Wang et al., 2014 - Google Patents
Useful lifetime analysis for high-power white LEDsWang et al., 2014
- Document ID
- 15369892246234380081
- Author
- Wang F
- Lu Y
- Publication year
- Publication venue
- Microelectronics Reliability
External Links
Snippet
An accelerated degradation test is used to analyze the useful lifetime of high-power white light-emitting diodes (HPWLEDs) as the point at which the light output declines to 70% of the initial flux in lumens, called L 70 In this study, the degradation-data-driven method (DDDM) …
- 238000004458 analytical method 0 title abstract description 28
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
- H05B33/00—Electroluminescent light sources
- H05B33/02—Details
- H05B33/08—Circuit arrangements not adapted to a particular application
- H05B33/0803—Circuit arrangements not adapted to a particular application for light emitting diodes (LEDs) comprising only inorganic semi-conductor materials
- H05B33/0806—Structural details of the circuit
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