DE60308161D1 - Lithographischer Apparat und Verfahren zur Herstellung eines Artikels - Google Patents
Lithographischer Apparat und Verfahren zur Herstellung eines ArtikelsInfo
- Publication number
- DE60308161D1 DE60308161D1 DE60308161T DE60308161T DE60308161D1 DE 60308161 D1 DE60308161 D1 DE 60308161D1 DE 60308161 T DE60308161 T DE 60308161T DE 60308161 T DE60308161 T DE 60308161T DE 60308161 D1 DE60308161 D1 DE 60308161D1
- Authority
- DE
- Germany
- Prior art keywords
- article
- making
- lithographic apparatus
- lithographic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Microscoopes, Condenser (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03254116A EP1491956B1 (de) | 2003-06-27 | 2003-06-27 | Lithographischer Apparat und Verfahren zur Herstellung eines Artikels |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60308161D1 true DE60308161D1 (de) | 2006-10-19 |
DE60308161T2 DE60308161T2 (de) | 2007-08-09 |
Family
ID=33396023
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60308161T Expired - Lifetime DE60308161T2 (de) | 2003-06-27 | 2003-06-27 | Lithographischer Apparat und Verfahren zur Herstellung eines Artikels |
Country Status (6)
Country | Link |
---|---|
US (2) | US7012673B2 (de) |
EP (1) | EP1491956B1 (de) |
JP (3) | JP4497551B2 (de) |
DE (1) | DE60308161T2 (de) |
TW (1) | TWI252380B (de) |
WO (1) | WO2005001572A2 (de) |
Families Citing this family (82)
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DE10332112A1 (de) * | 2003-07-09 | 2005-01-27 | Carl Zeiss Smt Ag | Projektionsbelichtungsverfahren und Projektionsbelichtungssystem |
US10503084B2 (en) | 2002-11-12 | 2019-12-10 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US9482966B2 (en) | 2002-11-12 | 2016-11-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
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KR101101737B1 (ko) * | 2002-12-10 | 2012-01-05 | 가부시키가이샤 니콘 | 노광장치 및 노광방법, 디바이스 제조방법 |
DE10261775A1 (de) | 2002-12-20 | 2004-07-01 | Carl Zeiss Smt Ag | Vorrichtung zur optischen Vermessung eines Abbildungssystems |
KR101288767B1 (ko) | 2003-02-26 | 2013-07-23 | 가부시키가이샤 니콘 | 노광 장치, 노광 방법 및 디바이스 제조 방법 |
ATE426914T1 (de) | 2003-04-07 | 2009-04-15 | Nikon Corp | Belichtungsgerat und verfahren zur herstellung einer vorrichtung |
KR101612681B1 (ko) | 2003-04-11 | 2016-04-15 | 가부시키가이샤 니콘 | 액침 리소그래피 머신에서 웨이퍼 교환동안 투영 렌즈 아래의 갭에서 액침 액체를 유지하는 장치 및 방법 |
US7213963B2 (en) | 2003-06-09 | 2007-05-08 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
TW201818451A (zh) * | 2003-06-13 | 2018-05-16 | 日商尼康股份有限公司 | 曝光裝置、元件製造方法 |
KR101265454B1 (ko) | 2003-06-19 | 2013-05-16 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조방법 |
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CN102944981A (zh) | 2003-07-09 | 2013-02-27 | 株式会社尼康 | 曝光装置、器件制造方法 |
EP1650787A4 (de) | 2003-07-25 | 2007-09-19 | Nikon Corp | Untersuchungsverfahren und untersuchungseinrichtung für ein optisches projektionssystem und herstellungsverfahren für ein optisches projektionssystem |
EP1503244A1 (de) | 2003-07-28 | 2005-02-02 | ASML Netherlands B.V. | Lithographischer Projektionsapparat und Verfahren zur Herstellung einer Vorrichtung |
US7326522B2 (en) | 2004-02-11 | 2008-02-05 | Asml Netherlands B.V. | Device manufacturing method and a substrate |
EP1653501B1 (de) | 2003-07-28 | 2012-09-19 | Nikon Corporation | Belichtungsvorrichtung, bauelemente-herstellungsverfahren und steuerverfahren für eine belichtungsvorrichtung |
US7175968B2 (en) | 2003-07-28 | 2007-02-13 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method and a substrate |
US7779781B2 (en) * | 2003-07-31 | 2010-08-24 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
SG145780A1 (en) | 2003-08-29 | 2008-09-29 | Nikon Corp | Exposure apparatus and device fabricating method |
TWI263859B (en) | 2003-08-29 | 2006-10-11 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
KR101288140B1 (ko) | 2003-09-03 | 2013-07-19 | 가부시키가이샤 니콘 | 액침 리소그래피용 유체를 제공하기 위한 장치 및 방법 |
JP4444920B2 (ja) * | 2003-09-19 | 2010-03-31 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
EP2837969B1 (de) * | 2003-09-29 | 2016-04-20 | Nikon Corporation | Belichtungsvorrichtung, Belichtungsverfahren und Verfahren zur Herstellung der Vorrichtung |
JP2005136364A (ja) * | 2003-10-08 | 2005-05-26 | Zao Nikon Co Ltd | 基板搬送装置、露光装置、並びにデバイス製造方法 |
KR101203028B1 (ko) * | 2003-10-08 | 2012-11-21 | 가부시키가이샤 자오 니콘 | 기판 반송 장치 및 기판 반송 방법, 노광 장치 및 노광 방법, 디바이스 제조 방법 |
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TWI553701B (zh) | 2003-10-09 | 2016-10-11 | 尼康股份有限公司 | Exposure apparatus and exposure method, component manufacturing method |
US7528929B2 (en) * | 2003-11-14 | 2009-05-05 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US8054447B2 (en) * | 2003-12-03 | 2011-11-08 | Nikon Corporation | Exposure apparatus, exposure method, method for producing device, and optical part |
US7982857B2 (en) * | 2003-12-15 | 2011-07-19 | Nikon Corporation | Stage apparatus, exposure apparatus, and exposure method with recovery device having lyophilic portion |
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US7589822B2 (en) | 2004-02-02 | 2009-09-15 | Nikon Corporation | Stage drive method and stage unit, exposure apparatus, and device manufacturing method |
EP1713114B1 (de) | 2004-02-03 | 2018-09-19 | Nikon Corporation | Belichtungsvorrichtung und verfahren zur herstellung einer vorrichtung |
US7050146B2 (en) * | 2004-02-09 | 2006-05-23 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
CN100592210C (zh) * | 2004-02-13 | 2010-02-24 | 卡尔蔡司Smt股份公司 | 微平版印刷投影曝光装置的投影物镜 |
KR101115111B1 (ko) * | 2004-02-13 | 2012-04-16 | 칼 짜이스 에스엠티 게엠베하 | 마이크로 리소그래프 투영 노광 장치 투영 대물 렌즈 |
KR101258033B1 (ko) * | 2004-04-19 | 2013-04-24 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
EP1747499A2 (de) | 2004-05-04 | 2007-01-31 | Nikon Corporation | Vorrichtung und verfahren zur bereitstellung eines fluids für die immersionslithographie |
US7796274B2 (en) | 2004-06-04 | 2010-09-14 | Carl Zeiss Smt Ag | System for measuring the image quality of an optical imaging system |
KR101264936B1 (ko) * | 2004-06-04 | 2013-05-15 | 가부시키가이샤 니콘 | 노광 장치, 노광 방법 및 디바이스 제조 방법 |
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US20060232753A1 (en) * | 2005-04-19 | 2006-10-19 | Asml Holding N.V. | Liquid immersion lithography system with tilted liquid flow |
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-
2003
- 2003-06-27 DE DE60308161T patent/DE60308161T2/de not_active Expired - Lifetime
- 2003-06-27 EP EP03254116A patent/EP1491956B1/de not_active Expired - Lifetime
-
2004
- 2004-06-14 US US10/866,077 patent/US7012673B2/en not_active Expired - Lifetime
- 2004-06-17 TW TW093117515A patent/TWI252380B/zh not_active IP Right Cessation
- 2004-06-25 JP JP2006516054A patent/JP4497551B2/ja not_active Expired - Fee Related
- 2004-06-25 WO PCT/EP2004/006875 patent/WO2005001572A2/en active Application Filing
-
2008
- 2008-03-11 US US12/073,908 patent/USRE42741E1/en not_active Expired - Fee Related
-
2010
- 2010-03-15 JP JP2010057575A patent/JP5017402B2/ja not_active Expired - Fee Related
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2011
- 2011-12-20 JP JP2011278754A patent/JP2012070000A/ja active Pending
Also Published As
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US20050002004A1 (en) | 2005-01-06 |
USRE42741E1 (en) | 2011-09-27 |
JP5017402B2 (ja) | 2012-09-05 |
JP2010141357A (ja) | 2010-06-24 |
WO2005001572A3 (en) | 2005-04-21 |
US7012673B2 (en) | 2006-03-14 |
JP4497551B2 (ja) | 2010-07-07 |
EP1491956B1 (de) | 2006-09-06 |
TW200525301A (en) | 2005-08-01 |
JP2012070000A (ja) | 2012-04-05 |
JP2009514183A (ja) | 2009-04-02 |
EP1491956A1 (de) | 2004-12-29 |
DE60308161T2 (de) | 2007-08-09 |
WO2005001572A2 (en) | 2005-01-06 |
TWI252380B (en) | 2006-04-01 |
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