion 22d in a state in which the probe 2a is accommodated in the probe holder 3, for example, when the amount of contraction of the rough winding portion 23b when a predetermined load is applied is applied. A conductive metal having a spring characteristic (stroke) that is larger than the shortest distance between the contact winding portion 23a and the contact winding portion 23a is used. By using the coil spring 23 having this spring characteristic, when a predetermined load is applied to the probe 2a, the base end portion 22d is brought into sliding contact with the tightly wound portion 23a, and the proximal end portion 22d and the tightly wound portion 23a are in contact with each other. Can be electrically connected.

The probe holder 3 is formed using an insulating material such as resin, machinable ceramic, silicon, etc., and a first member 31 located on the upper surface side and a second member 32 located on the lower surface side in FIG. 2 are laminated. Become. The first member 31 and the second member 32 are formed with a holding portion including a long hole 33, a holder hole 34, and a holder hole 35 for accommodating a plurality of probes 2a. The formation positions of the long hole 33, the holder hole 34, and the holder hole 35 are determined according to the wiring pattern of the semiconductor package 100.

FIG. 4 is a diagram illustrating a configuration of a main part of the probe unit according to the first embodiment. The long hole 33 has an opening at the upper end surface of the probe holder 3 and extends along the arrangement direction of the probe group 2. In addition, the long hole 33 has a length in the width direction perpendicular to the longitudinal direction of the long hole 33 in the opening (length in the longitudinal direction and the direction perpendicular to the stacking direction of the first member 31) in each probe group 2. It is formed so as to be substantially the same as the distance between the extending portions 213 of the probe 2a. Here, the distance between the extending portions 213 refers to the distance between the flat surface portions 213a of the extending portions 213.

Both holder holes 34 and 35 have a stepped hole shape with different diameters along the penetration direction. That is, the holder hole 34 includes a small-diameter portion 34a having an opening continuous with the long hole 33, and a large-diameter portion 34b having a larger diameter than the small-diameter portion 34a. The small diameter portion 34a has a slightly larger diameter than the diameter of the base portion 211 of the distal end portion 21a. Further, the large diameter portion 34 b is a slightly larger diameter than the diameter of the flange portion 21 b and / or the diameter of the coil spring 23.

On the other hand, the holder hole 35 includes a small diameter portion 35a having an opening at the lower end surface of the probe holder 3, and a large diameter portion 35b having a diameter larger than the small diameter portion 35a. The small diameter portion 35a has a slightly larger diameter than the tip portion 22a. Further, the large diameter portion 35 b is a slightly larger diameter than the diameter of the flange portion 22 b and / or the diameter of the coil spring 23. The shapes of the holder holes 34 and 35 are determined according to the configuration of the probe 2a to be accommodated. The holder holes 34 and 35 are formed so that their axes coincide with each other.

The flange portion 21b of the first plunger 21 has a function of preventing the probe 2a from being removed from the probe holder 3 by contacting the boundary wall surface between the small diameter portion 34a and the large diameter portion 34b of the holder hole 34. Further, the flange portion 22b of the second plunger 22 has a function of preventing the probe 2a from being removed from the probe holder 3 by contacting the boundary wall surface between the small diameter portion 35a and the large diameter portion 35b of the holder hole 35. In the first plunger 21, the flat surface portion 213 a of the extending portion 213 is supported by being in contact with the inner wall surface of the long hole 33, whereby the tip position of the contact portion 214 is positioned. By forming one long hole 33, the tip positions of the probes 2a of the plurality of probe groups 2 can be collectively determined.

The probe group 2 includes a distance d1 between the tips of the contact portions 214 of the first plunger 21 and a tip of the tip portion 22a of the second plunger 22 when each probe 2a is accommodated by the long hole 33 and the holder holes 34 and 35. The distance d2 between them is different. Thus, according to the pitch of a contact object, the pitch of the 1st plunger 21 and the pitch of the 2nd plunger 22 can be varied, and it can contact with each contact object.

FIG. 5 is a view showing a state when a semiconductor integrated circuit using the probe holder 3 is inspected. When the semiconductor integrated circuit is inspected, the coil spring 23 is compressed along the longitudinal direction due to the contact load from the semiconductor package 100. When the coil spring 23 is compressed, as shown in FIG. 5, the base end portion 22d of the second plunger 22 enters the tightly wound portion 23a and is in sliding contact with the inner peripheral side of the tightly wound portion 23a. At this time, since the axis of the second plunger 22 is not greatly shaken, the sliding contact between the base end portion 22d and the inner periphery of the tightly wound portion 23a is stabilized, and the tightly wound portion 23a slightly meanders. The contact resistance between the base end portion 22d and the coil spring 23 is stabilized, and reliable conduction is obtained.

The inspection signals supplied from the circuit board 200 to the semiconductor integrated circuit at the time of inspection reach the leads 101 of the semiconductor package 100 from the

electrodes

201 and 202 of the circuit board 200 via the probes 2a. Specifically, the probe 2 a reaches the lead 101 of the semiconductor package 100 via the second plunger 22, the tightly wound portion 23 a, and the first plunger 21. In this manner, in the probe 2a, the first plunger 21 and the second plunger 22 are conducted through the tightly wound portion 23a, so that the electrical signal conduction path can be minimized. Therefore, it is possible to prevent a signal from flowing through the rough winding portion 23b during inspection, and to reduce and stabilize the inductance. The two

electrodes

201 and 202 are, for example, the electrode 201 being a measurement electrode (Sense) and the electrode 202 being a power transmission electrode (Force).

Further, since the tip of the contact portion 214 is tapered, even if an oxide film is formed on the surface of the lead 101, the oxide film is broken through and the tip of the contact portion 214 is brought into direct contact with the lead 101. be able to.

Next, the manufacturing method of the front-end | tip part 21a of the 1st plunger 21 is demonstrated. 6 to 8 are views for explaining a method of manufacturing the plunger of the probe unit according to the present embodiment. First, cutting is performed by bringing a cutting member 300 having a spindle shape into a spindle shape into contact with the tip of a columnar base material 210 serving as the tip 21a (see FIG. 6). At this time, the center axis of the base material 210 and the axis passing through the tip of the cutting member 300 are brought into contact with each other, and cutting is performed by moving the cutting member 300 in a direction orthogonal to the axis. By this cutting process, a processed base material 210a having a concave tip is obtained (see FIG. 7).

Then, the same cutting process is performed on the processed base material 210a at a position where the shaft passing through the tip of the cutting member 300 passes the side surface of the processed base material 210a. In the present embodiment, the processing is performed at a position where the axis passing through the tip of the cutting member 300 coincides with the side surface of the processing base material 210a. By this cutting process, it is possible to obtain the tip portion 21a having the above-described base portion 211, inclined portion 212, extending portion 213, and contact portion 214 and having a stepped shape in a side view (see FIG. 8). In addition, you may process in the position where the axis | shaft which passes the front-end | tip of the cutting member 300 is outside the side surface of the processing base material 210a.

The tip portion 21a obtained by the above-described cutting process includes an inclination angle of the inclined surface 212a of the inclined portion 212 and an inclination angle of the inclined surface 214a of the contact portion 214 with respect to the central axis (longitudinal direction) of the distal end portion 21a (base portion 211). Are equal. The length of the extended portion 213 formed in the longitudinal direction of the processed base material 210a may be at least longer than the length by which the first plunger 21 moves forward and backward with respect to the probe holder 3 when the semiconductor package 100 is inspected.

According to the first embodiment described above, the two probes 2a constituting the probe group 2 are held in the holder holes 34 and 35 with respect to the probe holder 3 in which the long hole 33 is formed, and each tip portion 21a. Since the tip portion of the contact portion 214 is positioned by bringing the flat surface portion 213a of the extending portion 213 in contact with the inner wall surface of the elongated hole 33, the positioning accuracy of the probe 2a in the probe group 2 is maintained and simplified. The probe 2a can be held with a simple configuration. Further, since the tip portion 214 of the probe 2a can be positioned only by adjusting the diameter of the opening of the long hole 33, a holding portion for holding the probe 2a can be easily formed.

Further, according to the first embodiment described above, the distal end portion 21a supports the extending portion 213 whose cross section is cut into a D shape by the columnar base portion 211. Even when the diameter is reduced by D-cutting, the strength of the distal end portion 21a can be maintained by the base 211, and the cross-sectional area of the distal end portion 21a for conducting electrical signals can be secured. Thereby, the strength of the first plunger 21 with respect to the load from the semiconductor package 100 is ensured, and stable contact with the lead 101 is realized, and deformation (bending) of the distal end portion 21a due to repeated use is suppressed. it can. In addition, by securing a cross-sectional area with the base 211, a decrease in the specific resistance and high-frequency characteristics of the first plunger 21 is suppressed and stable transmission of electric signals is realized compared to a tip that is not D-cut. can do.

In addition, according to the first embodiment described above, by processing with the same cutting member, the inclination angle of the inclined surface 212a of the inclined portion 212 and the inclined angle of the inclined surface 214a of the contact portion 214 with respect to the central axis of the tip portion 21a. Therefore, the first plunger 21 that can secure the cross-sectional area of the distal end portion 21a for conducting electrical signals can be easily manufactured.

(Modification of Embodiment 1)
FIG. 9 is a diagram illustrating the configuration of the plunger of the probe unit according to the modification of the first embodiment. In the first embodiment described above, it has been described that the tip of the contact portion 214 of the tip portion 21a has one sharp end that is tapered. , May have two sharp ends.

The distal end portion 21e shown in FIG. 9 extends from the base 211, the inclined portion 212, the extending portion 213, and an end portion different from the side connected to the inclined portion 212 of the extending portion 213, and the longitudinal direction of the extending portion 213. And a contact portion 215 having two

sharp ends

215b and 215c that contact the lead 101 of the semiconductor package 100 at the tip.

The inclined surface 215a is formed by the cutting member 300 in the same manner as the contact portion 214 described above. That is, the inclination angle of the inclined surface 215a with respect to the central axis of the distal end portion 21e (base portion 211) is equal to the inclination angle of the inclined surface 212a of the inclined portion 212. The two

sharp ends

215b and 215c are formed by the same cutting member 300 as the inclined surface 215a, and each has a tapered shape. In this case, the angle formed by the opposing wall surfaces of the two

sharp ends

215b and 215c is twice the inclination angle of the inclined surface 212a of the inclined portion 212 (inclination angle of the inclined surface 215a). Further, the distance between the tips of the sharp ends 215b and 215c is formed to be smaller than the distance of the lead 101 (the distance in the same direction as the distance between the tips of the sharp ends 215b and 215c). The distance between the tips of the sharp ends 215b and 215c can be adjusted by adjusting the processing depth (distance in the central axis direction) by the cutting member 300.

Also in the tip portion 21e according to the modification, the tip portion of the contact portion 215 can be positioned by arranging the flat portion 213a in contact with the inner wall surface of the long hole 33.

Further, the tip portion 21e according to the modified example comes into contact with the lead 101 by two

sharp ends

215b and 215c. At this time, contact between the sharp ends 215 b and 215 c and the lead 101 is two-point contact with the main surface of the lead 101 by the two

sharp ends

215 b and 215 c. Therefore, the tip portion 21e can further stabilize the contact state with the lead 101 against the contact load applied by the semiconductor package 100, as compared with the tip portion 21a.

Further, according to the modification, the inclined surface 215a and the sharpened ends 215b and 215c are formed by the same cutting member 300, so that the first plunger can be easily manufactured.

In addition, in the front-end | tip part 21e concerning this modification, the sharp ends 215b and 215c are further cut by the cutting member 300, and it is good also as what has four or more sharp ends.

(Embodiment 2)
Next, a second embodiment of the present invention will be described. FIG. 10 is a partial cross-sectional view showing the configuration of the main part of the probe unit according to the second embodiment of the present invention. In addition, the same code | symbol is attached | subjected to the same component as the component mentioned above in FIG. In the first embodiment described above, when the first plunger 21 is replaced, the entire probe 2 is taken out from the probe holder 3, but in the second embodiment, only the first plunger 21 is replaced.

The probe unit according to the second embodiment has a probe 2b and a probe holder 5 instead of the probe 2a and the probe holder 3 described above. The probe 2b includes a first plunger 24 that contacts the lead 101 of the semiconductor package 100 when inspecting the semiconductor integrated circuit, a second plunger 22 that contacts an electrode of the circuit board 200 including the inspection circuit, and a first plunger 2b. A coil spring 23 is provided between the plunger 24 and the second plunger 22 and connects the first plunger 24 and the second plunger 22 in a telescopic manner.

The first plunger 24 and the second plunger 22 and the coil spring 23 constituting the probe 2b have the same axis. When the probe 2b contacts the semiconductor package 100, the coil spring 23 expands and contracts in the axial direction, so that the impact on the connection electrode of the semiconductor package 100 is reduced and a load is applied to the semiconductor package 100 and the circuit board 200. .

The first plunger 24 includes a distal end portion 24a having a tapered distal end shape, a flange portion 24b extending from the proximal end side of the distal end portion 24a and having a diameter larger than the diameter of the distal end portion 24a, and the distal end of the flange portion 24b. A base end portion 24c that extends in a substantially columnar shape from an end different from the side continuous with the portion 24a and has a smaller diameter than the diameter of the flange portion 24b is substantially coaxial.

The distal end portion 24a extends from an end portion on the side different from the side continuous with the base end portion 24c of the flange portion 24b, and extends from an end portion different from the side continuous with the flange portion 24b of the base portion 241. An inclined portion 242 having an inclined surface 242a (first inclined surface) obtained by obliquely cutting the longitudinal direction of the base portion 241, and an extending portion 243 extending from an end portion different from the side connected to the base portion 241 of the inclined portion 242 The extending portion 243 has an inclined surface 244a (second inclined surface) that extends from an end different from the side connected to the inclined portion 242 and is cut obliquely with respect to the longitudinal direction of the extending portion 243. A contact portion 244 that contacts the lead 101 of the semiconductor package 100 at the tip.

The extending portion 243 has a flat surface portion 243a formed by cutting a part of the side surface of the cylinder in a planar shape along the longitudinal direction, and a cross section having a plane perpendicular to the longitudinal direction as a cut surface has a D-shape. .

The probe holder 5 is formed using an insulating material such as resin, machinable ceramic, or silicon, and the first member 51 located on the upper surface side and the second member 52 located on the lower surface side in FIG. 10 are detachable. It is laminated. The first member 51 is formed by laminating a first laminated member 511 located on the upper surface side in FIG. 10 and a second laminated member 512 located on the lower surface side.

The first member 51 and the second member 52 are formed with a holding portion including a long hole 513, a holder hole 514, a holder hole 515, and a holder hole 521 for accommodating a plurality of probes 2b. The formation positions of the long hole 513, the holder hole 514, the holder hole 515, and the holder hole 521 are determined according to the wiring pattern of the semiconductor package 100.

The long hole 513 is formed in the first member 51, has an opening at the upper end surface of the probe holder 5, and extends along the arrangement direction of the probe group. Further, the long hole 513 has a length in the width direction perpendicular to the longitudinal direction of the long hole 513 in the opening (length in the longitudinal direction and the direction perpendicular to the stacking direction of the first members 51). The distance between the portions 243 is substantially the same. Here, the distance between the extending portions 243 refers to the distance between the flat portions 243a of the extending portions 243.

Both holder holes 514 and 515 have a stepped hole shape with different diameters along the penetration direction. That is, the holder hole 514 includes a small-diameter portion 514a having an opening continuous with the long hole 513, and a large-diameter portion 514b having a larger diameter than the small-diameter portion 514a. The small diameter portion 514a has a slightly larger diameter than the diameter of the base portion 241 of the distal end portion 24a. Further, the large diameter portion 514b is slightly larger than the diameter of the flange portion 24b.

On the other hand, the holder hole 515 includes a small-diameter portion 515a having an opening at the lower end surface of the first member 51, and a large-diameter portion 515b having a larger diameter than the small-diameter portion 515a. The small diameter portion 515a has a slightly larger diameter than the diameter of the base end portion 24c. The large diameter portion 515b is slightly larger than the diameter of the flange portion 24b. The shapes of the holder holes 514 and 515 are determined according to the configuration of the probe 2b to be accommodated. The holder holes 514 and 515 are formed so that their axes coincide with each other.

The holder hole 521 includes a small-diameter portion 521a having an opening at the lower end surface of the probe holder 5, and a large-diameter portion 521b having a larger diameter than the small-diameter portion 521a. The small diameter portion 521a has a slightly larger diameter than the tip portion 22a. The large diameter portion 521b has a slightly larger diameter than the diameter of the flange portion 22b and / or the diameter of the coil spring 23.

The flange portion 24b of the first plunger 24 is held in a hollow space formed by the large diameter portion 514b of the holder hole 514 and the large diameter portion 515b of the holder hole 515, and the boundary between the small diameter portion 514a and the large diameter portion 514b. By contacting the wall surface or the boundary wall surface between the small diameter portion 515a and the large diameter portion 515b, the first plunger 24 has a function of preventing the first plunger 24 from being removed from the first member 51. Further, the flange portion 22b of the second plunger 22 has a function of preventing the probe 2b from being removed from the probe holder 5 by coming into contact with the boundary wall surface between the small diameter portion 521a and the large diameter portion 521b of the holder hole 521.

In the first plunger 24, the flat portion 243a of the extending portion 243 is supported by being in contact with the inner wall surface of the long hole 513, whereby the tip position of the contact portion 244 is positioned. By forming one long hole 513, the tip positions of the probes 2b of the plurality of probe groups can be collectively determined.

Here, in the second embodiment, the first member 51 and the second member 52 are detachably provided, and the base end portion 24c and the tightly wound portion 23a of the first plunger 24 are the same as those described above. It is not connected by press-fitting like the boss portion 21c and the tightly wound portion 23a of the first embodiment, but is connected by contact to ensure electrical conduction.

Therefore, when replacing the first plunger 24, the first member 51 is removed from the second member 52, and the first member 51 holding the first plunger 24 to be replaced is newly attached to the second member 52. The first plunger 24 can be easily replaced.

In order to easily attach the first member 51 and the second member 52 in a predetermined arrangement, for example, a convex protrusion is provided on one surface of the opposing surface of the first member 51 and the second member 52, It is preferable that positioning can be performed by providing a concave hole that can be fitted to the protrusion on the other surface.

According to the second embodiment described above, the probe holder 5 in which the long hole 513 is formed in the first member 51, the two probes 2b constituting the probe group are replaced by the holder hole 514, the holder hole 515, and the holder hole 521. Since the flat portion 243a of the extending portion 243 and the inner wall surface of the elongated hole 513 are brought into contact with each other to position the tip of the contact portion 244, the probe 2b in the probe group The positioning accuracy can be maintained, and the probe 2b can be held with a simple configuration. Further, since the distal end portion 244 of the probe 2b can be positioned only by adjusting the diameter of the opening of the long hole 513, a holding portion for holding the probe 2b can be easily formed.

Further, according to the second embodiment described above, the first member 51 that is detachably stacked with the second member 52 holds the first plunger 24, so that the first member 51 can be replaced by simply replacing the first member 51. The plunger 24 can be easily replaced.

(Modification of Embodiment 2)
FIG. 11 is a partial cross-sectional view illustrating a configuration of a main part of a probe unit according to a modification of the second embodiment of the present invention. The probe unit according to this modification includes a probe 2c and a probe holder 5a instead of the probe 2a and the probe holder 3 described above. The probe 2c includes a first plunger 25 that contacts the lead 101 of the semiconductor package 100 when inspecting the semiconductor integrated circuit, a second plunger 22 that contacts an electrode of the circuit board 200 including the inspection circuit, and a first A coupling member 26 provided between the plunger 25 and the second plunger 22, and a coil spring 23 provided between the second plunger 22 and the coupling member 26 to connect the second plunger 22 and the coupling member 26 in a telescopic manner. With.

The first plunger 25 and the second plunger 22, the connecting member 26, and the coil spring 23 constituting the probe 2c have the same axis. When the probe 2c is brought into contact with the semiconductor package 100, the coil spring 23 expands and contracts in the axial direction to reduce the impact on the connection electrode of the semiconductor package 100, and applies a load to the semiconductor package 100 and the circuit board 200. .

The first plunger 25 has a distal end portion 25a having a tapered distal end shape, a flange portion 25b extending from the proximal end side of the distal end portion 25a and having a diameter larger than the diameter of the distal end portion 25a, and the distal end of the flange portion 25b A base end portion 25c that extends in a substantially columnar shape from an end different from the side continuous with the portion 25a and has a smaller diameter than the diameter of the flange portion 25b is provided substantially coaxially.

The distal end portion 25a extends from an end portion on a side different from the side continuous with the base end portion 25c of the flange portion 25b, and extends from a different end portion from the end portion connected to the flange portion 25b of the base portion 251. An inclined portion 252 having an inclined surface 252a (first inclined surface) obtained by obliquely cutting the longitudinal direction of the base portion 251; and an extending portion 253 extending from an end portion different from the side connected to the base portion 251 of the inclined portion 252. The extending portion 253 has an inclined surface 254a (second inclined surface) that extends from an end different from the side connected to the inclined portion 252 and is cut obliquely with respect to the longitudinal direction of the extending portion 253. A contact portion 254 that contacts the lead 101 of the semiconductor package 100 at the tip.

The extending portion 253 has a flat surface portion 253a formed by cutting a part of the side surface of the cylinder into a flat shape along the longitudinal direction, and a cross section having a plane perpendicular to the longitudinal direction as a cut surface has a D-shape. .

The connecting member 26 is formed using a conductive material, and has a distal end portion 26a having a tapered distal end shape, and a flange portion extending from the proximal end side of the distal end portion 26a and having a diameter larger than the diameter of the distal end portion 26a. 26b and a boss portion 26c extending from a different end portion from the side of the flange portion 26b connected to the tip end portion 26a and having a smaller diameter than the diameter of the flange portion 26b, and different from the side of the boss portion 26c connected to the flange portion 26b. A base end portion 26d extending from the end portion and having substantially the same diameter as the diameter of the boss portion 26c is substantially coaxial.

The coil spring 23 is a tightly wound portion 23a wound on the first plunger 25 side with an inner diameter substantially the same as the diameter of the base end portion 25c, while the second plunger 22 side has a predetermined inner diameter greater than the diameter of the base end portion 22d. It is the rough winding part 23b wound by the pitch. For example, when the inner diameter of the tightly wound portion 23a has an inner diameter substantially equal to that of the boss portion 25c, the end portion is pressed into the boss portion 25c and is in contact with the flange portion 25b.

The probe holder 5a is formed using an insulating material such as resin, machinable ceramic, or silicon, and the first member 53 located on the upper surface side and the second member 54 located on the lower surface side in FIG. 10 are detachable. It is laminated. The first member 53 is formed by laminating a first laminated member 531 located on the upper surface side in FIG. 10 and a second laminated member 532 located on the lower surface side. The second member 54 is formed by laminating a first laminated member 541 located on the upper surface side in FIG. 10 and a second laminated member 542 located on the lower surface side.

The first member 53 and the second member 54 are formed with a holding portion including a long hole 533, a holder hole 534, a holder hole 535, a holder hole 543, and a holder hole 544 for accommodating a plurality of probes 2c. The formation positions of the long hole 533, the holder hole 534, the holder hole 535, the holder hole 543, and the holder hole 544 are determined according to the wiring pattern of the semiconductor package 100.

The long hole 533 is formed in the first member 53, has an opening at the upper end surface of the probe holder 5a, and extends along the arrangement direction of the probe group. In addition, the long hole 533 has a length in the width direction perpendicular to the longitudinal direction of the long hole 533 in the opening (length in the longitudinal direction and a direction perpendicular to the stacking direction of the first member 53). The distance between the portions 253 is substantially the same. Here, the distance between the extending portions 253 refers to the distance between the flat surface portions 253a of the extending portions 253.

Both holder holes 534 and 535 have a stepped hole shape with different diameters along the penetration direction. That is, the holder hole 534 includes a small diameter portion 534a having an opening continuous with the long hole 533, and a large diameter portion 534b having a larger diameter than the small diameter portion 534a. The small diameter portion 534a has a slightly larger diameter than the diameter of the base portion 251 of the distal end portion 25a. Further, the large diameter portion 534b is slightly larger than the diameter of the flange portion 25b.

On the other hand, the holder hole 535 penetrates from the upper end surface of the second laminated member 532 toward the lower end surface. The holder hole 535 has a slightly larger diameter than the diameter of the base end portion 25c. The shapes of the holder holes 534 and 535 are determined according to the configuration of the probe 2c to be accommodated. Holder holes 534 and 535 are formed so that their axes coincide with each other.

The flange portion 25b of the first plunger 25 is held in a hollow space formed by the large diameter portion 534b of the holder hole 534 and the upper end surface of the second laminated member 532, and the small diameter portion 534a and the large diameter portion 534b The first plunger 25 is prevented from being removed from the first member 53 by contacting the boundary wall surface of the first plunger 25 or the boundary wall surface of the large-diameter portion 534 b and the upper end surface of the second laminated member 532.

Further, in the first plunger 25, the flat portion 253a of the extending portion 253 is supported in contact with the inner wall surface of the long hole 533, whereby the tip position of the contact portion 254 is positioned. By forming one long hole 533, the tip position of each probe 2c of a plurality of probe groups can be collectively determined.

Both holder holes 543 and 544 have stepped hole shapes with different diameters along the penetration direction. That is, the holder hole 543 includes a small-diameter portion 543a having an opening on the upper end surface of the second member 54, and a large-diameter portion 543b having a larger diameter than the small-diameter portion 543a. The small diameter part 543a has a slightly larger diameter than the diameter of the tip end part 26a. Further, the large diameter portion 543b is slightly larger than the diameter of the flange portion 26b and / or the diameter of the coil spring 23. Further, the length of the small diameter portion 543a in the penetration direction is shorter than the length of the distal end portion 26a in the longitudinal direction.

On the other hand, the holder hole 544 includes a small-diameter portion 544a having an opening at the lower end surface of the probe holder 5a and a large-diameter portion 544b having a larger diameter than the small-diameter portion 544a. The small diameter portion 544a has a slightly larger diameter than the tip portion 22a. The large diameter portion 544b is slightly larger than the diameter of the flange portion 22b and / or the diameter of the coil spring 23. The shapes of the holder holes 543 and 544 are determined according to the configuration of the probe 2c to be accommodated. Holder holes 543 and 544 are formed so that their axes coincide with each other.

The flange portion 26b of the connecting member 26 has a function of preventing the probe 2c from being removed from the second member 54 by contacting the boundary wall surface between the small diameter portion 543a and the large diameter portion 543b of the holder hole 543. The flange portion 22b of the second plunger 22 has a function of preventing the probe 2c from being removed from the second member 54 by abutting against the boundary wall surface between the small diameter portion 544a and the large diameter portion 544b of the holder hole 544. In this modification, the tip end portion 26 a protrudes from the upper surface of the first laminated member 541 in a state where at least the flange portion 26 b is in contact with the boundary wall surface between the small diameter portion 543 a and the large diameter portion 543 b.

Here, in this modification, the 1st member 53 and the 2nd member 54 are provided so that attachment or detachment is possible, and the base end part 25c and the connection member 26 of the 1st plunger 25 are the above-mentioned Embodiment 1. FIG. It is not connected by press-fitting like the boss portion 21c and the tightly wound portion 23a, but is connected by contact to ensure electrical conduction.

Therefore, when replacing the first plunger 25, the first member 53 is removed from the second member 54, and the first member 53 holding the first plunger 25 to be replaced is newly attached to the second member 54. The first plunger 25 can be easily replaced.

According to the modified example described above, the two probes 2c constituting the probe group are replaced with the holder hole 534, the holder hole 535, the holder hole 543, and the holder with respect to the probe holder 5a in which the long hole 533 is formed in the first member 53. Since the tip portion of the contact portion 254 is positioned by contacting the flat portion 253a of the extending portion 253 and the inner wall surface of the elongated hole 533 while being held in the hole 544, in the probe group While maintaining the positioning accuracy of the probe 2c, the probe 2c can be held with a simple configuration. Further, since the distal end portion 254 of the probe 2c can be positioned only by adjusting the diameter of the opening of the long hole 533, a holding portion for holding the probe 2c can be easily formed.

Further, according to the above-described modification 2-1, since the first member 53 that is detachably stacked with the second member 54 holds the first plunger 25, the first member 53 can be replaced by simply replacing the first member 53. 1 Plunger 25 can be easily replaced.

Further, according to the above-described modification 2-1, when the first member 53 is laminated on the second member 54, the tip end portion 26a protrudes from the upper surface of the first laminated member 541 by the coil spring 23. The part 26 a is inserted into the holder hole 535. At this time, since the distal end portion 26a serves as a positioning pin when the first member 53 is stacked on the second member 54, the first member 53 can be easily stacked on the second member 54.

Note that the shapes of the

contact portions

244 and 254 according to the second embodiment and the modified example 2-1 described above may have a plurality of sharp edges as in the modified example 1-1 described above.

In the first and second embodiments described above, the end wall of each flange portion and the boundary wall surface between the large-diameter portion and the small-diameter portion of the holder hole may be tapered. Thereby, positioning in the direction perpendicular to the axial direction of the probe when the probe is attached to the holder can be performed more reliably.

Moreover, although the 2nd contact part demonstrated as what was the front-end | tip part 22a and the flange part 22b, when attaching as a part of probe unit 1 as shown in FIG. 1, a 2nd contact part is only the flange part 22b. As a configuration, the tip of the flange portion 22b may be in contact with the electrode.

In addition, the probe 2a used in the probe group 2 is not limited to the above-described plunger and coil spring as long as the tip can be positioned by contacting the inner wall surface of the long hole 33, and the tip described above. A pogo pin having a portion, or a wire probe that obtains a load by bending a wire into a bow shape may be used. Also in the

probes

2b and 2c, a pogo pin or a wire probe may be used instead of the second plunger 22, the coil spring 23, and the connecting member 26 that are in contact with the

first plungers

24 and 25. Further, the connection electrode may be hemispherical in addition to a flat plate like the lead 101.

As described above, the probe unit according to the present invention is useful for maintaining the contact probe positioning accuracy in the probe group and holding the contact probe with a simple configuration.

1 Probe unit 2

Probe group

2a, 2b, 2c Contact probe (probe)
3, 5, 5a Probe holder 4

Holder member

21, 24, 25

First plunger

21a, 21e, 22a, 24a, 25a,

26a Tip portion

21b, 22b, 24b, 25b,

26b Flange portion

21c, 22c,

26c Boss portion

21d , 22d, 24c, 25c, 26d Base end portion 22 Second plunger 23 Coil spring 23a Closely wound portion 23b Coarse winding portion 26 Connecting

member

31, 51, 53

First member

32, 52, 54

Second member

33, 513, 533

Long holes

34, 35, 514, 515, 521, 534, 535, 543, 544

Holder holes

34a, 35a, 514a, 515a, 521a, 534a, 543a, 544a

Small diameter portions

34b, 35b, 514b, 515b, 521b, 534b, 543b, 544b Large diameter portion 100 Semiconductor package 101 Lead 200

Circuit board

201, 202

Electrode

211, 241, 251

Base

212, 242, 252

Inclined part

212a, 214a, 215a, 242a, 244a, 252a, 254

Inclined surface

213, 243, 253 Extending

part

213a, 243a,

253a Plane portion

214, 215, 244, 254

Contact portion

215b, 215c

Sharp end

511, 531, 541 First

laminated member

512, 532, 542 Second laminated member

Claims

A plurality of probe groups each including two contact probes that are in contact with one electrode to be contacted on one end side in the longitudinal direction, and a probe holder that holds the contact probes, each contact probe having the other contact probe A probe unit that comes into contact with different electrodes on the substrate on the end side,
The contact probe is
A base extending in a columnar shape;
An inclined portion having a first inclined surface extending from the base portion and inclined with respect to the longitudinal direction of the base portion;
An extending portion having a flat surface portion extending from an end portion different from the side connected to the base portion of the inclined portion and forming a plane parallel to the longitudinal direction of the base portion;
The extending portion extends from an end different from the side connected to the inclined portion, and has a second inclined surface whose inclination angle with respect to the longitudinal direction of the base portion is equal to the inclined angle of the first inclined surface, A contact portion that contacts one electrode of the contact target,
Have
In the probe holder,
A plurality of holder holes for holding a plurality of the contact probes;
An elongated hole having an opening on the upper end surface of the probe holder, communicating with one end of the plurality of holder holes, and supporting the flat portion on an inner wall surface and arranging the plurality of contact probes along the inner wall surface When,
A probe unit in which is formed.
The contact portion is formed at the tip, and has a plurality of sharp ends each having a tapered shape,
2. The probe unit according to claim 1, wherein an angle formed by opposing wall surfaces of two adjacent sharp ends among the plurality of sharp ends is twice the inclination angle of the first inclined surface.
The said long hole is parallel to the arrangement direction of the said probe group, and is extended in the direction orthogonal to the direction where the said contact probe which comprises the said probe group mutually opposes. Probe unit.
The contact probe is
A flange portion extending from an end portion different from the side connected to the inclined portion of the base portion and having a diameter larger than the diameter of the base portion;
The probe unit according to claim 3, wherein the flange portion is held by the probe holder by contacting the probe holder.
The contact probe is
A first plunger having the base, the inclined portion, the extending portion and the contact portion;
A second plunger in contact with the electrode of the substrate;
A coil spring provided between the first and second plungers to connect the first and second plungers in a telescopic manner;
Have
The probe holder is
A first member in which the elongated hole is formed and holds the first plunger;
A second member that holds the second plunger and the coil spring, and is detachable from the first member;
The probe unit according to any one of claims 1 to 4, characterized by comprising: