SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005

& ANSI/NCSL Z540-1-1994

A.A. JANSSON Inc.

2070 Airport Road
Waterford, MI 48327-1204
Eric Lundquist Phone: 248 674 4811

CALIBRATION

Valid To: August 31, 2020 Certificate Number: 1182.01

In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to this
laboratory to perform the following calibrations1:

I. Dimensional

Parameter/Equipment Range CMC2, 4 (±) Comments

Angle Blocks Up to 90° 9″ Vision measuring

system

Angle Plates & Squares Up to 18 in (38 + 0.64L) µin Master square

Angle Meters Up to 360° 35′ Sine plate

Bore Gages Up to 8 in (62 + 3.5L +0.6R) μin Ring gages

Brinell Scopes –

Reticle Up to 10 mm 0.006 mm Glass reticle

Micrometer Up to 10 mm 0.007 mm

(A2LA Cert. No. 1182.01) Revised 12/11/2019 Page 1 of 10

 Parameter/Equipment Range CMC2, 4 (±) Comments

Calipers3, 6 –

Dial and Vernier Up to 72 inches (100 + 3.5L) μin Gage blocks and
caliper checker
Digital Up to 20 inches (110 + 3.5L) μin
(> 20 to 72) inches (59 + 7.5L) μin

Comparator Gages & 2 μin resolution 4 μin Master gage blocks

Mikrokator3 5 μin resolution 5 μin
10 μin resolution 8 μin
20 μin resolution 12 μin
50 μin resolution 34 μin
100 μin resolution 73 μin

Depth Micrometer –
Linearity Resolution
0.001 in Up to 12 in 300 µin Comparison to gage
0.0004 in Up to 12 in 224 µin blocks
0.0001 in Up to 12 in (40 + 6L) µin
0.000040 in Up to 12 in (39 + 0.005L) µin

Flatness Resolution
0.001 in Up to 12 in 300 µin
0.0004 in Up to 12 in 200 µin
0.0001 in Up to 12 in 48 µin
0.000040 in Up to 12 in 43 µin

Feeler Gages Up to 0.2 in (11 + 100L) μin Universal length

measuring machine

Gage Blocks Up to 0.10 in 3.5 µin Master gage blocks

(> 0.10 to 4) in (1.7 + 1.2L) μin
(> 4 to 20) in (7 + 0.8L) μin

Glass Graduated Rules &

Reticles –
Linearity Up to 24 in (80 + 2.2L) µin Vision measuring system
Squareness Up to 12 in (120 + 5.3L) µin

(A2LA Cert. No. 1182.01) Revised 12/11/2019 Page 2 of 10

 Parameter/Equipment Range CMC2, 4 (±) Comments

Height Gages3 –

Resolution
0.000050 in Up to 48 in (45 + 3.5L) μin Comparison to gage
0.000100 in (58 + 3.3L) μin blocks
0.000500 in (240 + 2.5L) μin
0.001000 in (580 + 0.5L) μin

Height Masters Up to 24 in (22 + 1.8L) μin Comparison to gage

blocks

Indicator Calibrator –
Linearity Up to 0.2 in 13 µin Amplifier with gage
probe
Anvil Flatness Up to 60 µin 8 µin Optical flat

Inch Bars, Reference Up to 40 in (20 + 2.2L) Comparison to gage

Bars, Step Masters blocks

Inside Micrometers Up to 24 in (50 + 6L) µin Universal length

measuring machine

Length Standards Up to 24 in (6 + 2L) μin Mikrokator and gage

(> 24 to 72) in (17 + 2.3L) μin blocks
Up to 24 in (5 + 3L) μin ULM & length standards

Outside Micrometers
Resolution3 –
0.000020 in Up to 1 in 21 µin Comparison to gage
0.000050 in Up to 50 in (24 + 9L) µin blocks
0.0001 in Up to 50 in (69 + 6L) µin
0.001 in Up to 50 in (580 + 2L) µin

Anvil Parallelism Up to 1 in 31 µin Gage ball

Machine Tools3 –
Linear Displacement (0.1 to 80) m (0.3 + 1.4L) μm Laser
Accuracy

(A2LA Cert. No. 1182.01) Revised 12/11/2019 Page 3 of 10

 Parameter/Equipment Range CMC2, 4, 7 (±) Comments

Optical Coordinate
Measuring Machines &
Video
Systems3,7 –

Linear Displacement Stage Length: [(0.9T – 0.08)L + (-2.3T + 240)] μin Glass grid
Accuracy Up to 44 in

Linear Displacement Stage Length: [(1T – 0.7)L + (-0.8T + 99)] μin Glass rule
Accuracy Up to 34 in

Stage Length: [(1T – 0.7)L + (-0.8T + 180)] μin Glass rule

(> 34 to 44) in

Column Height: [(1.4T)L + (-1T + 130)] μin Gage blocks,

Up to 8 in indicator

Squareness Up to 18 in (5.3L + 120) μin Glass rule or

Optical ball
bar

Optical Comparators &

Optical Measuring
Machines3,8 –
Magnification –
Up to 8 in 10x, 20x, 25x, 30x 0.012 % of magnification Glass masters,
(> 8 to 16) in 31.25x, 50x, 62.5x 0.012 % of magnification angle blocks
(> 16 to 24) in 100x, 250x, 500x 0.012 % of magnification and measuring
rods
Linear Axis X & Y Axis [(1.4T – 4.4)L + (-1.4T + 110)] μin

Squareness 3 in 83 μin
Angularity (0 to 360)° 1′

(A2LA Cert. No. 1182.01) Revised 12/11/2019 Page 4 of 10

 Parameter/Equipment Range CMC2, 4 (±) Comments

Indicators3 –
Dial, Digital and Test

Up to 1 in 0.000020 in resolution 30 µin Universal length

0.000050 in resolution 35 µin measuring machine
0.000100 in resolution 35 µin (ULM)
0.000500 in resolution 100 µin
0.001000 in resolution 200 µin

Up to 0.2 in 0.000020 in resolution 28 µin Indicator calibrator

0.000050 in resolution 34 µin
0.000100 in resolution 34 µin
0.000500 in resolution 34 µin
0.001000 in resolution 45 µin

Up to 12 in 0.000020 in resolution 14 µin Gage blocks, gage

0.000050 in resolution 21 µin stand, anvil or master
0.000100 in resolution (100 + 4.5L) µin flat
0.000500 in resolution (166 + 0.5L) µin
0.001000 in resolution (300 + 0.3L) µin

Parallels, Straight Edges,

1-2-3 Blocks

Parallel & Straight Up to 40 in (14 + 3L) μin Amplifier, gage probe

Length, Width, Height Up to 40 in 37 µin and surface plate

Plain Pin/Plug Gages –

Low Accuracy Up to 16 in (33 + 1.4D) μin Universal length
High Accuracy Up to 16 in (10 + 1.3D) μin measuring machine

Pitch Gages –
English (2 to 84) TPI 220 µin Optical/vision
Metric (0.25 to 11.5) mm 220 µin (5.6 µm) measuring system
Acme (1 to 12) TPI 220 µin

Precision Levels –
Bubble Levels Up to 15 inches 100 µin Amplifier with gage
probe
High Accuracy Up to ± 1000 arc-sec 5” Sine plate and gage
Electronic Levels blocks

(A2LA Cert. No. 1182.01) Revised 12/11/2019 Page 5 of 10

 Parameter/Equipment Range CMC2, 4 (±) Comments

Radius Gages Up to 12 in (210 + 14L) μin Optical/vision

measuring system

Plain Ring Gages (0.050 to 0.50) in 15 μin Internal comparator

Up to 18 in (10 + 3.7D) μin High accuracy ULM

Protractors
Bevel Up to 180º 0º 2' 50" Optical/vision
measuring system
Non-Bevel (0 to 360)º 0º 5' 15" Sine Plate

Roundness Measuring
Systems3 –
Radial Departure Up to 360° 7 μin Precision sphere

Gage Head Calibration 200 μin 5 μin Gage blocks

Axial Error 100 µin 7 µin Precision sphere
Coning 100 µin 7 µin Precision sphere

Steel Rulers & Tape Up to 300 in (290 + 18L) µin Vision measuring
Measures system

Sine Plates & Sine Bars –

Master gage blocks,
Angle Up to 20 in 5″ master angle blocks,
Parallelism Up to 20 in 63 μin surface plate, amplifier
with gage head

Spheres & Precision Balls –

Diameter Up to 3 in (19 + 1.2D) μin Universal length
measuring machine,
High Accuracy Up to 3 in (8.5 + 1.5D) µin master precision balls

Sphericity Up to 3 in (3D + 6) + 3H µin Roundness measuring

system

(A2LA Cert. No. 1182.01) Revised 12/11/2019 Page 6 of 10

 Parameter/Equipment Range CMC2, 4 (±) Comments

Surface Plates 3 –

Grades AA, A and B

Flatness Up to 354 in DL 10√DL μin Precision level system,

Repeat Reading Up to 0.002 in 26 μin Repeat-O-Meter

Surface Finish Testers for

Ra3 –
(2 to 500) μin (113 to 120) μin 4 μin Master surface finish
roughness specimen at
(0.05 to 12.5) μm (2.88 to 3.06) μm 0.09 μm indicated points in
range

Surface Roughness
Specimens –
Ra (2 to 500) μin 3 μin Surface finish analyzer
Ry (Rmax) (2 to 500) µin 7 µin

Threaded Plug Gages –

Major Diameter Up to 12 in (29 + 1.7D) µin ULM and 3-wire
Pitch Diameter Up to 12 in (73 + 2D) µin method

Thread Wires Up to 0.500 in 13 μin Mikrokator and master

diameter thread wires

V-Blocks –
Parallelism Up to 10 in 32 μin Surface plate, gage pin,
Squareness Up to 10 in (63 + 10L) μin master square, amp.
and gage head

Roundness – Form Up to 10 in diameter [(3D + 6) + 3H] μin Roundness measuring

system

Flatness Up to 5 in 8 µin Optical flat

Over 5 in 9 µin

(A2LA Cert. No. 1182.01) Revised 12/11/2019 Page 7 of 10

II. Dimensional Testing1

Parameter/Equipment Range CMC2, 4 (±) Comments

Length5 –

1-Dimensional Up to 12 in (68 + 1.2L) μin Vision coordinate

measuring machine
2-Dimensional Up to (12 x 12) in (130 + 20L) μin

3-Dimensional Up to (12 x 12 x 4) in (240 + 53L) μin

Surface Finish5

Ra (2 to 500) μin 5 μin Surface analyzer

Ry (Rmax) (2 to 500) μin 7 μin

III. Mechanical

Parameter/Equipment Range CMC 2, 4 (±) Comments

Scales & Balances3 (> 10 to 500) mg 0.42 mg Class 3, 6 and F

(> 0.5 to 200) g 0.012 g weights
> 200 g to 2 kg 0.12 g
(> 2 to 10) kg 0.058 g
(> 10 to 29) kg 0.34 g

Torque Wrenches (5 to 50) in·lbf 0.9 % of reading Torque tester

(40 to 400) in·lbf 1.8 % of reading
(100 to 1000) ft∙lbf 1.2 % of reading
(25 to 250) ft∙lbf 0.8 % of reading
(60 to 600) ft∙lbf 1.5 % of reading

(A2LA Cert. No. 1182.01) Revised 12/11/2019 Page 8 of 10

 Parameter/Equipment Range CMC2 (±) Comments

Indirect Verification of HRA: Indirect verification per

Rockwell Hardness < 70 0.68 HRA ASTM E18
Testers3 (≥ 70 and < 80) 0.65 HRA
≥ 80 0.62 HRA

HRBW:
< 60 1.2 HRBW
(≥ 60 and < 80) 1.1 HRBW
≥ 80 0.84 HRBW

HRC:
< 35 0.72 HRC
(≥ 35 and < 60) 1.1 HRC
≥ 60 0.72 HRC

HR15N:
< 78 1.1 HR15N
(≥ 78 and < 90) 1.2 HR15N
≥ 90 0.87 HR15N
HR30N:
< 55 1.1 HR30N
(≥ 55 and < 77) 0.73 HR30N
≥ 77 0.68 HR30N
HR45N:
< 37 0.86 HR45N
(≥ 37 and < 66) 0.86 HR45N
≥ 66 0.69 HR45N
HR15TW:
< 81 0.96 HR15TW
(≥ 81 and < 87) 0.85 HR15TW
≥ 87 0.93 HR15TW
HR30TW:
< 57 1.1 HR30TW
(≥ 57 and < 70) 0.79 HR30TW
≥ 70 0.91 HR30TW
HR45TW:
< 33 1.3 HR45TW
(≥ 33 and < 53) 1.3 HR45TW
≥ 53 0.96 HR45TW

__________________________________
1
This laboratory offers commercial dimensional testing, calibration and field calibration services.

(A2LA Cert. No. 1182.01) Revised 12/11/2019 Page 9 of 10

2
Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine
calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent
expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage
factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory
may be greater than the CMC due to the behavior of the customer’s device and to influences from the
circumstances of the specific calibration.
3
Field calibration service is available for this calibration and this laboratory meets A2LA R104 – General
Requirements: Accreditation of Field Testing and Field Calibration Laboratories for these calibrations.
Please note the actual measurement uncertainties achievable on a customer's site can normally be
expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such
as the environment at the place of calibration and for other possible adverse effects such as those caused
by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced
by the item being calibrated, (e.g. resolution) must also be considered and this, on its own, could result
in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC.
4
In the statement of CMC, L is the numerical value of the nominal length of the device measured in inches
or meters; R is the numerical value of the resolution of the device in microinches; D is the numerical
value of the nominal diameter of the device and H is the height at which the part was measured in inches.
Pitch diameter is measured by the three-wire method. Major diameter is calibrated by direct
measurement. In the statement of CMC, DL is the diagonal length of the Unit under test in inches; and,
Q is the torque of the unit under test in ft·lbf, unless otherwise noted.
5
This laboratory meets R205 – Specific Requirements: Calibration Laboratory Accreditation Program for
the types of dimensional tests listed above and is considered equivalent to that of a calibration.
6
Repeatability of the Unit Under Test has not been utilized in the calculation of the CMC value for this
measurement parameter.
7
In the statement of CMC, T = greater of 1 ºF or ABS value of gage environmental temperature from 68
°F.
8
In the statement of CMC, T = greater of 4 ºF or ABS value of gage environmental temperature from 68
°F.

(A2LA Cert. No. 1182.01) Revised 12/11/2019 Page 10 of 10

 Accredited Laboratory
A2LA has accredited

A.A. JANSSON, INC.

Waterford, MI
for technical competence in the field of

Calibration
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2005 General
requirements for the competence of testing and calibration laboratories. This laboratory also meets the requirements of ANSI/NCSL
Z540-1-1994 and R205 – Specific Requirements: Calibration Laboratory Accreditation Program. This accreditation demonstrates
technical competence for a defined scope and the operation of a laboratory quality management system
(refer to joint ISO-ILAC-IAF Communiqué dated April 2017).

Presented this 16th day of August 2018.

_______________________
Vice President, Accreditation Services
For the Accreditation Council
Certificate Number 1182.01
Valid to August 31, 2020
Revised on December 11, 2019

For the calibrations to which this accreditation applies, please refer to the laboratory’s Calibration Scope of Accreditation.