TWM450049U - Semiconductor package heat carrying device having extended communication channel structure - Google Patents
Semiconductor package heat carrying device having extended communication channel structure Download PDFInfo
- Publication number
- TWM450049U TWM450049U TW101222440U TW101222440U TWM450049U TW M450049 U TWM450049 U TW M450049U TW 101222440 U TW101222440 U TW 101222440U TW 101222440 U TW101222440 U TW 101222440U TW M450049 U TWM450049 U TW M450049U
- Authority
- TW
- Taiwan
- Prior art keywords
- cavity
- communication channel
- motor
- extended communication
- semiconductor package
- Prior art date
Links
Landscapes
- Muffle Furnaces And Rotary Kilns (AREA)
- Engineering & Computer Science (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Pressure Vessels And Lids Thereof (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
Description
本創作係關於一種應用於半導體晶片封裝過程之載熱裝置之設計,特別是關於一種具有延伸連通腔道結構之半導體封裝載熱裝置。The present invention relates to the design of a heat carrying device for use in a semiconductor wafer packaging process, and more particularly to a semiconductor package heat carrying device having an extended communicating channel structure.
在習知之半導體晶片封裝過程中,必須先從晶圓切割出適當大小之晶片,再將其黏附於一載板上(載板可為一基板或可為一導線架等各種可以承載晶片用以聯繫外部電子訊號用之承載物)。在黏附之過程中,膠著材料中會產生許多氣泡,造成老化後之膠著材料中會有空腔而影響產品的可靠性、品質。In a conventional semiconductor chip packaging process, a wafer of a suitable size must be first cut from a wafer and then adhered to a carrier (the carrier can be a substrate or can be a lead frame and the like can be used for carrying a wafer) Contact the carrier for external electronic signals). During the process of adhesion, many bubbles are generated in the adhesive material, which causes a cavity in the adhesive material after aging, which affects the reliability and quality of the product.
傳統之方法有利用模壓膠體成型過程中短暫的高溫高壓條件,使膠著材料之膠層氣泡排出。或是藉由真空方式使氣泡由膠著材料之膠層中排除。或是藉由調整上晶片機之製程參數及製具使晶片與膠著材料界面間達到無氣泡。The traditional method utilizes the short-term high temperature and high pressure conditions in the molding process of the molding colloid to discharge the rubber layer bubbles of the adhesive material. Or by means of vacuum, the bubbles are excluded from the glue layer of the glue material. Or by adjusting the process parameters and the tool of the upper wafer machine to achieve no bubble between the wafer and the bonding material interface.
如中華民國公告號第257314號,其係揭露一種工業用恆溫高壓鍋裝置,其特徵在於壓力鍋內密閉端上,有一以數支固定柱固定之電熱裝置,用以供應鍋體內熱能;前述電熱裝置中央,設有攪拌裝置之風扇,該風扇之驅動軸經結合於鍋體外緣軸承座,伸出鍋體外以皮帶與驅動馬達相連接。For example, the Republic of China Announcement No. 257314 discloses an industrial constant temperature pressure cooker device characterized in that an electric heating device fixed by a plurality of fixed columns is provided on the closed end of the pressure cooker for supplying heat energy in the pot; the central part of the electric heating device The fan is provided with a stirring device, and the driving shaft of the fan is coupled to the bearing housing of the outer edge of the pan, and is extended outside the body to be connected with the driving motor by a belt.
藉由該鍋體外之驅動馬達,驅動前述電熱裝置中央之風扇旋轉,用以攪拌鍋體內受熱之高壓氣體,以達鍋體內高壓 氣體恆溫精度在3℃以內者。此工業用恆溫高壓鍋裝置即是在半導體晶片封裝過程中,用以去除氣泡之一種裝置。Driving the motor in the center of the electric heating device by the driving motor outside the pot to stir the heated high-pressure gas in the pot body to reach the high pressure in the pot body The gas temperature accuracy is within 3 °C. This industrial constant temperature pressure cooker device is a device for removing air bubbles during semiconductor chip packaging.
然而在習知技術中,為使加熱效果均勻,其在鍋體內裝置有一渦輪風扇,並結合一驅動軸且穿置於鍋體,在穿置部份結合有一軸封單元用以有效阻隔鍋體內外高壓差的問題。However, in the prior art, in order to make the heating effect uniform, a turbo fan is arranged in the pot body, and a driving shaft is coupled to the pot body, and a shaft sealing unit is coupled to the piercing portion for effectively blocking the pot body. The problem of high pressure difference between inside and outside.
而此軸封單元由於同時接觸該鍋體內部之高溫、高壓環境,且同時接觸外面常溫、常壓之環境,在長時間承受極大溫差與壓差之狀態下,造成該軸封單元易於損壞,在短時間內即需要更新之問題。此種問題會造成零組件花費成本大、頻繁更換耗費人力及停機造成產能降低等缺點。The shaft sealing unit is exposed to the high temperature and high pressure environment inside the pot body at the same time, and at the same time contacts the environment of normal temperature and normal pressure outside, and the shaft sealing unit is easily damaged in the state of being subjected to a great temperature difference and a pressure difference for a long time. The problem needs to be updated in a short time. Such problems can cause disadvantages such as high cost of components, frequent manpower replacement, and reduced capacity due to downtime.
緣此,本創作之主要目的即是提供一種具有延伸連通腔道結構之半導體封裝載熱裝置,利用其驅動馬達在結構上之設計以避免軸封之使用,故無前述之缺點。Accordingly, the main purpose of the present invention is to provide a semiconductor package heat carrying device having an extended communication channel structure, which is designed to avoid the use of the shaft seal by using the drive motor, so that there is no such disadvantage.
本創作之另一目的是提供一種可應用於半導體封裝加工時均勻加熱之載熱裝置,藉由連接一加壓控制組件,使載熱裝置可維持一預定之壓力,並在載熱裝置中裝置有一渦輪風扇轉動,並以馬達驅動渦輪風扇轉動,以使載熱裝置中之高溫氣體流動,使置於載熱裝置之半導體材料可均勻地受熱。Another object of the present invention is to provide a heat carrying device that can be applied to uniform heating during semiconductor package processing. By connecting a pressurization control assembly, the heat carrying device can maintain a predetermined pressure and is installed in the heat carrying device. A turbo fan rotates and drives the turbo fan to rotate by the motor to flow the high temperature gas in the heat carrying device, so that the semiconductor material placed on the heat carrying device can be uniformly heated.
本創作為解決習知技術之問題所採用之技術手段係主要在一具有延伸連通腔道結構之半導體封裝載熱裝置之設計上,腔體之延伸連通腔道結合端結合有一具有預定延伸長度及縮小口徑供容置傳動軸通過之延伸連通腔道。The technical means used in the present invention to solve the problems of the prior art is mainly in the design of a semiconductor package heat carrying device having an extended communication channel structure, the extended connecting channel junction end of the cavity is combined with a predetermined extension length and The reduced diameter is provided for the passage of the drive shaft through the extended communication passage.
在延伸連通腔道中配置有至少一用以支持傳動軸之軸承單元,再於延伸連通腔道結合一用以容置驅動馬達之馬達承置腔室,馬達承置腔室由延伸連通腔道與腔體保持一等壓腔室壓力,以使該驅動馬達處於一等壓之環境,且可避免使用軸封單元之使用。At least one bearing unit for supporting the drive shaft is disposed in the extended communication passage, and a motor bearing chamber for accommodating the drive motor is coupled to the extended communication passage, and the motor receiving chamber is extended from the communication passage The chamber maintains an isostatic chamber pressure to place the drive motor in an equal pressure environment and avoids the use of a shaft seal unit.
經由本創作所採用之技術手段,可以避免習知技術之軸封單元因長時間承受鍋體內之高壓與高溫,而導致頻繁更換零組件及人力之浪費,亦可避免因停機影響產能。Through the technical means adopted by the creation, the shaft sealing unit of the prior art can be prevented from being subjected to frequent replacement of components and manpower waste due to the high pressure and high temperature in the pot body for a long time, and the production capacity due to the shutdown can be avoided.
此外,在延伸連通腔道之外環面設有一冷卻裝置,可使馬達承置腔室與腔體形成一溫度差,增加馬達之工作壽命。In addition, a cooling device is disposed on the annular surface outside the extended communication channel, so that the motor receiving chamber forms a temperature difference with the cavity to increase the working life of the motor.
再者,延伸連通腔道係藉由至少一法蘭單元及至少一固定元件結合於腔體,而馬達承置腔室係藉由至少一固定元件結合於延伸連通腔道,可使馬達及渦輪風扇便於拆卸,減少驅動馬達及渦輪風扇維修保養或替換之工作時間及人力成本。Furthermore, the extended communication channel is coupled to the cavity by at least one flange unit and at least one fixing component, and the motor bearing cavity is coupled to the extended communication channel by at least one fixing component to enable the motor and the turbine The fan is easy to disassemble, reducing the working time and labor cost of the maintenance and replacement of the drive motor and turbofan.
本創作所採用的具體實施例,將藉由以下之實施例及附呈圖式作進一步之說明。The specific embodiments of the present invention will be further described by the following examples and accompanying drawings.
參閱第1圖及第2圖,其中第1圖係顯示本創作第一實施例之部分分解示意圖,第2圖係顯示本創作第一實施例之組合示意圖。如圖所示,本創作之載熱裝置100,包括有一腔體1、一門體2、一延伸連通腔道3及一馬達承置腔室4。其中門體2係可活動地結合於腔體1前端。Referring to FIG. 1 and FIG. 2, FIG. 1 is a partially exploded perspective view showing the first embodiment of the present creation, and FIG. 2 is a schematic view showing the combination of the first embodiment of the present creation. As shown in the figure, the heat carrying device 100 of the present invention comprises a cavity 1, a door body 2, an extended communication channel 3 and a motor receiving chamber 4. The door body 2 is movably coupled to the front end of the cavity 1.
腔體1內部形成一容置空間10以及定義有一延伸連通腔道結合端15,容置空間10裝置有一托置承架11及至少一加熱裝置12。托置承架11可放置一待加熱標的物,該待加熱標的物可以是一半導體晶片。An accommodating space 10 is defined in the cavity 1 and an extended connecting channel connecting end 15 is defined. The accommodating space 10 is provided with a supporting frame 11 and at least one heating device 12. The tray 11 can be placed with a target to be heated, and the object to be heated can be a semiconductor wafer.
加熱裝置12包括有一加熱承座121與一加熱管122,其中加熱承座121係位於容置空間10中之一預定位置,而加熱管122係環設於加熱承座121外,具有在容置空間10中加熱之作用,以加熱容置空間10及一預定升溫速率。The heating device 12 includes a heating socket 121 and a heating tube 122. The heating socket 121 is located at a predetermined position in the accommodating space 10, and the heating tube 122 is disposed outside the heating socket 121 and has a receiving position. The heating in the space 10 acts to heat the accommodating space 10 and a predetermined heating rate.
此外,腔體1之容置空間10中設有一渦輪風扇43,並經由凸伸出腔體1之延伸連通腔道結合端15之一傳動軸42連結有一驅動馬達41。渦輪風扇43係位於加熱承座121之內部,並透過驅動馬達41驅動渦輪風扇43轉動,使腔體1之容置空間10之氣體流動。In addition, a turbo fan 43 is disposed in the accommodating space 10 of the cavity 1, and a drive motor 41 is coupled via a drive shaft 42 extending from the cavity connecting end 15 of the protruding cavity 1. The turbo fan 43 is located inside the heating socket 121, and drives the turbo fan 43 to rotate through the drive motor 41 to flow the gas in the accommodation space 10 of the cavity 1.
腔體1之延伸連通腔道結合端15結合有一具有預定延伸長度及縮小口徑供容置傳動軸42通過之延伸連通腔道3,且在延伸連通腔道3中配置有至少一用以支持傳動軸42之軸承單元45,再於延伸連通腔道3結合一用以容置驅動馬達41之馬達承置腔室4,馬達承置腔室4形成有一馬達容置 空間40。The extended connecting passage coupling end 15 of the cavity 1 is combined with an extended connecting passage 3 having a predetermined extension length and a reduced diameter for receiving the transmission shaft 42, and at least one of the extending communication passages 3 is provided for supporting the transmission. The bearing unit 45 of the shaft 42 and the extended communication channel 3 are combined with a motor receiving chamber 4 for accommodating the driving motor 41. The motor receiving chamber 4 is formed with a motor housing. Space 40.
其中延伸連通腔道3係藉由至少一法蘭單元8及至少一固定元件9結合於腔體1之延伸連通腔道結合端15,而馬達承置腔室4係藉由至少一固定元件9a結合於延伸連通腔道3。The extending communication channel 3 is coupled to the extended communication channel coupling end 15 of the cavity 1 by at least one flange unit 8 and at least one fixing element 9, and the motor receiving cavity 4 is supported by at least one fixing element 9a. The connection is extended to the communication channel 3.
馬達承置腔室4經由延伸連通腔道3使腔體1之容置空間10、延伸連通腔道3之容置空間30以及馬達承置腔室4之馬達容置空間40三者保持連通,並與腔體1保持一等壓腔室壓力。且在延伸連通腔道3之外環面31設有一冷卻裝置32,使馬達承置腔室4與腔體1形成一溫度差。The motor receiving chamber 4 maintains the communication space 10 of the cavity 1 , the accommodating space 30 extending the communication channel 3 , and the motor accommodating space 40 of the motor receiving chamber 4 via the extending communication channel 3 . And maintaining an equal pressure chamber pressure with the cavity 1. And outside the extended communication channel 3, the annular surface 31 is provided with a cooling device 32 for forming a temperature difference between the motor receiving chamber 4 and the cavity 1.
驅動馬達41連結有一對導線411延伸於馬達承置腔室4外,以連接一電源並提供驅動馬達41所需之電能。驅動馬達41之外部係繞設有一銅管412,可經由連結一水供應源以冷卻該驅動馬達41之溫度。The drive motor 41 is coupled with a pair of wires 411 extending outside the motor receiving chamber 4 to connect a power source and provide the electrical energy required to drive the motor 41. A copper tube 412 is disposed around the outside of the drive motor 41 to cool the temperature of the drive motor 41 via a water supply source.
此外,腔體1之容置空間10鄰近延伸連通腔道3處裝置有一閘門44,以阻隔在該腔體1之容置空間10加熱時,其高熱氣體流動對驅動馬達41之影響。In addition, the accommodating space 10 of the cavity 1 is provided with a gate 44 adjacent to the extending communication channel 3 to block the influence of the high hot gas flow on the driving motor 41 when the accommodating space 10 of the cavity 1 is heated.
參閱第3圖,其係顯示本創作第一實施例之操作示意圖。如圖所示,腔體1內部之容置空間10更裝置有一溫度感測單元13及一壓力感測單元14,且分別連接於一控制器5。Referring to Figure 3, there is shown a schematic diagram of the operation of the first embodiment of the present creation. As shown in the figure, the accommodating space 10 inside the cavity 1 is further provided with a temperature sensing unit 13 and a pressure sensing unit 14, and is respectively connected to a controller 5.
溫度感測單元13可感測容置空間10之溫度,並送出一溫度感測信號S1至控制器5。控制器5可透過一加熱驅動信號S2以驅動加熱裝置12,並根據溫度感測信號S1以加 熱容置空間10達一預定溫度及一預定升溫速率。The temperature sensing unit 13 can sense the temperature of the accommodating space 10 and send a temperature sensing signal S1 to the controller 5. The controller 5 can drive the heating device 12 through a heating driving signal S2, and according to the temperature sensing signal S1 The heat receiving space 10 reaches a predetermined temperature and a predetermined heating rate.
壓力感測單元14則可感測腔體1之腔室壓力P1,並送出一壓力感測信號S3至控制器5。腔體1之容置空間10經由一進壓管路61連通於一加壓控制組件6,加壓控制組件6再連通一壓力源62,將壓力源62所產生之壓力輸入至腔體1之容置空間10中,使腔體1維持一預定腔室壓力P1。The pressure sensing unit 14 can sense the chamber pressure P1 of the cavity 1 and send a pressure sensing signal S3 to the controller 5. The accommodating space 10 of the cavity 1 is connected to a pressurization control unit 6 via a pressure inlet line 61. The pressurization control unit 6 is further connected to a pressure source 62 to input the pressure generated by the pressure source 62 to the chamber 1. In the accommodating space 10, the cavity 1 is maintained at a predetermined chamber pressure P1.
其中加壓控制組件6所連通之壓力源62可以是一外接之廠務管路621,亦可以是一整合於載熱裝置100之一空氣壓縮機622。進壓管路61其作動係經由控制器5之一加壓驅動信號S4以驅動加壓控制組件6,並根據壓力感測信號S3,以使腔體1維持一預定腔室壓力P1。The pressure source 62 connected to the pressurization control unit 6 may be an external factory line 621 or an air compressor 622 integrated in the heat carrying device 100. The pressure feed line 61 is actuated to pressurize the drive signal S4 via one of the controllers 5 to drive the pressurization control assembly 6 and to maintain the chamber 1 at a predetermined chamber pressure P1 based on the pressure sensing signal S3.
馬達承置腔室4經由延伸連通腔道3使腔體1之容置空間10、延伸連通腔道3之容置空間30以及馬達承置腔室4之馬達容置空間40三者保持連通,使馬達承置腔室4之腔室壓力P2與腔體1之腔室壓力P1保持一等壓腔室壓力(即P2=P1)。The motor receiving chamber 4 maintains the communication space 10 of the cavity 1 , the accommodating space 30 extending the communication channel 3 , and the motor accommodating space 40 of the motor receiving chamber 4 via the extending communication channel 3 . The chamber pressure P2 of the motor receiving chamber 4 is maintained at an equal pressure chamber pressure (i.e., P2 = P1) with the chamber pressure P1 of the chamber 1.
本創作之第一實施例中,腔體1之腔室壓力P1係維持在大於2個大氣壓,故馬達承置腔室4之腔室壓力P2亦保持在大於2個大氣壓之等壓腔室壓力。腔體1之容置空間10之溫度係介於攝氏25度至1000度之間,而馬達承置腔室4之溫度則由於延伸連通腔道3及冷卻裝置32之設置,而介於攝氏25度至500度之間,而與腔體1形成一溫度差。In the first embodiment of the present invention, the chamber pressure P1 of the chamber 1 is maintained at more than 2 atmospheres, so the chamber pressure P2 of the motor receiving chamber 4 is also maintained at an equal pressure chamber pressure greater than 2 atmospheres. . The temperature of the accommodating space 10 of the cavity 1 is between 25 degrees Celsius and 1000 degrees Celsius, and the temperature of the motor receiving chamber 4 is between 25 degrees Celsius due to the extension of the communication channel 3 and the cooling device 32. Between 500 degrees and a temperature difference with the cavity 1.
此外,馬達承置腔室4之馬達容置空間40更裝置有一馬達溫度感測單元16,用以感測馬達容置空間40之溫度, 並送出一馬達溫度感測信號S5至控制器5,供使用者隨時監控驅動馬達41之溫度。In addition, the motor accommodating space 40 of the motor receiving chamber 4 further includes a motor temperature sensing unit 16 for sensing the temperature of the motor accommodating space 40. And sending a motor temperature sensing signal S5 to the controller 5 for the user to monitor the temperature of the driving motor 41 at any time.
控制器5更連接有一操控面板7,可以手動設定容置空間10中欲達到之預定溫度、升溫速率與壓力,使待加熱標的物處於一預定之高溫高壓環境下,並受均勻之加熱。The controller 5 is further connected with a control panel 7 for manually setting the predetermined temperature, the heating rate and the pressure to be reached in the accommodating space 10, so that the object to be heated is in a predetermined high temperature and high pressure environment, and is uniformly heated.
請參閱第4圖及第5圖,其中第4圖係顯示本創作第二實施例之部分分解示意圖,而第5圖係顯示本創作第二實施例之組合示意圖。如圖所示,馬達承置腔室4更包括有一拆卸端46及一蓋板47。Please refer to FIG. 4 and FIG. 5, wherein FIG. 4 is a partial exploded view showing the second embodiment of the present creation, and FIG. 5 is a schematic view showing the combination of the second embodiment of the present creation. As shown, the motor receiving chamber 4 further includes a detaching end 46 and a cover plate 47.
拆卸端46形成在馬達承置腔室4之一選定位置,而蓋板47藉由至少一固定元件9b結合於馬達承置腔室4,並與馬達承置腔室4共同形成馬達容置空間40。The detaching end 46 is formed at a selected position of the motor receiving chamber 4, and the cover plate 47 is coupled to the motor receiving chamber 4 by at least one fixing member 9b, and forms a motor accommodating space together with the motor receiving chamber 4. 40.
由以上之實施例可知,本創作所提供之具有延伸連通腔道結構之半導體封裝載熱裝置確具產業上之利用價值,故本創作業已符合於專利之要件。It can be seen from the above embodiments that the semiconductor package heat carrying device with the extended connecting channel structure provided by the present invention has industrial utilization value, so the original operation has met the requirements of the patent.
以上所舉實施例僅係用以說明本創作,並非用以限制本創作之範圍,凡其他未脫離本創作所揭示之精神下而完成的等效修飾或置換,均應包含於後述申請專利範圍內。The above-mentioned embodiments are only intended to illustrate the present invention and are not intended to limit the scope of the present invention. All other equivalent modifications or substitutions that have been made without departing from the spirit of the present invention should be included in the scope of the following claims. Inside.
100‧‧‧載熱裝置100‧‧‧heating device
1‧‧‧腔體1‧‧‧ cavity
10‧‧‧容置空間10‧‧‧ accommodating space
11‧‧‧托置承架11‧‧‧Supporting Shelf
12‧‧‧加熱裝置12‧‧‧ heating device
121‧‧‧加熱承座121‧‧‧heating seat
122‧‧‧加熱管122‧‧‧heat pipe
13‧‧‧溫度感測單元13‧‧‧Temperature sensing unit
14‧‧‧壓力感測單元14‧‧‧ Pressure sensing unit
15‧‧‧延伸連通腔道結合端15‧‧‧ Extended connecting channel junction
16‧‧‧馬達溫度感測單元16‧‧‧Motor temperature sensing unit
2‧‧‧門體2‧‧‧
3‧‧‧延伸連通腔道3‧‧‧Extension of the connecting channel
30‧‧‧容置空間30‧‧‧ accommodating space
31‧‧‧外環31‧‧‧Outer Ring
32‧‧‧冷卻裝置32‧‧‧Cooling device
4‧‧‧馬達承置腔室4‧‧‧Motor bearing chamber
40‧‧‧馬達容置空間40‧‧‧Motor housing space
41‧‧‧驅動馬達41‧‧‧Drive motor
411‧‧‧導線411‧‧‧ wire
412‧‧‧銅管412‧‧‧Bronze tube
42‧‧‧傳動軸42‧‧‧ drive shaft
43‧‧‧渦輪風扇43‧‧‧ turbofan
44‧‧‧閘門44‧‧ ‧ gate
45‧‧‧軸承單元45‧‧‧ bearing unit
46‧‧‧拆卸端46‧‧‧Disassembly end
47‧‧‧蓋板47‧‧‧ Cover
5‧‧‧控制器5‧‧‧ Controller
6‧‧‧加壓控制組件6‧‧‧Pressure control components
61‧‧‧進壓管路61‧‧‧Intake line
62‧‧‧壓力源62‧‧‧Pressure source
621‧‧‧廠務管路621‧‧‧Factory pipeline
622‧‧‧空氣壓縮機622‧‧‧Air compressor
7‧‧‧操控面板7‧‧‧Control panel
8‧‧‧法蘭單元8‧‧‧Flange unit
9、9a、9b‧‧‧固定元件9, 9a, 9b‧‧‧ fixed components
S1‧‧‧溫度感測信號S1‧‧‧ temperature sensing signal
S2‧‧‧加熱驅動信號S2‧‧‧heating drive signal
S3‧‧‧壓力感測信號S3‧‧‧ pressure sensing signal
S4‧‧‧加壓驅動信號S4‧‧‧Pressure drive signal
S5‧‧‧馬達溫度感測信號S5‧‧‧ motor temperature sensing signal
P1、P2‧‧‧腔室壓力P1, P2‧‧‧ chamber pressure
第1圖係顯示本創作第一實施例之部分分解示意圖;第2圖係顯示本創作第一實施例之組合示意圖;第3圖係顯示本創作第一實施例之操作示意圖;第4圖係顯示本創作第二實施例之部分分解示意圖; 第5圖係顯示本創作第二實施例之組合示意圖。1 is a partial exploded view showing the first embodiment of the present creation; FIG. 2 is a schematic view showing the combination of the first embodiment of the present creation; FIG. 3 is a schematic view showing the operation of the first embodiment of the present creation; A partial exploded view showing the second embodiment of the present creation; Fig. 5 is a schematic view showing the combination of the second embodiment of the present creation.
100‧‧‧載熱裝置100‧‧‧heating device
1‧‧‧腔體1‧‧‧ cavity
10‧‧‧容置空間10‧‧‧ accommodating space
11‧‧‧托置承架11‧‧‧Supporting Shelf
12‧‧‧加熱裝置12‧‧‧ heating device
121‧‧‧加熱承座121‧‧‧heating seat
122‧‧‧加熱管122‧‧‧heat pipe
13‧‧‧溫度感測單元13‧‧‧Temperature sensing unit
14‧‧‧壓力感測單元14‧‧‧ Pressure sensing unit
15‧‧‧延伸連通腔道結合端15‧‧‧ Extended connecting channel junction
16‧‧‧馬達溫度感測單元16‧‧‧Motor temperature sensing unit
2‧‧‧門體2‧‧‧
3‧‧‧延伸連通腔道3‧‧‧Extension of the connecting channel
30‧‧‧容置空間30‧‧‧ accommodating space
31‧‧‧外環面31‧‧‧ outer annulus
32‧‧‧冷卻裝置32‧‧‧Cooling device
4‧‧‧馬達承置腔室4‧‧‧Motor bearing chamber
40‧‧‧馬達容置空間40‧‧‧Motor housing space
41‧‧‧驅動馬達41‧‧‧Drive motor
411‧‧‧導線411‧‧‧ wire
412‧‧‧銅管412‧‧‧Bronze tube
42‧‧‧傳動軸42‧‧‧ drive shaft
43‧‧‧渦輪風扇43‧‧‧ turbofan
44‧‧‧閘門44‧‧ ‧ gate
45‧‧‧軸承單元45‧‧‧ bearing unit
5‧‧‧控制器5‧‧‧ Controller
6‧‧‧加壓控制組件6‧‧‧Pressure control components
61‧‧‧進壓管路61‧‧‧Intake line
62‧‧‧壓力源62‧‧‧Pressure source
621‧‧‧廠務管路621‧‧‧Factory pipeline
622‧‧‧空氣壓縮機622‧‧‧Air compressor
7‧‧‧操控面板7‧‧‧Control panel
8‧‧‧法蘭單元8‧‧‧Flange unit
9、9a‧‧‧固定元件9, 9a‧‧‧Fixed components
S1‧‧‧溫度感測信號S1‧‧‧ temperature sensing signal
S2‧‧‧加熱驅動信號S2‧‧‧heating drive signal
S3‧‧‧壓力感測信號S3‧‧‧ pressure sensing signal
S4‧‧‧加壓驅動信號S4‧‧‧Pressure drive signal
S5‧‧‧馬達溫度感測信號S5‧‧‧ motor temperature sensing signal
P1、P2‧‧‧腔室壓力P1, P2‧‧‧ chamber pressure
Claims (10)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW101222440U TWM450049U (en) | 2012-11-20 | 2012-11-20 | Semiconductor package heat carrying device having extended communication channel structure |
KR2020130000067U KR200474740Y1 (en) | 2012-11-20 | 2013-01-03 | Apparatus for Heating a Semiconductor Package Having an Extended Connecting Chamber Structure |
JP2013036118A JP5525631B2 (en) | 2012-11-20 | 2013-02-26 | Pressurized container with extended communication chamber for semiconductor packaging |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW101222440U TWM450049U (en) | 2012-11-20 | 2012-11-20 | Semiconductor package heat carrying device having extended communication channel structure |
Publications (1)
Publication Number | Publication Date |
---|---|
TWM450049U true TWM450049U (en) | 2013-04-01 |
Family
ID=48800418
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW101222440U TWM450049U (en) | 2012-11-20 | 2012-11-20 | Semiconductor package heat carrying device having extended communication channel structure |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP5525631B2 (en) |
KR (1) | KR200474740Y1 (en) |
TW (1) | TWM450049U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113671280A (en) * | 2020-05-15 | 2021-11-19 | 洪义明 | High-voltage collapse testing equipment |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111630764B (en) * | 2018-01-23 | 2023-08-08 | 松下知识产权经营株式会社 | Power supply device and welding power supply device |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0668986B2 (en) * | 1986-11-17 | 1994-08-31 | 日立化成工業株式会社 | Method for manufacturing circuit connection structure |
EP0460286A3 (en) * | 1990-06-06 | 1992-02-26 | Siemens Aktiengesellschaft | Method and arrangement for bonding a semiconductor component to a substrate or for finishing a semiconductor/substrate connection by contactless pressing |
US6500266B1 (en) * | 2000-01-18 | 2002-12-31 | Applied Materials, Inc. | Heater temperature uniformity qualification tool |
JP4710205B2 (en) * | 2001-09-06 | 2011-06-29 | ソニー株式会社 | Flip chip mounting method |
JP2006156711A (en) | 2004-11-30 | 2006-06-15 | Mitsubishi Electric Corp | Cooling system for power semiconductor module |
KR20060104236A (en) * | 2005-03-29 | 2006-10-09 | 삼성전자주식회사 | Heating equipment for semiconductor manufacturing |
KR100985798B1 (en) | 2010-03-17 | 2010-10-06 | 유철원 | Sterilizing apparatus and method using hydrogen peroxide |
-
2012
- 2012-11-20 TW TW101222440U patent/TWM450049U/en not_active IP Right Cessation
-
2013
- 2013-01-03 KR KR2020130000067U patent/KR200474740Y1/en active IP Right Grant
- 2013-02-26 JP JP2013036118A patent/JP5525631B2/en active Active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113671280A (en) * | 2020-05-15 | 2021-11-19 | 洪义明 | High-voltage collapse testing equipment |
Also Published As
Publication number | Publication date |
---|---|
KR200474740Y1 (en) | 2014-10-08 |
KR20140003199U (en) | 2014-05-29 |
JP2014103372A (en) | 2014-06-05 |
JP5525631B2 (en) | 2014-06-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5136574B2 (en) | Plasma processing apparatus and plasma processing method | |
CN105280527B (en) | It is bonded head and the bare die bonding apparatus with the bonding head | |
CN201163615Y (en) | Bubble-removing bake oven apparatus for semiconductor packaging and processing | |
TWI704611B (en) | Cutting device and manufacturing method of cut product | |
US9583355B2 (en) | Plasma processing apparatus and plasma processing method | |
JP6491464B2 (en) | Molded product manufacturing apparatus and molded product manufacturing method | |
TWM450049U (en) | Semiconductor package heat carrying device having extended communication channel structure | |
JP2016101743A5 (en) | ||
KR20160038720A (en) | Resin molding apparatus and resin molding method | |
JP6557428B2 (en) | Resin sealing device and resin sealing method | |
WO2012026274A1 (en) | Sheet attaching device and attaching method | |
JP2007262907A (en) | Vacuum pump | |
JP2020188076A (en) | Placing table and method of manufacturing placing table | |
CN112997331A (en) | Temperature adjusting device | |
CN115036225A (en) | Ultra-high temperature vacuum bonding equipment for sapphire wafer bonding | |
JP2010177267A (en) | Conveyance tray, and vacuum treatment apparatus using the conveyance tray | |
JP6249018B2 (en) | Temperature detection tool | |
CN211868350U (en) | Exhaust mechanism of semiconductor plastic package mould | |
TW201832892A (en) | Resin sealing device and resin sealing method | |
TWI658530B (en) | Degassing chamber and semiconductor processing device | |
TWI846885B (en) | Vacuum valves and actuators used in vacuum valves | |
CN214411133U (en) | Wafer processing device | |
KR102267200B1 (en) | Substrate disposition apparatus including interval measuring element | |
CN118223005A (en) | Spray header heating device, vapor deposition equipment and spray header temperature control method | |
CN219424324U (en) | Discharging system suitable for preparing hot melt adhesive |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MC4K | Revocation of granted utility model | ||
MK4K | Expiration of patent term of a granted utility model |