WO2020259318A1

WO2020259318A1 - Assembling test circuit, array substrate, and liquid crystal display apparatus

Info

Publication number: WO2020259318A1
Application number: PCT/CN2020/095749
Authority: WO
Inventors: 黄世帅
Original assignee: 滁州惠科光电科技有限公司; 北海惠科光电技术有限公司
Priority date: 2019-06-26
Filing date: 2020-06-12
Publication date: 2020-12-30
Also published as: CN110189671A; CN110189671B

Abstract

An assembling test circuit used for liquid crystal display panel testing, the liquid crystal display panel comprising a display area and a non-display area, and the assembling test circuit comprising: a plurality of test solder pad groups (100) arranged in the non-display area, each test solder pad group (100) comprising two test solder pad pairs (110, 120) and an adapting solder pad (130), and the two test solder pad pairs (110, 120) sharing the adapting solder pad (130) during the assembling test process.

Description

Boxed test circuit, array substrate and liquid crystal display device

Cross references to related applications

This application claims the priority of a Chinese patent application filed with the Chinese Patent Office on June 26, 2019, the application number is 201910561526X, and the application name is "box test circuit, array substrate and liquid crystal display device", the entire content of which is incorporated by reference In this application.

Technical field

This application relates to the field of liquid crystal display technology, and in particular to a boxed test circuit, an array substrate and a liquid crystal display device.

Background technique

At present, before the bonding process of the display panel, the lighting test needs to be carried out by means of shorting bar (shorting rod) lighting. The test data signals are divided into ODD odd-numbered and even-numbered types, and the odd-numbered signals will be connected in series and electrically connected to A test area; even-numbered signals will be stringed together and electrically connected to another test area. The box test is completed by applying a test signal to the test area to be transmitted into the display panel. With the development of technology in the TV industry, people have higher and higher requirements for the quality of liquid crystal displays, and the resolution of liquid crystal display panels has also become higher. For large-size and high-resolution products, the number of COF (Chip On Flex, or Chip On Film) will increase, and the test area between COFs will also increase. In the process of lighting test, too many test areas will need to increase the number of needles and increase the needle time, which seriously affects the detection efficiency.

Summary of the invention

A boxed test circuit for testing a liquid crystal display panel. The liquid crystal display panel includes a display area and a non-display area. The boxed test circuit includes: a plurality of test pad groups arranged in the non-display area Wherein, the test pad group includes:

Two test pad pairs; and

Transfer pads, and the transfer pads are shared by the two test pad pairs during the box test process.

An array substrate includes a display area and a non-display area. The non-display area is provided with a box test circuit, and the box test circuit includes a plurality of test pad groups, wherein the test pad group includes:

Two test pad pairs; and

A liquid crystal display device includes the aforementioned array substrate.

Description of the drawings

In order to more clearly describe the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings needed in the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained from these drawings without creative work.

Figure 1 is a schematic structural diagram of an exemplary boxed test circuit;

Fig. 2 is a schematic diagram of wiring in an exemplary boxed test circuit;

FIG. 3 is a schematic structural diagram of a box-forming test circuit provided by an embodiment of the application;

FIG. 4 is a schematic diagram of wiring of a box-forming test circuit provided by an embodiment of the application.

Detailed ways

In order to make the purpose, technical solutions, and advantages of this application clearer, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are used to explain the application, and are not used to limit the application.

In the TFT-LCD (Thin Film Transistor- Liquid Crystal Display, a thin film transistor liquid crystal display) manufacturing process, after the TFT array substrate and the color filter substrate to form a display module (Cell box), the integrated circuit (IC ) Before soldering to the Cell box, it is necessary to test the function of each thin film transistor on the TFT substrate by lighting the shorting bar (shorting bar). Please refer to Figure 1 and Figure 2. COF (Chip On Flex, or, Chip On Film) is used to fix ICs. A cell test pad (test area) is set between each pair of COFs. Each cell test The pad must provide signals through a needle.

For large-size and high-resolution products, the number of COFs will increase, and the number of cell test pad groups between COFs will also increase. Too many cell test pads will require more needle insertion numbers and needle insertion time, which will affect the detection efficiency.

In response to the above problems, an embodiment of the present application provides a box-forming test circuit. Please refer to Figures 3 and 4. The box-forming test circuit is used to test a liquid crystal display panel. The liquid crystal display panel includes a display area and a non-display area. Area, the boxed test circuit includes a plurality of test pad groups 100 arranged in the non-display area, wherein at least one of the test pad groups 100 includes two test pad pairs and one transfer pad 130 , And during the box test process, the two test pad pairs share the transfer pad 130, and one of the test pad pairs includes an odd data test pad 110 and an even data test pad 120.

It can be understood that the test pad groups 100 originally located between each pair of COFs are grouped together in pairs, and the test is performed on two pairs of adjacent COFs through a set of pins, which can reduce the number of pin sets by half, thereby improving the detection efficiency . At the same time, two pairs of test pads in the same test pad group 100 share a transfer pad 130. After the test is completed with one pair of test pads, and then another pair of test pads are used for testing, the It is necessary to pin the transfer pad 130 again, which reduces the number of pins for the transfer pad 130 and further improves the detection efficiency. In addition, two pairs of test pads share one transfer pad 130, which also saves the manufacturing space and manufacturing cost of one transfer pad 130.

In one of the embodiments, in the same test pad group 100, the transfer pad 130 is arranged between the two test pad pairs. It can be understood that the 100 sets of test pad groups are arranged between two adjacent COFs, each pair of test pads are electrically connected to the COF on the same side, and the transfer pads 130 are two of the same group. The test pads are shared. Therefore, when the transfer pad 130 is arranged between the two pairs of test pads, crossover between leads can be avoided, which is beneficial to simplify the wiring design.

In one of the embodiments, the test pad group includes a first odd data test pad 111, a first even data test pad 121, a transfer pad 130, and a second odd data test pad 112 arranged in sequence. And the second even data test pad 122.

The first odd-numbered data test pad 111 and the second odd-numbered data test pad 112 are connected to the odd-numbered test signal lines in the liquid crystal display panel and the integrated circuit circuit corresponding to the COF in the liquid crystal display panel. connection.

The first even-numbered data test pad 121 and the second even-numbered data test pad 122 are both electrically connected to the even-numbered test signal line and the integrated circuit corresponding to the COF.

The transfer board pad is electrically connected to the color filter substrate in the liquid crystal display panel.

In this embodiment, the test pad group includes a first odd data test pad 111, a first even data test pad 121, a transfer pad 130, a second odd data test pad 112, and a first Two even-numbered data test pads 122, during the testing process, the first odd-numbered data test pad 111 and the first even-numbered data test pad 121 can respectively provide odd-numbered data and even-numbered data for the integrated circuits in the corresponding COF, and The second odd-numbered data test pad 112 and the second even-numbered data test pad 122 respectively provide odd-numbered data and even-numbered data for the integrated circuit in the COF corresponding to the second odd-numbered data test pad 112 and the second even-numbered data test pad 122 to implement the lighting test. In addition, during the test, the two pairs of test pads are electrically connected to the color filter substrate in the liquid crystal display panel through the common transfer pad 130.

In one of the embodiments, the boxed test circuit further includes an adapter board 200, and the adapter pad 130 and the color filter substrate are electrically connected through the adapter board 200.

In one of the embodiments, during the box test process, the first odd-numbered data test pad 111 and the second odd-numbered data test pad 112 respectively output data signals through the odd-numbered test signal lines, and the first An even-numbered data test pad 121 and the second even-numbered data test pad 122 respectively output data signals through the even-numbered test signal lines, and the transfer pad 130 serves as the color filter substrate through the transfer board 200 Provide a common voltage signal. That is, in this embodiment, the first odd data test pad 111 and the second odd data test pad 112 respectively output data signals through the odd test signal line, and the first even data test pad 121 and The second even-numbered data test pads 122 respectively output data signals through the even-numbered test signal lines. After receiving the data signals, the array substrate forms an electric field between the color film substrate after receiving the common voltage signal to drive liquid crystal molecules. Rotate to achieve display test.

In one of the embodiments, each of the odd data test pads 110 corresponds to one of the odd data test signal lines, and each of the even data test pads 120 corresponds to one of the even data test signal lines. It can be understood that since two pairs of test pads in the same test pad group 100 share a transfer pad 130, if all odd data test pads 110 share an odd data test signal line, and all even data test The pads 110 share an even-numbered data test signal line. If any odd-numbered data test pad 110 is still connected in series with one test signal line, and any even-numbered data test pad 120 is still connected in series with another test signal line, the same test The two COFs corresponding to the pad group 100 will work at the same time, and the COFs cannot be tested one by one. In this embodiment, each of the odd-numbered data test pads 110 corresponds to one of the odd-numbered data test signal lines, and each of the even-numbered data test pads 120 corresponds to one of the even-numbered data test signal lines, which can individually provide signals to Each of the odd-numbered data test pads 110 and the even-numbered data test pads 120 can test the COF one by one.

Based on the same inventive concept, an embodiment of the present application further provides an array substrate, the array substrate includes a display area and a non-display area, the non-display area is provided with a box test circuit, the box test circuit includes multiple Test pad groups 100, at least one of the test pad groups 100 includes two test pad pairs and one transfer pad 130, and the two test pad pairs share the Transfer pads 130, one of the test pad pairs includes an odd data test pad 110 and an even data test pad 120.

It is understandable that the test pad groups 100 originally located between each pair of COFs are grouped together in pairs, and the test is performed on two adjacent pairs of COFs through a set of pins, which can reduce the number of pin sets by half, thereby improving the detection efficiency . At the same time, two pairs of test pads in the same test pad group 100 share a transfer pad 130. After the test is completed with one pair of test pads, and then another pair of test pads are used for testing, the It is necessary to pin the transfer pad 130 again, which reduces the number of pins for the transfer pad 130 and further improves the detection efficiency. In addition, two pairs of test pads share one transfer pad 130, which also saves the manufacturing space and manufacturing cost of one transfer pad 130.

In one of the embodiments, during the box test process, the first odd data test pad and the second odd data test pad respectively output data signals through the odd test signal line, and the first even The data test pad and the second even-numbered data test pad respectively output data signals through the even-numbered test signal lines, and the transfer pad 130 provides a common voltage signal to the color filter substrate through the transfer board 200 .

In one of the embodiments, each of the odd data test pads 110 corresponds to one of the odd data test signal lines, and each of the even data test pads 120 corresponds to one of the even data test signal lines.

Based on the same inventive concept, an embodiment of the present application also provides a liquid crystal display device, which includes the array substrate as described in any of the foregoing embodiments.

In summary, the embodiments of the present application provide a boxed test circuit, an array substrate and a liquid crystal display device. The boxed test circuit is used to test a liquid crystal display panel, the liquid crystal display panel includes a display area and a non-display area, and the boxed test circuit includes a plurality of test pad groups 100 arranged in the non-display area , Wherein at least one of the test pad groups 100 includes two test pad pairs and one transfer pad 130, and the two test pad pairs share the transfer pad 130 during the box test process, One of the test pad pairs includes an odd data test pad 110 and an even data test pad 120. In this application, the test pad groups 100 originally located between each pair of COFs are grouped together in pairs, and the test is realized through a set of piercing for two pairs of adjacent COFs, reducing the number of piercing groups by half, thereby improving the detection efficiency . At the same time, two pairs of test pads in the same test pad group 100 share a transfer pad 130. After the test replacement is completed with one pair of test pads, and then another pair of test pads are used for testing, There is no need to pin the transfer pad 130, which reduces the number of pins to the transfer pad 130 and further improves the detection efficiency. In addition, two pairs of test pads share one transfer pad 130, which also saves the manufacturing space and manufacturing cost of one transfer pad 130.

The technical features of the above-mentioned embodiments can be combined arbitrarily. In order to make the description concise, all possible combinations of the technical features in the above-mentioned embodiments are not described. However, as long as there is no contradiction in the combination of these technical features, All should be considered as the scope of this specification.

The above-mentioned embodiments only express a few implementation modes of the present application, and their description is relatively specific and detailed, but they should not be understood as a limitation on the scope of the patent application. It should be pointed out that for those of ordinary skill in the art, without departing from the concept of this application, several modifications and improvements can be made, and these all fall within the protection scope of this application. Therefore, the scope of protection of the patent of this application shall be subject to the appended claims.

Claims

A boxed test circuit for testing a liquid crystal display panel. The liquid crystal display panel includes a display area and a non-display area. The boxed test circuit includes: a plurality of test pad groups arranged in the non-display area Wherein, the test pad group includes:

Two test pad pairs; and

Transfer pads, and the transfer pads are shared by the two test pad pairs during the box test process.
The boxed test circuit according to claim 1, wherein the pair of test pads comprises:

Odd data test pads; and

Even data test pads.
The boxed test circuit according to claim 1, wherein, in the test pad group, the transfer pad is arranged between two pairs of test pads.
5. The box-forming test circuit of claim 3, wherein the two test pad pairs alternately use the transfer pads for box-forming test.
The boxed test circuit according to claim 3, wherein the test pad group includes a first odd data test pad, a first even data test pad, a transfer pad, and a second odd data arranged in sequence. Test pad and second even data test pad;

The first odd-numbered data test pad and the second odd-numbered data test pad are both connected to the odd-numbered test signal lines in the liquid crystal display panel and the integrated circuit circuit corresponding to the chip-on-chip film in the liquid crystal display panel. connection;

The first even-numbered data test pad and the second even-numbered data test pad are electrically connected to the even-numbered test signal line and the integrated circuit corresponding to the flip chip film; and

The transfer board pad is electrically connected to the color filter substrate in the liquid crystal display panel.
5. The boxed test circuit according to claim 5, wherein each of the odd data test pads corresponds to one of the odd data test signal lines, and each of the even data test pads corresponds to one of the even data test signals line.
5. The boxed test circuit of claim 5, further comprising an adapter board, and the adapter pad and the color filter substrate are electrically connected through the adapter board.
7. The box-forming test circuit of claim 7, wherein, in the box-forming test process, the transfer pad provides a common voltage signal to the color filter substrate through the transfer board.
7. The box-forming test circuit of claim 6, wherein, in the box-forming test process, the first odd-numbered data test pad and the second odd-numbered data test pad respectively output data through the odd-numbered test signal line signal.
The box-forming test circuit according to claim 9, wherein, in the box-forming test process, the first even-numbered data test pad and the second even-numbered data test pad respectively output data through the even-numbered test signal line signal.
5. The boxed test circuit of claim 3, wherein the test pad group is arranged between adjacent flip-chip films.
11. The boxed test circuit of claim 11, wherein the test pad pair is electrically connected to the flip chip film on the same side as the test pad pair.
An array substrate includes a display area and a non-display area. The non-display area is provided with a box test circuit, and the box test circuit includes a plurality of test pad groups, wherein the test pad group includes:

Two test pad pairs; and

Transfer pads, and the transfer pads are shared by the two test pad pairs during the box test process.
11. The array substrate of claim 13, wherein the pair of test pads comprises:

Odd data test pads; and

Even data test pads.
13. The array substrate according to claim 13, wherein, in the same test pad group, the transfer pad is arranged between two test pad pairs.
The array substrate of claim 13, wherein the two test pad pairs alternately use the transfer pads to perform a box test.
A liquid crystal display device, the liquid crystal display device includes an array substrate, the array substrate includes a display area and a non-display area, the non-display area is provided with a box test circuit, the box test circuit includes: The test pad group, wherein the test pad group includes:

Two test pad pairs; and

Transfer pads, and the transfer pads are shared by the two test pad pairs during the box test process.