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Michael Richter 0002
Person information
- affiliation: Intel Mobile Communications, Neubiberg, Germany
- affiliation (PhD 2011): University of Potsdam, Germany
Other persons with the same name
- Michael Richter — disambiguation page
- Michael Richter 0001
— Royal Holloway - University of London, Department of Economics, UK (and 1 more)
- Michael Richter 0003 — Micron Semiconductor (Deutschland) GmbH, Munich, Germany
- Michael Richter 0004
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2010 – 2019
- 2014
- [j4]Michael Richter, Krishnendu Chakrabarty
Optimization of Test Pin-Count, Test Scheduling, and Test Access for NoC-Based Multicore SoCs. IEEE Trans. Computers 63(3): 691-702 (2014) - [j3]Mukesh Agrawal, Michael Richter, Krishnendu Chakrabarty
Test-Delivery Optimization in Manycore SOCs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(7): 1067-1080 (2014) - 2012
- [j2]Thomas Rabenalt, Michael Richter, Frank Poehl, Michael Gössel:
Highly Efficient Test Response Compaction Using a Hierarchical X-Masking Technique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(6): 950-957 (2012) - [c7]Michael Richter, Krishnendu Chakrabarty
Test pin count reduction for NoC-based Test delivery in multicore SOCs. DATE 2012: 787-792 - [c6]Mukesh Agrawal, Michael Richter, Krishnendu Chakrabarty
A dynamic programming solution for optimizing test delivery in multicore SOCs. ITC 2012: 1-10 - 2011
- [b1]Michael Richter:
Anwendung nichtlinearer Codes zur Fehlererkennung und -korrektur. University of Potsdam, 2011, pp. 1-134 - 2010
- [c5]Thomas Rabenalt, Michael Richter, Michael Gössel:
High Performance Compaction for Test Responses with Many Unknowns. Asian Test Symposium 2010: 179-184
2000 – 2009
- 2009
- [j1]Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel:
X-tolerant Test Data Compaction with Accelerated Shift Registers. J. Electron. Test. 25(4-5): 247-258 (2009) - [c4]Michael Richter, Michael Gössel:
Concurrent checking with split-parity codes. IOLTS 2009: 159-163 - 2008
- [c3]Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel:
Accelerated Shift Registers for X-tolerant Test Data Compaction. ETS 2008: 133-139 - [c2]Michael Richter, Klaus Oberländer, Michael Gössel:
New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability. IOLTS 2008: 37-42 - 2007
- [c1]Andreas Leininger, Martin Fischer, Michael Richter, Michael Gössel:
Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques. ITC 2007: 1-9
Coauthor Index
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