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Cai et al., 2016 - Google Patents

Thermal degradation kinetics of LED lamps in step-up-stress and step-down-stress accelerated degradation testing

Cai et al., 2016

Document ID
11636596032390041579
Author
Cai M
Yang D
Zheng J
Mo Y
Huang J
Xu J
Chen W
Zhang G
Chen X
Publication year
Publication venue
Applied Thermal Engineering

External Links

Snippet

Step-down-stress accelerated degradation testing (SDSADT) for light-emitting diode (LED) lamps is proposed. Meanwhile, achieving a solution to terminate the initial increase in the optical parameters of LED products rapidly is considered. The thermal degradation kinetics …
Continue reading at www.sciencedirect.com (other versions)

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
    • H05B33/00—Electroluminescent light sources
    • H05B33/02—Details
    • H05B33/08—Circuit arrangements not adapted to a particular application
    • H05B33/0803—Circuit arrangements not adapted to a particular application for light emitting diodes (LEDs) comprising only inorganic semi-conductor materials
    • H05B33/0884—Circuit arrangements not adapted to a particular application for light emitting diodes (LEDs) comprising only inorganic semi-conductor materials with monitoring or protection
    • H05B33/089—Circuit arrangements not adapted to a particular application for light emitting diodes (LEDs) comprising only inorganic semi-conductor materials with monitoring or protection of the load stage
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
    • H05B33/00—Electroluminescent light sources
    • H05B33/02—Details
    • H05B33/08—Circuit arrangements not adapted to a particular application
    • H05B33/0803—Circuit arrangements not adapted to a particular application for light emitting diodes (LEDs) comprising only inorganic semi-conductor materials
    • H05B33/0806—Structural details of the circuit

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