research-article

Layout-aware pseudo-functional testing for critical paths considering power supply noise effects

Authors:

Qiang XuAuthors Info & Claims

DATE '10: Proceedings of the Conference on Design, Automation and Test in Europe

Pages 1432 - 1437

Published: 08 March 2010 Publication History

Abstract

When testing delay faults on critical paths, conventional structural test patterns may be applied in functionally-unreachable states, leading to over-testing or under-testing of the circuits. In this paper, we propose novel layout-aware pseudo-functional testing techniques to tackle the above problem. Firstly, by taking the circuit layout information into account, functional constraints related to delay faults on critical paths are extracted. Then, we generate functionally-reachable test cubes for every true critical path in the circuit. Finally, we fill the don't-care bits in the test cubes to maximize power supply noises on critical paths under the consideration of functional constraints. The effectiveness of the proposed methodology is verified with large ISCAS'89 benchmark circuits.

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Cited By

Yuan FLiu XXu QPhillips JHu AGraeb H(2011)Pseudo-functional testing for small delay defects considering power supply noise effectsProceedings of the International Conference on Computer-Aided Design10.5555/2132325.2132333(34-39)Online publication date: 7-Nov-2011
https://dl.acm.org/doi/10.5555/2132325.2132333
Wu MTsai KCheng WPan HHuang JKifli AScheffer LPhillips JHu A(2010)A scalable quantitative measure of IR-drop effects for scan pattern generationProceedings of the International Conference on Computer-Aided Design10.5555/2133429.2133461(162-167)Online publication date: 7-Nov-2010
https://dl.acm.org/doi/10.5555/2133429.2133461
Mu SWang YYang HChao MChen STseng CTsai TScheffer LPhillips JHu A(2010)Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designsProceedings of the International Conference on Computer-Aided Design10.5555/2133429.2133460(155-161)Online publication date: 7-Nov-2010
https://dl.acm.org/doi/10.5555/2133429.2133460

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Information & Contributors

Information

Published In

cover image ACM Conferences

DATE '10: Proceedings of the Conference on Design, Automation and Test in Europe

March 2010

1868 pages

ISBN:9783981080162

General Chairs:
Giovanni De Micheli
EPF Lausanne, CH
,
Bashir Al-Hashimi
University of Southampton, UK
,
Program Chairs:
Wolfgang Mueller
University of Paderborn, SE
,
Enrico Macii
Politecnico di Torino, IT

Sponsors

EDAA: European Design Automation Association
ECSI
EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
The IEEE Computer Society TTTC
The IEEE Computer Society DATC
The Russian Academy of Sciences: The Russian Academy of Sciences

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European Design and Automation Association

Leuven, Belgium

Publication History

Published: 08 March 2010

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Research-article

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DATE '10

Sponsor:

EDAA
EDAC
SIGDA
The Russian Academy of Sciences

DATE '10: Design, Automation and Test in Europe

March 8 - 12, 2010

Germany, Dresden

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Overall Acceptance Rate 518 of 1,794 submissions, 29%

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Cited By

Yuan FLiu XXu QPhillips JHu AGraeb H(2011)Pseudo-functional testing for small delay defects considering power supply noise effectsProceedings of the International Conference on Computer-Aided Design10.5555/2132325.2132333(34-39)Online publication date: 7-Nov-2011
https://dl.acm.org/doi/10.5555/2132325.2132333
Wu MTsai KCheng WPan HHuang JKifli AScheffer LPhillips JHu A(2010)A scalable quantitative measure of IR-drop effects for scan pattern generationProceedings of the International Conference on Computer-Aided Design10.5555/2133429.2133461(162-167)Online publication date: 7-Nov-2010
https://dl.acm.org/doi/10.5555/2133429.2133461
Mu SWang YYang HChao MChen STseng CTsai TScheffer LPhillips JHu A(2010)Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designsProceedings of the International Conference on Computer-Aided Design10.5555/2133429.2133460(155-161)Online publication date: 7-Nov-2010
https://dl.acm.org/doi/10.5555/2133429.2133460

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