JP4578951B2 - 表示装置の作製方法 - Google Patents
表示装置の作製方法 Download PDFInfo
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- JP4578951B2 JP4578951B2 JP2004341712A JP2004341712A JP4578951B2 JP 4578951 B2 JP4578951 B2 JP 4578951B2 JP 2004341712 A JP2004341712 A JP 2004341712A JP 2004341712 A JP2004341712 A JP 2004341712A JP 4578951 B2 JP4578951 B2 JP 4578951B2
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- XZCJVWCMJYNSQO-UHFFFAOYSA-N butyl pbd Chemical compound C1=CC(C(C)(C)C)=CC=C1C1=NN=C(C=2C=CC(=CC=2)C=2C=CC=CC=2)O1 XZCJVWCMJYNSQO-UHFFFAOYSA-N 0.000 description 1
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- SLLGVCUQYRMELA-UHFFFAOYSA-N chlorosilicon Chemical compound Cl[Si] SLLGVCUQYRMELA-UHFFFAOYSA-N 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 238000004040 coloring Methods 0.000 description 1
- 229920001940 conductive polymer Polymers 0.000 description 1
- 150000004696 coordination complex Chemical class 0.000 description 1
- VBVAVBCYMYWNOU-UHFFFAOYSA-N coumarin 6 Chemical compound C1=CC=C2SC(C3=CC4=CC=C(C=C4OC3=O)N(CC)CC)=NC2=C1 VBVAVBCYMYWNOU-UHFFFAOYSA-N 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
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- 238000000151 deposition Methods 0.000 description 1
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- 239000010432 diamond Substances 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 238000010790 dilution Methods 0.000 description 1
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- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
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- 239000010931 gold Substances 0.000 description 1
- 239000001056 green pigment Substances 0.000 description 1
- 150000004820 halides Chemical class 0.000 description 1
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 1
- 239000003779 heat-resistant material Substances 0.000 description 1
- RBTKNAXYKSUFRK-UHFFFAOYSA-N heliogen blue Chemical compound [Cu].[N-]1C2=C(C=CC=C3)C3=C1N=C([N-]1)C3=CC=CC=C3C1=NC([N-]1)=C(C=CC=C3)C3=C1N=C([N-]1)C3=CC=CC=C3C1=N2 RBTKNAXYKSUFRK-UHFFFAOYSA-N 0.000 description 1
- 125000004464 hydroxyphenyl group Chemical group 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
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- 238000005499 laser crystallization Methods 0.000 description 1
- 239000001989 lithium alloy Substances 0.000 description 1
- 125000000040 m-tolyl group Chemical group [H]C1=C([H])C(*)=C([H])C(=C1[H])C([H])([H])[H] 0.000 description 1
- 239000000693 micelle Substances 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- JFNLZVQOOSMTJK-KNVOCYPGSA-N norbornene Chemical compound C1[C@@H]2CC[C@H]1C=C2 JFNLZVQOOSMTJK-KNVOCYPGSA-N 0.000 description 1
- 229920001778 nylon Polymers 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- IEQIEDJGQAUEQZ-UHFFFAOYSA-N phthalocyanine Chemical compound N1C(N=C2C3=CC=CC=C3C(N=C3C4=CC=CC=C4C(=N4)N3)=N2)=C(C=CC=C2)C2=C1N=C1C2=CC=CC=C2C4=N1 IEQIEDJGQAUEQZ-UHFFFAOYSA-N 0.000 description 1
- 238000009832 plasma treatment Methods 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 229920000172 poly(styrenesulfonic acid) Polymers 0.000 description 1
- 229920000767 polyaniline Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 229920006289 polycarbonate film Polymers 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 229940005642 polystyrene sulfonic acid Drugs 0.000 description 1
- 150000004032 porphyrins Chemical class 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000002203 pretreatment Methods 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 150000002910 rare earth metals Chemical class 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 239000001054 red pigment Substances 0.000 description 1
- 239000010979 ruby Substances 0.000 description 1
- 229910001750 ruby Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- GGCZERPQGJTIQP-UHFFFAOYSA-N sodium;9,10-dioxoanthracene-2-sulfonic acid Chemical compound [Na+].C1=CC=C2C(=O)C3=CC(S(=O)(=O)O)=CC=C3C(=O)C2=C1 GGCZERPQGJTIQP-UHFFFAOYSA-N 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000007790 solid phase Substances 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 230000005236 sound signal Effects 0.000 description 1
- 229920001169 thermoplastic Polymers 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 239000004416 thermosoftening plastic Substances 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- QEPMORHSGFRDLW-UHFFFAOYSA-L zinc;2-(2-hydroxyphenyl)-3h-1,3-benzoxazole-2-carboxylate Chemical compound [Zn+2].OC1=CC=CC=C1C1(C([O-])=O)OC2=CC=CC=C2N1.OC1=CC=CC=C1C1(C([O-])=O)OC2=CC=CC=C2N1 QEPMORHSGFRDLW-UHFFFAOYSA-L 0.000 description 1
Images
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
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- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
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- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
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Description
本実施形態においては、プラスチック基板を用いて形成される光学フィルムを有する表示装置の作製方法を、図1を用いて示す。
本実施形態では、光学フィルターと第2の基板との接着面が第1実施形態と異なる光学フィルムの作製方法、及びそれを有する表示装置の作製方法について、図2を用いて説明する。
本実施形態においては、画素を有する層上に光学フィルターを転写した後、その上にプラスチック基板を接着して表示装置の対向基板を形成する工程について図3を用いて述べる。
本実施形態では、第1実施形態乃至第3実施形態を用いて形成した光学フィルムを両面に有する表示装置の作製方法について、図4を用いて説明する。なお、本実施形態においては、第1実施形態を用いた例を示す。
本実施形態では、複数の種類の基板を用いて作製される表示装置の作製方法について、図5を用いて説明する。
本実施形態においては、第1実施形態乃至第3実施形態のいずれかにおいて、剥離体と被剥離体との界面で、さらに剥離しやすい工程について図1を用いて述べる。ただし、第1実施形態に限らず、第2実施形態乃至第5実施形態に適宜適応することができる。
本実施形態においては、第1実施形態乃至第5実施形態のいずれかにおいて、剥離体と被剥離体との界面で、さらに剥離しやすい工程について述べる。ただし、第1実施形態に限らず、第2実施形態乃至第5実施形態に適宜適応することができる。
本実施形態は、第1実施形態乃至第7実施形態と、金属酸化膜を形成する工程が異なる光学フィルムの形成方法について説明する。ここでは、第1実施形態を用いて説明する。
本実施の形態では、第1実施形態乃至第8実施形態のいずれかで適応が可能な発光素子の構造について図14を用いて説明する。
H,23H−ポルフィリン−白金(以下、PtOEPと示す)などが知られている。
ると、第1の電極及び第2の電極の両方に発光することができる。
Claims (19)
- 第1の基板上に、第1の金属膜と、第1の酸化物膜と、光学フィルターとを順に積層し、
前記光学フィルターを介して前記第1の基板と向かい合うように、前記光学フィルター上に支持体を剥離可能な粘着媒体を用いて貼り合わせ、
前記第1の基板及び前記第1の金属膜を剥離して光学フィルムを形成する第1の工程と、
第2の基板上に第2の金属膜と、第2の酸化物膜とを順に積層し、前記第2の酸化物膜上に画素を有する層を形成する第2の工程と、
前記第1の工程及び前記第2の工程の後、前記光学フィルムの前記第1の酸化物膜と前記第2の基板の画素を有する層の表面とを第1の接着剤を用いて貼り合わせ、
前記第2の基板及び前記第2の金属膜を剥離する第3の工程とを有することを特徴とする表示装置の作製方法。 - 第1の基板上に、第1の金属膜と、第1の酸化物膜と、光学フィルターとを順に積層し、
前記光学フィルターを介して前記第1の基板と向かい合うように、前記光学フィルター上にプラスチック基板、偏光板、又は位相差板を有する偏光板である第2の基板を第1の接着剤を用いて貼り合わせ、
前記第2の基板上に剥離可能な粘着媒体を用いて支持体を貼り合わせ、
前記第1の基板及び前記第1の金属膜を剥離して光学フィルムを形成する第1の工程と、
第3の基板上に第2の金属膜と、第2の酸化物膜とを順に積層し、前記第2の酸化物膜上に画素を有する層を形成する第2の工程と、
前記第1の工程及び前記第2の工程の後、前記光学フィルムの前記第1の酸化物膜と前記第3の基板の画素を有する層の表面とを第2の接着剤を用いて貼り合わせ、
前記第3の基板及び前記第2の金属膜を剥離する第3の工程とを有することを特徴とする表示装置の作製方法。 - 第1の基板上に、第1の金属膜と、第1の酸化物膜と、光学フィルターとを順に積層し、
前記光学フィルターを介して前記第1の基板と向かい合うように、前記光学フィルター上に支持体を剥離可能な粘着媒体を用いて貼り合わせ、
前記第1の基板及び前記第1の金属膜を剥離し、
前記第1の酸化物膜上にプラスチック基板、偏光板、又は位相差板を有する偏光板である第2の基板を第1の接着剤を用いて貼り合わせた後、前記支持体及び前記剥離可能な粘着媒体を除去して光学フィルムを形成する第1の工程と、
第3の基板上に第2の金属膜と、第2の酸化物膜とを順に積層し、前記第2の酸化物膜上に画素を有する層を形成する第2の工程と、
前記第1の工程及び前記第2の工程の後、前記光学フィルムの前記光学フィルターと前記第3の基板の画素を有する層の表面とを第2の接着剤を用いて貼り合わせ、
前記第3の基板及び前記第2の金属膜を剥離する第3の工程とを有することを特徴とする表示装置の作製方法。 - 第1の基板上に、第1の金属膜と、第1の酸化物膜と、光学フィルターとを順に積層し、
前記光学フィルターを介して前記第1の基板と向かい合うように、前記光学フィルター上に支持体を剥離可能な粘着媒体を用いて貼り合わせ、
前記第1の基板及び前記第1の金属膜を剥離して光学フィルムを形成する第1の工程と、
第2の基板上に第2の金属膜と、第2の酸化物膜とを順に積層し、前記第2の酸化物膜上に画素を有する層を形成する第2の工程と、
前記第1の工程及び前記第2の工程の後、前記光学フィルムの前記第1の酸化物膜と前記第2の基板の画素を有する層の表面とを第1の接着剤を用いて貼り合わせ、
前記第2の基板及び前記第2の金属膜を剥離する第3の工程と、
前記第2の酸化物膜の表面に、第2の接着剤を用いてプラスチック基板、偏光板、又は位相差板を有する偏光板である第3の基板を貼り合わせた後、前記剥離可能な粘着媒体及び前記支持体を除去する第4の工程とを有することを特徴とする表示装置の作製方法。 - 第1の基板上に、第1の金属膜と、第1の酸化物膜と、光学フィルターとを順に積層し、
前記光学フィルターを介して前記第1の基板と向かい合うように、前記光学フィルター上にプラスチック基板、偏光板、又は位相差板を有する偏光板である第2の基板を第1の接着剤を用いて貼り合わせ、
前記第2の基板上に剥離可能な粘着媒体を用いて支持体を貼り合わせ、
前記第1の基板及び前記第1の金属膜を剥離して光学フィルムを形成する第1の工程と、
第3の基板上に第2の金属膜と、第2の酸化物膜とを順に積層し、前記第2の酸化物膜上に画素を有する層を形成する第2の工程と、
前記第1の工程及び前記第2の工程の後、前記光学フィルムの前記第1の酸化物膜と前記第3の基板の画素を有する層の表面とを第2の接着剤を用いて貼り合わせ、
前記第3の基板及び前記第2の金属膜を剥離する第3の工程と、
前記第2の酸化物膜の表面に、第3の接着剤を用いてプラスチック基板、偏光板、又は位相差板を有する偏光板である第4の基板を貼り合わせた後、前記剥離可能な粘着媒体及び前記支持体を除去する第4の工程とを有することを特徴とする表示装置の作製方法。 - 第1の基板上に、第1の金属膜と、第1の酸化物膜と、光学フィルターとを順に積層し、
前記光学フィルターを介して前記第1の基板と向かい合うように、前記光学フィルター上に支持体を剥離可能な粘着媒体を用いて貼り合わせ、
前記第1の基板及び前記第1の金属膜を剥離し、
前記第1の酸化物膜上にプラスチック基板、偏光板、又は位相差板を有する偏光板である第2の基板を第1の接着剤を用いて貼り合わせた後、前記支持体及び前記剥離可能な粘着媒体を除去して光学フィルムを形成する第1の工程と、
第3の基板上に第2の金属膜と、第2の酸化物膜とを順に積層し、前記第2の酸化物膜上に画素を有する層を形成する第2の工程と、
前記第1の工程及び前記第2の工程の後、前記光学フィルムの前記光学フィルターと前記第3の基板の画素を有する層の表面とを第2の接着剤を用いて貼り合わせ、
前記第3の基板及び前記第2の金属膜を剥離する第3の工程と、
前記第2の酸化物膜の表面に、第3の接着剤を用いてプラスチック基板、偏光板、又は位相差板を有する偏光板である第4の基板を貼り合わせる第4の工程とを有することを特徴とする表示装置の作製方法。 - 請求項4において、前記第4の工程の後、前記光学フィルター上にプラスチック基板、偏光板、又は位相差板を有する偏光板を貼り合わせることを特徴とする表示装置の作製方法。
- 請求項1又は4において、前記第1の基板及び前記第2の基板は、石英基板、セラミックス基板、シリコン基板、金属基板、又はステンレス基板であることを特徴とする表示装置の作製方法。
- 請求項2、3、5又は6において、前記第1の基板及び前記第3の基板は、石英基板、セラミックス基板、シリコン基板、金属基板、又はステンレス基板であることを特徴とする表示装置の作製方法。
- 請求項1乃至9のいずれか一において、前記第1の金属膜と前記第1の酸化物膜の間に、第1の金属酸化物膜が形成されることを特徴とする表示装置の作製方法。
- 請求項1乃至10のいずれか一において、前記第2の金属膜と前記第2の酸化物膜の間に、第2の金属酸化物膜が形成されることを特徴とする表示装置の作製方法。
- 請求項1乃至11のいずれか一において、前記画素を有する層は、半導体素子及び当該半導体素子に接続する画素電極を有することを特徴とする表示装置の作製方法。
- 請求項12において、前記半導体素子は、TFT、有機半導体トランジスタ、ダイオード、又はMIM素子であることを特徴とする表示装置の作製方法。
- 請求項1乃至13のいずれか一において、前記光学フィルターは、カラーフィルター、又は色変換フィルターであることを特徴とする表示装置の作製方法。
- 請求項1乃至14のいずれか一において、前記第1の金属膜及び前記第2の金属膜は、チタン、アルミニウム、タンタル、タングステン、モリブデン、銅、クロム、ネオジム、鉄、ニッケル、コバルト、ルテニウム、ロジウム、パラジウム、オスミウム、イリジウムから選ばれた元素、又は前記元素を主成分とする合金材料若しくは化合物材料からなる単層、又はこれらの積層であることを特徴とする表示装置の作製方法。
- 請求項1乃至15のいずれか一において、前記第1の酸化物膜及び前記第2の酸化物膜は、酸化シリコン、酸化窒化シリコン、又は金属酸化物であることを特徴とする表示装置の作製方法。
- 請求項1乃至16のいずれか一において、前記支持体は、ガラス基板、石英基板、金属基板、又はセラミックス基板であることを特徴とする表示装置の作製方法。
- 請求項1乃至17のいずれか一において、前記剥離可能な粘着媒体は、反応剥離型粘着剤、熱剥離型粘着剤、光剥離型粘着剤、嫌気剥離型粘着剤、又はこれらの一つ若しくは複数で形成される粘着層を両面に有する部材であることを特徴とする表示装置の作製方法。
- 請求項1乃至18のいずれか一において、前記表示装置は、液晶表示装置、発光表示装置、デジタルマイクロミラーデバイス、プラズマディスプレイパネル、フィールドエミッションディスプレイ、又は電気泳動表示装置であることを特徴とする表示装置の作製方法。
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Families Citing this family (86)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100330748A1 (en) * | 1999-10-25 | 2010-12-30 | Xi Chu | Method of encapsulating an environmentally sensitive device |
JP4357854B2 (ja) * | 2003-02-28 | 2009-11-04 | 大日本印刷株式会社 | 光学フィルターおよびこれを用いた有機elディスプレイ |
US8048251B2 (en) | 2003-10-28 | 2011-11-01 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing optical film |
CN100583193C (zh) * | 2003-11-28 | 2010-01-20 | 株式会社半导体能源研究所 | 制造显示设备的方法 |
KR101075599B1 (ko) * | 2004-06-23 | 2011-10-20 | 삼성전자주식회사 | 표시장치 |
US7753751B2 (en) | 2004-09-29 | 2010-07-13 | Semiconductor Energy Laboratory Co., Ltd. | Method of fabricating the display device |
US8772783B2 (en) * | 2004-10-14 | 2014-07-08 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
JP4923610B2 (ja) * | 2006-02-16 | 2012-04-25 | コニカミノルタホールディングス株式会社 | 有機エレクトロルミネッセンス素子、表示装置及び照明装置 |
KR100751453B1 (ko) * | 2006-06-14 | 2007-08-23 | 삼성전자주식회사 | 표시장치와 이의 제조방법 |
US8137417B2 (en) | 2006-09-29 | 2012-03-20 | Semiconductor Energy Laboratory Co., Ltd. | Peeling apparatus and manufacturing apparatus of semiconductor device |
TWI430435B (zh) * | 2006-09-29 | 2014-03-11 | Semiconductor Energy Lab | 半導體裝置的製造方法 |
KR101447044B1 (ko) * | 2006-10-31 | 2014-10-06 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체장치 |
JP2008242311A (ja) * | 2007-03-28 | 2008-10-09 | Sumitomo Chemical Co Ltd | 着色感光性樹脂組成物、並びにそれを用いた色フィルタアレイ及び固体撮像素子 |
JP2008242324A (ja) * | 2007-03-28 | 2008-10-09 | Sumitomo Chemical Co Ltd | 着色感光性樹脂組成物、並びにそれを用いた色フィルタアレイ、固体撮像素子およびカメラシステム |
KR101400807B1 (ko) * | 2007-11-20 | 2014-05-29 | 엘지디스플레이 주식회사 | 전기영동표시장치 및 그 제조 방법 |
US9071809B2 (en) * | 2008-01-04 | 2015-06-30 | Nanolumens Acquisition, Inc. | Mobile, personsize display system and method of use |
KR100889682B1 (ko) * | 2008-01-30 | 2009-03-19 | 삼성모바일디스플레이주식회사 | 유기전계발광표시장치 및 그의 제조방법 |
KR100922359B1 (ko) * | 2008-02-14 | 2009-10-19 | 삼성모바일디스플레이주식회사 | 유기발광 표시장치 |
JP5071152B2 (ja) * | 2008-02-28 | 2012-11-14 | ソニー株式会社 | 表示装置の製造方法および照明装置の製造方法 |
KR101588576B1 (ko) | 2008-07-10 | 2016-01-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 장치 및 전자 기기 |
JP2011003522A (ja) * | 2008-10-16 | 2011-01-06 | Semiconductor Energy Lab Co Ltd | フレキシブル発光装置、電子機器及びフレキシブル発光装置の作製方法 |
KR100971080B1 (ko) * | 2008-11-04 | 2010-07-20 | 이한준 | 이방성 도전볼을 포함하는 혐기성 광경화 접착제의제조방법과 혐기성 광경화접착제를 이용한평판디스플레이의 회로접속방법 |
JP5586920B2 (ja) * | 2008-11-20 | 2014-09-10 | 株式会社半導体エネルギー研究所 | フレキシブル半導体装置の作製方法 |
TWI571684B (zh) | 2008-11-28 | 2017-02-21 | 半導體能源研究所股份有限公司 | 液晶顯示裝置 |
KR101938125B1 (ko) * | 2008-12-17 | 2019-01-15 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 장치 및 전자 기기 |
TWI607670B (zh) | 2009-01-08 | 2017-12-01 | 半導體能源研究所股份有限公司 | 發光裝置及電子裝置 |
KR101006182B1 (ko) * | 2009-01-09 | 2011-01-07 | 주식회사 나래나노텍 | 자외선 및 자연 경화제를 포함한 자외선 경화제를 이용한 패턴 전극의 본딩 구조 및 그 본딩 방법 |
CN101833215B (zh) * | 2009-03-09 | 2013-07-10 | 财团法人工业技术研究院 | 可挠式电子装置的转移结构及可挠式电子装置的制造方法 |
FR2943177B1 (fr) * | 2009-03-12 | 2011-05-06 | Soitec Silicon On Insulator | Procede de fabrication d'une structure multicouche avec report de couche circuit |
US20100253902A1 (en) * | 2009-04-07 | 2010-10-07 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device and manufacturing method thereof |
JP2011018873A (ja) * | 2009-05-22 | 2011-01-27 | Sony Ericsson Mobilecommunications Japan Inc | 電磁シールド方法および電磁シールド用フィルム |
FR2947380B1 (fr) | 2009-06-26 | 2012-12-14 | Soitec Silicon Insulator Technologies | Procede de collage par adhesion moleculaire. |
KR101707433B1 (ko) | 2009-09-04 | 2017-02-16 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 장치 및 발광 장치를 제작하기 위한 방법 |
KR101618157B1 (ko) * | 2009-12-21 | 2016-05-09 | 삼성디스플레이 주식회사 | 표시 장치 및 이의 제조 방법 |
KR101058880B1 (ko) * | 2010-05-07 | 2011-08-25 | 서울대학교산학협력단 | 액티브 소자를 구비한 led 디스플레이 장치 및 그 제조방법 |
TWI400549B (zh) * | 2010-06-01 | 2013-07-01 | Prime View Int Co Ltd | 彩色電泳顯示裝置之製造方法 |
WO2012025954A1 (ja) | 2010-08-25 | 2012-03-01 | パナソニック株式会社 | 有機発光素子とその製造方法、および有機表示パネルと有機表示装置 |
WO2012025961A1 (ja) * | 2010-08-25 | 2012-03-01 | パナソニック株式会社 | 有機発光素子とその製造方法、および有機表示パネルと有機表示装置 |
US9722212B2 (en) * | 2011-02-14 | 2017-08-01 | Semiconductor Energy Laboratory Co., Ltd. | Lighting device, light-emitting device, and manufacturing method and manufacturing apparatus thereof |
KR102040242B1 (ko) * | 2011-05-12 | 2019-11-05 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 장치 및 발광 장치를 이용한 전자 기기 |
CN102169266B (zh) * | 2011-05-17 | 2012-07-04 | 深圳市华星光电技术有限公司 | 液晶显示面板及其驱动、制作方法 |
FR2980598B1 (fr) | 2011-09-27 | 2014-05-09 | Isorg | Interface utilisateur sans contact a composants semiconducteurs organiques |
FR2980599B1 (fr) * | 2011-09-27 | 2014-05-09 | Isorg | Surface imprimee interactive |
KR20130037275A (ko) * | 2011-10-06 | 2013-04-16 | 주식회사 엔씰텍 | 플렉서블 소자를 구비하는 전자 장치의 제조 방법 |
KR20140082974A (ko) * | 2011-10-12 | 2014-07-03 | 아사히 가라스 가부시키가이샤 | 밀착성 수지층을 구비한 전자 디바이스의 제조 방법 |
JP5614423B2 (ja) * | 2012-03-29 | 2014-10-29 | 三菱マテリアル株式会社 | パワーモジュール用基板及びその製造方法 |
FR2989483B1 (fr) | 2012-04-11 | 2014-05-09 | Commissariat Energie Atomique | Dispositif d'interface utilisateur a electrodes transparentes |
TWI469194B (zh) | 2012-05-16 | 2015-01-11 | Au Optronics Corp | 有機電致發光裝置之畫素結構 |
DE102012107797A1 (de) * | 2012-08-23 | 2014-02-27 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung eines Licht emittierenden Halbleiterbauelements und Licht emittierendes Halbleiterbauelement |
KR102161078B1 (ko) | 2012-08-28 | 2020-09-29 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 및 그 제작 방법 |
FR2995419B1 (fr) | 2012-09-12 | 2015-12-11 | Commissariat Energie Atomique | Systeme d'interface utilisateur sans contact |
TWI566005B (zh) * | 2012-09-26 | 2017-01-11 | 友達光電股份有限公司 | 製作顯示面板之方法 |
FR2996933B1 (fr) | 2012-10-15 | 2016-01-01 | Isorg | Appareil portable a ecran d'affichage et dispositif d'interface utilisateur |
KR101951223B1 (ko) * | 2012-10-26 | 2019-02-25 | 삼성디스플레이 주식회사 | 표시장치 및 그 제조방법 |
JP6186697B2 (ja) * | 2012-10-29 | 2017-08-30 | セイコーエプソン株式会社 | 有機el装置の製造方法、有機el装置、電子機器 |
CN103995377A (zh) * | 2013-02-18 | 2014-08-20 | 群创光电股份有限公司 | 显示面板制造方法与系统 |
KR102479472B1 (ko) | 2013-04-15 | 2022-12-19 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 장치 |
JP6182985B2 (ja) * | 2013-06-05 | 2017-08-23 | セイコーエプソン株式会社 | 電気光学装置、電気光学装置の製造方法、電子機器 |
JP2015046391A (ja) * | 2013-08-01 | 2015-03-12 | 株式会社半導体エネルギー研究所 | 発光装置、及び電子機器 |
KR102224416B1 (ko) | 2013-08-06 | 2021-03-05 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 박리 방법 |
TWI794098B (zh) | 2013-09-06 | 2023-02-21 | 日商半導體能源研究所股份有限公司 | 發光裝置以及發光裝置的製造方法 |
FR3010829B1 (fr) * | 2013-09-19 | 2017-01-27 | St Microelectronics Sa | Procede de realisation d'un filtre optique au sein d'un circuit integre, et circuit integre correspondant |
JP6310668B2 (ja) * | 2013-10-02 | 2018-04-11 | 株式会社ジャパンディスプレイ | 表示装置及び表示装置の製造方法 |
JP6513929B2 (ja) | 2013-11-06 | 2019-05-15 | 株式会社半導体エネルギー研究所 | 剥離方法 |
CN104752621B (zh) * | 2013-12-26 | 2017-05-17 | 昆山工研院新型平板显示技术中心有限公司 | 一种提高有源矩阵有机发光显示器显示质量的方法 |
JP2015195140A (ja) * | 2014-03-31 | 2015-11-05 | 株式会社東芝 | フレキシブル有機el表示装置の製造方法 |
TWI695525B (zh) | 2014-07-25 | 2020-06-01 | 日商半導體能源研究所股份有限公司 | 剝離方法、發光裝置、模組以及電子裝置 |
FR3025052B1 (fr) | 2014-08-19 | 2017-12-15 | Isorg | Dispositif de detection d'un rayonnement electromagnetique en materiaux organiques |
EP3239273B1 (en) * | 2014-12-25 | 2019-11-13 | DIC Corporation | Nematic liquid crystal composition and liquid crystal display element using the same |
JP5885868B1 (ja) * | 2015-03-24 | 2016-03-16 | 日東電工株式会社 | パネル部材への連続貼りに用いる光学フィルム積層体 |
KR102415326B1 (ko) * | 2015-10-29 | 2022-06-30 | 삼성디스플레이 주식회사 | 플렉서블 표시 장치 및 플렉서블 표시 장치의 제조 방법 |
JP6822858B2 (ja) | 2016-01-26 | 2021-01-27 | 株式会社半導体エネルギー研究所 | 剥離の起点の形成方法及び剥離方法 |
JP6701777B2 (ja) * | 2016-02-15 | 2020-05-27 | セイコーエプソン株式会社 | 電気光学装置、電子機器 |
JP2017208254A (ja) * | 2016-05-19 | 2017-11-24 | 株式会社ジャパンディスプレイ | 表示装置及びその製造方法 |
CN106098940B (zh) * | 2016-08-26 | 2019-09-06 | 武汉华星光电技术有限公司 | 无损剥离柔性基板的方法 |
KR102597231B1 (ko) * | 2016-09-30 | 2023-11-03 | 삼성디스플레이 주식회사 | 영상 처리 장치, 표시 장치 및 두부 장착 표시 장치 |
KR102179165B1 (ko) * | 2017-11-28 | 2020-11-16 | 삼성전자주식회사 | 캐리어 기판 및 상기 캐리어 기판을 이용한 반도체 패키지의 제조방법 |
CN109872642B (zh) * | 2017-12-04 | 2021-05-18 | 利亚德光电股份有限公司 | 小间距led显示模块及其制作方法 |
CN108735865B (zh) * | 2018-05-26 | 2019-11-01 | 矽照光电(厦门)有限公司 | 一种显示结构生产方法 |
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US10360825B1 (en) | 2018-09-24 | 2019-07-23 | Innolux Corporation | Flexible electronic device |
US11856835B2 (en) * | 2018-09-27 | 2023-12-26 | Sharp Kabushiki Kaisha | Method for manufacturing display device |
EP3894915A4 (en) | 2018-12-14 | 2022-08-17 | 3M Innovative Properties Company | LIQUID CRYSTAL DISPLAY DEVICE HAVING A FRONT FACE LIGHT CONTROL FILM |
JP7332147B2 (ja) * | 2019-08-26 | 2023-08-23 | 株式会社Joled | 表示パネル、および、表示パネルの製造方法 |
CN112442402B (zh) * | 2019-09-05 | 2025-01-24 | 中国石油化工股份有限公司 | 一种酸气的分离工艺 |
KR20220097772A (ko) * | 2020-12-31 | 2022-07-08 | 삼성디스플레이 주식회사 | 표시 패널, 이를 구비한 표시 장치, 및 표시 패널의 제조방법 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003045890A (ja) * | 2001-08-01 | 2003-02-14 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
JP2003109773A (ja) * | 2001-07-27 | 2003-04-11 | Semiconductor Energy Lab Co Ltd | 発光装置、半導体装置およびそれらの作製方法 |
JP2003174153A (ja) * | 2001-07-16 | 2003-06-20 | Semiconductor Energy Lab Co Ltd | 剥離方法および半導体装置の作製方法、および半導体装置 |
JP2003195787A (ja) * | 2001-07-16 | 2003-07-09 | Semiconductor Energy Lab Co Ltd | 発光装置の作製方法 |
JP2003204049A (ja) * | 2001-10-30 | 2003-07-18 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
JP2003229548A (ja) * | 2001-11-30 | 2003-08-15 | Semiconductor Energy Lab Co Ltd | 乗物、表示装置、および半導体装置の作製方法 |
Family Cites Families (58)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3624273A (en) * | 1968-11-22 | 1971-11-30 | Alfred J Gale | Flat screen display devices using an array of charged particle sources |
JPS5331971A (en) | 1976-09-06 | 1978-03-25 | Nippon Telegr & Teleph Corp <Ntt> | Forming method of metal oxide film or semiconductor oxide film |
US4800100A (en) * | 1987-10-27 | 1989-01-24 | Massachusetts Institute Of Technology | Combined ion and molecular beam apparatus and method for depositing materials |
US5156720A (en) * | 1989-02-02 | 1992-10-20 | Alcan International Limited | Process for producing released vapor deposited films and product produced thereby |
JP2617798B2 (ja) * | 1989-09-22 | 1997-06-04 | 三菱電機株式会社 | 積層型半導体装置およびその製造方法 |
JPH0553008A (ja) * | 1991-08-27 | 1993-03-05 | Kyocera Corp | カラーフイルタ |
JP2849008B2 (ja) | 1992-11-02 | 1999-01-20 | 三容真空工業株式会社 | カラー液晶表示装置 |
DE4433330C2 (de) * | 1994-09-19 | 1997-01-30 | Fraunhofer Ges Forschung | Verfahren zur Herstellung von Halbleiterstrukturen mit vorteilhaften Hochfrequenzeigenschaften sowie eine Halbleiterwaferstruktur |
US5757456A (en) * | 1995-03-10 | 1998-05-26 | Semiconductor Energy Laboratory Co., Ltd. | Display device and method of fabricating involving peeling circuits from one substrate and mounting on other |
FR2744285B1 (fr) * | 1996-01-25 | 1998-03-06 | Commissariat Energie Atomique | Procede de transfert d'une couche mince d'un substrat initial sur un substrat final |
EP1744365B1 (en) * | 1996-08-27 | 2009-04-15 | Seiko Epson Corporation | Exfoliating method and transferring method of thin film device |
SG65697A1 (en) * | 1996-11-15 | 1999-06-22 | Canon Kk | Process for producing semiconductor article |
US6033995A (en) * | 1997-09-16 | 2000-03-07 | Trw Inc. | Inverted layer epitaxial liftoff process |
JP3395661B2 (ja) * | 1998-07-07 | 2003-04-14 | 信越半導体株式会社 | Soiウエーハの製造方法 |
US6274887B1 (en) * | 1998-11-02 | 2001-08-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method therefor |
US6590229B1 (en) * | 1999-01-21 | 2003-07-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and process for production thereof |
US6278841B1 (en) * | 1999-07-26 | 2001-08-21 | Eastman Kodak Company | Camera having label mounted electrical component |
JP2001075124A (ja) * | 1999-09-02 | 2001-03-23 | Toppan Printing Co Ltd | 液晶表示装置用電極基板の製造方法及び液晶表示装置 |
TW522453B (en) * | 1999-09-17 | 2003-03-01 | Semiconductor Energy Lab | Display device |
JP4942867B2 (ja) | 1999-09-17 | 2012-05-30 | 株式会社半導体エネルギー研究所 | El表示装置及び電子装置 |
JP3942770B2 (ja) * | 1999-09-22 | 2007-07-11 | 株式会社半導体エネルギー研究所 | El表示装置及び電子装置 |
US6641933B1 (en) * | 1999-09-24 | 2003-11-04 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting EL display device |
US6646692B2 (en) * | 2000-01-26 | 2003-11-11 | Semiconductor Energy Laboratory Co., Ltd. | Liquid-crystal display device and method of fabricating the same |
JP4712198B2 (ja) | 2000-02-01 | 2011-06-29 | 株式会社半導体エネルギー研究所 | 表示装置の作製方法 |
TW494447B (en) * | 2000-02-01 | 2002-07-11 | Semiconductor Energy Lab | Semiconductor device and manufacturing method thereof |
JP2001291850A (ja) * | 2000-04-10 | 2001-10-19 | Hitachi Cable Ltd | 結晶シリコン薄膜の製造方法 |
US7579203B2 (en) * | 2000-04-25 | 2009-08-25 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
US6562648B1 (en) * | 2000-08-23 | 2003-05-13 | Xerox Corporation | Structure and method for separation and transfer of semiconductor thin films onto dissimilar substrate materials |
KR20020027930A (ko) | 2000-10-06 | 2002-04-15 | 김순택 | 플라스틱 기판을 이용한 유기 발광 표시장치 |
FR2817395B1 (fr) * | 2000-11-27 | 2003-10-31 | Soitec Silicon On Insulator | Procede de fabrication d'un substrat notamment pour l'optique, l'electronique ou l'optoelectronique et substrat obtenu par ce procede |
AUPR216700A0 (en) * | 2000-12-19 | 2001-01-25 | Woodside Energy Limited | Method for separation of non-hydrocarbon gases from hydrocarbon gases |
TW545080B (en) * | 2000-12-28 | 2003-08-01 | Semiconductor Energy Lab | Light emitting device and method of manufacturing the same |
JP4059475B2 (ja) * | 2001-03-12 | 2008-03-12 | 日東電工株式会社 | カラーフィルター付き樹脂シートとその製造方法および液晶表示装置 |
JP4801278B2 (ja) * | 2001-04-23 | 2011-10-26 | 株式会社半導体エネルギー研究所 | 発光装置及びその作製方法 |
US6808773B2 (en) | 2001-05-24 | 2004-10-26 | Kyodo Printing Co., Ltd. | Shielding base member and method of manufacturing the same |
JP3923339B2 (ja) | 2002-02-28 | 2007-05-30 | 共同印刷株式会社 | シールド材の製造方法 |
JP4019305B2 (ja) * | 2001-07-13 | 2007-12-12 | セイコーエプソン株式会社 | 薄膜装置の製造方法 |
TW564471B (en) * | 2001-07-16 | 2003-12-01 | Semiconductor Energy Lab | Semiconductor device and peeling off method and method of manufacturing semiconductor device |
TW558743B (en) * | 2001-08-22 | 2003-10-21 | Semiconductor Energy Lab | Peeling method and method of manufacturing semiconductor device |
JP3724725B2 (ja) | 2001-11-01 | 2005-12-07 | ソニー株式会社 | 表示装置の製造方法 |
TWI264121B (en) * | 2001-11-30 | 2006-10-11 | Semiconductor Energy Lab | A display device, a method of manufacturing a semiconductor device, and a method of manufacturing a display device |
US6953735B2 (en) * | 2001-12-28 | 2005-10-11 | Semiconductor Energy Laboratory Co., Ltd. | Method for fabricating a semiconductor device by transferring a layer to a support with curvature |
JP2003298284A (ja) | 2002-04-02 | 2003-10-17 | Kyodo Printing Co Ltd | シールド材及びその製造方法 |
US7223672B2 (en) * | 2002-04-24 | 2007-05-29 | E Ink Corporation | Processes for forming backplanes for electro-optic displays |
JP4410456B2 (ja) * | 2002-04-24 | 2010-02-03 | 株式会社リコー | 薄膜デバイス装置の製造方法、およびアクティブマトリクス基板の製造方法 |
TWI272641B (en) * | 2002-07-16 | 2007-02-01 | Semiconductor Energy Lab | Method of manufacturing a semiconductor device |
US7291970B2 (en) * | 2002-09-11 | 2007-11-06 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting apparatus with improved bank structure |
CN100391004C (zh) * | 2002-10-30 | 2008-05-28 | 株式会社半导体能源研究所 | 半导体装置以及半导体装置的制作方法 |
EP1434264A3 (en) * | 2002-12-27 | 2017-01-18 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method using the transfer technique |
JP2004319538A (ja) * | 2003-04-10 | 2004-11-11 | Seiko Epson Corp | 半導体装置の製造方法、集積回路、電子光学装置及び電子機器 |
JP2005011794A (ja) * | 2003-05-22 | 2005-01-13 | Tohoku Pioneer Corp | 有機elパネル及びその製造方法 |
JP3855270B2 (ja) | 2003-05-29 | 2006-12-06 | ソニー株式会社 | アンテナ実装方法 |
US8048251B2 (en) * | 2003-10-28 | 2011-11-01 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing optical film |
CN101635263B (zh) * | 2003-11-28 | 2013-03-13 | 株式会社半导体能源研究所 | 显示装置的制造方法 |
CN100583193C (zh) * | 2003-11-28 | 2010-01-20 | 株式会社半导体能源研究所 | 制造显示设备的方法 |
US7084045B2 (en) * | 2003-12-12 | 2006-08-01 | Seminconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
US7041520B1 (en) * | 2004-10-18 | 2006-05-09 | Softpixel, Inc. | Method for fabricating liquid crystal displays with plastic film substrate |
US7166520B1 (en) * | 2005-08-08 | 2007-01-23 | Silicon Genesis Corporation | Thin handle substrate method and structure for fabricating devices using one or more films provided by a layer transfer process |
-
2004
- 2004-11-18 CN CN200480035192A patent/CN100583193C/zh not_active Expired - Fee Related
- 2004-11-18 KR KR1020067012918A patent/KR101095293B1/ko active IP Right Grant
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- 2009-10-09 US US12/576,270 patent/US7935969B2/en not_active Expired - Lifetime
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-
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- 2013-11-07 US US14/074,063 patent/US9004970B2/en not_active Expired - Lifetime
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- 2015-03-17 US US14/659,968 patent/US9666752B2/en active Active
-
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- 2017-05-25 US US15/605,086 patent/US10128402B2/en not_active Expired - Lifetime
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003174153A (ja) * | 2001-07-16 | 2003-06-20 | Semiconductor Energy Lab Co Ltd | 剥離方法および半導体装置の作製方法、および半導体装置 |
JP2003195787A (ja) * | 2001-07-16 | 2003-07-09 | Semiconductor Energy Lab Co Ltd | 発光装置の作製方法 |
JP2003109773A (ja) * | 2001-07-27 | 2003-04-11 | Semiconductor Energy Lab Co Ltd | 発光装置、半導体装置およびそれらの作製方法 |
JP2003045890A (ja) * | 2001-08-01 | 2003-02-14 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
JP2003204049A (ja) * | 2001-10-30 | 2003-07-18 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
JP2003229548A (ja) * | 2001-11-30 | 2003-08-15 | Semiconductor Energy Lab Co Ltd | 乗物、表示装置、および半導体装置の作製方法 |
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US20150187984A1 (en) | 2015-07-02 |
US20070181246A1 (en) | 2007-08-09 |
CN1886769A (zh) | 2006-12-27 |
US7601236B2 (en) | 2009-10-13 |
KR20060116842A (ko) | 2006-11-15 |
US20100067235A1 (en) | 2010-03-18 |
CN100583193C (zh) | 2010-01-20 |
US20110198601A1 (en) | 2011-08-18 |
US8581491B2 (en) | 2013-11-12 |
KR101095293B1 (ko) | 2011-12-16 |
US7935969B2 (en) | 2011-05-03 |
US10128402B2 (en) | 2018-11-13 |
KR20110091797A (ko) | 2011-08-12 |
US20170263806A1 (en) | 2017-09-14 |
JP2005183374A (ja) | 2005-07-07 |
US20140060728A1 (en) | 2014-03-06 |
WO2005052893A1 (en) | 2005-06-09 |
US9004970B2 (en) | 2015-04-14 |
US9666752B2 (en) | 2017-05-30 |
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