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Harrison Lee 0002

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affiliation: Stanford University, CA, USA

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2020 – today

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2022
[c3]
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  dblp key:
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Nelson Sepúlveda-Ramos, Jeffrey W. Teng, Harrison Lee, John D. Cressler:
Improved Electrical Reliability and Performance Enhancements in SiGe HBTs Using Dummy BEOL Metal Layers. BCICTS 2022: 62-65
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Harrison Lee, Arya Moradinia, Jeffrey W. Teng, Nelson Sepúlveda-Ramos, John D. Cressler:
Performance vs. Reliability Tradeoffs of Medium Breakdown and High Performance Cascode Amplifier Cells. BCICTS 2022: 66-69
2020
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Arya Moradinia, Rafael Perez Martinez, Jeffrey W. Teng, Nelson Sepúlveda-Ramos, Harrison Lee, John D. Cressler:
Circuit-Level Safe-Operating-Area of a High-Speed SiGe BiCMOS Wireline Driver. BCICTS 2020: 1-5

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