JP4007526B2 - 6-side inspection system for chips - Google Patents

Description

[0001]
BACKGROUND OF THE INVENTION
In the manufacturing process of a hexahedral chip among various chips (various small electronic components such as capacitors, resistors, etc.), the present invention has six surfaces (front, back, top, bottom, left and right surfaces). ) With a CCD camera or other chip inspection camera to inspect the external shape, scratches, defects, dirt, and other defects on each side of the chip, and separate the chips into non-defective products. This relates to a six-surface inspection apparatus for chips.
[0002]
[Prior art]
Conventionally, it has been widely practiced to visually inspect defects such as scratches, defects, and dirt on the chip to separate the chips into non-defective products and defective products. First, only one surface (upper surface) and then two surfaces (upper surface and Although the inspection of the lower surface has been performed, visual inspection becomes difficult as the miniaturization of the chip (for example, the 0603 type is 0.6 mm in length and 0.3 mm in width) progresses, and the final product (for example, television) From the seriousness of troubles caused by the chip after becoming a video, etc., improvement of the inspection accuracy of the chip has been demanded. Recently, four or six surfaces of the chip are used by using a camera. The entire surface is inspected.
[0003]
However, the conventional six-surface inspection apparatus for chips using a camera, for example, as shown in FIG. 7, loads a chip t from the feeder 2a into the concave portion 3a of the circumferential portion and conveys it to one side. A vertical rotor 1b is installed by vertically intersecting the circumferential recesses 3a and 3b, and a camera (1) provided at the front, upper, and lower positions opposite the circumferential recess 3a of the horizontal rotor 1a. After inspecting the front surface, the upper surface, and the lower surface of the chip t with a, (2) a, and (3) a, transfer the inspected chip from the concave portion 3a of the horizontal rotor 1a to the concave portion 3b of the vertical rotor 1b. The cameras (4) a, (5) a, (6) a provided at the upper, left, and right positions relative to the concave portion 3b of the vertical rotor 1b, After inspecting the left surface and inspecting the six surfaces of the chip t, The flop t is obtained so as to separation into non-defective products and defective products.
[0004]
[Prior art issues]
The above-described conventional apparatus has the following problems, and an effective solution has been demanded.
(B) The cost is high because two precision and expensive rotors are required.
(2) Installation space is required to install two rotors, and the apparatus becomes large.
C) It is difficult to set the timing of two rotors that rotate at high speed intermittent rotation (1000 to 2000 steps per minute), and troubles are likely to occur when changing chips.
(D) Since it is transported by two rotors and finally inspects the six surfaces of the chip and performs good / bad separation, the inspection speed and the separation speed are slow, which hinders high-speed processing.
[0005]
[Problems solved by the present invention]
Therefore, the present invention solves the above-described conventional problems by developing a chip six-surface inspection apparatus that can perform six-surface inspection of a chip on one rotor.
[0006]
That is, the present invention is provided with six cameras for three around the concave portion of the rotor, initially inspecting three surfaces of the chip with the three cameras, and passing the U-shaped chute from the concave portion through the U-shaped chute. Turn the front, back, and rotate the top, bottom, left, and right 90 ° and return to the recess, inspect the three sides of the tip with the three cameras, and the six sides of the tip are the same An apparatus capable of being inspected on a rotor is provided to solve a conventional problem.
[0007]
[Means for solving the problems]
The present invention is equipped with a chip conveyed by a feeder or the like so as to be separated and loaded one by one into each concave part of a rotor in which a concave part for chip loading is formed in the circumferential part of a disk that rotates intermittently at high speed. The inspection camera (1), (2), (3) at the front, upper, and lower positions relative to the recess of the rotor,
[0008]
A pipe-shaped U-shaped chute having a chute hole introduction port through which a chip is passed at a front position relative to the rear concave portion from the concave portion and a discharge port opened at a front position opposite to the rear concave portion from the concave portion. Prepared,
[0009]
The U-shaped chute is formed with a U-shaped chute hole and twisted by 90 ° between the inlet and outlet, and the front and rear surfaces are inverted by 180 ° before the tip reaches the outlet. With the top, bottom, left and right sides rotated 90 degrees,
[0010]
Cameras for inspection (4), (5), (6) are provided at front, upper, and lower positions relative to the rear concave portion of the U-shaped chute,
[0011]
In the process of transporting the chips loaded in each recess by intermittent rotation of the rotor, the camera (1) inspects the front surface of the chip, the camera (2) the upper surface, the camera (3) the lower surface, and the three-surface inspected chip Pass the U-shaped chute from the recess and reverse the front and rear surfaces, rotate the top, bottom, left and right surfaces by 90 ° and return them to the recess. The present invention solves the problem by a six-surface inspection device for a chip, wherein the six surfaces of the chip are inspected by inspecting the left surface and the right surface with a camera (6).
[0012]
【Example】
Examples of the present invention will be described. (See FIGS. 1-6)
The chip t conveyed by the feeder 2 or the like is conveyed by being separately loaded into each concave portion 3 of the rotor 1 in which the concave portion 3 for chip loading is formed in the circumferential portion of the disk that rotates intermittently at high speed. Provided with inspection cameras (1), (2), (3) at front, upper and lower positions relative to the recess 3 of the rotor 1,
[0013]
A pipe in which an introduction port 4b of a chute hole 4a through which the chip t is passed is opened at a front position opposite to the rear recess 3 from the recess 3, and a discharge port 4c is opened at a front position opposite to the rear recess from the recess. With a U-shaped chute 4
[0014]
The U-shaped chute 4 is formed with a U-shaped chute hole 4a (the cross-sectional shape of the hole is a square or a rectangle corresponding to the cross-sectional shape of the chip) and 90 ° between the inlet 4b and the outlet 4c. Twist and form the tip t from the introduction port 4b to the discharge port 4c, the front and rear surfaces are inverted 180 ° and the upper, lower, left and right surfaces are rotated 90 °,
[0015]
Cameras (4), (5), (6) for inspection are provided at front, upper, and lower positions relative to the rear recess 3 of the U-shaped chute 4;
[0016]
In the process of transporting the chip t loaded in each recess 3 by intermittent rotation of the rotor 1, the front surface of the chip t with the camera (1), the upper surface with the camera (2), and the lower surface with the camera (3) are inspected. The inspected chip t passes through the U-shaped chute 4 from the recess 3 and the front and rear surfaces are reversed, and the upper, lower, left, and right surfaces are rotated by 90 ° and returned to the recess 3, and the chip (4) is used to This is a six-surface inspection device for chips, in which six surfaces of the chip t are inspected by inspecting the rear surface of t, the left surface with the camera (5), and the right surface with the camera (6).
[0017]
The aspect of the above-described embodiment apparatus will be described in more detail. For example, the intake holes 6 communicating with the intake grooves 5 are provided in the respective recesses 3 of the rotor 1 to suck and hold the chips t loaded in the respective recesses 3. So that
[0018]
In addition, an air inlet 7 is opened in the upper surface of the recess 3 facing the camera (3) or (6) provided in the lower position so as to suck and hold the chip t, and the chip is mounted on the base 8 on the lower surface of the recess 3. t is provided with a window 9 for inspecting the lower and right surfaces of t with the camera (3) or (6),
[0019]
A recess 3 at a position opposite to the inlet 4b of the U-shaped chute 4 is provided with an injection port 10, and the tip t of the recess 3 is blown into the inlet 4b by the injection force of the outlet 10 and a recess opposite to the carry-out port 4c. The tip t in the U-shaped chute 4 is transferred in cooperation with the suction force of the third suction hole 6 and is loaded back into the recess 3.
[0020]
[Action]
The operation of the illustrated embodiment will be described below. One chip t is separately loaded from the feeder 2 or the like into each recess 3 of the rotor 1 and conveyed at high speed, and the chip in the recess 3 is moved by the camera (1) in front of the recess 3. The front surface of t is inspected, and in the next step, the upper surface is inspected with the camera (2) in the upper position, and in the next step, the lower surface is inspected with the camera (3) in the lower position.
[0021]
In the lower surface inspection, the air inlet 7 sucks and holds the chip t upward, and the inspection of the camera (3) is performed through the window 9 on the lower surface.
[0022]
The recess 3 of the tip t that has undergone the three-surface inspection is opposed to the introduction port 4b of the U-shaped chute 4, and at the same time, the tip t of the recess 3 is blown into the introduction port 4b by the blowing force of the blowing port 10, and at the same time relative to the discharge port 4c The suction force of the suction hole 6 of the recessed portion 3 cooperates and the tip t is transferred to the discharge port 4c. During this time, the front and rear surfaces of the tip t are turned 180 °, and the upper, lower, left and right sides are turned 90 °. A rotated posture is returned to the recess 3.
[0023]
In the next step, the rear surface of the chip t reloaded by the camera (4) in the front position of the recess 3 is inspected. In the next step, the left surface is inspected by the upper camera (5). Inspect the right side with the camera (6).
[0024]
In the right side inspection, similarly to the lower surface inspection, the air inlet 7 sucks and holds the chip t upward, and the camera (6) is inspected through the window 9 on the lower surface.
[0025]
The chip t that has been subjected to the six-surface inspection in the above-described manner is excluded from the rotor in accordance with the classification of the non-defective chip and the defective chip according to the six-surface inspection result during the subsequent step conveyance, and the non-defective chip is removed from the rotor. Take out and store.
[0026]
【effect】
6-side inspection of the chip can be performed on the circumference of one rotor, so only one rotor is required, the cost is low, the installation space is small, the inspection separation speed is fast, and extremely high efficiency An apparatus may be provided.
[Brief description of the drawings]
FIG. 1 is a plan view showing a schematic configuration of an apparatus according to an embodiment of the present invention.
FIG. 2 is a perspective view showing six surfaces (front, back, top, bottom, left, right) of the chip.
FIG. 3 is a perspective view showing a state in which the front and rear surfaces of the chip of FIG. 2 are turned by 180 ° and the upper, lower, left, and right surfaces are rotated by 90 °.
FIG. 4 is a partially enlarged cross-sectional view showing a state in which the front surface of the chip is inspected with the camera (1) and the rear surface is inspected with the camera (4).
FIG. 5 is a partially enlarged cross-sectional view showing a state in which the upper surface of the chip is inspected with the camera (2) and the left surface is inspected with the camera (5).
6 is a partially enlarged cross-sectional view showing a state in which the lower surface of the chip is inspected with the camera (3) and the right surface is inspected with the camera (6). FIG.
FIG. 7 is a perspective view of a conventional device.
[Explanation of symbols]
t Chip 1 Rotor 2 Feeder 3 Recess 4 U-shaped chute 4a Chute hole 4b Inlet 4c Discharge port 5 Intake groove 6 Intake hole 7 Intake port 8 Base 9 Window 10 Fumarole

Claims (3)

Chips transported by a feeder or the like are prepared so as to be separately loaded and transported to each recess of a rotor in which a recess for chip loading is formed on the circumferential portion of a disk that rotates intermittently at high speed. Cameras for inspection (1), (2), (3) are provided at front, upper, and lower positions relative to the recess,
A pipe-shaped U-shaped chute having a chute hole introduction port through which a chip is passed at a front position relative to the rear concave portion from the concave portion and a discharge port opened at a front position opposite to the rear concave portion from the concave portion. Prepared,
The U-shaped chute is formed with a U-shaped chute hole and twisted by 90 ° between the inlet and outlet, and the front and rear surfaces are inverted by 180 ° before the tip reaches the outlet. With the top, bottom, left and right sides rotated 90 degrees,
Cameras for inspection (4), (5), (6) are provided at front, upper, and lower positions relative to the rear concave portion of the U-shaped chute,
In the process of transporting the chips loaded in each recess by intermittent rotation of the rotor, the camera (1) inspects the front surface of the chip, the camera (2) the upper surface, the camera (3) the lower surface, and the three-surface inspected chip Pass the U-shaped chute from the recess and reverse the front and rear surfaces, rotate the top, bottom, left and right surfaces by 90 ° and return them to the recess. The left side is inspected on the right side with the camera (6), so that 6 sides of the chip are inspected.
6-side inspection device for chips. In each recess of the rotor, an intake hole communicating with the intake groove is arranged, and the chip loaded in each recess is prepared to be sucked and held,
In addition, an air inlet is opened in the upper surface of the concave portion facing the camera provided in the lower position so that the chip is sucked and held, and the lower surface and right surface of the chip are inspected by the camera on the base plate on the lower surface of the concave portion. Opened the window,
6. A six-surface inspection apparatus for chips according to claim 1. A concave portion at a position opposite to the inlet of the U-shaped chute is provided with a jet port, and the tip of the concave portion is blown into the inlet by the jet force of the jet port, and cooperates with the suction force of the inlet hole of the concave portion opposite to the carry-out port. The tip in the U-shaped chute is transported and loaded back into the recess.
6. A six-surface inspection apparatus for chips according to claim 1.