Fan et al., 2021 - Google Patents
Prognostics of radiation power degradation lifetime for ultraviolet light-emitting diodes using stochastic data-driven modelsFan et al., 2021
View HTML- Document ID
- 4482132006987286840
- Author
- Fan J
- Jing Z
- Cao Y
- Ibrahim M
- Li M
- Fan X
- Zhang G
- Publication year
- Publication venue
- Energy and AI
External Links
Snippet
With their advantages of high efficiency, long lifetime, compact size and being free of mercury, ultraviolet light-emitting diodes (UV LEDs) are widely applied in disinfection and purification, photolithography, curing and biomedical devices. However, it is challenging to …
- 238000006731 degradation reaction 0 title abstract description 104
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
- H05B33/00—Electroluminescent light sources
- H05B33/02—Details
- H05B33/08—Circuit arrangements not adapted to a particular application
- H05B33/0803—Circuit arrangements not adapted to a particular application for light emitting diodes (LEDs) comprising only inorganic semi-conductor materials
- H05B33/0884—Circuit arrangements not adapted to a particular application for light emitting diodes (LEDs) comprising only inorganic semi-conductor materials with monitoring or protection
- H05B33/089—Circuit arrangements not adapted to a particular application for light emitting diodes (LEDs) comprising only inorganic semi-conductor materials with monitoring or protection of the load stage
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Huang et al. | Degradation modeling of mid-power white-light LEDs by using Wiener process | |
| Wang et al. | Useful lifetime analysis for high-power white LEDs | |
| CN111612142B (en) | BP neural network-based high-power LED life prediction method | |
| Jing et al. | Lifetime prediction of ultraviolet light-emitting diodes using a long short-term memory recurrent neural network | |
| Ibrahim et al. | System level reliability assessment for high power light-emitting diode lamp based on a Bayesian network method | |
| Fan et al. | Prognostics of radiation power degradation lifetime for ultraviolet light-emitting diodes using stochastic data-driven models | |
| Chen et al. | Analysis and modeling of high-power phosphor-coated white light-emitting diodes with a large surface area | |
| Wu et al. | A gamma process-based prognostics method for CCT shift of high-power white LEDs | |
| Liu et al. | Lifetime prediction of a multi-chip high-power LED light source based on artificial neural networks | |
| Hao et al. | The design of two-step-down aging test for LED lamps under temperature stress | |
| Padmasali et al. | A generalized methodology for predicting the lifetime performance of LED luminaire | |
| Radevici et al. | Influence of photo-generated carriers on current spreading in double diode structures for electroluminescent cooling | |
| Wen et al. | In-Situ early anomaly detection and remaining useful lifetime prediction for high-power white LEDs with distance and entropy-based long short-term memory recurrent neural networks | |
| Sawant et al. | Failure modes and effects criticality analysis and accelerated life testing of LEDs for medical applications | |
| Herzog et al. | Lifetime prediction of current-and temperature-induced degradation in silicone-encapsulated 365 nm high-power light-emitting diodes | |
| Wu et al. | Durability evaluation of PV modules using image processing tools | |
| Tsai et al. | Investigation on some parameters affecting optical degradation of LED packages during high-temperature aging | |
| Truong et al. | An improved accelerated degradation model for LED reliability assessment with self-heating impacts | |
| Abbasinejad et al. | A comprehensive detailed formula for LED degradation and lifetime estimation leading to reduce CO2 emissions | |
| Sutharssan | Prognostics and health management of light emitting diodes | |
| Shailesh et al. | Application of accelerated life testing principles to project long term lumen maintenance of LED luminaires | |
| Lu et al. | Light-emitting diodes for space applications | |
| Huang et al. | Degradation mechanism decoupling of mid-power white-light LEDs by SPD simulation | |
| Hao et al. | Step-down accelerated aging test for LED lamps based on Nelson models | |
| Cai et al. | Highly accelerated life testing of LED luminaries |