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JPS6428566A - Voltage measuring apparatus - Google Patents

Voltage measuring apparatus

Info

Publication number
JPS6428566A
JPS6428566A JP62183852A JP18385287A JPS6428566A JP S6428566 A JPS6428566 A JP S6428566A JP 62183852 A JP62183852 A JP 62183852A JP 18385287 A JP18385287 A JP 18385287A JP S6428566 A JPS6428566 A JP S6428566A
Authority
JP
Japan
Prior art keywords
light
voltage
measured
changes
crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62183852A
Other languages
Japanese (ja)
Other versions
JPH0799376B2 (en
Inventor
Shinichi Wakana
Yoshiaki Goto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP62183852A priority Critical patent/JPH0799376B2/en
Publication of JPS6428566A publication Critical patent/JPS6428566A/en
Publication of JPH0799376B2 publication Critical patent/JPH0799376B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To achieve a higher voltage measuring accuracy eliminating changes in a transmission impedance of a measuring cable, by scanning a laser beam at a position of an object to e measured where a voltage is distributed to a number of terminals or at more than one part to convert changes in the voltage to changes in the quantity of light of the laser beam utilizing a double refraction property of an electrochemical crystal. CONSTITUTION:A plurality of electrodes 13 for contact are arranged in contact with one, two or more feeder parts of an object 11 to be measured and an electrochemical crystal 14 which is laminated between the electrode 13 and a transparent electrode 15 for setting is provided with a double refraction property as caused by a voltage. A laser light l incident upon the crystal 14 from a laser light source 20 is generated and undergoes an optical axis conversion by an optical system such as a 1/4 deflection plate 16, a polarized beam splitter 17 and a lens system 18 to scan the light l per electrode 13 with a deflector 19. The quantity of light proportional to a voltage to be measured as object 11 is received with a light receiver 22 from the beam light subjected to the optical axis conversion and a detection signal S1 detected is processed 23 to control driving and measuring test control systems 21 and 24.
JP62183852A 1987-07-23 1987-07-23 Voltage measuring device Expired - Fee Related JPH0799376B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62183852A JPH0799376B2 (en) 1987-07-23 1987-07-23 Voltage measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62183852A JPH0799376B2 (en) 1987-07-23 1987-07-23 Voltage measuring device

Publications (2)

Publication Number Publication Date
JPS6428566A true JPS6428566A (en) 1989-01-31
JPH0799376B2 JPH0799376B2 (en) 1995-10-25

Family

ID=16142957

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62183852A Expired - Fee Related JPH0799376B2 (en) 1987-07-23 1987-07-23 Voltage measuring device

Country Status (1)

Country Link
JP (1) JPH0799376B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0614806A (en) * 1992-06-30 1994-01-25 Yoshida Kogyo Kk <Ykk> Slide fastener and its manufacture
US5677635A (en) * 1993-11-22 1997-10-14 Fujitsu Limited Voltage and displacement measuring apparatus and probe
CN1322475C (en) * 1999-12-23 2007-06-20 英特尔公司 Methods and apparatus for creating motion illusion
KR20220062130A (en) * 2019-09-27 2022-05-13 어드밴스드 마이크로 디바이시즈, 인코포레이티드 Electro-Optical Waveform Analysis Process

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6418073A (en) * 1987-07-13 1989-01-20 Hamamatsu Photonics Kk Detecting apparatus for voltage

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6418073A (en) * 1987-07-13 1989-01-20 Hamamatsu Photonics Kk Detecting apparatus for voltage

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0614806A (en) * 1992-06-30 1994-01-25 Yoshida Kogyo Kk <Ykk> Slide fastener and its manufacture
US5677635A (en) * 1993-11-22 1997-10-14 Fujitsu Limited Voltage and displacement measuring apparatus and probe
CN1322475C (en) * 1999-12-23 2007-06-20 英特尔公司 Methods and apparatus for creating motion illusion
KR20220062130A (en) * 2019-09-27 2022-05-13 어드밴스드 마이크로 디바이시즈, 인코포레이티드 Electro-Optical Waveform Analysis Process

Also Published As

Publication number Publication date
JPH0799376B2 (en) 1995-10-25

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees