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ATE487695T1 - Neues diazo-naphthochinon-schwefelsäure- bisphenolderivat für fotolithografische submikronstrukturierung und herstellungsverfahren dafür - Google Patents

Neues diazo-naphthochinon-schwefelsäure- bisphenolderivat für fotolithografische submikronstrukturierung und herstellungsverfahren dafür

Info

Publication number
ATE487695T1
ATE487695T1 AT08738374T AT08738374T ATE487695T1 AT E487695 T1 ATE487695 T1 AT E487695T1 AT 08738374 T AT08738374 T AT 08738374T AT 08738374 T AT08738374 T AT 08738374T AT E487695 T1 ATE487695 T1 AT E487695T1
Authority
AT
Austria
Prior art keywords
naphthoquinone
diazo
photolithographic
sulfuric acid
production process
Prior art date
Application number
AT08738374T
Other languages
English (en)
Inventor
Vummadi Reddy
Vaidya Rao
Mannepalli Kantam
Sunkara Madhavendra
Virendra Dwivedi
Original Assignee
Council Scient Ind Res
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Council Scient Ind Res filed Critical Council Scient Ind Res
Application granted granted Critical
Publication of ATE487695T1 publication Critical patent/ATE487695T1/de

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/022Quinonediazides
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C245/00Compounds containing chains of at least two nitrogen atoms with at least one nitrogen-to-nitrogen multiple bond
    • C07C245/12Diazo compounds, i.e. compounds having the free valencies of >N2 groups attached to the same carbon atom
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C309/00Sulfonic acids; Halides, esters, or anhydrides thereof
    • C07C309/63Esters of sulfonic acids
    • C07C309/72Esters of sulfonic acids having sulfur atoms of esterified sulfo groups bound to carbon atoms of six-membered aromatic rings of a carbon skeleton
    • C07C309/76Esters of sulfonic acids having sulfur atoms of esterified sulfo groups bound to carbon atoms of six-membered aromatic rings of a carbon skeleton containing nitrogen atoms, not being part of nitro or nitroso groups, bound to the carbon skeleton
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/022Quinonediazides
    • G03F7/023Macromolecular quinonediazides; Macromolecular additives, e.g. binders
    • G03F7/0233Macromolecular quinonediazides; Macromolecular additives, e.g. binders characterised by the polymeric binders or the macromolecular additives other than the macromolecular quinonediazides
    • G03F7/0236Condensation products of carbonyl compounds and phenolic compounds, e.g. novolak resins
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/38Treatment before imagewise removal, e.g. prebaking
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C2601/00Systems containing only non-condensed rings
    • C07C2601/06Systems containing only non-condensed rings with a five-membered ring
    • C07C2601/08Systems containing only non-condensed rings with a five-membered ring the ring being saturated
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C2602/00Systems containing two condensed rings
    • C07C2602/02Systems containing two condensed rings the rings having only two atoms in common
    • C07C2602/04One of the condensed rings being a six-membered aromatic ring
    • C07C2602/10One of the condensed rings being a six-membered aromatic ring the other ring being six-membered, e.g. tetraline

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Materials For Photolithography (AREA)
  • Non-Silver Salt Photosensitive Materials And Non-Silver Salt Photography (AREA)
AT08738374T 2007-03-23 2008-03-20 Neues diazo-naphthochinon-schwefelsäure- bisphenolderivat für fotolithografische submikronstrukturierung und herstellungsverfahren dafür ATE487695T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IN649DE2007 2007-03-23
PCT/IN2008/000169 WO2008117308A2 (en) 2007-03-23 2008-03-20 Novel diazonaphthoquinonesulfonic acid bisphenol derivative useful in photo lithographic sub micron patterning and a process for preparation thereof

Publications (1)

Publication Number Publication Date
ATE487695T1 true ATE487695T1 (de) 2010-11-15

Family

ID=39591257

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08738374T ATE487695T1 (de) 2007-03-23 2008-03-20 Neues diazo-naphthochinon-schwefelsäure- bisphenolderivat für fotolithografische submikronstrukturierung und herstellungsverfahren dafür

Country Status (7)

Country Link
US (1) US8563215B2 (de)
EP (1) EP2137140B1 (de)
JP (1) JP5631732B2 (de)
AT (1) ATE487695T1 (de)
DE (1) DE602008003423D1 (de)
PL (1) PL2137140T3 (de)
WO (1) WO2008117308A2 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI643843B (zh) * 2017-08-10 2018-12-11 國家中山科學研究院 含五碳環衍生物聚胺酯之製備方法
CN109062008B (zh) * 2018-08-21 2022-03-11 西陇科学股份有限公司 一种紫外正性光刻胶
KR102710054B1 (ko) * 2022-09-16 2024-09-24 삼성에스디아이 주식회사 반도체 포토레지스트용 조성물 및 이를 이용한 패턴 형성 방법

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE516129A (de) * 1949-07-23
EP0285797A3 (de) * 1987-03-11 1989-01-04 Siemens Aktiengesellschaft Verfahren zur Erzeugung von Resiststrukturen
US5182183A (en) * 1987-03-12 1993-01-26 Mitsubishi Kasei Corporation Positive photosensitive planographic printing plates containing specific high-molecular weight compound and photosensitive ester of O-napthoquinonediazidosulfonic acid with polyhydroxybenzophenone
US5290656A (en) * 1988-05-07 1994-03-01 Sumitomo Chemical Company, Limited Resist composition, novel phenol compound and quinone diazide sulfonic acid ester of novel phenol compound
DE3837499A1 (de) * 1988-11-04 1990-05-23 Hoechst Ag Verfahren zur herstellung von substituierten 1,2-naphthochinon-(2)-diazid-4-sulfonsaeureestern und deren verwendung in einem strahlungsempfindlichen gemisch
JP3001607B2 (ja) * 1989-04-24 2000-01-24 シーメンス、アクチエンゲゼルシヤフト 二層法における寸法安定な構造転写方法
JP2571136B2 (ja) * 1989-11-17 1997-01-16 日本ゼオン株式会社 ポジ型レジスト組成物
US5362599A (en) * 1991-11-14 1994-11-08 International Business Machines Corporations Fast diazoquinone positive resists comprising mixed esters of 4-sulfonate and 5-sulfonate compounds
US5384228A (en) * 1992-04-14 1995-01-24 Tokyo Ohka Kogyo Co., Ltd. Alkali-developable positive-working photosensitive resin composition
JP2935223B2 (ja) * 1992-04-14 1999-08-16 東京応化工業株式会社 レジストパターン形成用材料の製造方法及びタンタルのパターン形成方法
EP0965580B1 (de) * 1998-06-15 2003-09-03 Toyo Gosei Kogyo Co., Ltd. Verfahren zur Herstellung von 1,2-Naphthochinon-2-diazidderivaten
JP2001233911A (ja) * 2000-02-21 2001-08-28 Toyo Ink Mfg Co Ltd 重合性組成物
US6559291B1 (en) * 2002-03-25 2003-05-06 Council Of Scientific And Industrial Research Process for the preparation of diazonaphthoquinonesulfonylchlorides using diphosgene and triphosgene
JP4159022B2 (ja) * 2002-03-28 2008-10-01 カウンセル オブ サイエンティフィック アンド インダストリアル リサーチ ジホスゲン及びトリホスゲンを使用したジアゾナフトキノンスルホニルクロリドの調製法
US6852465B2 (en) * 2003-03-21 2005-02-08 Clariant International Ltd. Photoresist composition for imaging thick films
US6905809B2 (en) * 2003-04-01 2005-06-14 Clariant Finance (Bvi) Limited Photoresist compositions
US7407731B2 (en) * 2005-03-25 2008-08-05 Fujifilm Electronic Materials U.S.A., Inc. Photosensitive resin compositions
WO2007026374A1 (en) * 2005-09-01 2007-03-08 Council Of Scientific And Industrial Research A single pot process for the preparation of diazonaphthoquinonesulfonyl ester

Also Published As

Publication number Publication date
PL2137140T3 (pl) 2011-04-29
US8563215B2 (en) 2013-10-22
JP2010522230A (ja) 2010-07-01
US20100081084A1 (en) 2010-04-01
DE602008003423D1 (de) 2010-12-23
EP2137140A2 (de) 2009-12-30
WO2008117308A3 (en) 2008-11-13
EP2137140B1 (de) 2010-11-10
WO2008117308A2 (en) 2008-10-02
WO2008117308A4 (en) 2009-01-08
JP5631732B2 (ja) 2014-11-26

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