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Michael Gössel
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- affiliation: University of Potsdam, Germany
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2020 – today
- 2024
- [c84]Alexander Benedict Behrens, Michael Gössel:
Determination of Optimal H-Matrices for 2-Bit Error Correcting Codes. ARCS 2024: 344-357 - 2023
- [c83]Georg Duchrau, Michael Gössel:
Modified Cross Parity Codes for Adjacent Double Error Correction. ARCS 2023: 94-102 - 2022
- [c82]Georg Duchrau, Michael Gössel:
A New Decoding Method for Double Error Correcting Cross Parity Codes. IOLTS 2022: 1-5
2010 – 2019
- 2019
- [c81]Paul-Patrick Nordmann, Michael Gössel:
A New DEC/TED Code for Fast Correction of 2-Bit-Errors. IOLTS 2019: 171-175 - 2018
- [j37]Paul-Patrick Nordmann, Michael Gössel:
Regular LPDC Codes with Guaranteed Minimal Hamming Distance. J. Autom. Lang. Comb. 23(1-3): 271-280 (2018) - 2017
- [c80]Alexander Klockmann, Georg Georgakos, Michael Gössel:
A new 3-bit burst-error correcting code. IOLTS 2017: 3-4 - 2015
- [c79]Günther Nieß, Thomas Kern, Michael Gössel:
Möglichkeiten der Modellierung von Fehlern in MLC-Flash-Speichern durch Fehlergraphen. GI-Jahrestagung 2015: 1445-1459 - 2014
- [c78]Christian Badack, Michael Gössel:
Triple error detection for Imai-Kamiyanagi codes based on subsyndrome computations. ETS 2014: 1-2 - [c77]Milos Krstic
, Stefan Weidling, Vladimir Petrovic, Michael Gössel:
Improved circuitry for soft error correction in combinational logic in pipelined designs. IOLTS 2014: 93-98 - [c76]Christian Badack, Thomas Kern, Michael Gössel:
Modified DEC BCH codes for parallel correction of 3-bit errors comprising a pair of adjacent errors. IOLTS 2014: 116-121 - [c75]Stefan Weidling, Michael Gössel:
Fault tolerant linear state machines. LATW 2014: 1-6 - 2013
- [c74]Egor S. Sogomonyan, Stefan Weidling, Michael Gössel:
A new method for correcting time and soft errors in combinational circuits. DDECS 2013: 283-286 - [c73]Stefan Weidling, Egor S. Sogomonyan, Michael Gössel:
Error Correction of Transient Errors in a Sum-Bit Duplicated Adder by Error Detection. DSD 2013: 855-862 - 2012
- [j36]Thomas Rabenalt, Michael Richter, Frank Poehl, Michael Gössel:
Highly Efficient Test Response Compaction Using a Hierarchical X-Masking Technique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(6): 950-957 (2012) - 2011
- [j35]Thomas Rabenalt, Michael Gössel, Andreas Leininger:
Masking of X-Values by Use of a Hierarchically Configurable Register. J. Electron. Test. 27(1): 31-41 (2011) - [c72]Michael Augustin, Michael Gössel, Rolf Kraemer:
Implementation of Selective Fault Tolerance with conventional synthesis tools. DDECS 2011: 213-218 - [c71]Michael Augustin, Michael Gössel, Rolf Kraemer:
Selective fault tolerance for finite state machines. IOLTS 2011: 43-48 - 2010
- [c70]Thomas Rabenalt, Michael Richter, Michael Gössel:
High Performance Compaction for Test Responses with Many Unknowns. Asian Test Symposium 2010: 179-184 - [c69]Michael Augustin, Michael Gössel, Rolf Kraemer:
Reducing the area overhead of TMR-systems by protecting specific signals. IOLTS 2010: 268-273
2000 – 2009
- 2009
- [j34]Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel:
X-tolerant Test Data Compaction with Accelerated Shift Registers. J. Electron. Test. 25(4-5): 247-258 (2009) - [c68]Frank-Uwe Faber, Matthias Beck, Markus Rudack, Olivier Barondeau, Thomas Rabenalt, Michael Gössel, Andreas Leininger:
Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment. ETS 2009: 39-44 - [c67]Thomas Rabenalt, Michael Gössel, Andreas Leininger:
Masking of X-values by Use of a Hierarchically Configurable Register. ETS 2009: 149-154 - [c66]Michael Richter, Michael Gössel:
Concurrent checking with split-parity codes. IOLTS 2009: 159-163 - 2008
- [j33]Michael Gössel, Egor S. Sogomonyan:
A Non-linear Split Error Detection Code. Fundam. Informaticae 83(1-2): 109-115 (2008) - [c65]Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel:
Accelerated Shift Registers for X-tolerant Test Data Compaction. ETS 2008: 133-139 - [c64]Michael Richter, Klaus Oberländer, Michael Gössel:
New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability. IOLTS 2008: 37-42 - 2007
- [j32]Frank Poehl, Matthias Beck, Ralf Arnold, Jan Rzeha, Thomas Rabenalt, Michael Gössel:
On-chip evaluation, compensation and storage of scan diagnosis data. IET Comput. Digit. Tech. 1(3): 207-212 (2007) - [c63]Andreas Leininger, Martin Fischer, Michael Richter, Michael Gössel:
Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques. ITC 2007: 1-9 - 2006
- [j31]Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld:
Modulo p=3 Checking for a Carry Select Adder. J. Electron. Test. 22(1): 101-107 (2006) - [c62]Zhanglei Wang, Krishnendu Chakrabarty, Michael Gössel:
Test set enrichment using a probabilistic fault model and the theory of output deviations. DATE 2006: 1270-1275 - [c61]Frank Poehl, Jan Rzeha, Matthias Beck, Michael Gössel, Ralf Arnold, Peter Ossimitz:
On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. ETS 2006: 239-246 - [c60]Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel:
A New Self-Checking and Code-Disjoint Non-Restoring Array Divider. IOLTS 2006: 23-30 - 2005
- [c59]Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel:
New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors. Asian Test Symposium 2005: 76-81 - [c58]Vitalij Ocheretnij, G. Kouznetsov, Ramesh Karri
On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations. IOLTS 2005: 141-146 - 2004
- [j30]Michael Gössel, Krishnendu Chakrabarty
A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST. J. Electron. Test. 20(6): 611-622 (2004) - [c57]Andrej A. Morosov, Michael Gössel, Valerij V. Saposhnikov, Vladimir V. Saposhnikov:
Complementary Circuits for On-Line Detection for 1-out-of-3 Codes. ARCS Workshops 2004: 76-83 - [c56]Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel:
Self-checking Carry-selectAdder with Sum-bit Duplication. ARCS Workshops 2004: 84-91 - [c55]Andreas Leininger, Michael Gössel, Peter Muhmenthaler:
Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code. DATE 2004: 1302-1309 - [c54]Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel:
A New Self-Checking Sum-Bit Duplicated Carry-Select Adder. DATE 2004: 1360-1361 - [c53]Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel:
A new self-checking multiplier by use of a code-disjoint sum-bit duplicated adder. ETS 2004: 30-35 - [c52]Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Andrej A. Morosov, Michael Gössel:
Necessary and Sufficient Conditions for the Existence of Totally Self-Checking Circuits. IOLTS 2004: 25-30 - [c51]Vitalij Ocheretnij, Daniel Marienfeld, Egor S. Sogomonyan, Michael Gössel:
Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits. IOLTS 2004: 31-36 - [c50]Kaijie Wu, Ramesh Karri
Low Cost Concurrent Error Detection for the Advanced Encryption Standard. ITC 2004: 1242-1248 - 2003
- [j29]Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel:
Zero-Aliasing Space Compaction of Test Responses Using a Single Periodic Output. IEEE Trans. Computers 52(12): 1646-1651 (2003) - [j28]Adit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan:
Multimode scan: Test per clock BIST for IP cores. ACM Trans. Design Autom. Electr. Syst. 8(4): 491-505 (2003) - [c49]Ramesh Karri, Grigori Kuznetsov, Michael Gössel:
Parity-Based Concurrent Error Detection of Substitution-Permutation Network Block Ciphers. CHES 2003: 113-124 - [c48]Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld:
A Modulo p Checked Self-Checking Carry Select Adder. IOLTS 2003: 25-29 - [c47]Kartik Mohanram, Egor S. Sogomonyan, Michael Gössel, Nur A. Touba:
Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits. IOLTS 2003: 35- - [c46]Ramesh Karri
Parity-Based Concurrent Error Detection in Symmetric Block Ciphers. ITC 2003: 919-926 - 2002
- [j27]Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty
Synthesis of single-output space compactors for scan-based sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(10): 1171-1179 (2002) - [c45]Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty
Robust Space Compaction of Test Responses. Asian Test Symposium 2002: 254-259 - [c44]Chunsheng Liu, Krishnendu Chakrabarty
An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment. DATE 2002: 382-386 - [c43]Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan:
Partially Duplicated Code-Disjoint Carry-Skip Adder. DFT 2002: 78-86 - [c42]Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel:
A New Self-Checking Code-Disjoint Carry-Skip Adder. IOLTW 2002: 39-43 - [c41]Michael Gössel, Egor S. Sogomonyan, Adit D. Singh:
Scan-Path with Directly Duplicated and Inverted Duplicated Registers. VTS 2002: 47-52 - 2001
- [c40]Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty:
Synthesis of single-output space compactors with application to scan-based IP cores. ASP-DAC 2001: 496-502 - [c39]Michael Gössel, Vitalij Ocheretnij, S. Chakrabarty:
Diagnosis by Repeated Application of Specific Test Inputs and by Output Monitoring of the MISA. Asian Test Symposium 2001: 57-62 - [c38]Vitalij Ocheretnij, Egor S. Sogomonyan, Michael Gössel:
A New Code-Disjoint Sum-Bit Duplicated Carry Look-Ahead Adder for Parity Codes. Asian Test Symposium 2001: 365- - [c37]Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan:
Code-Disjoint Carry-Dependent Sum Adder with Partial Look-Ahead. IOLTW 2001: 147-152 - [c36]Andrej A. Morosov, Michael Gössel, Krishnendu Chakrabarty, Bhargab B. Bhattacharya:
Design of Parameterizable Error-Propagating Space Compactors for Response Observation. VTS 2001: 48-53 - [c35]Egor S. Sogomonyan, Andrej A. Morosov, Jan Rzeha, Michael Gössel, Adit D. Singh:
Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging. VTS 2001: 184-189 - 2000
- [j26]Alexej Dmitriev, Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Michael Gössel, V. Moshanin, Andrej A. Morosov:
New Self-dual Circuits for Error Detection and Testing. VLSI Design 11(1): 1-21 (2000) - [c34]Vitalij Ocheretnij, Michael Gössel, Vladimir V. Saposhnikov, Valerij V. Saposhnikov:
A New Method of Redundancy Addition for Circuit Optimization. EUROMICRO 2000: 1172- - [c33]Andrej A. Morosov, Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Michael Gössel:
New Self-Checking Circuits by Use of Berger-Codes. IOLTW 2000: 141-146 - [c32]Michael Gössel, Alexej Dmitriev, Vladimir V. Saposhnikov, Valerij V. Saposhnikov:
A New Method for Concurrent Checking by Use of a 1-out-of-4 Code. IOLTW 2000: 147-152 - [c31]Debaleena Das, Nur A. Touba, Markus Seuring, Michael Gössel:
Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes. IOLTW 2000: 171- - [c30]Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel:
Zero-Aliasing Space Compression using a Single Periodic Output and its Application to Testing of Embedded Cores. VLSI Design 2000: 382-391
1990 – 1999
- 1999
- [j25]Vladimir V. Saposhnikov, V. Moshanin, Valerij V. Saposhnikov, Michael Gössel:
Experimental Results for Self-Dual Multi-Output Combinational Circuits. J. Electron. Test. 14(3): 295-300 (1999) - [j24]Egor S. Sogomonyan, Adit D. Singh, Michael Gössel:
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. J. Electron. Test. 15(1-2): 87-96 (1999) - [c29]Markus Seuring, Michael Gössel:
A Structural Approach for Space Compaction for Sequential Circuits. DFT 1999: 227- - [c28]Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring:
Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. ITC 1999: 286-293 - [c27]Michael Gössel, Andrej A. Morosov, Egor S. Sogomonyan:
A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces. VTS 1999: 49-57 - [c26]Markus Seuring, Michael Gössel:
A Structural Method for Output Compaction of Sequential Automata Implemented as Circuits. WIA 1999: 158-163 - 1998
- [j23]Valerij V. Saposhnikov, Andrej A. Morosov, Vladimir V. Saposhnikov, Michael Gössel:
A New Design Method for Self-Checking Unidirectional Combinational Circuits. J. Electron. Test. 12(1-2): 41-53 (1998) - [j22]Sebastian T. J. Fenn, Michael Gössel, Mohammed Benaissa, David Taylor:
On-Line Error Detection for Bit-Serial Multipliers in GF(2m). J. Electron. Test. 13(1): 29-40 (1998) - [j21]Andrej A. Morosov, Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Michael Gössel:
Self-Checking Combinational Circuits with Unidirectionally Independent Outputs. VLSI Design 5(4): 333-345 (1998) - [c25]Vladimir V. Saposhnikov, Valerij V. Saposhnikov, Alexej Dmitriev, Michael Gössel:
Self-Dual Duplication for Error Detection. Asian Test Symposium 1998: 296-300 - [c24]T. Bogue, Michael Gössel, Helmut Jürgensen, Yervant Zorian:
Built-In Self-Test with an Alternating Output. DATE 1998: 180-184 - [c23]Egor S. Sogomonyan, Adit D. Singh, Michael Gössel:
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. VTS 1998: 324-331 - [c22]Markus Seuring, Michael Gössel, Egor S. Sogomonyan:
A Structural Approach for Space Compaction for Concurrent Checking and BIST. VTS 1998: 354-361 - 1997
- [c21]Hendrik Hartje, Michael Gössel, Egor S. Sogomonyan:
Code-Disjoint Circuits for Parity Circuits. Asian Test Symposium 1997: 100- - [c20]Michael Gössel, Sebastian T. J. Fenn, David Taylor:
On-line error detection for finite field multipliers. DFT 1997: 307-312 - [c19]Andrzej Hlawiczka, Michael Gössel, Egor S. Sogomonyan:
A linear code-preserving signature analyzer COPMISR. VTS 1997: 350-355 - 1996
- [j20]Michael Gössel, Egor S. Sogomonyan:
A parity-preserving multi-input signature analyzer and its application for concurrent checking and BIST. J. Electron. Test. 8(2): 165-177 (1996) - [j19]Sandip Kundu, Egor S. Sogomonyan, Michael Gössel, Steffen Tarnick:
Self-Checking Comparator with One Periodic Output. IEEE Trans. Computers 45(3): 379-380 (1996) - [c18]Egor S. Sogomonyan, Michael Gössel:
Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems. VTS 1996: 138-144 - [c17]Vladimir V. Saposhnikov, Alexej Dmitriev, Michael Gössel, Valerij V. Saposhnikov:
Self-dual parity checking-A new method for on-line testing. VTS 1996: 162-168 - 1995
- [c16]T. Bogue, Helmut Jürgensen, Michael Gössel:
BIST with negligible aliasing through random cover circuits. ASP-DAC 1995 - 1994
- [c15]T. Bogue, Helmut Jürgensen, Michael Gössel:
Design of Cover Circuits for Monitoring the Output of a MISA. DFT 1994: 124-132 - [c14]Stefan Gerber, Michael Gössel:
Detection of Permanent Hardware Faults of a Floating Point Adder by Pseudoduplication. EDCC 1994: 327-335 - [c13]Michael Gössel, Egor S. Sogomonyan:
Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design. VTS 1994: 151-157 - 1993
- [j18]Egor S. Sogomonyan, Michael Gössel:
Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs. J. Electron. Test. 4(3): 267-281 (1993) - [c12]Egor S. Sogomonyan, Michael Gössel:
Design of Self-Parity Combinational Circuits for Self-testing and On-line Detection. DFT 1993: 239-246 - [c11]Michael Gössel, Helmut Jürgensen:
Monitoring BIST by covers. EURO-DAC 1993: 208-213 - [c10]Michael Gössel, Egor S. Sogomonyan:
Self-parity cominational circuits for self-testing, concurrent fault detection and parity scan design. VLSI 1993: 103-111 - 1992
- [c9]Egor S. Sogomonyan, Michael Gössel:
Self-testing and self-checking combinational circuits with weakly independent outputs. VTS 1992: 298-303 - 1991
- [c8]Michael Gössel:
Optimal Error Detection Circuits for Sequential Circuits with Observable States. Fault-Tolerant Computing Systems 1991: 171-180 - [c7]Wolfgang Hahn, Michael Gössel:
Pseudoduplication of floating-point addition. A method of compiler generated checking of permanent hardware faults. VTS 1991: 161-165
1980 – 1989
- 1989
- [c6]Michael Gössel, J. Saedler:
Parallel computing of line-codings by use of a display processor system and the parallel determination of a discrete curvature. Recent Issues in Pattern Analysis and Recognition 1989: 29-41 - [c5]Rolf-Jürgen Vilser, Reiner Creutzburg
Parallel matrix multiplication on an array-logical processor. Recent Issues in Pattern Analysis and Recognition 1989: 72-78 - [c4]Wolfgang Luth, Michael Gössel:
Linear image operations on the A6472 image processing system by use of the residue arithmetics. Recent Issues in Pattern Analysis and Recognition 1989: 162-168 - [c3]Michael Gössel, Burghard Rebel:
Parallel Access, to rectangles. Recent Issues in Pattern Analysis and Recognition 1989: 201-213 - 1988
- [j17]Wolfgang Luth, Rolf-Jürgen Vilser, Norbert Eichhorn, Michael Gössel:
Bitgenaue schnelle Arithmethik mit dem Bildverarbeitunssystem BVS A 6472. Angew. Inform. 30(3): 110-115 (1988) - [c2]Michael Gössel, V. V. Kaversnev, Burghard Rebel:
Parallel memories for straight line and rectangle access. Parcella 1988: 89-109 - 1987
- [c1]Michael Gössel, R. Rebel:
Memories for Parallel Subtree-Access. Parallel Algorithms and Architectures 1987: 122-130 - 1985
- [j16]Ferdinand Börner, Reinhard Pöschel, Michael Gössel:
Sets of Permutations and Their Realization by Permutation Networks. J. Inf. Process. Cybern. 21(7/8): 331-342 (1985) - 1983
- [j15]Michael Gössel:
Bemerkung über die Existenz von Signaturregistern zur Erkennung geradzahliger Fehler. Elektron. Rechenanlagen 25(5): 233 (1983) - 1980
- [j14]Michael Gössel, Reinhard Pöschel:
Invariant Relations for Automata - A Proposal. J. Inf. Process. Cybern. 16(4): 147-169 (1980)
1970 – 1979
- 1977
- [j13]Michael Gössel, Heinz D. Modrow:
Verallgemeinerte Superposition bei binären Automaten. Acta Cybern. 3(2): 163-171 (1977) - [j12]Michael Gössel, Reinhard Pöschel:
On the Characterization of Linear and Linearizable Automata by a Superposition Principle. Math. Syst. Theory 11: 61-76 (1977) - 1975
- [j11]Michael Gössel, Heinz D. Modrow:
Ein verallgemeinertes Superpositionsprinzig für binäre Automaten. J. Inf. Process. Cybern. 11(10-12): 630-631 (1975) - 1973
- [j10]Michael Gössel:
Über stabile Umkehrautomaten linearer Automaten. J. Inf. Process. Cybern. 9(1/2): 49-60 (1973) - [j9]Heinz D. Modrow, Michael Gössel:
Zur Verarbeitung von Zufallsfolgen durch abstrakte Automaten I. J. Inf. Process. Cybern. 9(7/8): 433-454 (1973) - [j8]Heinz D. Modrow, Michael Gössel:
Zur Verarbeitung von Zufallsfolgen durch abstrakte Automaten II. J. Inf. Process. Cybern. 9(9): 549-567 (1973) - 1972
- [j7]Michael Gössel, Hans-Volker Pürschel:
Über Momente der Autokorrelationsfunktion eines Zeichens. J. Inf. Process. Cybern. 8(1): 49-53 (1972) - [j6]Michael Gössel, Heinz D. Modrow:
Zur Realisierung stochastischer Automaten aus Zufallsgeneratoren und determinierten Automaten. J. Inf. Process. Cybern. 8(6/7): 325-333 (1972) - 1971
- [j5]K. Bellmann, Michael Gössel:
Versuch einer automatentheoretischen Beschreibung von Selektionsprozessen. Acta Cybern. 1(2): 93-96 (1971) - [j4]Michael Gössel:
Über die Reduktion eines erweiterten linearen Automaten. J. Inf. Process. Cybern. 7(1): 49-52 (1971) - [j3]Michael Gössel:
Zur minimalen Modellbildung bei linearen diskreten Systemen. J. Inf. Process. Cybern. 7(5/6): 355-369 (1971) - 1970
- [j2]Michael Gössel:
Abstandsmatrix eines Zeichens. J. Inf. Process. Cybern. 6(3): 145-153 (1970)
1960 – 1969
- 1969
- [j1]Michael Gössel:
Ein Algorithmus für die Diagrammtechnik der Greenschen Funktion. J. Inf. Process. Cybern. 5(2): 127-137 (1969)
Coauthor Index
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