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SoC test scheduling using the B-tree based floorplanning technique

Published: 18 January 2005 Publication History

Abstract

We present in this paper a new algorithm to co-optimize the problems of test scheduling and core wrapper design under power constraints for core-based SoC (System on Chip) designs. The problem of test scheduling is first transformed into a floorplanning problem with a given maximum height (test access mechanism width) constraint. Then, we apply the B*-tree based floorplanning technique to solve the SoC test scheduling problem. Experimental results based on the ITC'02 benchmarks show that our method is very effective and efficient---our method obtains the best results ever reported for SoC test scheduling with power constraint in every efficient running time. Compared with recent works, our method achieves average improvements of 4.7% to 20.1%.

References

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V. Iyengar, K. Chakrabarty, and E. J. Marinissen, "On using rectangle packing for SOC wrapper/TAM co-optimization," VTS, pp.253--258, 2002.
[2]
K. Chakrabarty, "Test scheduling for core-based system using mixed-integer linear programming," IEEE TCAD, pp.1163--1174, 2000.
[3]
V. Iyengar, K. Chakrabarty, and E. J. Marinissen, "Test wrapper and test access mechanism co-optimization for System-on-Chip," ITC, pp.1023--1032, 2001.
[4]
Y. Huang, S. M. Reddy, W.-T. Cheng, and P. Reuter, "Optimal core wrapper width selection and SOC test scheduling based on 3-D bin packing algorithm," ITC, pp.74--82, 2002.
[5]
W. Zou, S. M. Reddy, I. Pomeranz, and Y. Huang, "SOC test scheduling using simulated annealing," VTS, 2003.
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Y. Xia, M. Chrzanowska-Jeske, B. Wang, and M. Jeske, "Using a distributed rectangle bin-packing approach for core-based SoC test scheduling with power constraints," ICCAD, pp.100--105, 2003.
[7]
Y.-C. Chang, Y.-W. Chang, G.-M. Wu, and S.-W. Wu, "B*-Trees: A new representation for non-slicing floorplans," DAC, pp.458--463, 2000.
[8]
Y. Zorian, E. J. Marinissen, and S. Dey, "Testing embedded core-based system chips," ITC, pp. 130--143, 1998.
[9]
S. Kirkpatrick, C. D. Gelatt, Jr., and M. P. Vecchi, "Optimization by simulated annealing," pp.671--680, Science, Vol.220, No.4598, 1983.
[10]
E. J. Marinissen, V. Iyengar, and K. Chakrabarty. ITC'02 SoC Test Benchmarks, http://www.extra.research.philips.com/itc02socbenchm/
[11]
P.-N. Guo, C.-K. Cheng, and T. Yoshimura, "An O-Tree representation of non-slicing floorplan and its application," DAC, pp.268--273, 1999.

Cited By

View all
  • (2018)Window-based peak power model and Particle Swarm Optimization guided 3-dimensional bin packing for SoC test schedulingIntegration, the VLSI Journal10.1016/j.vlsi.2015.01.00650:C(61-73)Online publication date: 28-Dec-2018
  • (2018)Power-aware system-on-chip test scheduling using enhanced rectangle packing algorithmComputers and Electrical Engineering10.1016/j.compeleceng.2012.04.01038:6(1444-1455)Online publication date: 27-Dec-2018
  • (2017)A Multiobjective Optimization Method for the SOC Test Time, TAM, and Power Optimization Using a Strength Pareto Evolutionary AlgorithmInformation Technology - New Generations10.1007/978-3-319-54978-1_86(685-695)Online publication date: 18-Jul-2017
  • Show More Cited By

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cover image ACM Conferences
ASP-DAC '05: Proceedings of the 2005 Asia and South Pacific Design Automation Conference
January 2005
1495 pages
ISBN:0780387376
DOI:10.1145/1120725
  • General Chair:
  • Ting-Ao Tang
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 18 January 2005

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Cited By

View all
  • (2018)Window-based peak power model and Particle Swarm Optimization guided 3-dimensional bin packing for SoC test schedulingIntegration, the VLSI Journal10.1016/j.vlsi.2015.01.00650:C(61-73)Online publication date: 28-Dec-2018
  • (2018)Power-aware system-on-chip test scheduling using enhanced rectangle packing algorithmComputers and Electrical Engineering10.1016/j.compeleceng.2012.04.01038:6(1444-1455)Online publication date: 27-Dec-2018
  • (2017)A Multiobjective Optimization Method for the SOC Test Time, TAM, and Power Optimization Using a Strength Pareto Evolutionary AlgorithmInformation Technology - New Generations10.1007/978-3-319-54978-1_86(685-695)Online publication date: 18-Jul-2017
  • (2009)Test Scheduling for Core-Based SOCs Using Genetic Algorithm Based Heuristic ApproachProceedings of the 3rd International Conference on Intelligent Computing: Advanced Intelligent Computing Theories and Applications. With Aspects of Artificial Intelligence10.1007/978-3-540-74205-0_107(1032-1041)Online publication date: 17-Nov-2009
  • (2008)A Test Scheduling Scheme for Core-Based SoCs Using Genetic Algorithm2008 International Conference on Embedded Software and Systems Symposia10.1109/ICESS.Symposia.2008.65(38-43)Online publication date: Jul-2008
  • (2007)Placement of defect-tolerant digital microfluidic biochips using the T-tree formulationACM Journal on Emerging Technologies in Computing Systems (JETC)10.1145/1295231.12952343:3(13-es)Online publication date: 1-Nov-2007
  • (2007)A genetic algorithm based heuristic technique for power constrained test scheduling in core-based SOCs2007 IFIP International Conference on Very Large Scale Integration10.1109/VLSISOC.2007.4402522(320-323)Online publication date: Oct-2007
  • (2007)Genetic Algorithm Based Approach for Hierarchical SOC Test SchedulingProceedings of the International Conference on Computing: Theory and Applications10.1109/ICCTA.2007.65(141-145)Online publication date: 5-Mar-2007

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