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28th ETS 2023: Venezia, Italy
- IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023. IEEE 2023, ISBN 979-8-3503-3634-4
- Jiaoyan Yao, Ying Zhang, Yifeng Hua, Yuanxiang Li, Jizhong Yang, Xin Chen:
Spotlight: An Impairing Packet Transmission Attack Targeting Specific Node in NoC-based TCMP. 1-4 - Hanzhi Xun, Moritz Fieback
, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui:
Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. 1-6 - Tobias Faller, Nikolaos Ioannis Deligiannis, Markus Schwörer, Matteo Sonza Reorda
, Bernd Becker:
Constraint-Based Automatic SBST Generation for RISC-V Processor Families. 1-6 - Mohammad Hasan Ahmadilivani, Mahdi Taheri, Jaan Raik, Masoud Daneshtalab, Maksim Jenihhin:
DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs' Reliability Assessment. 1-6 - Fabio Pavanello, Cédric Marchand, Ian O'Connor, Régis Orobtchouk, Fabien Mandorlo, Xavier Letartre, Sébastien Cueff, Elena-Ioana Vatajelu, Giorgio Di Natale, Benoit Cluzel, Aurelien Coillet, Benoît Charbonnier, Pierre Noe, Frantisek Kavan, Martin Zoldak, Michal Szaj, Peter Bienstman, Thomas Van Vaerenbergh, Ulrich Rührmair, Paulo F. Flores
, Luís Guerra e Silva, Ricardo Chaves, Luís Miguel Silveira
, Mariano Ceccato
, Dimitris Gizopoulos, George Papadimitriou, Vasileios Karakostas, Axel Brando, Francisco J. Cazorla, Ramon Canal, Pau Closas, Adria Gusi-Amigo, Paolo Crovetti, Alessio Carpegna, Tzamn Melendez Carmona, Stefano Di Carlo, Alessandro Savino
:
EUROPULS: NEUROmorphic energy-efficient secure accelerators based on Phase change materials aUgmented siLicon photonicS. 1-6 - Zaheer Tabassam, Andreas Steininger:
SET Effects on Quasi Delay Insensitive and Synchronous Circuits. 1-6 - Nikolaos Ioannis Deligiannis, Tobias Faller, Chenghan Zhou, Riccardo Cantoro, Bernd Becker, Matteo Sonza Reorda
:
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing. 1-5 - Janusz Rajski, Maciej Trawka, Jerzy Tyszer, Bartosz Wlodarczak:
Hybrid Ring Generators for In-System Test Applications. 1-6 - Tao Zhang, Mark M. Tehranipoor, Farimah Farahmandi:
BitFREE: On Significant Speedup and Security Applications of FPGA Bitstream Format Reverse Engineering. 1-6 - Jens Anders, Pablo Andreu, Bernd Becker, Steffen Becker, Riccardo Cantoro, Nikolaos Ioannis Deligiannis, Nourhan Elhamawy, Tobias Faller, Carles Hernández, Nele Mentens
, Mahnaz Namazi Rizi
, Ilia Polian, Abolfazl Sajadi
, Matthias Sauer, Denis Schwachhofer
, Matteo Sonza Reorda
, Todor Stefanov, Ilya Tuzov, Stefan Wagner
, Nusa Zidaric
:
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors. 1-10 - Khaled Galal Abdelwahab Abdelaziz, Ralph Görgen, Görschwin Fey:
FINaL: Driving High-Level Fault Injection Campaigns with Natural Language. 1-4 - Francesco Lorenzelli
, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li
, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen:
Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications. 1-6 - Marcel Merten, Sebastian Huhn, Rolf Drechsler:
Increasing SAT-Resilience of Logic Locking Mechanisms using Formal Methods. 1-6 - Soyed Tuhin Ahmed, Roman Rakhmatullin, Mehdi B. Tahoori:
Online Fault-Tolerance for Memristive Neuromorphic Fabric Based on Local Approximation. 1-4 - Yi He, Yanjing Li:
Understanding Permanent Hardware Failures in Deep Learning Training Accelerator Systems. 1-6 - Moritz Fieback
, Filip Bradaric, Mottaqiallah Taouil, Said Hamdioui:
Online Fault Detection and Diagnosis in RRAM. 1-6 - Giorgio Insinga, M. Battilana, M. Coppetta, N. Mautone, G. Carnevale, M. Giltrelli, Pierre Scaramuzza, Rudolf Ullmann:
Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip. 1-6 - Fernando Fernandes dos Santos, Luigi Carro, Paolo Rech:
Understanding and Improving GPUs' Reliability Combining Beam Experiments with Fault Simulation. 1-10 - Bruno E. Forlin, Wouter van Huffelen, Carlo Cazzaniga, Paolo Rech, Nikolaos Alachiotis, Marco Ottavi
:
An unprotected RISC-V Soft-core processor on an SRAM FPGA: Is it as bad as it sounds? 1-6 - Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee:
Error Resilient Transformers: A Novel Soft Error Vulnerability Guided Approach to Error Checking and Suppression. 1-6 - Denis Schwachhofer
, Maik Betka, Steffen Becker, Stefan Wagner
, Matthias Sauer, Ilia Polian:
Automating Greybox System-Level Test Generation. 1-4 - Brojogopal Sapui, Jonas Krautter, Mahta Mayahinia, Atousa Jafari, Dennis Gnad, Sergej Meschkov
, Mehdi B. Tahoori:
Power Side-Channel Attacks and Countermeasures on Computation-in-Memory Architectures and Technologies. 1-6 - Peter Domanski, Dirk Pflüger, Raphaël Latty:
Learn to Tune: Robust Performance Tuning in Post-Silicon Validation. 1-4 - Alperen Bolat, Yahya Can Tugrul, Seyyid Hikmet Çelik
, Sakir Sezer, Marco Ottavi
, Oguz Ergin
:
DEV-PIM: Dynamic Execution Validation with Processing-in-Memory. 1-6 - Stefan Holst, Ruijun Ma
, Xiaoqing Wen, Aibin Yan, Hui Xu:
BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell. 1-6 - Jayeeta Chaudhuri, Krishnendu Chakrabarty:
Criticality Analysis of Ring Oscillators in FPGA Bitstreams *. 1-4 - Deniz Kasap, Alessio Carpegna, Alessandro Savino
, Stefano Di Carlo:
Micro-Architectural features as soft-error markers in embedded safety-critical systems: preliminary study. 1-5 - Ching-Yuan Chen, Biresh Kumar Joardar, Janardhan Rao Doppa, Partha Pratim Pande, Krishnendu Chakrabarty:
Attacking Memristor-Mapped Graph Neural Network by Inducing Slow-to-Write Errors. 1-4 - Marcello Traiola, Angeliki Kritikakou, Olivier Sentieys:
harDNNing: a machine-learning-based framework for fault tolerance assessment and protection of DNNs. 1-6 - Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero:
Semi-Supervised Deep Learning for Microcontroller Performance Screening. 1-6 - Xhesila Xhafa, Patrick Girard, Arnaud Virazel:
Learning-Based Characterization Models for Quality Assurance of Emerging Memory Technologies. 1-2 - Gabriele Gavarini, Annachiara Ruospo, Ernesto Sánchez:
SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks. 1-6 - Chaofang Ma, Jianan Mu, Jing Ye, Shuai Chen, Yuan Cao, Huawei Li, Xiaowei Li:
Online Reliability Evaluation Design: Select Reliable CRPs for Arbiter PUF and Its Variants. 1-6 - Annachiara Ruospo, Gabriele Gavarini, A. Porsia
, Matteo Sonza Reorda
, Ernesto Sánchez, Riccardo Mariani, J. Aribido, Jyotika Athavale:
Image Test Libraries for the on-line self-test of functional units in GPUs running CNNs. 1-6 - Gildas Léger, Antonio J. Ginés, Eduardo J. Peralías, Valentin Gutierrez, C. Dominguez, Maria Angeles Jalón, L. Carranza:
A Single-Event Latchup setup for high-precision AMS circuits. 1-6 - Josie E. Rodriguez Condia
, Juan-David Guerrero-Balaguera
, Edward Javier Patiño Nuñez, Robert Limas Sierra, Matteo Sonza Reorda
:
Evaluating the Prevalence of SFUs in the Reliability of GPUs. 1-6 - Theofilos Spyrou, Haralampos-G. Stratigopoulos:
On-Line Testing of Neuromorphic Hardware. 1-6 - Lila Ammoura, Marie-Lise Flottes, Patrick Girard, Jean-Philippe Noel, Arnaud Virazel:
Intra-cell Resistive-Open Defect Analysis on a Foundry 8T SRAM-based IMC Architecture. 1-4 - Lorenzo Masciullo, Roberto Passerone, Francesco Regazzoni
, Ilia Polian:
Secrets Leaking Through Quicksand: Covert Channels in Approximate Computing. 1-6 - Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis. 1-4 - Eslam Yassien, Yongjia Xu, Hui Jiang, Thach Nguyen, Jennifer Dworak, Theodore W. Manikas
, Kundan Nepal:
Harvesting Wasted Clock Cycles for Efficient Online Testing. 1-6 - Payam Habiby, Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich, Sebastian Huhn, Rolf Drechsler:
Synthesis of IJTAG Networks for Multi-Power Domain Systems on Chips. 1-6 - Upoma Das, M. Sazadur Rahman
, N. Nalla Anandakumar, Kimia Zamiri Azar, Fahim Rahman, Mark M. Tehranipoor, Farimah Farahmandi:
PSC-Watermark: Power Side Channel Based IP Watermarking Using Clock Gates. 1-6 - Katayoon Basharkhah, Raheleh Sadat Mirhashemi, Nooshin Nosrati, Mohammad-Javad Zare, Zainalabedin Navabi:
Learning Electrical Behavior of Core Interconnects for System-Level Crosstalk Prediction. 1-6 - Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee:
A Resilience Framework for Synapse Weight Errors and Firing Threshold Perturbations in RRAM Spiking Neural Networks. 1-4 - Yanning Ji, Ruize Wang, Kalle Ngo, Elena Dubrova, Linus Backlund:
A Side-Channel Attack on a Hardware Implementation of CRYSTALS-Kyber. 1-5 - Markus Ulbricht, Yvan Tortorella, Michael Rogenmoser, Li Lu, Junchao Chen, Francesco Conti, Milos Krstic
, Luca Benini:
PULP Fiction No More - Dependable PULP Systems for Space. 1-10 - Athanasios Xynos, Vasileios Tenentes
, Yiorgos Tsiatouhas
:
SiCBit-PUF: Strong in-Cache Bitflip PUF Computation for Trusted SoCs. 1-6 - Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian:
On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI. 1-4 - Shao-Chun Hung, Arjun Chaudhuri, Krishnendu Chakrabarty:
Test-Point Insertion for Power-Safe Testing of Monolithic 3D ICs using Reinforcement Learning*. 1-6 - Marti Alonso, David Andreu, Ramon Canal, Stefano Di Carlo, Cristiano Pegoraro Chenet, Juanjo Costa, Andreu Girones, Dimitris Gizopoulos, Vasileios Karakostas, Beatriz Otero, George Papadimitriou, Eva Rodríguez, Alessandro Savino
:
Validation, Verification, and Testing (VVT) of future RISC-V powered cloud infrastructures: the Vitamin-V Horizon Europe Project perspective. 1-6 - Matthias Ludwig
, Ann-Christin Bette, Bernhard Lippmann, Georg Sigl:
Counterfeit Detection by Semiconductor Process Technology Inspection. 1-4 - Changming Cui, Tuanhui Xu, Haitao Fu, Junlin Huang:
Physical-aware Interconnect Testing and Repairing of Chiplets. 1-4 - Manil Dev Gomony
, Anteneh Gebregiorgis, Moritz Fieback
, Marc Geilen
, Sander Stuijk
, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Güneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui:
Dependability of Future Edge-AI Processors: Pandora's Box. 1-6 - Asimina Koutra, Vasileios Tenentes
:
High Throughput and Energy Efficient SHA-2 ASIC Design for Continuous Integrity Checking Applications. 1-6 - S. L. Tweehuysen, G. L. A. Adriaans, M. Gomony:
Stimuli Generation for IC Design Verification using Reinforcement Learning with an Actor-Critic Model. 1-4 - Abdalrhman Badran, Somayeh Sadeghi Kohan, Jan Dennis Reimer, Sybille Hellebrand:
Approximate Communication: Balancing Performance, Power, Reliability, and Safety. 1-6 - Abhishek Kumar Mishra, Anup Das, Nagarajan Kandasamy:
Online Performance Monitoring of Neuromorphic Computing Systems. 1-4 - Ferhat Can Ataman
, Mohammed Aladsani, Georgios C. Trichopoulos, Y. B. Chethan Kumar, Sule Ozev:
Mismatch Measurement for MIMO mm-Wave Radars via Simple Power Monitors. 1-6 - Ferhat Can Ataman
, Muslum Emir Avci, Y. B. Chethan Kumar, Sule Ozev:
Global Tuning for System Performance Optimization of RF MIMO Radars. 1-4 - Xhesila Xhafa, Aymen Ladhar, Eric Faehn, Lorena Anghel
, Gregory di Pendina, Patrick Girard, Arnaud Virazel:
On Using Cell-Aware Methodology for SRAM Bit Cell Testing. 1-4
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