JP5703589B2 - Appearance inspection device - Google Patents

Description

  The present invention relates to an appearance inspection apparatus, and more particularly to an appearance inspection apparatus for imaging and inspecting the appearance of an electronic component such as a capacitor to determine whether it is good or bad.

  At the final stage of the manufacturing process, electronic components such as capacitors and inductors are inspected for electrical characteristics and appearance to determine whether they are good or defective, and reject only defective products and tap only good products. In the appearance inspection, the electronic components housed in the recesses of the transport table are imaged by illuminating illumination light, and the quality is determined by observing the captured images. Patent document 1 can be mentioned as this kind of external appearance inspection apparatus.

  In this type of visual inspection apparatus, as shown in FIG. 6, the electronic component 120 is housed in a recess 101 formed on the outer peripheral edge of a disc-shaped transport table 100 rotating in the direction of arrow a, and a guide is provided. In a state where the outer peripheral portion is sealed with the member 110, the illumination light y is applied from the main surface side of the transfer table 100 and is imaged with a CCD camera (not shown). A circular direction identification mark 121 is formed on the upper surface of the electronic component 120. Reference numeral 105 denotes a base, and 106 denotes a cover glass.

  However, in the appearance inspection apparatus shown in FIG. 6, the suction holding means is in contact with the side surface 101 a of the recess 101 and the side surface 110 a of the guide member 110 as shown in FIG. Has been. Accordingly, when the illumination light y is applied, a part of the illumination light y is blocked by the ridge line portion 101b of the recess 101 and the ridge line portion 110a of the guide member 110, and the CCD camera does not reach the ridge line portion of the electronic component 120. There was a problem in the appearance selection by the captured images. Specifically, the image of the portion marked with x in FIG. 7 becomes unclear.

JP 2008-241596 A

  SUMMARY OF THE INVENTION An object of the present invention is to provide an appearance inspection apparatus that can clearly image even a ridge line portion of an electronic component.

In order to achieve the above object, an appearance inspection apparatus according to an aspect of the present invention includes:
In an appearance inspection apparatus that stores one by one rectangular parallelepiped-shaped electronic components in a recess formed in a conveyance table that is rotationally driven intermittently in one direction, and images and inspects the appearance of the electronic components,
The transport table has a disk shape, and the concave portions are formed at a predetermined pitch on the outer peripheral edge portion thereof.
The recess is opened on one main surface and outer peripheral surface of the transfer table,
An imaging means and an illumination means are arranged at a position facing the one main surface of the recess,
Having a first inclined surface provided on a notched ridge line portion comprising a side surface of the recess and the one main surface, the first inclined surface is provided only on the downstream side in the rotation direction of the transport table;
The intersection of the side surface and the first inclined surface is the side on which the illumination light from the illumination means strikes, and is disposed on the opposite side of the illumination means from the chamfered portion of the corner of the electronic component,
A guide member having a side surface at a position facing the outer peripheral surface of the concave portion and having one principal surface that is the same plane as one principal surface of the transfer table is disposed,
A second inclined surface provided on a notched ridge line portion comprising a side surface and one main surface of the guide member;
The electronic component is positioned so that its side surface comes into contact with the side surface of the recess,
Furthermore, the electronic apparatus includes an adsorption holding unit that adsorbs and holds the electronic component in the concave portion, and the adsorption holding unit is disposed on the downstream side in the rotation direction of the transport table, and the electronic component is arranged on the first and second inclined surface sides. Adsorbing and holding,
It is characterized by.

  In the appearance inspection apparatus, light is irradiated from the illumination unit to the electronic component housed in the recess of the transport table. Since the first inclined surface is provided in the ridge line portion composed of the side surface and one main surface of the recess, the illumination light reaches the corner of the electronic component without being blocked by the ridge line portion, and the surface of the electronic component Is clearly imaged. As a result, the appearance of the electronic component can be inspected without hindrance.

  According to the present invention, even the ridge line portion of the electronic component can be clearly imaged, and the accuracy of appearance selection is improved.

It is a top view which shows schematic structure of an external appearance inspection apparatus. The principal part of the external appearance inspection apparatus which is 1st Example is shown, (A) is a top view, (B) is X1-X1 sectional drawing of (A), (C) is X2-X2 sectional drawing of (A). is there. It is explanatory drawing of the illumination state with respect to an electronic component, (A) shows coaxial epi-illumination, (B) shows ring illumination. The principal part of the external appearance inspection apparatus which is 2nd Example is shown, (A) is a top view, (B) is X3-X3 sectional drawing of (A), (C) is X4-X4 sectional drawing of (A). is there. The principal part of the external appearance inspection apparatus which is 3rd Example is shown, (A) is X5-X5 sectional drawing of (B), (B) is a back view, (C) is X6-X6 sectional drawing of (B). is there. The principal part of the conventional external appearance inspection apparatus is shown, (A) is a plan view, (B) is an X7-X7 sectional view of (A), and (C) is an X8-X8 sectional view of (A). It is explanatory drawing which shows the shadow of the illumination light in the conventional external appearance inspection apparatus.

  Embodiments of an electronic component appearance inspection apparatus according to the present invention will be described below with reference to the accompanying drawings. In addition, in each figure, the same code | symbol is attached | subjected to a common component and part, and the overlapping description is abbreviate | omitted.

(Schematic configuration of inspection device, see Fig. 1)
An outline of an example of an apparatus for measuring the characteristics of an electronic component and inspecting its appearance will be described with reference to FIG.

  As shown in FIG. 1, the inspection apparatus 1 supplies chip-type electronic components (here, the target is a multilayer ceramic capacitor) from a parts feeder 10 to a conveyance table 20, and the conveyance table 20 is in the direction of arrow a. As the motor rotates intermittently, the electrical characteristics of the electronic components are measured, the appearance is inspected, and defective products are removed. Then, one non-defective product is placed in the recess 51 of the tape 50 that is intermittently conveyed in the direction of the arrow b. It is designed to be housed one by one.

  The transfer table 20 has a disk shape, and has a recess 21 that accommodates electronic components one by one at the outer peripheral edge thereof. The supply station 41 rotates intermittently in the direction of arrow a for each arrangement pitch of the recess 21. The electronic parts are accommodated. An outer peripheral guide member 30 for sealing the outer peripheral side of the recess 21 facing the outer peripheral surface of the transport table 20 is arranged except for the transport region of the tape 50 as shown by hatching in FIG. Yes.

  The electronic component accommodated in the recess 21 is measured for capacity characteristics at a station 42, measured for voltage characteristics at a station 43, and inspected for appearance at a station 44. Electronic parts that are determined to be defective by measurement / inspection at the respective stations 42, 43, 44 are excluded from the take-out portion 31 formed on the outer peripheral guide member 30. The electronic components determined as non-defective products are delivered from the transport table 20 to the tape 50 at the discharge station 45. Further, a cover member (not shown) is provided so as to cover the surface of the tape 50 including the discharge station 45.

  The tape 50 is formed with recesses 51 for receiving electronic components one by one at the same pitch as the recesses 21 and is fed out from the supply reel 52 and conveyed in the direction of the arrow b. It is accommodated in the recess 51 at the station 45. A seal tape 53 is affixed to the surface of the tape 50 that accommodates the electronic components, and is welded by the heater 54 and then wound around the reel 55.

  Note that the characteristic measurement, inspection, quality determination method, and the like at the stations 42 and 43 are the same as those in the prior art, and detailed description is omitted, and the configuration of the appearance inspection station 44 will be described below.

(Refer to the first embodiment, FIGS. 2 to 3)
As shown in FIG. 2, a base 60 is disposed on the lower surface side of the transfer table 20, and a cover glass 61 is disposed on the upper surface side. The cover glass 61 has a window portion 61 a at a position corresponding to the appearance inspection station 44. Concave portions 21 formed at equal pitches on the outer peripheral edge of the transfer table 20 are open on one main surface (the main surface on the cover glass 61 side) and the outer peripheral surface of the transfer table 20, and the bottom is closed by the base 60. In addition, the side surface 30a of the guide member 30 is closely opposed to the outer peripheral surface.

  Further, a vacuum suction means 65 for sucking and holding the electronic component 120 in the recess 21 is installed between the base 60 and the outer peripheral guide member 30. The vacuum suction means 65 sucks and holds the electronic component 120 in a state where the electronic component 120 is in contact with the side surface 21a and the side surface 30a of the outer peripheral guide member 30 in the recess 21 (see FIG. 2A). The ridge line part which consists of the side surface 21a and one main surface of the recessed part 21 is made into the cut | disconnected 1st slope part 21b. Furthermore, the ridgeline part which consists of the side surface 30a and one main surface of the outer periphery guide member 30 is made into the 2nd inclined surface 30b which was notched.

  As shown in FIG. 2C, a CCD camera 70 and a ring illuminator 75, which are imaging means, are arranged at a position facing one main surface of the recess 21.

  The electronic components 120 housed one by one in the recess 21 of the transport table 20 and transported to the appearance inspection station 44 receive the illumination light y from the ring illuminator 75 while the rotation of the transport table 20 is temporarily stopped. Then, the surface is imaged by the CCD camera 70. This image is displayed on a monitor screen (not shown), and the presence or absence of an external scratch or the like is determined. At this time, since the ridge line portion of the electronic component 120 and the portions facing the side surfaces 21a and 30a are the ridge line portions of the side surfaces 21a and 30a are inclined surfaces 21b and 30b, the illumination light y is the ridge line of the electronic component 120. As a result, the surface of the electronic component 120 is clearly imaged. Thus, the appearance of the electronic component 120 can be inspected without hindrance.

  Incidentally, the first inclined surface 21 b is formed on the downstream side with respect to the rotation direction “a” of the transport table 20. This is because the transportability is more stable when the electronic component 120 is transported against the downstream side surface 21a in the recess 21 than the downstream side surface 21c.

  Further, the corners of the electronic component 120 are chamfered in a circular arc shape in cross section. The area of the inclined surfaces 21b and 30b is larger than the chamfered portion of the corner of the electronic component 120, so that the illumination light y can be effectively irradiated to the corner of the electronic component 120. Is preferable. In terms of area ratio, the area of the inclined surfaces 21 b and 30 b is preferably 10 to 100% wider than the area of the chamfered portion of the corner of the electronic component 120.

  As shown in FIG. 3A, if vertical illumination (coaxial epi-illumination) is applied from directly above the electronic component 120, the captured image will not be adversely affected even if the inclined surfaces 21b and 30b are not formed. You might also say that. However, since the corner portion of the electronic component 120 is a chamfered portion 120a having a circular arc cross section, light is regularly reflected by the chamfered portion 120a in the coaxial incident illumination, and as a result, the image of the corner portion of the electronic component 120 is It becomes unclear.

  However, ring illumination or dome illumination by the illuminator 75 radiates illumination light y from various angles as shown in FIG. 3B, and therefore, the chamfered portion 120a of the electronic component 120 is also reflected at various angles. . Therefore, as illumination light, ring illumination or dome illumination is preferable to coaxial epi-illumination.

(Refer to the second embodiment, FIG. 4)
In the second embodiment, as shown in FIG. 4, an electrostatic adsorption means 66 is provided as means for adsorbing and holding the electronic component 120 in the recess 21. The electrostatic attraction means 66 holds and holds the electronic component 120 in contact with the side surface 21a and the side surface 30a of the outer circumferential guide member 30 in the recess 21 (see FIG. 4A). Other configurations are the same as those of the first embodiment. Therefore, the operational effects of the second embodiment are the same as those of the first embodiment.

(Refer to the third embodiment, FIG. 5)
In the third embodiment, as shown in FIG. 5, the recess 21 is formed so as to open to the lower surface side of the transport table 20, and a window 60 a for appearance imaging is formed on the base 60. Other configurations are the same as those of the first embodiment. Accordingly, the operational effects of the third embodiment are the same as those of the first embodiment.

(Other examples)
The appearance inspection apparatus according to the present invention is not limited to the above-described embodiment, and can be variously modified within the scope of the gist thereof. In particular, the electronic component that is the object to be inspected is not limited to the capacitor, but may be an inductor, a filter, a composite component, or the like.

  As described above, the present invention is useful for an appearance inspection apparatus that images and inspects the appearance of an electronic component, and is particularly excellent in that even a ridge line portion of the electronic component can be clearly imaged.

DESCRIPTION OF SYMBOLS 20 ... Transfer table 21 ... Concave part 21a ... Side 21b ... 1st inclined surface 30 ... Outer periphery guide member 30a ... Side surface 30b ... 2nd inclined surface 65 ... Vacuum suction means 66 ... Electrostatic suction means 70 ... CCD camera 75 ... Ring Lighting 120 ... Electronic components

Claims (6)

In an appearance inspection apparatus that stores one by one rectangular parallelepiped-shaped electronic components in a recess formed in a conveyance table that is rotationally driven intermittently in one direction, and images and inspects the appearance of the electronic components,
The transport table has a disk shape, and the concave portions are formed at a predetermined pitch on the outer peripheral edge portion thereof.
The recess is opened on one main surface and outer peripheral surface of the transfer table,
An imaging means and an illumination means are arranged at a position facing the one main surface of the recess,
Having a first inclined surface provided on a notched ridge line portion comprising a side surface of the recess and the one main surface, the first inclined surface is provided only on the downstream side in the rotation direction of the transport table;
The intersection of the side surface and the first inclined surface is the side on which the illumination light from the illumination means strikes, and is disposed on the opposite side of the illumination means from the chamfered portion of the corner of the electronic component,
A guide member having a side surface at a position facing the outer peripheral surface of the concave portion and having one principal surface that is the same plane as one principal surface of the transfer table is disposed,
A second inclined surface provided on a notched ridge line portion comprising a side surface and one main surface of the guide member;
The electronic component is positioned so that its side surface comes into contact with the side surface of the recess,
Furthermore, the electronic apparatus includes an adsorption holding unit that adsorbs and holds the electronic component in the concave portion, and the adsorption holding unit is disposed on the downstream side in the rotation direction of the transport table, and the electronic component is arranged on the first and second inclined surface sides. Adsorbing and holding,
An appearance inspection apparatus characterized by The visual inspection apparatus according to claim 1, wherein the first inclined surface and / or the second inclined surface has a larger area than a chamfered portion of a corner portion of the electronic component. The visual inspection apparatus according to claim 2 , wherein the first inclined surface and / or the second inclined surface has an area that is 10 to 100% wider than a chamfered portion of a corner of the electronic component. . Appearance inspection apparatus according to any one of claims 1 to 3, characterized in, that the suction holding means is a vacuum suction means. Appearance inspection apparatus according to any one of claims 1 to 3, characterized in, that the suction holding means is an electrostatic adsorption means. It said illuminating means appearance inspection apparatus according to any one of claims 1 to 5, characterized in, that a ring illumination.

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