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Cai et al., 2016 - Google Patents

Effects of stress-loading test methods on the degradation of light-emitting diode modules

Cai et al., 2016

Document ID
9397330024244234831
Author
Cai M
Yang D
Zheng J
Huang J
Liu D
Xiao J
Zhang P
Zhang G
Chen X
Publication year
Publication venue
Microelectronics Reliability

External Links

Snippet

This study investigates the degradation of light-emitting diode (LED) lamp modules by various stress–load test approaches, namely, step-up stress accelerated degradation testing, step-down stress accelerated degradation testing (SDSADT), and constant stress …
Continue reading at www.sciencedirect.com (other versions)

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
    • H05B33/00—Electroluminescent light sources
    • H05B33/02—Details
    • H05B33/08—Circuit arrangements not adapted to a particular application
    • H05B33/0803—Circuit arrangements not adapted to a particular application for light emitting diodes (LEDs) comprising only inorganic semi-conductor materials
    • H05B33/0842—Circuit arrangements not adapted to a particular application for light emitting diodes (LEDs) comprising only inorganic semi-conductor materials with control
    • H05B33/0857—Circuit arrangements not adapted to a particular application for light emitting diodes (LEDs) comprising only inorganic semi-conductor materials with control of the color point of the light
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
    • H05B33/00—Electroluminescent light sources
    • H05B33/02—Details
    • H05B33/08—Circuit arrangements not adapted to a particular application
    • H05B33/0803—Circuit arrangements not adapted to a particular application for light emitting diodes (LEDs) comprising only inorganic semi-conductor materials
    • H05B33/0806—Structural details of the circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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