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Kristin De Meyer
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2010 – 2019
- 2015
- [c8]Dmitry Yakimets, Doyoung Jang, Praveen Raghavan, Geert Eneman, Hans Mertens, P. Schuddinck, Arindam Mallik, Marie Garcia Bardon, Nadine Collaert, Abdelkarim Mercha, Diederik Verkest, Aaron Thean, Kristin De Meyer:
Lateral NWFET optimization for beyond 7nm nodes. ICICDT 2015: 1-4 - [c7]Abhitosh Vais
, Koen Martens, Jacopo Franco, Dennis Lin, AliReza Alian, Philippe Roussel, S. Sioncke, Nadine Collaert
The relationship between border traps characterized by AC admittance and BTI in III-V MOS devices. IRPS 2015: 5 - [c6]Michal Rakowski, Marianna Pantouvaki, Peter De Heyn, Peter Verheyen, Mark Ingels, Hongtao Chen, Jeroen De Coster, Guy Lepage, Brad Snyder, Kristin De Meyer, Michiel Steyaert
22.5 A 4×20Gb/s WDM ring-based hybrid CMOS silicon photonics transceiver. ISSCC 2015: 1-3 - 2013
- [c5]Michal Rakowski, Marianna Pantouvaki, Hui Yu, Wim Bogaerts, Kristin De Meyer, Michiel Steyaert, Bradley Snyder, Peter O'Brien, Julien Ryckaert, Philippe Absil, Joris Van Campenhout:
Low-power, low-penalty, flip-chip integrated, 10Gb/s ring-based 1V CMOS photonics transmitter. OFC/NFOEC 2013: 1-3 - 2012
- [c4]Michal Rakowski, Julien Ryckaert, Marianna Pantouvaki, Hui Yu, Wim Bogaerts, Kristin De Meyer, Michiel Steyaert
Low-Power, 10-Gbps 1.5-Vpp differential CMOS driver for a silicon electro-optic ring modulator. CICC 2012: 1-6 - 2011
- [c3]Geert Eneman, J. Cho, V. Moroz, Dragomir Milojevic, M. Choi, Kristin De Meyer, Abdelkarim Mercha, Eric Beyne, Thomas Hoffmann, Geert Van der Plas:
An analytical compact model for estimation of stress in multiple Through-Silicon Via configurations. DATE 2011: 505-506 - 2010
- [j7]Brahim Benbakhti, J. S. Ayubi-Moak, Karol Kalna
Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures. Microelectron. Reliab. 50(3): 360-364 (2010)
2000 – 2009
- 2009
- [c2]Jan Van Olmen, Jan Coenen, Wim Dehaene, Kristin De Meyer, Cedric Huyghebaert, Anne Jourdain, Guruprasad Katti, Abdelkarim Mercha, Michal Rakowski, Michele Stucchi, Youssef Travaly, Eric Beyne
3D Stacked IC demonstrator using Hybrid Collective Die-to-Wafer bonding with copper Through Silicon Vias (TSV). 3DIC 2009: 1-5 - [c1]Abhisek Dixit
Measurement and Analysis of Parasitic Capacitance in FinFETs with High-k Dielectrics and Metal-Gate Stack. VLSI Design 2009: 253-258 - 2007
- [j6]Z. Li, Tom Schram, Luigi Pantisano, A. Stesmans, Thierry Conard, S. Shamuilia, V. V. Afanasiev, A. Akheyar, Sven Van Elshocht, D. P. Brunco, W. Deweerd, Y. Naoki, P. Lehnen, Stefan De Gendt, Kristin De Meyer:
Mechanism of O2-anneal induced Vfb shifts of Ru gated stacks. Microelectron. Reliab. 47(4-5): 518-520 (2007) - 2005
- [j5]G. S. Lujan, Wim Magnus, L.-Å. Ragnarsson, Stefan Kubicek, Stefan De Gendt, Marc M. Heyns, Kristin De Meyer:
Modelling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance. Microelectron. Reliab. 45(5-6): 794-797 (2005)
1990 – 1999
- 1993
- [j4]Rudi C. Vankemmel, Wim Schoenmaker, Rudi Cartuyvels, Kristin M. De Meyer:
Scaling considerations of the constitutive equations in a 2-D finite element heterojunction simulator PRISM. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(11): 1786-1797 (1993) - 1990
- [j3]Cristiano Sala, Wim Magnus, Kristin De Meyer:
Carrier transport modelling in the inversion layer of submicron semiconductor devices. Eur. Trans. Telecommun. 1(3): 313-317 (1990) - [j2]Philippe Jansen, N. Maene, Walter De Raedt, S. Naten, D. Stubbe, Wim Schoenmaker, M. Van Rossum, Kristin M. De Meyer:
AlGaAs/GaAs: High electron mobility transistor simulations with PRISM. Eur. Trans. Telecommun. 1(4): 433-437 (1990)
1980 – 1989
- 1986
- [j1]W. Maes, Kristin M. De Meyer, Luc H. Dupas:
SIMPAR: A Versatile Technology Independent Parameter Extraction Program Using a New Optimized Fit-Strategy. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(2): 320-325 (1986)
Coauthor Index
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