JP2018189582A - 計測装置 - Google Patents
計測装置 Download PDFInfo
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- JP2018189582A JP2018189582A JP2017093942A JP2017093942A JP2018189582A JP 2018189582 A JP2018189582 A JP 2018189582A JP 2017093942 A JP2017093942 A JP 2017093942A JP 2017093942 A JP2017093942 A JP 2017093942A JP 2018189582 A JP2018189582 A JP 2018189582A
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- 238000005259 measurement Methods 0.000 title claims abstract description 45
- 238000009826 distribution Methods 0.000 claims abstract description 14
- 230000001678 irradiating effect Effects 0.000 claims abstract description 4
- 230000003746 surface roughness Effects 0.000 claims description 22
- 238000003754 machining Methods 0.000 claims description 9
- 238000005498 polishing Methods 0.000 abstract 2
- 239000000463 material Substances 0.000 description 32
- 238000000034 method Methods 0.000 description 24
- 239000000523 sample Substances 0.000 description 6
- 238000005520 cutting process Methods 0.000 description 5
- 230000001427 coherent effect Effects 0.000 description 4
- 239000002173 cutting fluid Substances 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
- G01B17/08—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
- G01B17/06—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S15/00—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems
- G01S15/88—Sonar systems specially adapted for specific applications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/52—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S15/00
- G01S7/521—Constructional features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/52—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S15/00
- G01S7/539—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S15/00 using analysis of echo signal for target characterisation; Target signature; Target cross-section
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S15/00—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems
- G01S15/003—Bistatic sonar systems; Multistatic sonar systems
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Computer Networks & Wireless Communication (AREA)
- Acoustics & Sound (AREA)
- Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Machine Tool Sensing Apparatuses (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
Abstract
Description
計測装置1は、超音波を被削材(計測対象)51に照射する超音波振動子20と、超音波振動子20から照射され、被削材51で反射、回折した超音波を集束する音響レンズ32と、音響レンズ32で集束された超音波を電気信号に変換する受光素子配列(受音素子部)41と、受音素子配列41からのアナログ信号をデジタル信号に変換するA/Dコンバータアレイ42と、A/Dコンバータアレイ42に接続される計算機43と、超音波振動子20に対して被削材51を相対的に移動又は傾斜可能な駆動機構53と、を備える。計算機43は、超音波の走査照射によって受音素子配列41で得られる情報を時系列で記憶し、時系列で記憶した情報を空間情報に変換して音響強度分布を取得する。
20 超音波振動子
32 音響レンズ
41 受光素子配列(受音素子部)
42 A/Dコンバータアレイ(A/D変換部)
43 計算機
51 被削材(加工される対象物、計測対象)
53 駆動機構
60 数値制御装置
70 表示器
Claims (4)
- 工作機械で加工される対象物を計測対象として計測する計測装置であって、
超音波を前記計測対象に照射する超音波振動子と、
前記超音波振動子から照射され、前記計測対象で反射、回折した超音波を集束する音響レンズと、
前記音響レンズで集束された超音波を電気信号に変換する受音素子部と、
前記受音素子部からのアナログ信号をデジタル信号に変換するA/D変換部と、
A/D変換部に接続される計算機と、
前記超音波振動子に対して前記計測対象を相対的に移動又は傾斜可能な駆動機構と、
を備え、
前記計算機は、
超音波の走査照射によって前記受音素子部で得られる情報を時系列で記憶し、時系列で記憶した情報を空間情報に変換して音響強度分布を取得する計測装置。 - 加工形状を指令する数値制御装置を更に備え、
前記駆動機構は、
前記数値制御装置から取得した前記加工形状に応じて前記超音波振動子、前記音響レンズ及び前記受音素子部を移動又は傾斜させる請求項1に記載の計測装置。 - 前記計算機は、取得した音響強度分布から微細構造の幾何寸法及び表面粗さを算出可能な請求項1又は2に記載の計測装置。
- 前記計算機は、取得した空間的な音響強度分布を、前記加工形状に重ね合わせて表示可能な請求項2に記載の計測装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017093942A JP6480979B2 (ja) | 2017-05-10 | 2017-05-10 | 計測装置 |
DE102018002838.1A DE102018002838B4 (de) | 2017-05-10 | 2018-04-09 | Messvorrichtung |
US15/952,655 US10502563B2 (en) | 2017-05-10 | 2018-04-13 | Measurement device |
CN201810426089.6A CN108871245B (zh) | 2017-05-10 | 2018-05-07 | 测量装置 |
Applications Claiming Priority (1)
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JP2017093942A JP6480979B2 (ja) | 2017-05-10 | 2017-05-10 | 計測装置 |
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JP2018189582A true JP2018189582A (ja) | 2018-11-29 |
JP6480979B2 JP6480979B2 (ja) | 2019-03-13 |
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Country Status (4)
Country | Link |
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US (1) | US10502563B2 (ja) |
JP (1) | JP6480979B2 (ja) |
CN (1) | CN108871245B (ja) |
DE (1) | DE102018002838B4 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE112021003868T5 (de) | 2020-09-17 | 2023-05-11 | Fanuc Corporation | Berechnungsvorrichtung, System zur Vorhersage der Oberflächenrauheit und Berechnungsverfahren |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109060207B (zh) * | 2018-08-22 | 2019-08-20 | 大连理工大学 | 过盈配合连接力超声检测装置与方法 |
CN113190638B (zh) * | 2021-05-08 | 2024-09-06 | 苏州触达信息技术有限公司 | 基于声音测距的电子地图绘制方法 |
TWI831592B (zh) * | 2023-01-31 | 2024-02-01 | 台達電子工業股份有限公司 | 量測方法及其非接觸式位移感測裝置 |
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2017
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-
2018
- 2018-04-09 DE DE102018002838.1A patent/DE102018002838B4/de active Active
- 2018-04-13 US US15/952,655 patent/US10502563B2/en active Active
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DE112021003868T5 (de) | 2020-09-17 | 2023-05-11 | Fanuc Corporation | Berechnungsvorrichtung, System zur Vorhersage der Oberflächenrauheit und Berechnungsverfahren |
Also Published As
Publication number | Publication date |
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CN108871245B (zh) | 2022-05-13 |
DE102018002838B4 (de) | 2021-11-11 |
JP6480979B2 (ja) | 2019-03-13 |
CN108871245A (zh) | 2018-11-23 |
US10502563B2 (en) | 2019-12-10 |
DE102018002838A1 (de) | 2018-11-15 |
US20180328726A1 (en) | 2018-11-15 |
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