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Mixed-signal switching noise analysis using Voronoi-tessellated substrate macromodels

Published: 01 January 1995 Publication History
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References

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        cover image ACM Conferences
        DAC '95: Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
        January 1995
        760 pages
        ISBN:0897917251
        DOI:10.1145/217474
        Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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        Published: 01 January 1995

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        • (2016)Layout Tools for Analog Integrated Circuits and Mixed-Signal Systems-on-Chip: A SurveyElectronic Design Automation for IC Implementation, Circuit Design, and Process Technology10.1201/b19714-22(479-499)Online publication date: 14-Apr-2016
        • (2007)Dynamic models for substrate coupling in mixed-mode systemsIET Circuits, Devices & Systems10.1049/iet-cds:200602061:3(221)Online publication date: 2007
        • (2006)Substrate optimization based on semi-analytical techniquesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/43.74372718:2(172-190)Online publication date: 1-Nov-2006
        • (2004)Technology Impact on Substrate NoiseSubstrate Noise Coupling in Mixed-Signal ASICs10.1007/0-306-48170-7_1(1-21)Online publication date: 2004
        • (2000)Layout tools for analog ICs and mixed-signal SoCsProceedings of the 2000 international symposium on Physical design10.1145/332357.332378(76-83)Online publication date: 1-May-2000
        • (1999)Efficient techniques for accurate extraction and modeling of substrate coupling in mixed-signal IC'sProceedings of the conference on Design, automation and test in Europe10.1145/307418.307531(84-es)Online publication date: 1-Jan-1999
        • (1999)Multilevel finite difference methods for the characterization of substrate coupling in deep sub-micron designsProceedings. XII Symposium on Integrated Circuits and Systems Design (Cat. No.PR00387)10.1109/SBCCI.1999.802961(26-29)Online publication date: 1999
        • (1999)Effect of Noise on Analog Circuit TestingJournal of Electronic Testing: Theory and Applications10.1023/A:100834310884015:1-2(11-22)Online publication date: 1-Aug-1999
        • (1998)Efficient techniques for accurate modeling and simulation of substrate coupling in mixed-signal IC'sProceedings of the conference on Design, automation and test in Europe10.5555/368058.368450(892-898)Online publication date: 23-Feb-1998
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