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Elaine Crespo Marques
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2020 – today
- 2020
- [j6]Nilson Maciel, Elaine Crespo Marques, Lirida A. B. Naviner
, Yongliang Zhou
Magnetic Tunnel Junction Applications. Sensors 20(1): 121 (2020) - [c6]Nilson Maciel, Elaine Crespo Marques, Lírida A. B. Naviner
Magnetic Tunnel Junction-based Analog-to-Digital Converter using Spin Orbit Torque Mechanism. ICECS 2020: 1-4
2010 – 2019
- 2019
- [j5]Elaine Crespo Marques
A Review of Sparse Recovery Algorithms. IEEE Access 7: 1300-1322 (2019) - [c5]Elaine Crespo Marques, Nilson Maciel, Lirida A. B. Naviner
Deep Learning Approaches for Sparse Recovery in Compressive Sensing. ISPA 2019: 129-134 - [c4]Elaine Crespo Marques, Nilson Maciel, Lirida A. B. Naviner
Nonlinear Functions in Learned Iterative Shrinkage-Thresholding Algorithm for Sparse Signal Recovery. SiPS 2019: 324-329 - 2018
- [j4]Nilson Maciel, Elaine Crespo Marques, Lirida A. B. Naviner
Single-event transient effects on dynamic comparator in 28 nm FDSOI CMOS technology. Microelectron. Reliab. 88-90: 965-968 (2018) - [c3]Elaine Crespo Marques, Nilson Maciel, Lirida A. B. Naviner
Compressed Sensing for Wideband HF Channel Estimation. ICFSP 2018: 1-5 - 2017
- [c2]Nilson Maciel de Paiva, Elaine Crespo Marques, Lirida Alves de Barros Naviner
Sparsity analysis using a mixed approach with greedy and LS algorithms on channel estimation. ICFSP 2017: 91-95 - 2015
- [c1]Francisco C. Ribeiro, Elaine Crespo Marques, Nilson M. Paiva Jr., Juraci F. Galdino:
Sparsity-aware direct decision-feedback equalization of ionospheric HF channels. MILCOM 2015: 1467-1472 - 2011
- [j3]Lirida A. B. Naviner
FIFA: A fault-injection-fault-analysis-based tool for reliability assessment at RTL level. Microelectron. Reliab. 51(9-11): 1459-1463 (2011) - 2010
- [j2]G. G. dos Santos, Elaine Crespo Marques, Lirida A. B. Naviner
Using error tolerance of target application for efficient reliability improvement of digital circuits. Microelectron. Reliab. 50(9-11): 1219-1222 (2010) - [j1]Elaine Crespo Marques, Lirida A. B. Naviner
An efficient tool for reliability improvement based on TMR. Microelectron. Reliab. 50(9-11): 1247-1250 (2010)
Coauthor Index
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