KR20010035260A - Thin film transistor type fingerprint acquisition device whose light sensing part has light shield layer thereon - Google Patents
Thin film transistor type fingerprint acquisition device whose light sensing part has light shield layer thereon Download PDFInfo
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- KR20010035260A KR20010035260A KR1020010004193A KR20010004193A KR20010035260A KR 20010035260 A KR20010035260 A KR 20010035260A KR 1020010004193 A KR1020010004193 A KR 1020010004193A KR 20010004193 A KR20010004193 A KR 20010004193A KR 20010035260 A KR20010035260 A KR 20010035260A
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- 239000010409 thin film Substances 0.000 title abstract description 3
- 238000002161 passivation Methods 0.000 claims abstract description 5
- 238000000034 method Methods 0.000 claims description 11
- 239000010408 film Substances 0.000 abstract description 13
- 230000003287 optical effect Effects 0.000 abstract description 8
- 238000009413 insulation Methods 0.000 abstract description 3
- 230000002093 peripheral effect Effects 0.000 abstract description 2
- 230000035699 permeability Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 5
- 230000001681 protective effect Effects 0.000 description 5
- 239000000758 substrate Substances 0.000 description 4
- 229910021417 amorphous silicon Inorganic materials 0.000 description 3
- 150000004767 nitrides Chemical class 0.000 description 3
- 206010034972 Photosensitivity reaction Diseases 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000036211 photosensitivity Effects 0.000 description 2
- 238000000151 deposition Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V40/00—Recognition of biometric, human-related or animal-related patterns in image or video data
- G06V40/10—Human or animal bodies, e.g. vehicle occupants or pedestrians; Body parts, e.g. hands
- G06V40/12—Fingerprints or palmprints
- G06V40/13—Sensors therefor
- G06V40/1306—Sensors therefor non-optical, e.g. ultrasonic or capacitive sensing
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V40/00—Recognition of biometric, human-related or animal-related patterns in image or video data
- G06V40/10—Human or animal bodies, e.g. vehicle occupants or pedestrians; Body parts, e.g. hands
- G06V40/12—Fingerprints or palmprints
- G06V40/13—Sensors therefor
- G06V40/1318—Sensors therefor using electro-optical elements or layers, e.g. electroluminescent sensing
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Abstract
Description
본 발명은 TFT형 지문입력기에 관한 것으로, 보다 구체적으로는 광감지부의 표면에, 광입사층를 제외한 영역에 광차폐층을 형성하여 지문에서 반사된 광의 입사범위를 줄이는 구조를 갖는 TFT 지문입력기에 관한 것이다.The present invention relates to a TFT type fingerprint input device, and more particularly, to a TFT fingerprint input device having a structure in which a light shielding layer is formed on a surface of the light sensing unit except for the light incidence layer to reduce an incident range of light reflected from the fingerprint. will be.
컴퓨터의 사용자 접근권한(access authority)을 부여하는 기술의 하나로서, 미리 등록된 사용자의 지문을 인식하여 접근권한을 부여하는 지문인식장치 (fingerprint recognition system)가 사용되고 있다. 지문인식장치는 지문에 빛을 비추어 반사된 지문영상을 해석하여 데이터베이스에 저장되어 있는 지문과 비교함으로써 악세스 인증을 하는 장치이다. 지문인식장치는 대형 컴퓨터는 물론, 소형 휴대용 컴퓨터, 무선키보드, 마우스몸체 등에 많이 설치되어 있다.As a technique for granting a user's access authority of a computer, a fingerprint recognition system that recognizes a fingerprint of a user registered in advance and grants an access right is used. The fingerprint recognition device is an apparatus for access authentication by analyzing a reflected fingerprint image by shining light on a fingerprint and comparing the fingerprint image with a fingerprint stored in a database. Fingerprint readers are installed in a large computer, as well as a small portable computer, a wireless keyboard, a mouse body.
지문인식장치에는 크게, 렌즈나 프리즘을 사용하는 방식과, 무렌즈 방식으로서 평면형인 박막트랜지스터(thin film transistor, TFT) 지문입력기가 있다. TFT 지문입력기는 a-Si:H의 감광성을 이용한 접촉식 이미지센서의 일종인데, 비교적 얇은 구조로써 높은 감광성을 얻을 수 있다.The fingerprint recognition apparatus is largely divided into a method using a lens or a prism, and a planar thin film transistor (TFT) fingerprint input device as a lensless method. The TFT fingerprint input device is a kind of contact image sensor that uses a-Si: H photosensitivity, and has a relatively thin structure to obtain high photosensitivity.
TFT 지문입력기의 구조와 작용원리에 대해서 도1a와 1b를 참조하여 설명한다. 도1a는 TFT 지문입력기의 단위셀(unit cell)의 종단면도이고, 도1b는 도1a의 지문입력기와 같은 단위셀이 4개 배열된 등가회로를 나타내고 있다.The structure and working principle of the TFT fingerprint input device will be described with reference to Figs. 1A and 1B. FIG. 1A is a longitudinal cross-sectional view of a unit cell of a TFT fingerprint input device, and FIG. 1B shows an equivalent circuit in which four unit cells, such as the fingerprint input device of FIG. 1A, are arranged.
도1a에서 TFT 지문입력기(10)는 투명기판(11)에 광감지부(12)와 스위칭부(13)가 횡으로 배열되며, 투명기판(11) 아래에는 백라이트(back light)가 위를 향해 발광하여 지문입력기(10)를 통과하고 있다. 광감지부(12)의 소스전극(12-S)과 스위칭부(13)의 드레인전극(13-D)은 제1전극(14)을 통해 전기적으로 연결되고, 광감지부(12)의 게이트전극(12-G)에는 제2전극(15)이 연결되어 있다.In FIG. 1A, in the TFT fingerprint inputter 10, the light sensing unit 12 and the switching unit 13 are horizontally arranged on the transparent substrate 11, and a back light is directed upward below the transparent substrate 11. It emits light and passes through the fingerprint input device 10. The source electrode 12 -S of the light sensing unit 12 and the drain electrode 13 -D of the switching unit 13 are electrically connected through the first electrode 14, and the gate of the light sensing unit 12 is connected. The second electrode 15 is connected to the electrode 12 -G.
상기 구성에서, 광감지부(12)의 드레인전극(12-D)과 소스전극(12-S) 사이에는 아모퍼스실리콘(a-Si:H) 등의 감광층(12-P)이 형성되어 있어, 이 감광층(12-P)으로 소정 광량 이상의 빛이 입사되면 드레인전극(12-D)과 소스전극(12-S)이 전기적으로 도통된다. 이에 따라, 컴퓨터에 접근하려는 자가 지문을 지문입력기(10)에 대면 투명기판(11) 하부의 백라이트로부터 발생된 빛(L)이 지문패턴에 따라 반사되어 광감지부(12)의 감광층(12-P)에 수광됨으로써, 광감지부(12)가 도통된다.In the above configuration, a photosensitive layer 12-P such as amorphous silicon (a-Si: H) is formed between the drain electrode 12-D and the source electrode 12-S of the light sensing unit 12. Therefore, when light having a predetermined amount of light or more is incident on the photosensitive layer 12 -P, the drain electrode 12-D and the source electrode 12-S are electrically conductive. As a result, when the user attempts to access the computer with the fingerprint inputter 10, the light L generated from the backlight under the transparent substrate 11 is reflected according to the fingerprint pattern, thereby causing the photosensitive layer 12 of the light sensing unit 12 to be exposed. By receiving light at -P), the light sensing unit 12 is turned on.
한편, 스위칭부(13)는 게이트단자(13-G)에 인가되는 게이트 제어신호에 의해 지문을 스캐닝하도록 설정된 매 프레임마다 스위칭되어, 지문입력기(10)에 입력되는 지문영상을 배열된 각 광감지부(12)별로 스캔한 프레임으로서 형성토록 한다. 따라서, 스위칭부(13)에는 외부광이 입사되지 못하도록 드레인전극(13-D)과 소스전극(12-S)에 광차폐층(13-sh)이 덮혀있다.On the other hand, the switching unit 13 is switched every frame set to scan the fingerprint by the gate control signal applied to the gate terminal (13-G), each of the light sensing arranged in the fingerprint image input to the fingerprint input unit 10 It forms so that it may form as a frame scanned for every 12. Accordingly, the light blocking layer 13-sh is covered with the drain electrode 13-D and the source electrode 12-S so that external light does not enter the switching unit 13.
그런데, 종래의 TFT 지문입력기에서는 도1c에서와 같은 문제가 있다. 광감지부(12)의 감광층(12-P)의 유효감지영역은 드레인(12-D)과 소스(12-S) 사이에 노출된 감광층(12-P)의 면적(이하 ″광입사층″)만큼이지만, 실제로 광입사층에 입사되는 지문반사광의 영역(실질입사영역)은 이보다 훨씬 넓어진다. 즉, 물체(지문)로부터 반사된 빛이 산란되어 감광층(12-P)에 도달하기 때문에 매우 넓은 각도로 입사될 수 있는 것이다. 특히, 도1d와 같이 다수의 광감지부가 배열되는 구조에서 인접한 광감지부(12a, 12b) 사이에 중첩된 실질입사영역에서 지문이 입력되는 경우에는 지문패턴의 해상도가 저하된다. 렌즈와 프리즘을 사용하는 광학식과 달리, 평면형 지문인식기인 무렌즈 TFT 방식에서는 렌즈나 프리즘으로써 실질입사영역을 줄이는 일이 쉽지 않다.However, in the conventional TFT fingerprint input device, there is a problem as shown in FIG. 1C. The effective sensing area of the photosensitive layer 12 -P of the photosensitive unit 12 is the area of the photosensitive layer 12 -P exposed between the drain 12 -D and the source 12 -S (hereinafter referred to as "light incidence"). Layer ″), the area of the fingerprint reflection light (actually incident area) that is actually incident on the light incident layer becomes much wider than this. That is, since light reflected from an object (fingerprint) is scattered and reaches the photosensitive layer 12 -P, it can be incident at a very wide angle. In particular, in the structure where a plurality of light sensing units are arranged as shown in FIG. 1D, when a fingerprint is input in an actual incident region overlapping between adjacent light sensing units 12a and 12b, the resolution of the fingerprint pattern is reduced. Unlike the optical method using a lens and a prism, it is not easy to reduce the real incident area by a lens or a prism in the lensless TFT method, which is a planar fingerprint reader.
따라서, 본 발명의 목적은 TFT 지문입력기의 광감지부의 표면에, 광입사층를 제외한 주위 영역에 광차폐층을 형성하여 광감지부에 입사되는 광의 범위를 줄이는 구조를 갖는 TFT 지문입력기를 제공하는 것이다.Accordingly, an object of the present invention is to provide a TFT fingerprint input device having a structure in which a light shielding layer is formed on the surface of the light sensing part of the TFT fingerprint input device in a peripheral area except the light incidence layer to reduce the range of light incident on the light sensing part. .
도1a는 종래의 TFT 지문입력기의 단면도.1A is a cross-sectional view of a conventional TFT fingerprint input device.
도1b는 도1a에 나타낸 TFT 지문입력기의 등가회로.Fig. 1B is an equivalent circuit of the TFT fingerprint input device shown in Fig. 1A.
도1c는 종래의 TFT 지문입력기의 광감지부 구조도.1C is a structure diagram of a light detecting unit of a conventional TFT fingerprint input device.
도1d는 종래의 TFT 지문입력기의 문제점을 나타내는 모식도.1D is a schematic diagram showing a problem of a conventional TFT fingerprint input device.
도2a는 본 발명에 따른 TFT 지문입력기의 구조도.2A is a structural diagram of a TFT fingerprint input device according to the present invention;
도2b는 본 발명에 따라 문제점이 해결되는 것을 나타내는 모식도.Figure 2b is a schematic diagram showing that the problem is solved according to the present invention.
〈도면부호의 설명〉<Explanation of drawing code>
TFT 지문입력기(10), 투명기판(11), 광감지부(12), 소스전극(12-S), 게이트전극(12-G), 드레인전극(12-D), 감광층(12-P), 스위칭부(13), 드레인전극(13-D), 소스전극(12-S), 광차폐층(13-sh), 제1전극(14), 제2전극(15), 광차폐층(17), 보호막(18)TFT fingerprint input device 10, transparent substrate 11, light sensing unit 12, source electrode 12-S, gate electrode 12-G, drain electrode 12-D, photosensitive layer 12-P ), Switching unit 13, drain electrode 13-D, source electrode 12-S, light shielding layer 13-sh, first electrode 14, second electrode 15, light shielding layer (17), Shield (18)
본 발명에 따른 TFT 지문입력기는,TFT fingerprint input device according to the present invention,
광입사층, 광입사층 표면에 형성된 드레인 및 소스전극으로 구성되는 광감지부와, 드레인 및 소스 전극에 표면에 광차폐층이 형성되어 있는 스위칭부로 구성되는 공지의 TFT 지문입력기에 있어서,In the known TFT fingerprint input device which consists of a light-sensing part which consists of a light incident layer, the drain and the source electrode formed in the light incident layer surface, and the switching part in which the light shielding layer is formed in the drain and the source electrode in the surface,
상기 광감지부가, 지문에서 반사되어 입사되는 광이 입사되는 광입사층, 상기 광입사층의 양단에 연결된 드레인전극 및 소스전극, 상기 드레인전극 및 소스전극의 표면에 형성된 절연층, 상기 절연층 위에 형성되되 상기 광입사층이 노출되도록 형성되는 광차폐층으로 구성되는 구조를 갖는다.The light sensing unit includes a light incidence layer through which light incident from the fingerprint is incident, a drain electrode and a source electrode connected to both ends of the light incidence layer, an insulating layer formed on a surface of the drain electrode and the source electrode, and on the insulating layer Is formed but has a structure consisting of a light shielding layer formed to expose the light incident layer.
이러한 구조로써, 상기 광입사층에 입사되는 광의 입사각도가 상기 광차폐층의 에지에 의해 제한되어 광입사층에 입사되는 광의 입사각 범위를 감소시키고 구조상의 물리적 강도를 증대시킬 수 있는 것을 특징으로 한다.With this structure, the angle of incidence of the light incident on the light incident layer is limited by the edge of the light shielding layer, so that the angle of incidence of the light incident on the light incident layer can be reduced and the physical strength of the structure can be increased. .
또한, 상기 광차폐층 표면에 질화막(Si3N4)이나 PSG 등의 보호막(passivation)을 형성하면 보다 더 입사광의 입사각 범위를 감소시킬 수 있고 광감지부의 물리적 강도를 더욱 향상시킬 수 있다.In addition, if a passivation film such as nitride film (Si 3 N 4 ) or PSG is formed on the surface of the light shielding layer, the incident angle range of incident light may be further reduced, and the physical strength of the light sensing unit may be further improved.
실시예Example
도2a는 본 발명에 따른 TFT 지문입력기의 구조도이다. 종래의 TFT 지문입력기(도1a 참조)와 전체적으로 유사한 구조를 갖지만, 광감지부(12)의 드레인(12-D) 및 소스(12-S)위의 절연층 표면에 광차폐층(17)이 형성되어 있다. 이는 스위칭부(13)의 광차폐층(13-sh)과 동일한 공정으로 형성된다.2A is a structural diagram of a TFT fingerprint input device according to the present invention. Although generally having a structure similar to that of a conventional TFT fingerprint input device (see FIG. 1A), the light shielding layer 17 is formed on the surface of the insulating layer on the drain 12-D and the source 12-S of the light sensing unit 12. Formed. This is formed in the same process as the light shielding layer 13 -sh of the switching unit 13.
그러나, 그 작용에 있어서는 전혀 다르다. 스위칭부(13)의 광차폐층(13-sh)은 외부광을 완전히 차폐하여 오로지 스위칭동작만을 할 수 있도록 하기 위한 것이지만, 광감지부(12)의 광차폐층(17)은 광입사층에 입사되는 반사광의 입사범위를 최대한 줄여서 도1c에서 설명한 것과 같은 실질입사영역을 줄이기 위한 것이다.However, the operation is completely different. The light shielding layer 13-sh of the switching unit 13 is for shielding external light completely so that only the switching operation can be performed, but the light shielding layer 17 of the light sensing unit 12 is provided to the light incident layer. In order to reduce the incident range of the incident reflected light as much as possible to reduce the actual incident region as described in Figure 1c.
광감지부(12)의 광차페층(17)은 불투광성 절연막에 의해 형성될 수 있다. 예를 들어, 산화막이나 질화막이나 절연성 폴리실리콘막 등으로 형성할 수 있다. 또한, 광차폐층(17)의 제조공정은 스위칭부(13)의 광차폐층의 공정과 유사하다. 다만, 광입사층을 노출시켜야 하므로, 포토마스크 공정과 에칭 공정이 추가될 것이다. 예를 들어, 광감지부(12)의 드레인(12-D)과 소스(12-S) 표면의 절연층 전체를 덮도록 광차폐층을 증착하고 나서, 광입사층을 제외한 영역을 리소그래피 방법에 의해 포토레지스트로 코팅하고 에칭에 의해 광입사층을 노출시킬 수 있다.The light blocking layer 17 of the light sensing unit 12 may be formed by an opaque insulating film. For example, it can be formed from an oxide film, a nitride film, an insulating polysilicon film, or the like. In addition, the manufacturing process of the light shielding layer 17 is similar to the process of the light shielding layer of the switching unit 13. However, since the light incident layer must be exposed, a photomask process and an etching process will be added. For example, after depositing the light shielding layer so as to cover the entire insulating layer on the surface of the drain 12-D and the source 12-S of the light sensing unit 12, the region except the light incident layer is applied to the lithography method. Can be coated with a photoresist and the light incident layer can be exposed by etching.
한편, 광차폐층(17)의 상부에 다시 보호막(passivation)(18)을 형성할 수 있다. 보호막은 집적회로를 형성하고 패키징하기 전의 최종 외부층에 형성되는 질화막 또는 글라스(PSG)층을 말한다. 주로 물리적 강도 증대, 외부 습기나 온도 등에 대한 내성 향상, 절연성 향상 등의 목적으로 보호막을 형성한다.Meanwhile, a passivation layer 18 may be formed on the light shielding layer 17 again. The protective film refers to a nitride film or glass (PSG) layer formed on the final outer layer before forming and packaging an integrated circuit. A protective film is formed mainly for the purpose of increasing physical strength, improving resistance to external moisture or temperature, and improving insulation.
본 발명에서도 광차폐층(17) 상부에 보호막(18)을 형성하면 입사광이 산란되는 에지가 더욱 두꺼워지므로 실질입사영역을 더 줄일 수 있으며, 지문입력기 자체의 물리적 강도를 광차폐층(17) 단독일 때보다도 더욱 증대시킬 수 있다. 보호막(18)의 제조 공정도 광차폐층(17)과 유사하게 이루어진다.In the present invention, if the protective film 18 is formed on the light shielding layer 17, the edge where the incident light is scattered becomes thicker, and thus the actual incident area can be further reduced, and the physical strength of the fingerprint input device itself can be reduced. It can be further increased than when. The manufacturing process of the protective film 18 is also made similarly to the light shielding layer 17.
본 발명에 따르면, TFT 지문입력기의 광입사층에 지문반사광이 입사되는 실질입사영역을 줄일 수 있으므로, 광입사층의 유효감지영역에 근접한 광만을 감지할 수 있게 된다. 따라서, 광감지부를 배열구조로 사용하는 실제의 지문입력기에 있어서, 각 광감지부별로 자신이 담당하는 범위 내의 빛만을 받아들일 수 있게 되므로, 입력된 지문영상의 해상도와 콘트라스트가 높아지게 된다. 또한, 지문입력기 자체의 물리적 기계적 강도를 증대시킬 수 있다. 물리적 강도는 보호막을 추가로 형성함으로써 더욱 더 증대된다.According to the present invention, since the actual incident area where the fingerprint reflection light is incident on the light incident layer of the TFT fingerprint input device can be reduced, only light close to the effective sensing area of the light incident layer can be detected. Therefore, in the actual fingerprint input device using the light sensing unit in an array structure, only the light within the range which is in charge of each light sensing unit can be received, thereby increasing the resolution and contrast of the input fingerprint image. In addition, it is possible to increase the physical mechanical strength of the fingerprint input itself. Physical strength is further increased by further forming a protective film.
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KR1020010004193A KR100338978B1 (en) | 2001-01-30 | 2001-01-30 | Thin film transistor type fingerprint acquisition device whose light sensing part has light shield layer thereon |
PCT/KR2002/000129 WO2002061667A1 (en) | 2001-01-30 | 2002-01-29 | Thin film transistor type fingerprint acquisition device whose light sensing part has light shield layer thereon |
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Cited By (6)
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KR100464175B1 (en) * | 2002-03-18 | 2005-01-03 | (주) 제이.에스.씨.앤.아이 | Finger print recognition sensor and method for manufacturing the same |
KR100485390B1 (en) * | 2002-08-16 | 2005-04-25 | 주식회사 디젠트 | Fingerprint recognition system |
KR100560347B1 (en) * | 2002-03-29 | 2006-03-14 | 테스텍 주식회사 | Method For Fabricating TFT Fingerprint Input Device Of Fingerprint Recognition Device |
KR100710182B1 (en) * | 2004-12-30 | 2007-04-20 | 동부일렉트로닉스 주식회사 | light blocking layer CMOS image sensor and method for manufacturing the same |
KR100764569B1 (en) * | 2005-12-20 | 2007-10-10 | 한상열 | Input Device for Portable Electronic Device |
KR100911460B1 (en) * | 2003-03-17 | 2009-08-11 | 삼성전자주식회사 | Fingerprinting device and method for fabricating the same |
Families Citing this family (4)
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KR100964559B1 (en) * | 2003-04-25 | 2010-06-21 | 삼성전자주식회사 | Fingerprinting device |
TWI601301B (en) * | 2015-07-31 | 2017-10-01 | 友達光電股份有限公司 | Optical sensing device and fabricating method thereof |
CN109416732B (en) * | 2016-06-28 | 2022-06-14 | 虹软科技股份有限公司 | Display capable of detecting fingerprint |
CN110008936A (en) * | 2019-04-19 | 2019-07-12 | 广州新视界光电科技有限公司 | A kind of fingerprint recognition mould group and fingerprint identification device |
Family Cites Families (3)
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KR100401265B1 (en) * | 1998-12-04 | 2004-03-20 | 엘지.필립스 엘시디 주식회사 | Thin film transistor type photosensitive device |
KR100608571B1 (en) * | 1999-01-14 | 2006-08-03 | 엘지.필립스 엘시디 주식회사 | Thin film transistor type photo sensor |
JP2001094089A (en) * | 1999-09-27 | 2001-04-06 | Casio Comput Co Ltd | Finger print sensor |
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2001
- 2001-01-30 KR KR1020010004193A patent/KR100338978B1/en active IP Right Grant
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100464175B1 (en) * | 2002-03-18 | 2005-01-03 | (주) 제이.에스.씨.앤.아이 | Finger print recognition sensor and method for manufacturing the same |
KR100560347B1 (en) * | 2002-03-29 | 2006-03-14 | 테스텍 주식회사 | Method For Fabricating TFT Fingerprint Input Device Of Fingerprint Recognition Device |
KR100485390B1 (en) * | 2002-08-16 | 2005-04-25 | 주식회사 디젠트 | Fingerprint recognition system |
KR100911460B1 (en) * | 2003-03-17 | 2009-08-11 | 삼성전자주식회사 | Fingerprinting device and method for fabricating the same |
KR100710182B1 (en) * | 2004-12-30 | 2007-04-20 | 동부일렉트로닉스 주식회사 | light blocking layer CMOS image sensor and method for manufacturing the same |
KR100764569B1 (en) * | 2005-12-20 | 2007-10-10 | 한상열 | Input Device for Portable Electronic Device |
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KR100338978B1 (en) | 2002-06-03 |
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