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JPS6418073A - Detecting apparatus for voltage - Google Patents

Detecting apparatus for voltage

Info

Publication number
JPS6418073A
JPS6418073A JP62174536A JP17453687A JPS6418073A JP S6418073 A JPS6418073 A JP S6418073A JP 62174536 A JP62174536 A JP 62174536A JP 17453687 A JP17453687 A JP 17453687A JP S6418073 A JPS6418073 A JP S6418073A
Authority
JP
Japan
Prior art keywords
dimensional
measured
substance
electrooptical material
voltages
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62174536A
Other languages
Japanese (ja)
Other versions
JPH0830721B2 (en
Inventor
Hironori Takahashi
Shinichiro Aoshima
Yutaka Tsuchiya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority to JP62174536A priority Critical patent/JPH0830721B2/en
Priority to EP88111142A priority patent/EP0299432B1/en
Priority to US07/217,790 priority patent/US4906922A/en
Priority to DE3889986T priority patent/DE3889986T2/en
Publication of JPS6418073A publication Critical patent/JPS6418073A/en
Priority to US07/460,645 priority patent/US5034683A/en
Publication of JPH0830721B2 publication Critical patent/JPH0830721B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To enable the simultaneous detection of voltages at two-dimensional positions of a substance to be measured, by a method wherein light beams from a light source is made to enter uniformly and in parallel the two-dimensional parts of an electrooptical material corresponding to a plurality of two-dimensional positions of the substance to be measured. CONSTITUTION:A parallel light falling on an electrooptical material 2 enters it uniformly with a prescribed two-dimensional expansion formed by a magnifying optical system 6. Meanwhile, the electrooptical material 2 is positioned so that it covers a plurality of two-dimensional positions of a substance 3 to be measured wherefrom voltages are to be detected. A refractive index of each two-dimensional part of the electrooptical material 2 is varied by a voltage at each two-dimensional position of the corresponding substance 3 to be measured. Accordingly, the polarized state of each light beam entering each two-dimensional part of the electrooptical material 2 is varied with a variation in the refractive index of each two-dimensional part of the electrooptical material 2, and the beam is outputted as an emission light and enters a detector 13. By this method, voltages at the two-dimensional positions of the substance 3 to be measured can be detected simultaneously in the detector 13.
JP62174536A 1987-07-13 1987-07-13 Voltage detector Expired - Fee Related JPH0830721B2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP62174536A JPH0830721B2 (en) 1987-07-13 1987-07-13 Voltage detector
EP88111142A EP0299432B1 (en) 1987-07-13 1988-07-12 A voltage detecting device
US07/217,790 US4906922A (en) 1987-07-13 1988-07-12 Voltage mapping device having fast time resolution
DE3889986T DE3889986T2 (en) 1987-07-13 1988-07-12 Arrangement of a voltage detector.
US07/460,645 US5034683A (en) 1987-07-13 1990-01-03 Voltage detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62174536A JPH0830721B2 (en) 1987-07-13 1987-07-13 Voltage detector

Publications (2)

Publication Number Publication Date
JPS6418073A true JPS6418073A (en) 1989-01-20
JPH0830721B2 JPH0830721B2 (en) 1996-03-27

Family

ID=15980252

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62174536A Expired - Fee Related JPH0830721B2 (en) 1987-07-13 1987-07-13 Voltage detector

Country Status (1)

Country Link
JP (1) JPH0830721B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6428566A (en) * 1987-07-23 1989-01-31 Fujitsu Ltd Voltage measuring apparatus
JPH0427843A (en) * 1989-08-02 1992-01-30 Hamamatsu Photonics Kk Low noise pulse light source using laser diode and voltage detector using the light source
EP0701140A2 (en) 1994-09-07 1996-03-13 Hamamatsu Photonics K.K. Checking apparatus for array electrode substrate
JP2008290792A (en) * 2007-05-22 2008-12-04 Sanyo Kasei:Kk Hose displaying bobbin

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6428566A (en) * 1987-07-23 1989-01-31 Fujitsu Ltd Voltage measuring apparatus
JPH0427843A (en) * 1989-08-02 1992-01-30 Hamamatsu Photonics Kk Low noise pulse light source using laser diode and voltage detector using the light source
EP0701140A2 (en) 1994-09-07 1996-03-13 Hamamatsu Photonics K.K. Checking apparatus for array electrode substrate
US5621521A (en) * 1994-09-07 1997-04-15 Hamamatsu Photonics K.K. Checking apparatus for array electrode substrate
JP2008290792A (en) * 2007-05-22 2008-12-04 Sanyo Kasei:Kk Hose displaying bobbin

Also Published As

Publication number Publication date
JPH0830721B2 (en) 1996-03-27

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees