CN1307714C - 树脂密封型半导体器件及用于生产这种半导体器件的生产工艺 - Google Patents
树脂密封型半导体器件及用于生产这种半导体器件的生产工艺 Download PDFInfo
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Abstract
一种树脂密封型半导体器件带有:安装台(14);安装在该支架上的半导体芯片(16),该芯片的后表面与该支架接触;与该支架和该芯片关联的散热器(18);以及封装支架、芯片和散热器的模制树脂封装(10)。该支架被设定成芯片的后表面部分地被该支架所覆盖,因此未被覆盖的区域限定在电子元件的后表面上。根据该支架来互补地设置散热器,使其与电子元件后表面的未被覆盖的区域直接接触,因此安装台和散热器的整体厚度小于安装台的厚度与散热器的厚度之和。
Description
技术领域
本发明涉及一种带有密封在模制树脂封装内的电子元件的树脂密封型半导体器件,以及一种结合在该模制树脂封装内以帮助电子元件散热的散热器,本发明还涉及一种制造这种树脂封装型半导体器件的制造方法。
技术背景
一般而言,树脂密封型半导体器件通过使用包含安装台(mountstage)和多个引线的引线框架而制造。确切地说,首先,诸如半导体芯片的电子元件被安装在安装台上,然后,各个引线的内端通过焊线电连接至形成并排列在电子元件上的终端焊盘。随后,该电子元件与安装台一起放在一个由金属铸模限定的浇注腔(molding cavity)内,使得这些引线通过该金属铸模伸向外面。此后,在该浇注腔内注入一种合适的树脂材料,通过这种方式把电子元件、安装台以及引线的里面部分包围并密封在模制树脂封装内,使引线的外面部分从模制树脂封装伸出,从而制成了树脂密封型半导体器件。
由于电子元件在运行中生成大量的热量,在例如公开号为2000-294712和2001-156235的日本专利申请(KOKAI)中公开了一种结合并埋置在模制树脂封装内的散热器,以帮助从电子元件散热。确切地说,这种散热器被做成合适的诸如铜片和铜合金片等金属片,具有100-250μm的厚度,且形成有多个凸起或散热肋。散热器与安装台的关联方式是这些凸起或散热肋与安装台的后表面接触,从而使热量通过安装台从电子元件传递到散热器上。
当然,在模制树脂封装内结合散热器造成了模制树脂封装整体厚度的增加,这与树脂密封型半导体器件的厚度应做得尽可能小的趋势是背道而驰的。虽然可以通过变薄模制树脂封装的表层来降低其整体厚度,但为了能够防止水分渗入该模制树脂封装,该表层必须具有厚于200μm的厚度。否则,包含在该模制树脂封装内的布线图形将会过早地遭受侵蚀。请注意,布线图形通常由铝制成。
无论如何,一直没人提出在没有变薄模制树脂封装的表层的情况下来降低模制树脂封装的整体厚度的建议。
发明内容
因此,本发明的主要目标是提供一种带有密封在模制树脂封装内的电子元件的树脂密封型半导体器件,以及一种结合在该模制树脂封装内以帮助从电子元件散热的散热器,其中,模制树脂封装的整体厚度可在没有变薄其表层的厚度的情况下得到降低。
本发明的另一目标是提供一种制造这种树脂密封型半导体器件的方法。
根据本发明的第一方面,提供了一种树脂密封型半导体器件,其包括:安装台;安装在安装台上的电子元件,电子元件的后表面与安装台接触;与安装台和电子元件关联的散热器;以及封装安装台、电子元件以及散热器的模制树脂封装。该安装台被设定成使得电子元件的后表面部分被该安装台所覆盖,因此未被覆盖的区域限定在电子元件的后表面上。另一方面,根据安装台来互补地设置散热器,使其与电子元件后表面的未被覆盖的区域直接接触,因此安装台和散热器的整体厚度小于安装台的厚度与散热器的厚度之和。
优选地,该散热器包含分别覆盖电子元件后表面上的未被覆盖的区域的片状部分(plate section)。每个片状部分可形成有多个凸起,与电子元件后表面上的未被覆盖的对应区域直接接触。每个片状部分还可形成有用于模制树脂封装的多个开口,以帮助树脂在浇注腔内的扩散。同样,两个相邻的片状部分可以在由电子元件的后表面包围的区域的外面通过连线(tie)组件连接成整体。
优选地,安装台包括中心片状组件以及从该中心片状组件整体地径向延伸的细长带状组件,电子元件后表面上的未被覆盖的区域由中心片状组件和细长带状组件所限定。在这种情况中,每个片状部分的结构与两个相邻的细长带状组件之间所限定的区域的结构基本相同。
当模制树脂封装和电子元件具有矩形结构时,细长带状组件可以整体地径向伸过矩形电子元件的角,电子元件后表面上的每个未被覆盖的区域可以由中心片状组件和细长带状组件限定为一般等腰三角形。在这种情况中,每个片状部分带有一般等腰三角形的结构,它与限定在电子元件后表面上的对应的一般等腰三角区域基本上类似。
无论如何,每个片状部分可以形成有多个凸起,与电子元件后表面上的未被覆盖的对应区域直接接触。同样,每个片状部分还可以形成有用于模制树脂封装的多个开口,以帮助树脂在浇注腔内的扩散。
两个相邻的片状部分可以在由电子元件的后表面包围的区域的外面通过连线组件连接成整体,同样,每个连线组件可以带有从其向外伸出的芯柱组件(stem element),该芯柱组件在由电子元件的后表面所包围的区域的外面与安装台的对应细长带状组件接触。
当每个片状部分具有一般等腰三角形结构时,两个相邻等腰三角形片状部分的两个顶点部分可能在由电子元件的后表面所包围的区域的外面被与模制树脂封装的对应角相邻的一般U型连线组件相互连接成整体。类似地,每个U型连线组件可以带有从其向外伸出的芯柱组件,该芯柱组件在由电子元件的后表面所包围的区域的外面与安装台的对应细长带状组件接触。
当片状部分具有厚于安装台的厚度时,散热器可以包含在其上面放有安装台的中心片状组件的片状组件。另一方面,当每个片状部分形成有多个凸起时,由于形成有这些凸起,片状部分可能具有厚于安装台的实际厚度。无论如何,优选地,使片状组件变薄,使得片状组件的后表面与片状部分的后表面对齐。
根据本发明的第二方面,提供了一种制造树脂密封型半导体器件的制造方法,该方法包括步骤:准备带有在其上面安装了电子元件的安装台的引线框架,电子元件的后表面与安装台接触,该安装台被设定成电子元件的后表面部分被该安装台所覆盖,因此未被覆盖的区域设定在电子元件的后表面上;准备带有根据安装台而互补设置的散热器的散热器框架;根据第一浇注管芯来设置散热器框架,使得散热器位于由第一浇注管芯所限定的半个浇注腔内的适当的位置上;根据第一浇注管芯来设置引线框架,把其放在散热器框架上面,使得安装台与散热器18互相互补关联,因而散热器与电子元件后表面上的未被覆盖的区域直接接触,使安装台和散热器的整体厚度小于安装台的厚度与散热器的厚度之和;配合第二浇注管芯与第一浇注管芯,使得该半个浇注腔与由第二浇注管芯所限定的半个浇注腔结合,以生成一个完整的浇注腔;把未凝固的树脂浇注到完整的浇注腔内,以生成封装安装台、半导体芯片和散热器的模制树脂封装;在模制树脂封装完全凝固之后,把模制树脂封装以及引线框架和散热器框架从第一和第二浇注管芯移开;以及修整(trim)引线框架和散热器框架,使得安装台和散热器分别与引线框架和散热器框架切割分开。
在该制造方法中,散热器包含分别覆盖电子元件后表面上的未被覆盖的区域的片状部分。同样,每个片状部分形成有多个凸起,与电子元件后表面上的未被覆盖的对应区域直接接触。每个片状部分还可形成有用于模制树脂封装的多个开口,以帮助未凝固的树脂在完整的浇注腔内进行扩散。
附图说明
参考附图,下面的描述将使上述目标和其它目标变得更加易于理解。在附图中:
图1是根据本发明的树脂密封型半导体器件的第一实施例的平面图,其包括模制树脂封装以及从该模制树脂封装伸出的多个引线;
图2A是沿图1的A-A线切开的剖面图,示出封装在模制树脂封装内的安装台、电子元件以及散热器;
图2B是沿图1的B-B线切开的剖面图;
图3是包含在如图1、2和3所示的树脂密封型半导体器件内的引线和安装台的布置方式的平面图;
图4是在其内部完整地结合有如图3所示的引线和安装台的引线框架的平面图;
图5是包含在如图1、2A和2B所示的树脂密封型半导体器件内的引线、安装台和电子元件的布置方式的平面图;
图6是包含在如图1、2A和2B所示的树脂密封型半导体器件内的散热器的平面图;
图7是在其内部完整地结合有如图6所示的散热器的散热器框架的平面图;
图8是包含在如图1、2A和2B所示的树脂密封型半导体器件内的安装台和散热器的布置方式的平面图;
图9A是与图2A对应的剖面图,示出用于制造如图1、2A和2B所示的树脂密封型半导体器件的制造方法的第一代表性步骤;
图9B是与图2B对应的剖面图,示出与图9A中的制造方法相同的第一代表性步骤;
图10A是与图2A对应的剖面图,示出用于制造树脂密封型半导体器件的制造方法的第二代表性步骤;
图10B是与图2B对应的剖面图,示出与图10A中的制造方法相同的第二代表性步骤;
图11A是与图2A对应的剖面图,示出用于制造树脂密封型半导体器件的制造方法的第三代表性步骤;
图11B是与图2B对应的剖面图,示出与图11A中的制造方法相同的第三代表性步骤;
图12A是与图2A对应的剖面图,示出用于制造树脂密封型半导体器件的制造方法的第四代表性步骤;
图12B是与图2B对应的剖面图,示出与图12A中的制造方法相同的第四代表性步骤;
图13是与图2A对应的剖面图,示出根据本发明的树脂密封型半导体器件的第二实施例;以及
图14是与图6对应的平面图,示出包含在如图12所示的树脂密封型半导体器件的第二实施例内的散热器。
具体实施方式
首先,参考图1,根据本发明的树脂密封型半导体器件的一种实施例在平面图中示出,图2A和2B分别示出沿图1的A-A和B-B线切开的树脂密封型半导体器件的剖面图。
显然,从图1可看出,树脂密封型半导体器件包含:具有矩形结构的模制树脂封装10以及从模制树脂封装10的侧面伸出的多个引线12,且每个引线12的内引线部分埋置在模制树脂封装10内。如图2A和2B所示,树脂密封型半导体器件还包括安装台14、安装在安装台14上且与其后表面接触的电子元件16、以及与安装台14和电子元件16关联的散热器18,且安装台14、电子元件16和散热器18封装并密封在模制树脂封装10内。
在本实施例中,电子元件16形成为矩形半导体芯片且带有多个终端焊盘,其形成在半导体芯片16的顶表面上并沿其顶表面的四个侧面排列。如图2A所示,每个引线12的内引线部分通过焊线20与半导体芯片16上对应的终端焊盘电连接。
参考图3,包含在模制树脂封装10内的引线12和安装台14的布置方式在平面图中示出。请注意,在图3中,模制树脂封装10的矩形周线由双点划线或虚线PL表示。
可从图3看出,引线12被分成四组,且每组内的引线12沿由虚线PL表示的模制树脂封装10的对应侧排列。安装台14带有中心圆形片状组件14A和从中心圆形片状组件14A整体地径向延伸至模制树脂封装10的各个角的细长带状组件14B。如图2B所示,每个细长带状组件14B的外端部分在模制树脂封装10的对应角处向上弯曲并整形成暴露至外面。
如图4所示,在制造树脂密封型半导体器件时,引线12和安装台14整体地结合在引线框架LF内。引线框架LF由金属片制成,它由诸如铜和铜合金等合适的金属材料组成且具有至多300μm的厚度。在本实施例中,金属片的厚度设置为200μm,因此,引线12和安装台14具有与该金属片相同的厚度(200μm)。
可从图4看出,引线框架LF带有外框架部分22,每组内的引线12整体地从外框架部分22的对应侧伸出,且与横向穿过它们的连线条24构成整体。如图4所示,4个连线条24在末端上互相连接成矩形,且每个细长带状组件14B在其外端处与该矩形的对应角连接成整体。总之,引线12和安装台14由外框架部分22支撑。
参考图5,包含在模制树脂封装10内的引线12、安装台14以及半导体芯片16的布置方式在平面图中示出。请注意,类似于图3,模制树脂封装10的矩形周线由虚线PL表示。
如图5所示,半导体芯片16安装在并用合适的压焊粘合剂粘附到安装台14上,且引线12的内引线部分分别通过压焊线20电连接至半导体芯片16上的终端焊盘(未示出)。
显然,可从图5看出,中心圆形片状组件14A具有比矩形半导体芯片16的后表面小得多的区域,且每个细长带状组件14B均很窄。确切地说,中心圆形片状组件14A放在半导体芯片16的中心,且4个细长带状组件14B分别延伸穿过半导体芯片16的矩形的4个角。
因此,如图5所示,半导体芯片16的后表面没有完全被安装台14所覆盖。在本实施例中,半导体芯片16的后表面上的4个未被覆盖的区域由从中心圆形片状组件14A径向延伸至模制树脂封装10的各个角的4个细长带状组件14B限定,且每个未被覆盖的区域为一般等腰三角形,与通过在矩形周线(PL)内划两条对角线而形成的4个等腰三角形中的对应三角形基本相同。
参考图6,包含在模制树脂封装10内的散热器18在平面图中示出。请注意,类似于图3和5,模制树脂封装10的矩形周线由虚线PL表示。
散热器18带有为一般等腰三角形的4个片状部分18A,这些等腰三角形与半导体芯片16的后表面上所限定的未被覆盖的等腰三角形区域(图5)的对应三角形类似。如图6所示,每个三角形片状部分18A形成有多个凸起26和多个狭缝状开口28。
同样,散热器18带有4个一般U型连线组件18B,放在模制树脂封装10的各个角上,使得两个相邻三角形片状部分18A的两个顶点部分通过位于模制树脂封装10的对应角的邻近处的一般U型的连线组件18B连接成整体。即,三角形片状部分18A相互之间的连接是由U型连线组件18B在由半导体芯片16的后表面所包围的区域的外面进行的。每个U型连线组件18B提供有整体地延伸至模制树脂封装10的对应角的芯柱组件18C,且芯柱组件18C向上弯曲并整形成暴露在模制树脂封装10的对应角的外面。请注意,在图2B的剖面图中,只能看到两个对角上的芯柱组件18C。
如图7所示,在制造树脂密封型半导体器件时,散热器18整体地结合在散热器框架HF内。散热器框架HF由金属片制成,它由诸如铜和铜合金等具有优良热传导性的合适的金属材料形成且具有例如125-150μm的厚度。在本实施例中,金属片的厚度设置为150μm,因此,散热器18具有与该金属片相同的厚度(150μm)。
但是,由于散热器18带有多个形成并排列在其上面的凸起26,其每个三角形片状部分18A具有厚于150μm的实际厚度。确切地说,由于凸起26可能具有50-100μm的高度,三角形片状部分18A的实际厚度可能为175-250μm。在本实施例中,凸起26的高度设置为100μm,因此,每个三角形片状部分18A具有250μm的实际厚度。
显然,可从图7看出,散热器框架HF带有外框架部分30,其形成有开口32且与引线框架LF的外框架部分22具有基本相同的尺寸。当引线框架LF的外框架部分22被放在散热器框架HF的外框架部分30的上面且使它们互相对准时,开口32被设置成包围4组引线12。散热器18被放在开口32内,使散热器18的4个芯柱组件18C与外框架部分30结合成整体,因此散热器18由外框架部分30支撑。
参考图8,包含在模制树脂封装10内的安装台14和散热器18的布置方式在平面图中示出。请注意,类似于图3、5和6,模制树脂封装10的矩形周线由虚线PL表示。
显然,可从图2B、3和8中看出,安装台14放在散热器18的上面,但只有细长带状组件14B的外端与散热器18的芯柱组件18C接触。即,各个三角形片状部分18A被排列在由4个细长带状组件14B所限定的一般等腰三角形的区域内,且与中心圆形片状组件14A和细长带状组件14B没有接触。简言之,安装台14和散热器18的设置互相补充,使三角形片状部分或主部分18A不会与安装台14重叠。因此,如图2A所示,每个三角形片状部分18A的凸起26与半导体芯片16的后表面直接接触。
利用安装台14和散热器18的上述布置方式,半导体芯片16内生成的部分热量通过与细长带状组件14B的外端接触的芯柱组件18C传递至散热器18,而其它热量直接传递到散热器18的三角形片状部分18A。即,根据本发明,在抑制安装台14、半导体芯片16和散热器18的整体厚度的同时,可以有效地从半导体芯片16排除热量。
确切地说,传统上,例如在上述公开号为2000-294712和2001-156235的日本专利申请(KOKAI)所公开的文件中,由于其上面安装有半导体芯片的安装台被放在散热器上,安装台、半导体芯片和散热器的整体厚度等于的安装台、半导体芯片和散热器的各自厚度之和。相反,根据本发明,由于安装台14和散热器18互相补充,使三角形片状部分18A不会和安装台14重叠,所以安装台14、半导体芯片16和散热器18的整体厚度小于安装台14、半导体芯片16和散热器18的各自厚度之和。
因此,覆盖半导体芯片16(与安装台14和散热器18关联)后侧的模制树脂封装10的表层厚度可以设置为至少200μm,而不会造成模制树脂封装10的整体厚度的不合需求的增加。因而,有可能防止水分渗入到模制树脂封装10内,从而可以保护包含在模制树脂封装10内的铝布线图形过早地遭受侵蚀。
参考图9A和9B、10A和10B、11A和11B以及12A和12B,示出了制造上述树脂密封型半导体器件的制造方法。
请注意,虽然该制造方法包括:用于在引线框架LF的安装台14上安装半导体芯片16的安装工艺,以及用于把各个引线12电连接至形成在半导体芯片16的顶表面上的终端焊盘的压焊工艺,但安装工艺和压焊工艺已经完成了。同样,请注意,在该制造方法中,如图11A和11B以及12A和12B所示,使用了一对下层和上层金属浇注管芯34L和34U以浇注树脂封装10。
首先,如图9A和9B所示,准备了下层金属浇注管芯34L,且相对于下层金属浇注管芯34L来放置散热器框架HF,使散热器18位于一半由下层金属浇注管芯34L所限定的浇注腔内的位置上。在这种情况中,三角形片状部分18A与下层金属浇注管芯34L的半个浇注腔的底部距离有至少200μm的距离。
然后,如图10A和10B所示,带有安装在安装台14上的导线压焊半导体芯片16的引线框架LF相对于下层金属浇注管芯34L放在散热器框架HF上,使外框架22和30互相对准,因此安装台14和散热器18互相互补关联,使得三角形片状部分18A不会与安装台14重叠,如图8最佳所示。因此,每个三角形片状部分18A的凸起26与半导体芯片16后表面上的未被覆盖的对应的一般三角形的区域直接接触,如图10A所示,其中半导体芯片16由两个相邻细长带状组件14B所限定。
随后,如图11A和11B所示,上层金属浇注管芯34U与下层金属浇注管芯34L相配合,以在它们之间限定一个完整的浇注腔,用于浇注树脂封装10。此后,通过形成在下层金属浇注管芯34L或上层金属浇注管芯34U内的入口通道,把诸如环氧树脂等合适的未凝固树脂注入到浇注腔内,因此引线12的内引线部分、安装台14、带有焊线20的半导体芯片16和散热器18被包围并封装在模制树脂封装10内,且引线12的外引线部分从模制树脂封装10中伸出,如图12A和12B所示。
在该浇注工艺中,由于在三角形片状部分18A内形成有多个狭缝状开口28,有可能帮助注入的树脂在浇注腔内的扩散。即,由于对浇注腔内注入的树脂的扩散的辅助作用,形成的狭缝状开口28有助于防止在模制树脂封装10内产生空隙。请注意,每个狭缝状开口28可以具有100-1000μm的宽度和1-10mm的长度。
在模制树脂封装10完全凝固之后,把树脂封装10从金属浇注对34L和34U移开,对引线框架LF和散热器框架HF进行修整处理。即,引线12和安装台14与引线框架LF切割分开,散热器18与散热器框架HF切割分开,从而形成了如图1、2A和2B所示的树脂密封型半导体器件。请注意,在修整处理中,连线条24被同时切掉,使得引线12互相分开。
参考与图2A和6对应的图13和14,示出了根据本发明的树脂密封型半导体器件的第二实施例。请注意,在图13和14中,类似于图2A和6中的元件由相同的参考数字表示。
如这些附图所示,散热器18带有放在其中心的薄小圆形片状组件18D,使中心圆形片状组件14放在这个薄小圆形片状组件18D上。确切地说,如图14最佳所示,每个三角形片状部分18A的顶点被整形成内凹拱形,以在散热器18的中心形成一个由这些内凹拱形所限定的圆形空间,且薄小圆形片状组件18D被放置为占据这个圆形空间。
在第二实施例中,圆形片状组件18D形成为由合适金属材料制成的独立部件,且通过使用合适的具有优良热传导性的粘附剂粘附至三角形片状组件18A的内凹拱形。同样,虽然圆形片状组件18D可以具有50-70μm的厚度,优选地,使圆形片状组件18D变薄,使得圆形片状组件18D的后表面与三角形片状部分18A的后表面对齐。即,在本实施例中,优选地,把圆形片状组件18D的厚度设置为50μm。
因此,根据第二实施例,由于圆形片状组件18D的存在,相对于上述第一实施例,可以更有效地使热量从半导体芯片16传递到散热器18上。
在第二实施例中,虽然圆形片状组件18D形成为独立的部件,它可以整体地结合在散热器框架HF内,如图7所示。在这种情况中,对散热器框架HF进行用于降低圆形片状组件18D的厚度的按压处理,因此圆形片状组件18D的后表面与等腰三角形片状部分18A的后表面对齐。
最后,本领域的普通技术人员应该理解上述描述是对器件和工艺的优选实施例的描述,且在不背离本发明的精神和范围的情况下可以作出各种改变和修改。
Claims (34)
1.一种树脂密封型半导体器件,其包括:
安装台(14),其形成为具有中心片状组件;
安装在所述安装台(14)上的电子元件(16),使得所述安装台的中心片状组件位于所述电子元件的后表面的中心,所述安装台的中心片状组件具有比所述半导体元件的后表面的区域小的区域,从而不重叠的区域限定在所述电子元件的后表面上;
与所述安装台(14)和所述电子元件(16)关联的散热器(18);以及
封装所述安装台(14)、所述电子元件(16)以及所述散热器(18)的模制树脂封装(10),
其中,相对于所述安装台(14)来互补地设置所述散热器(18),使其与所述电子元件(16)后表面的不重叠的区域直接接触。
2.如权利要求1所述的树脂密封型半导体器件,其中所述散热器(18)包含与所述电子元件(16)后表面上的所述不重叠的区域重叠的各个片状部分(18A)。
3.如权利要求2所述的树脂密封型半导体器件,其中,每个所述片状部分(18A)形成有多个凸起(26),这些凸起(26)与所述电子元件(16)后表面上的对应的不重叠的区域直接接触。
4.如权利要求3所述的树脂密封型半导体器件,其中,每个所述片状部分(18A)还形成有用于所述模制树脂封装(10)的多个开口(28),以帮助树脂在浇注腔内的扩散。
5.如权利要求2所述的树脂密封型半导体器件,其中,两个相邻的片状部分(18A)在由所述电子元件(16)的后表面包围的区域的外面,通过连线组件(18B)互相连接成整体。
6.如权利要求2所述的树脂密封型半导体器件,其中所述安装台(14)包括从中心片状组件整体地径向延伸的细长带状组件(14B),所述电子元件(16)后表面上的所述不重叠的区域为所述中心片状组件和所述细长带状组件与所述电子元件(16)的后表面不重叠的区域。
7.如权利要求6所述的树脂密封型半导体器件,其中,每个所述片状部分(18A)的结构与两个相邻的细长带状组件(14B)之间所限定的区域的结构对应。
8.如权利要求6所述的树脂密封型半导体器件,其中,每个所述片状部分(18A)形成有多个凸起(26),这些凸起(26)与所述电子元件(16)后表面上的对应的不重叠的区域直接接触。
9.如权利要求7所述的树脂密封型半导体器件,其中,每个所述片状部分(18A)还形成有用于所述模制树脂封装(10)的多个开口(28),以帮助树脂在浇注腔内的扩散。
10.如权利要求6所述的树脂密封型半导体器件,其中,两个相邻的片状部分(18A)在由所述电子元件(16)的后表面包围的区域的外面,通过连线组件(18B)互相连接成整体。
11.如权利要求10所述的树脂密封型半导体器件,其中,每个所述连线组件(18B)带有从其向外伸出的芯柱组件(18C),且所述芯柱组件在由所述电子元件(16)的后表面所包围的所述区域的外面,与所述安装台(14)的对应细长带状组件(14B)的端部接触。
12.如权利要求6所述的树脂密封型半导体器件,其中所述片状部分(18A)的厚度厚于所述安装台(14)的厚度,且所述散热器(18)包含片状组件(18D),在该片状组件上面放有所述安装台的中心片状组件(14A)。
13.如权利要求12所述的树脂密封型半导体器件,其中所述片状组件(18D)被变薄,使得所述片状组件的后表面与所述片状部分(18A)的后表面对齐。
14.如权利要求8所述的树脂密封型半导体器件,其中,由于凸起(26)的形成,所述片状部分(18A)的实际厚度厚于所述安装台(14)的实际厚度,且所述散热器(18)包含片状组件(18D),在该片状组件上面放有所述安装台的中心片状组件(14A)。
15.如权利要求14所述的树脂密封型半导体器件,其中所述片状组件(18D)被变薄,使得所述片状组件的后表面与所述片状部分(18A)的后表面对齐。
16.如权利要求2所述的树脂密封型半导体器件,其中所述模制树脂封装(10)和所述电子元件(16)具有矩形的结构,所述安装台(14)包含整体地径向从中心片状组件延伸到所述矩形电子元件的各个角的四个细长带状组件(14B),并且由所述中心片状组件和所述细长带状组件将每个所述不重叠的区域限定为所述电子元件(16)后表面上的一般等腰三角形的区域。
17.如权利要求16所述的树脂密封型半导体器件,其中,每个所述片状部分(18A)具有一般等腰三角形的结构,它与限定在所述电子元件(16)后表面上的一般等腰三角形的区域对应。
18.如权利要求16所述的树脂密封型半导体器件,其中,每个所述通常为等腰三角形的片状部分(18)形成有多个凸起(26),这些凸起(26)与所述电子元件(16)后表面上对应的一般等腰三角形的区域直接接触。
19.如权利要求17所述的树脂密封型半导体器件,其中,每个所述一般等腰三角形片状部分(18)还形成有用于所述模制树脂封装(10)的多个开口(28),以帮助树脂在浇注腔内的扩散。
20.如权利要求16所述的树脂密封型半导体器件,其中,两个相邻等腰三角形所述片状部分(18A)的两个顶点部分在由所述电子元件(16)的后表面所包围的区域的外面,被与所述模制树脂封装(10)的对应角相邻的一般U型连线组件(18B)相互连接成整体。
21.如权利要求20所述的树脂密封型半导体器件,其中,每个所述U型连线组件(18B)带有从其向外伸出的芯柱组件(18C),且所述芯柱组件在由所述电子元件(16)的后表面所包围的区域的外面,与所述安装台(14)的对应细长带状组件(14B)的端部接触。
22.如权利要求6所述的树脂密封型半导体器件,其中所述等腰三角形片状部分(18A)的厚度厚于所述安装台(14)的厚度,且所述散热器(18)包含片状组件(18D),在该片状组件上面放有所述安装台的中心片状组件(14A)。
23.如权利要求22所述的树脂密封型半导体器件,其中所述片状组件(18D)被变薄,使得所述片状组件的后表面与所述等腰三角形片状部分(18A)的后表面对齐。
24.如权利要求18所述的树脂密封型半导体器件,其中,由于凸起(26)的形成,所述等腰三角形片状部分(18A)的实际厚度厚于所述安装台(14)的实际厚度,且所述散热器(18)包含片状组件(18D),在该片状组件上面放有所述安装台的中心片状组件(14A)。
25.如权利要求24所述的树脂密封型半导体器件,其中所述片状组件(18D)被变薄,使得所述片状组件的后表面与所述等腰三角形片状部分(18A)的后表面对齐。
26.一种制造树脂密封型半导体器件的制造方法,该方法包括:
准备带有在其上面安装了电子元件(16)的安装台(14)的引线框架(LF),使得所述电子元件的后表面与所述安装台接触,所述安装台被设定成使得所述电子元件的后表面部分地与所述安装台重叠,从而不重叠的区域限定在所述电子元件的后表面上;
准备带有相对于所述安装台(14)而互补设置的散热器(18)的散热器框架(HF);
相对于第一浇注管芯(34L)来设置所述散热器框架(HF),使得所述散热器(18)位于一半由所述第一浇注管芯所限定的浇注腔内的适当的位置上;
相对于所述第一浇注管芯(34L)来设置所述引线框架(LF),把其放在所述散热器框架(HF)上,使得所述安装台(14)与所述散热器(18)互相互补关联,从而所述散热器与限定在所述电子元件(16)后表面上的不重叠的区域直接接触,使所述安装台和所述散热器的整体厚度小于所述安装台的厚度与所述散热器的厚度之和;
将第二浇注管芯(34U)与所述第一浇注管芯(34L)相配合,使得所述半个浇注腔与由所述第二浇注管芯所限定的半个浇注腔结合,以生成完整的浇注腔;
把未凝固的树脂浇注到完整的浇注腔内,以生成封装所述安装台(14)、所述半导体芯片和所述散热器(18)的模制树脂封装(10);
在所述模制树脂封装(10)完全凝固之后,把所述模制树脂封装以及所述引线框架(LF)和所述散热器框架(HF)从所述第一和第二浇注管芯(34L、34U)移去;以及
修整所述引线框架(LF)和所述散热器框架(HF),使得所述安装台(14)和所述散热器(18)分别从所述引线框架和所述散热器框架切割并分开。
27.如权利要求26所述的制造方法,其中所述散热器(18)包含与所述电子元件(16)后表面上的所述不重叠的区域重叠的各个片状部分(18A)。
28.如权利要求27所述的制造方法,其中,每个所述片状部分(18)形成有多个凸起(26),这些凸起(26)与所述电子元件(16)后表面上的对应的不重叠的区域直接接触。
29.如权利要求28所述的制造方法,其中,每个所述片状部分(18)还形成有用于所述模制树脂封装(10)的多个开口(28),以帮助未凝固的树脂在所述完整的浇注腔内进行扩散。
30.一种树脂密封型半导体器件,包括:
安装台,其形成为具有中心片状组件;
安装在所述安装台上的电子元件,使得所述安装台的中心片状组件位于所述电子元件的后表面的中心,所述安装台的中心片状组件具有比所述半导体元件的后表面的区域小的区域,从而不重叠的区域限定在所述电子元件的后表面上;
与所述安装台和所述电子元件关联的散热器;以及
封装所述安装台、所述电子元件以及所述散热器的模制树脂封装,
其中,相对于所述安装台来互补地设置所述散热器,使其与所述电子元件的后表面的不重叠的区域直接接触,从而安装台和所述散热器的整体厚度小于所述安装台的厚度与所述散热器的厚度之和。
31.一种树脂密封型半导体器件,包括:
安装台,其形成为具有中心片状组件;
安装在所述安装台上的电子元件,使得所述安装台的中心片状组件位于所述电子元件的后表面的中心,所述安装台的中心片状组件具有比所述半导体元件的后表面的区域小的区域,从而不重叠的区域限定在所述电子元件的后表面上;
散热器,与所述安装台和所述电子元件关联,并且具有形成和布置在其上的多个凸起;以及
封装所述安装台、所述电子元件以及所述散热器的模制树脂封装,
其中,相对于所述安装台来互补地设置所述散热器,使得所述散热器的凸起与所述电子元件的后表面的不重叠的区域直接接触。
32.如权利要求1所述的树脂密封型半导体器件,其中所述散热器被所述模制树脂封装完全封装并且与所述模制树脂封装接触。
33.如权利要求1所述的树脂密封型半导体器件,其中,不重叠的区域离散地布置在所述安装台的中心片状组件的周围,所述散热器包括与所述电子元件的后表面的所述不重叠的区域重叠的各个片状部件。
34.如权利要求1所述的树脂密封型半导体器件,其中,不重叠的区域离散地布置在所述安装台的中心片状组件的周围,所述散热器包括与所述电子元件的后表面的所述不重叠的区域重叠的各个片状部件,以及其上放置所述安装台的中心片状组件的片状部分,所述片状部件的厚度厚于所述散热器的片状部分的厚度。
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US (1) | US7030505B2 (zh) |
JP (1) | JP2004179253A (zh) |
KR (1) | KR100598269B1 (zh) |
CN (1) | CN1307714C (zh) |
TW (1) | TWI250630B (zh) |
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JP2006261255A (ja) * | 2005-03-16 | 2006-09-28 | Matsushita Electric Ind Co Ltd | 半導体装置 |
TWI274524B (en) * | 2005-12-19 | 2007-02-21 | Advanced Semiconductor Eng | Heat fixture for wire bonding |
US20070176271A1 (en) * | 2006-02-01 | 2007-08-02 | Stats Chippac Ltd. | Integrated circuit package system having die-attach pad with elevated bondline thickness |
JP2008085002A (ja) * | 2006-09-27 | 2008-04-10 | Sanyo Electric Co Ltd | 半導体装置およびその製造方法 |
JP2009009957A (ja) * | 2007-06-26 | 2009-01-15 | Nec Electronics Corp | 半導体装置 |
US7808089B2 (en) * | 2007-12-18 | 2010-10-05 | National Semiconductor Corporation | Leadframe having die attach pad with delamination and crack-arresting features |
US20090152683A1 (en) * | 2007-12-18 | 2009-06-18 | National Semiconductor Corporation | Rounded die configuration for stress minimization and enhanced thermo-mechanical reliability |
US7868430B2 (en) * | 2008-09-26 | 2011-01-11 | Infineon Technologies Ag | Semiconductor device |
US9054077B2 (en) * | 2010-03-10 | 2015-06-09 | Altera Corporation | Package having spaced apart heat sink |
TWI434629B (zh) * | 2011-08-19 | 2014-04-11 | Unimicron Technology Corp | 半導體封裝結構及其製法 |
CN104112728B (zh) * | 2013-11-22 | 2017-10-31 | 广东美的制冷设备有限公司 | 器件安装结构和集成电路模块 |
TWI524482B (zh) * | 2013-12-11 | 2016-03-01 | 南茂科技股份有限公司 | 晶片封裝結構及其製造方法 |
DE102014105861B4 (de) * | 2014-04-25 | 2015-11-05 | Infineon Technologies Ag | Sensorvorrichtung und Verfahren zum Herstellen einer Sensorvorrichtung |
US10453777B2 (en) * | 2018-01-30 | 2019-10-22 | Toyota Motor Engineering & Manufacturing North America, Inc. | Power electronics assemblies with cio bonding layers and double sided cooling, and vehicles incorporating the same |
CN110416178A (zh) * | 2019-07-12 | 2019-11-05 | 南通沃特光电科技有限公司 | 一种集成电路封装结构及其封装方法 |
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- 2003-11-06 KR KR1020030078222A patent/KR100598269B1/ko not_active IP Right Cessation
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Also Published As
Publication number | Publication date |
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KR100598269B1 (ko) | 2006-07-07 |
US7030505B2 (en) | 2006-04-18 |
CN1503358A (zh) | 2004-06-09 |
TWI250630B (en) | 2006-03-01 |
JP2004179253A (ja) | 2004-06-24 |
TW200414465A (en) | 2004-08-01 |
KR20040045298A (ko) | 2004-06-01 |
US20040099933A1 (en) | 2004-05-27 |
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