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Journal of Electronic Testing, Volume 26
Volume 26, Number 1, February 2010
- Vishwani D. Agrawal:
Editorial. 1-2 - Karim Arabi:
Guest Editorial. 5 - Qi Fan:
General Design for Test Guidelines for RF IC. 7-12 - Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee:
Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation Principles. 13-24 - Pedro Fonseca da Mota, José Machado da Silva
, Ricardo A. Veiga:
Estimation of RF PA Nonlinearities after Cross-correlating Current and Output Voltage. 25-35 - Rim M. Ayadi, Mohammed Masmoudi:
Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAs. 37-45 - Maria Angeles Jalón, Eduardo J. Peralías
ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method. 47-58 - Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting (Tim) Cheng
Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case Study. 59-71 - Hongjoong Shin, Joonsung Park, Jacob A. Abraham:
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. 73-86 - David C. Keezer
Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic. 87-96 - Rajeev Narayanan, Mohamed H. Zaki
Using Stochastic Differential Equation for Verification of Noise in Analog/RF Circuits. 97-109 - Norbert Dumas, Florence Azaïs, Frédérick Mailly
Study of an Electrical Setup for Capacitive MEMS Accelerometers Test and Calibration. 111-125 - Yindar Chuo, Bozena Kaminska:
Testing Multilayer Flexible Wireless Multisensor Platforms. 127-138 - Matthew Giassa, Ajit Khosla
Applications for Low Frequency Impedance Analysis Systems. 139-144
Volume 26, Number 2, April 2010
- Vishwani D. Agrawal:
Editorial. 145 - Prabhat Mishra
Guest Editorial. 149-150 - Hongxia Fang, Krishnendu Chakrabarty
RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences. 151-164 - Maheshwar Chandrasekar, Nikhil P. Rahagude, Michael S. Hsiao:
Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test Generation. 165-176 - Yongquan Fan, Zeljko Zilic:
Qualifying Serial Interface Jitter Rapidly and Cost-effectively. 177-193 - Kanupriya Gulati, Sunil P. Khatri:
Fault Table Computation on GPUs. 195-209 - Jason G. Tong, Marc Boule, Zeljko Zilic:
Defining and Providing Coverage for Assertion-Based Dynamic Verification. 211-225 - Bin Xue, Sandeep K. Shukla
Analysis of Scheduled Latency Insensitive Systems with Periodic Clock Calculus. 227-242 - In-Ho Moon, Kevin Harer:
Learning from Constraints for Formal Property Checking. 243-259 - Gianpiero Cabodi, Leandro Dipietro, Marco Murciano, Sergio Nocco:
Finding Multiple Equivalence-Preserving Transformations in Combinational Circuits through Incremental-SAT. 261-278 - Sven Verdoolaege
Experience with Widening Based Equivalence Checking in Realistic Multimedia Systems. 279-292
Volume 26, Number 3, June 2010
- Vishwani D. Agrawal:
Editorial. 293 - Maynard Falconer, Garrison W. Greenwood, Kristina Morgan, Kiran Kumar Kamisetty, Adam Norman, Konika Ganguly:
Using Evolutionary Algorithms for Signal Integrity Assessment of High-Speed Data Buses. 297-305 - Stephan Eggersglüß, Görschwin Fey
MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics. 307-322 - M. Kiran Kumar Reddy, Bharadwaj S. Amrutur, Rubin A. Parekhji:
False Error Vulnerability Study of On-line Soft Error Detection Mechanisms. 323-335 - Osnat Keren:
One-to-Many: Context-Oriented Code for Concurrent Error Detection. 337-353 - Luca Testa
Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors. 355-365 - Hyoung-Kook Kim, Wen-Ben Jone, Laung-Terng Wang:
Fault Modeling and Analysis for Resistive Bridging Defects in a Synchronizer. 367-392 - Wang-Dauh Tseng, Lung-Jen Lee:
Test Data Compression Using Multi-dimensional Pattern Run-length Codes. 393-400
Volume 26, Number 4, August 2010
- Vishwani D. Agrawal:
Editorial. 401 - Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam:
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices. 405-417 - Ting Long, Houjun Wang, Shulin Tian, Jianguo Huang, Bing Long:
Test Generation Algorithm for Linear Systems Based on Genetic Algorithm. 419-428 - Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda
A BIST Solution for Frequency Domain Characterization of Analog Circuits. 429-441 - Cleonilson Protásio de Souza
A New Built-in TPG Based on Berlekamp-Massey Algorithm. 443-451 - Ardy van den Berg, Pengwei Ren, Erik Jan Marinissen
Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism. 453-464 - Sobeeh Almukhaizim, Shouq Alsubaihi, Ozgur Sinanoglu
On the Application of Dynamic Scan Chain Partitioning for Reducing Peak Shift Power. 465-481 - Berndt M. Gammel, Stefan Mangard:
On the Duality of Probing and Fault Attacks. 483-493
Volume 26, Number 5, October 2010
- Vishwani D. Agrawal:
Editorial. 495 - Jacob D. Biamonte
Fault Models for Quantum Mechanical Switching Networks. 499-511 - Ahmad A. Al-Yamani, Edward J. McCluskey:
Test Set Compression Through Alternation Between Deterministic and Pseudorandom Test Patterns. 513-521 - Chenglin Yang, Shulin Tian, Bing Long, Fang Chen:
A Novel Test Point Selection Method for Analog Fault Dictionary Techniques. 523-534 - Yasser Sedaghat
Classification of Activated Faults in the FlexRay-Based Networks. 535-547 - Keunyoung Park, Sang Guun Yoo
JTAG Security System Based on Credentials. 549-557 - Zhen Wang, Mark G. Karpovsky, Konrad J. Kulikowski:
Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED Codes. 559-580 - Michael A. Kochte, Christian G. Zoellin, Hans-Joachim Wunderlich:
Efficient Concurrent Self-Test with Partially Specified Patterns. 581-594
Volume 26, Number 6, December 2010
- Vishwani D. Agrawal:
Editorial. 595-596 - Ramyanshu Datta, Antony Sebastine, Ashwin Raghunathan, Gary D. Carpenter, Kevin J. Nowka
On-Chip Delay Measurement Based Response Analysis for Timing Characterization. 599-619 - Aymen Ladhar, Mohamed Masmoudi:
An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis. 621-639 - Jari Hannu
Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture. 641-658 - Prashant Dubey, Akhil Garg, Shashank Mahajan:
Study of Read Recovery Dynamic Faults in 6T SRAMS and Method to Improve Test Time. 659-666 - Kazuteru Namba, Hideo Ito:
Chiba Scan Delay Fault Testing with Short Test Application Time. 667-677 - Usha Sandeep Mehta
Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead. 679-688 - Stefano Gandini, Walter Ruzzarin, Ernesto Sánchez, Giovanni Squillero
A Framework for Automated Detection of Power-related Software Errors in Industrial Verification Processes. 689-697
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