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"A 5000 h RF life test on 330 W RF-LDMOS transistors for radars applications."

Olivier Latry et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.086

access: closed

type: Journal Article

metadata version: 2022-10-02

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Olivier Latry, Pascal Dherbécourt, Karine Mourgues, Hichame Maanane, Jean Pierre Sipma, F. Cornu, Philippe Eudeline, Mohamed Masmoudi:
A 5000 h RF life test on 330 W RF-LDMOS transistors for radars applications. Microelectron. Reliab. 50(9-11): 1574-1576 (2010)

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