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Jeffrey W. Teng
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2020 – today
- 2024
- [c10]Harrison P. Lee, Delgermaa Nergui, Jeffrey W. Teng, Jackson P. Moody, Nelson Sepúlveda-Ramos, John D. Cressler:
Anomalous Mixed-Mode Damage Effects in SiGe HBTs at Cryogenic Temperatures. IRPS 2024: 1-4 - 2023
- [c9]Harrison P. Lee, Nelson Sepúlveda-Ramos, Jeffrey W. Teng, Jackson P. Moody, Delgermaa Nergui, Brett L. Ringel, Zachary R. Brumbach, Alizeh Premani, Uppili S. Raghunathan, Vibhor Jain, John D. Cressler:
The Effects of Carbon Doping on the Performance and Electrical Reliability of SiGe HBTs. BCICTS 2023: 253-256 - [c8]Jackson P. Moody, Jeffrey W. Teng, John D. Cressler:
The Impact of BEOL Stress on SiGe HBTs at Cryogenic Temperatures. BCICTS 2023: 270-273 - 2022
- [c7]Nelson Sepúlveda-Ramos, Jeffrey W. Teng, Harrison Lee, John D. Cressler:
Improved Electrical Reliability and Performance Enhancements in SiGe HBTs Using Dummy BEOL Metal Layers. BCICTS 2022: 62-65 - [c6]Harrison Lee, Arya Moradinia, Jeffrey W. Teng, Nelson Sepúlveda-Ramos, John D. Cressler:
Performance vs. Reliability Tradeoffs of Medium Breakdown and High Performance Cascode Amplifier Cells. BCICTS 2022: 66-69 - 2021
- [c5]Harrison P. Lee, Jeffrey W. Teng, Nelson Sepúlveda-Ramos, John D. Cressler:
Dynamic Behavior of Breakdown Mechanisms in SiGe HBTs. BCICTS 2021: 1-4 - [c4]George N. Tzintzarov, Jeffrey W. Teng, Adrian Ildefonso, John D. Cressler:
Analysis of the Impact of Radiation-Induced Optical Transients on Deep-Space Optical Communications Systems using PPM. OFC 2021: 1-3 - 2020
- [c3]Arya Moradinia, Rafael Perez Martinez, Jeffrey W. Teng, Nelson Sepúlveda-Ramos, Harrison Lee, John D. Cressler:
Circuit-Level Safe-Operating-Area of a High-Speed SiGe BiCMOS Wireline Driver. BCICTS 2020: 1-5 - [c2]Hanbin Ying, Sunil G. Rao, Jeffrey W. Teng, Milad Frounchi, Markus Müller, Xiaodi Jin, Michael Schröter, John D. Cressler:
Compact Modeling of SiGe HBTs for Design of Cryogenic Control and Readout Circuits for Quantum Computing. BCICTS 2020: 1-4
2010 – 2019
- 2019
- [c1]Hanbin Ying, Jeffrey W. Teng, George N. Tzintzarov, Anup P. Omprakash, Sunil G. Rao, Uppili S. Raghunathan, Adrian Ildefonso, Martin S. Fernandez, John D. Cressler:
DC and RF Variability of SiGe HBTs Operating Down to Deep Cryogenic Temperatures. BCICTS 2019: 1-4
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last updated on 2024-10-07 22:20 CEST by the dblp team
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