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Publication search results
found 44 matches
- 2015
- Jacob A. Abraham, Ravishankar K. Iyer, Dimitris Gizopoulos, Dan Alexandrescu, Yervant Zorian:
The future of fault tolerant computing. IOLTS 2015: 108-109 - Dan Alexandrescu, Adrian Evans, Enrico Costenaro, Maximilien Glorieux:
A call for cross-layer and cross-domain reliability analysis and management. IOLTS 2015: 19-22 - Mohammad Ashraful Anam, Yiannis Andreopoulos:
Failure mitigation in linear, sesquilinear and bijective operations on integer data streams via numerical entanglement. IOLTS 2015: 122-127 - Ijeoma Anarado, Yiannis Andreopoulos:
Mitigation of fail-stop failures in integer matrix products via numerical packing. IOLTS 2015: 101-107 - Serhiy Avramenko, Stefano Esposito, Massimo Violante, Marco Sozzi, Massimo Traversone, Marco Binello, Marco Terrone:
An Hybrid Architecture for consolidating mixed criticality applications on multicore systems. IOLTS 2015: 26-29 - Suvadeep Banerjee, Md Imran Momtaz, Abhijit Chatterjee:
Concurrent error detection in nonlinear digital filters using checksum linearization and residue prediction. IOLTS 2015: 53-58 - Lake Bu, Mark G. Karpovsky, Zhen Wang:
New byte error correcting codes with simple decoding for reliable cache design. IOLTS 2015: 200-205 - Riccardo Cantoro, Matteo Sonza Reorda, Alireza Rohani, Hans G. Kerkhoff:
On the maximization of the sustained switching activity in a processor. IOLTS 2015: 34-35 - Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos:
Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents. IOLTS 2015: 150-155 - Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis:
MUGEN: A high-performance fault-tolerant routing algorithm for unreliable Networks-on-Chip. IOLTS 2015: 71-76 - Nikolaos Eftaxiopoulos-Sarris, Nicholas Axelos, Kiamal Z. Pekmestzi:
Low leakage radiation tolerant CAM/TCAM cell. IOLTS 2015: 206-211 - Jaime Espinosa, Carles Hernández, Jaume Abella:
Characterizing fault propagation in safety-critical processor designs. IOLTS 2015: 144-149 - Adrian Evans, Enrico Costenaro, Arkady Bramnik:
Flip-flop SEU reduction through minimization of the temporal vulnerability factor (TVF). IOLTS 2015: 162-167 - Vasileios Gerakis, Leonidas Katselas, Alkis A. Hatzopoulos:
Fault modeling and testing of through silicon via interconnections. IOLTS 2015: 30-31 - Amr Haggag, Nik Sumikawa, Aamer Shaukat:
Reliability/yield trade-off in mitigating "no trouble found" field returns. IOLTS 2015: 174-175 - Ghaith Bany Hamad, Otmane Aït Mohamed, Yvon Savaria:
Efficient multilevel formal analysis and estimation of design vulnerability to Single Event Transients. IOLTS 2015: 1-6 - Gurgen Harutunyan, Yervant Zorian:
An effective embedded test & diagnosis solution for external memories. IOLTS 2015: 168-170 - Tong-Yu Hsieh, Yi-Han Peng:
Filtering-based error-tolerability evaluation of image processing circuits. IOLTS 2015: 132-137 - Katerina Katsarou, Yiorgos Tsiatouhas:
Soft error immune latch under SEU related double-node charge collection. IOLTS 2015: 46-49 - Yuta Kimi, Go Matsukawa, Shuhei Yoshida, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto:
An accurate soft error propagation analysis technique considering temporal masking disablement. IOLTS 2015: 23-25 - Nektarios Kranitis, Antonis Tsigkanos, George Theodorou, Ioannis Sideris, Antonis M. Paschalis:
A single chip dependable and adaptable payload Data Processing Unit. IOLTS 2015: 138-143 - Marc Lacruche, Nicolas Borrel, Clement Champeix, Cyril Roscian, Alexandre Sarafianos, Jean-Baptiste Rigaud, Jean-Max Dutertre, Edith Kussener:
Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses. IOLTS 2015: 13-18 - Joseph Lenox, Spyros Tragoudas:
Towards Trojan circuit detection with maximum state transition exploration. IOLTS 2015: 50-52 - Chang Liu, Michael A. Kochte, Hans-Joachim Wunderlich:
Efficient observation point selection for aging monitoring. IOLTS 2015: 176-181 - Anzhela Yu. Matrosova, Eugeniy Mitrofanov, Toral Shah:
Simplification of fully delay testable combinational circuits. IOLTS 2015: 44-45 - Bodhisatwa Mazumdar, Sk Subidh Ali, Ozgur Sinanoglu:
Power analysis attacks on ARX: An application to Salsa20. IOLTS 2015: 40-43 - Alexandros Panteloukas, Anastasios Psarras, Chrysostomos Nicopoulos, Giorgos Dimitrakopoulos:
Timing-resilient Network-on-Chip architectures. IOLTS 2015: 77-82 - Panagiota Papavramidou, Michael Nicolaidis:
Low-power memory repair for high defect densities. IOLTS 2015: 171-173 - Zissis Poulos, Andreas G. Veneris:
Mining simulation metrics for failure triage in regression testing. IOLTS 2015: 182-187 - Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi:
BTI and leakage aware dynamic voltage scaling for reliable low power cache memories. IOLTS 2015: 194-199
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