WO2013145879A1 - ブースターアンテナおよびその製造方法 - Google Patents
ブースターアンテナおよびその製造方法 Download PDFInfo
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- WO2013145879A1 WO2013145879A1 PCT/JP2013/052957 JP2013052957W WO2013145879A1 WO 2013145879 A1 WO2013145879 A1 WO 2013145879A1 JP 2013052957 W JP2013052957 W JP 2013052957W WO 2013145879 A1 WO2013145879 A1 WO 2013145879A1
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- Prior art keywords
- conductive film
- comparative example
- booster antenna
- silver
- volume
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q1/00—Details of, or arrangements associated with, antennas
- H01Q1/36—Structural form of radiating elements, e.g. cone, spiral, umbrella; Particular materials used therewith
- H01Q1/364—Structural form of radiating elements, e.g. cone, spiral, umbrella; Particular materials used therewith using a particular conducting material, e.g. superconductor
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
- G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
- G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
- G06K19/077—Constructional details, e.g. mounting of circuits in the carrier
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
- G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
- G06K19/077—Constructional details, e.g. mounting of circuits in the carrier
- G06K19/07749—Constructional details, e.g. mounting of circuits in the carrier the record carrier being capable of non-contact communication, e.g. constructional details of the antenna of a non-contact smart card
- G06K19/07773—Antenna details
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
- G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
- G06K19/077—Constructional details, e.g. mounting of circuits in the carrier
- G06K19/07749—Constructional details, e.g. mounting of circuits in the carrier the record carrier being capable of non-contact communication, e.g. constructional details of the antenna of a non-contact smart card
- G06K19/07773—Antenna details
- G06K19/07794—Antenna details the record carrier comprising a booster or auxiliary antenna in addition to the antenna connected directly to the integrated circuit
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P11/00—Apparatus or processes specially adapted for manufacturing waveguides or resonators, lines, or other devices of the waveguide type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q1/00—Details of, or arrangements associated with, antennas
- H01Q1/12—Supports; Mounting means
- H01Q1/22—Supports; Mounting means by structural association with other equipment or articles
- H01Q1/2208—Supports; Mounting means by structural association with other equipment or articles associated with components used in interrogation type services, i.e. in systems for information exchange between an interrogator/reader and a tag/transponder, e.g. in Radio Frequency Identification [RFID] systems
- H01Q1/2225—Supports; Mounting means by structural association with other equipment or articles associated with components used in interrogation type services, i.e. in systems for information exchange between an interrogator/reader and a tag/transponder, e.g. in Radio Frequency Identification [RFID] systems used in active tags, i.e. provided with its own power source or in passive tags, i.e. deriving power from RF signal
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q1/00—Details of, or arrangements associated with, antennas
- H01Q1/36—Structural form of radiating elements, e.g. cone, spiral, umbrella; Particular materials used therewith
- H01Q1/38—Structural form of radiating elements, e.g. cone, spiral, umbrella; Particular materials used therewith formed by a conductive layer on an insulating support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q9/00—Electrically-short antennas having dimensions not more than twice the operating wavelength and consisting of conductive active radiating elements
- H01Q9/04—Resonant antennas
- H01Q9/0407—Substantially flat resonant element parallel to ground plane, e.g. patch antenna
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
- H05K1/092—Dispersed materials, e.g. conductive pastes or inks
- H05K1/097—Inks comprising nanoparticles and specially adapted for being sintered at low temperature
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/16—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor
- H05K1/165—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor incorporating printed inductors
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10007—Types of components
- H05K2201/10098—Components for radio transmission, e.g. radio frequency identification [RFID] tag, printed or non-printed antennas
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/12—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
- H05K3/1275—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns by other printing techniques, e.g. letterpress printing, intaglio printing, lithographic printing, offset printing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49016—Antenna or wave energy "plumbing" making
Definitions
- the present invention relates to a booster antenna and a manufacturing method thereof, and more particularly, to a booster antenna for an RFID tag and a manufacturing method thereof.
- the RFID tag is a tag using RFID (Radio Frequency IDentification (individual identification technology by wireless communication)), and is a thin type equipped with a semiconductor chip for storing data such as an identification number and an antenna for transmitting and receiving radio waves. It is a lightweight small electronic device.
- RFID Radio Frequency IDentification
- Such an RFID tag is expected to be widely used in various usage environments in various fields such as physical distribution management, and it is desired to reduce the manufacturing cost by mass production and spread it.
- the RFID tag antenna needs to have low electrical resistance in order to increase the data transmission / reception possible distance (communication distance) and reduce data loss during transmission / reception.
- RFID tags should be used in various logistics management fields (eg, tracking of transport containers, traceability, location information management, and clothing management by clothing washers like laundry tags).
- the RFID tag antenna circuit can be formed by using a coil or wire of copper wire as an antenna, a method of transferring a metal foil such as copper foil or aluminum foil onto a substrate, or a substrate such as a plastic film. For example, there is a method of etching the metal foil after masking the metal foil laminated on the material with an etching resistant ink by printing an antenna circuit pattern.
- these methods are limited in productivity and are not suitable for mass production, so that it is difficult to further reduce manufacturing costs.
- the metal foil is manufactured by rolling or the like, but the ratio of the metal in the metal foil is almost 100%. Since the value is high, the RFID tag in which the antenna circuit is formed of the metal foil has a problem that the electrical property is good but the flexibility is poor.
- a metal foil having a film thickness of about 10 to 50 ⁇ m is generally used. However, if the metal foil is too thick, the properties of the metal plate are approximated. There is a possibility that the metal foil peels off from the base material when the RFID tag is bent.
- the ratio of the metal in the metal foil is high, stress is concentrated on the bent surface when the RFID tag is bent, and cracks are likely to occur on the bent surface, resulting in deterioration of electrical characteristics and disconnection, It will not function as an RFID tag antenna.
- using a conductive film composed of a metal component and a resin component to reduce the metal ratio generally improves the flexibility by stress relaxation.
- the amount of the metal component is reduced, the electrical resistance is deteriorated and the characteristics sufficient for the RFID tag antenna are not satisfied.
- a water-based conductive ink containing 40% by mass or less of silver particles is formed into a film by flexographic printing.
- a conductive film having a thickness of 0.1 to 0.5 ⁇ m is formed on the surface of the film-like base material to manufacture an antenna for an IC tag which is a kind of RFID tag.
- a method has been proposed (see, for example, JP 2010-268073 A).
- JP 2010-268073 A Japanese Patent Application Laid-Open No.
- a booster antenna formed so as to be electromagnetically coupled to the RFID tag chip antenna
- the RFID tag chip integrally formed with the antenna it is necessary to attach a booster antenna that is excellent in electrical characteristics and flexibility and can be mass-produced at low cost, similarly to an antenna integrally formed on an RFID tag chip.
- an object of the present invention is to provide a booster antenna that is excellent in electrical characteristics and flexibility and can be mass-produced at low cost, and a method for manufacturing the same, in view of the above-described conventional problems.
- the present inventors have found that a silver conductive film containing a sintered body of 10 to 50% by volume of silver particles and having a volume resistivity of 3 to 100 ⁇ ⁇ cm on the substrate.
- a booster antenna that is excellent in electrical characteristics and flexibility and can be mass-produced at low cost can be manufactured by manufacturing the booster antenna formed in the present invention, and the present invention has been completed.
- the booster antenna according to the present invention is characterized in that a silver conductive film containing a sintered body of 10 to 50% by volume of silver particles and having a volume resistivity of 3 to 100 ⁇ ⁇ cm is formed on a substrate.
- the surface resistivity of the silver conductive film is preferably 0.5 ⁇ / ⁇ or less, and the thickness is preferably 1 to 6 ⁇ m.
- the method for manufacturing a booster antenna according to the present invention includes forming a silver conductive film on a substrate by applying a silver particle dispersion liquid containing 50 to 70% by mass of silver particles to the substrate and then baking it.
- the silver particle dispersion is preferably applied to the substrate by flexographic printing.
- the average particle diameter of a silver particle is 20 nm or less.
- the “average particle diameter of silver particles” refers to an average primary particle diameter that is an average value of primary particle diameters obtained by transmission electron micrographs (TEM images) of silver particles. ADVANTAGE OF THE INVENTION According to this invention, the booster antenna which is excellent in an electrical property and flexibility and can be mass-produced cheaply can be manufactured.
- FIG. 1 is a diagram illustrating a shape in which Ag ink is printed on a substrate in Examples and Comparative Examples.
- FIG. FIG. 2A is a diagram illustrating the shape of a booster antenna created using the conductive films created in Examples and Comparative Examples.
- FIG. 2B, FIG. It is a figure which shows the state which attached the RFID tag chip
- FIG. FIG. 3 is a diagram schematically showing a bending test sample used in Examples and Comparative Examples.
- FIG. 4 is a diagram for explaining a bending test performed in Examples and Comparative Examples, and (b) is a diagram schematically showing a sample for a bending test in which a portion surrounded by a dotted circle in (a) is enlarged. is there.
- a silver conductive film containing a sintered body of 10 to 50% by volume of silver particles and having a volume resistivity of 3 to 100 ⁇ ⁇ cm is formed on a substrate. If the amount of silver particle sintered body in the silver conductive film is less than 10% by volume, the amount of silver particle sintered body in the silver conductive film is too small and the conductivity deteriorates, and it is used as a booster antenna for RFID tags. If it does, it will not function as a booster antenna.
- the amount of silver particles in the silver conductive film exceeds 50% by volume
- stress is concentrated on the bent surface when the RFID tag is bent, and cracks are generated on the bent surface. It tends to occur. As a result, deterioration of electrical characteristics and disconnection are likely to occur, and the possibility of not functioning as a booster antenna increases.
- the volume resistivity of the silver conductive film is in the range of 3 to 100 ⁇ ⁇ cm
- the communication distance is lengthened and the RFID tag data is reliably transmitted and received with the reader / writer. Therefore, data loss during transmission / reception by the booster antenna is less likely to occur.
- the surface resistivity of a silver electrically conductive film is 0.5 ohm / square or less.
- the communication distance should be increased and the RFID tag data can be reliably transmitted and received with the reader / writer. Therefore, data loss during transmission / reception by the booster antenna is less likely to occur.
- the thickness of the silver conductive film is preferably 1 to 6 ⁇ m. The thinner the silver conductive film, the more advantageous in terms of cost.
- the silver conductive film is applied onto the substrate by applying a silver particle dispersion containing 50 to 70% by mass of silver particles to the substrate and then baking it. Form.
- the silver particle content in the silver particle dispersion is less than 50% by mass, it becomes difficult to form the silver conductive film on the substrate, and the amount of the sintered body of silver particles in the silver conductive film is too small.
- the silver particle dispersion is preferably applied to the substrate by flexographic printing, and the flexographic printing may be repeated a plurality of times.
- the average particle diameter of the silver particles is preferably 20 nm or less, and preferably 5 to 15 nm.
- the average particle size of the silver particles is about several nanometers to several tens of nanometers, the specific surface area increases and the melting point decreases dramatically, so that the silver particles are sintered even when fired at a low temperature of 300 ° C. or lower.
- the average particle diameter (primary particle average diameter) of the silver particles is, for example, 60% by mass of Ag particles (silver particles having an average particle diameter of 10 nm), 3.0% by mass of vinyl chloride copolymer latex, and 2.0% by mass.
- An image observed in a bright field at an acceleration voltage of 100 kV with a JEM-100 CXMark-II type manufactured by Co., Ltd., magnification of 300,000 times Photographed can be calculated from the obtained TEM image.
- the primary particle average diameter of the silver particles can be calculated using, for example, image analysis software (A Image-kun (registered trademark) manufactured by Asahi Kasei Engineering Co., Ltd.). This image analysis software discriminates and analyzes individual particles based on color shading. For example, for a 300,000-fold TEM image, the “particle brightness” is “dark” and “noise removal filter”.
- Examples 1-4 60% by mass of Ag particles (silver particles having an average particle size of 10 nm), 3.0% by mass of vinyl chloride copolymer latex, 2.0% by mass of polyurethane thickener, 2.5% by mass of propylene glycol, Ink ink (PFI-700 type manufactured by P-Chem Associates, Inc.) was prepared.
- Ag particles silver particles having an average particle size of 10 nm
- vinyl chloride copolymer latex 3.0% by mass of vinyl chloride copolymer latex
- 2.0% by mass of polyurethane thickener 2.0% by mass of polyurethane thickener
- propylene glycol 2.5% by mass of propylene glycol
- Ink ink PFI-700 type manufactured by P-Chem Associates, Inc.
- flexographic printing machine JEM Flex, a multi-purpose fine printing machine manufactured by JEOL Ltd.
- flexographic printing plate manufactured by Watanabe Gosando Co., Ltd.
- AWP grade DEF 150 lines of surface treatment, 96 DOT%)
- anilox capacity 8 cc / m 2 (400 lines / inch)
- printing speed 20 m / min
- printing frequency once (Example 1), twice (Example 1)
- Example 2 Three times (Example 3) and four times (Example 4) on a base material (PET (polyethylene terephthalate) film Melinex 545 (Melinex: registered trademark)) 10 manufactured by Dupontidine Film Co., Ltd.
- PET polyethylene terephthalate
- Melinex 545 Melinex: registered trademark
- the printed matter is heat-treated on a hot plate at 140 ° C. for 30 seconds.
- a conductive film (silver conductive film) was obtained by firing.
- the produced conductive film is transferred together with the substrate in FIG. Cut into the approximate J shape shown in FIG.
- FIG. 2B after the booster antenna 14 was prepared by sticking on an adhesive release film (type PET38 manufactured by Lintec Corporation), an RFID tag chip (with the antenna integrally formed) ( A Trap Monza 3) 16 manufactured by Impinj was attached (so that the booster antenna 14 was electromagnetically coupled to the antenna of the RFID tag chip 16).
- the film thickness, electric resistance (line resistance) and surface resistivity of the conductive film were measured, and the volume resistivity of the conductive film and the metal (Ag) in the conductive film were measured. The percentage was calculated.
- the film thickness of the conductive film was measured by measuring the height difference between the surface of the substrate on which the conductive film was formed and the surface of the conductive film using a laser microscope (model VK-9700 manufactured by KEYENCE), and averaged It was determined by calculating the value. As a result, the film thickness of the conductive film was 1.4 ⁇ m in Example 1, 2.1 ⁇ m in Example 2, 3.0 ⁇ m in Example 3, and 3.6 ⁇ m in Example 4.
- the electrical resistance (line resistance) of the conductive film is determined by measuring the electrical resistance in the longitudinal direction of the longest straight line part (5.0 mm ⁇ 70 mm rectangular part) of one conductive film of the booster antenna (model CDM-03D manufactured by CUSTOM). It was measured by. As a result, the electric resistance of the conductive film was 7.7 ⁇ in Example 1, 1.8 ⁇ in Example 2, 1.2 ⁇ in Example 3, and 0.8 ⁇ in Example 4.
- the surface resistivity of the conductive film is obtained by cutting the conductive film into a size of 2.0 cm ⁇ 2.0 cm and using a surface resistivity meter (Lorestar GP manufactured by Mitsubishi Chemical Analytic Co., Ltd.) by a four-terminal method. It was measured.
- the surface resistivity of the conductive film was 0.25 ⁇ / ⁇ in Example 1, 0.06 ⁇ / ⁇ in Example 2, 0.03 ⁇ / ⁇ in Example 3, 0.02 ⁇ / ⁇ in Example 4.
- the volume resistivity of the conductive film was determined from the film thickness, electrical resistance, and area (area formed on the surface of the substrate) of the conductive film. As a result, the volume resistivity of the conductive film was 44.6 ⁇ ⁇ cm in Example 1, 17.4 ⁇ ⁇ cm in Example 2, 15.3 ⁇ ⁇ cm in Example 3, and 13.6 ⁇ ⁇ cm in Example 4. Met.
- the ratio of the metal (Ag) in the conductive film is obtained by dissolving a conductive film having a printed area of 2.6 cm ⁇ 13.1 cm in a concentrated nitric acid solution (of a known weight), and obtaining the Ag concentration in the solution by ICP emission spectrometry. After calculating the weight (g) of Ag in the conductive film, the Ag volume (cm 3 ) is determined from the Ag density of 10.5 g / cm 3 , and the conductive film thickness and printed area (2.6 cm) are calculated. ⁇ 13.1 cm) determine the volume of the conductive film from was calculated from the volume of Ag (cm 3) ⁇ 100 / conductive volume (cm 3).
- the proportion of Ag in the conductive film was 22, 4% by volume in Example 1, 31.0% by volume in Example 2, 37.1% by volume in Example 3, and 48.3% by Example 4. %Met.
- a frequency range (ISO / IEC) of 800 MHz to 1100 MHz is used in a anechoic box (MY1530 manufactured by Micronics) using a communication distance measuring device (tagformance manufactured by Voiantic). The communication distance (based on 18000-6C standard) was measured. Prior to this measurement, the environment was set under these conditions (setting using a reference tag attached to tagformance).
- FIG. 3 the conductive film produced in this example was cut into a substantially rectangular conductive film 12 ′ having a size of 5.0 mm ⁇ 20.0 mm, and an adhesive release film (Model PET38 manufactured by Lintec Corporation) was cut. )
- a sample 20 for bending test was prepared by pasting on 18. The portion of the conductive film 12 ′ of the bending test sample 20 is referred to as FIG. As shown in FIG.
- the line resistance (tester) was measured, and the resistance deterioration rate (100% when the line resistance did not change) was obtained from each (line resistance after operation ⁇ 100 / line resistance before the test).
- the resistance deterioration rate was 100% after 10 times, 100 times, and 500 times in Examples 1 and 2, and 100% and 500 times after 10 times and 100 times in Example 3. It was 125% later, and in Example 4, it was 100% after 10 times, 150% after 100 times, and 180% after 500 times.
- Example 1 The conditions and results of Examples 1 to 4 are shown in Tables 1 to 3.
- Comparative Example 1, Examples 5-7 First, vinyl chloride copolymer latex, polyurethane thickener and propylene glycol were added to the Ag ink used in Examples 1 to 4, and 50% by mass of Ag particles (silver particles having an average particle size of 10 nm) and 18.4% by mass. An Ag ink containing a vinyl chloride copolymer latex, 2.0% by mass of polyurethane thickener, and 2.5% by mass of propylene glycol was prepared. Except for using this Ag ink, the number of times of printing was 1 (Comparative Example 1), 2 (Example 5), 3 (Example 6), and 4 times in the same manner as in Examples 1 to 4.
- Example 7 After obtaining a conductive film, a booster antenna mounted with an RFID tag chip and a sample for bending test were prepared, and the film thickness, electrical resistance and surface resistivity of the conductive film were measured, and the volume resistance of the conductive film was measured. The ratio and the ratio of Ag in the conductive film were calculated. In addition, the communication distance of the RFID tag chip-mounted booster antenna was measured by the same method as in Examples 1 to 4, and the resistance deterioration rate of the bending test sample was obtained.
- the film thickness of the conductive film was 1.7 ⁇ m in Comparative Example 1, 2.5 ⁇ m in Example 5, 3.4 ⁇ m in Example 6, and 4.8 ⁇ m in Example 7, and the electrical resistance of the conductive film was
- Comparative Example 1 measurement is not possible due to overload (OL), Example 8.9 is 8.9 ⁇ , Example 6 is 3.9 ⁇ , Example 7 is 2.8 ⁇ , and the surface resistivity of the conductive film is Comparative Example In Example 1, measurement was impossible due to overload (OL), in Example 5, it was 0.43 ⁇ / ⁇ , in Example 6, 0.18 ⁇ / ⁇ , and in Example 7, 0.10 ⁇ / ⁇ .
- the volume resistivity of the conductive film cannot be calculated by overload (OL) in Comparative Example 1, 78.7 ⁇ ⁇ cm in Example 5, 53.5 ⁇ ⁇ cm in Example 6, and 46.1 ⁇ in Example 7. -It was cm.
- the ratio of Ag in the conductive film was 8.5% by volume in Comparative Example 1, 15.5% by volume in Example 5, 17.5% by volume in Example 6, and 18.8% by volume in Example 7. Met.
- the communication distance at a frequency of 955 MHz was 0.0 m in Comparative Example 1, 2.7 m in Example 5, 3.5 m in Example 6, and 3.4 m in Example 7.
- the resistance deterioration rate could not be calculated due to overload (OL) in Comparative Example 1, and in Examples 5 to 7, it was 100% after 10 times, after 100 times, and after 500 times.
- Examples 5 to 7 and Comparative Example 1 are shown in Tables 1 to 3.
- Examples 8 to 10, Comparative Example 2 First, the Ag ink used in Examples 1 to 4 was centrifuged at 3000 rpm for 10 minutes, and then the supernatant was removed to prepare an Ag ink in which the concentration of Ag particles was adjusted to 70% by mass. Except for using this Ag ink, the number of times of printing was 1 (Example 8), 2 (Example 9), 3 (Example 10) and 4 times in the same manner as in Examples 1 to 4.
- a booster antenna mounted with an RFID tag chip and a sample for bending test were prepared, and the film thickness, electrical resistance and surface resistivity of the conductive film were measured, and the volume resistance of the conductive film was measured. The ratio and the ratio of Ag in the conductive film were calculated.
- the communication distance of the RFID tag chip-mounted booster antenna was measured by the same method as in Examples 1 to 4, and the resistance deterioration rate of the bending test sample was obtained.
- the film thickness of the conductive film was 1.7 ⁇ m in Example 8, 2.5 ⁇ m in Example 9, 2.8 ⁇ m in Example 10, and 3.1 ⁇ m in Comparative Example 2, and the electrical resistance of the conductive film was Example 8 was 5.5 ⁇ , Example 9 was 1.8 ⁇ , Example 10 was 1.0 ⁇ , Comparative Example 2 was 0.6 ⁇ , and the surface resistivity of the conductive film was 0.19 ⁇ in Example 8. / ⁇ , 0.09 ⁇ / ⁇ in Example 9, 0.03 ⁇ / ⁇ in Example 10, and 0.01 ⁇ / ⁇ in Comparative Example 2.
- the volume resistivity of the conductive film was 32.8 ⁇ ⁇ cm in Example 8, 17.4 ⁇ ⁇ cm in Example 9, 10.8 ⁇ ⁇ cm in Example 10, and 7.9 ⁇ ⁇ cm in Comparative Example 2. there were.
- the proportion of Ag in the conductive film was 25.6% by volume in Example 8, 32.7% by volume in Example 9, 43.3% by volume in Example 10, and 54.7% by volume in Comparative Example 2.
- the communication distance at a frequency of 955 MHz was 3.6 m in Example 8, 4.0 m in Example 9, 4.0 m in Example 10, and 4.2 m in Comparative Example 2.
- the resistance deterioration rate was 100% after 10 times, 100 times, and 500 times in Example 8, and 100% after 10 times and 100 times in Example 9, and 120 after 500 times.
- Example 10 100% after 10 times, 110% after 100 times, 150% after 500 times, and in Comparative Example 2, 100% after 10 times, 350% after 100 times, 500% It was 1200% later.
- the conditions and results of Examples 8 to 10 and Comparative Example 2 are shown in Tables 1 to 3.
- Examples 11 to 13, Comparative Examples 3 and 4 Except for an anilox capacity of 20 cc / m 2 (150 lines / inch), the number of times of printing was 1 (Example 11), 2 (Example 12), and 3 times in the same manner as in Examples 1-4. (Example 13) After obtaining a conductive film, 4 times (Comparative Example 3) and 8 times (Comparative Example 4), a booster antenna mounted with an RFID tag chip and a sample for bending test were prepared.
- the volume resistivity of the electrically conductive film and the ratio of Ag in the electrically conductive film were calculated.
- the communication distance of the RFID tag chip-mounted booster antenna was measured by the same method as in Examples 1 to 4, and the resistance deterioration rate of the bending test sample was obtained.
- the film thickness of the conductive film was 2.2 ⁇ m in Example 11, 3.6 ⁇ m in Example 12, 5.6 ⁇ m in Example 13, 7.5 ⁇ m in Comparative Example 3, and 11.4 ⁇ m in Comparative Example 4.
- the electrical resistance of the conductive film is 1.6 ⁇ in Example 11, 0.9 ⁇ in Example 12, 0.2 ⁇ in Example 13, 0.2 ⁇ in Comparative Example 3, and 0.2 ⁇ in Comparative Example 4.
- the surface resistivity of the conductive film is 0.06 ⁇ / ⁇ in Example 11, 0.02 ⁇ / ⁇ in Example 12, 0.01 ⁇ / ⁇ in Example 13, 0.01 ⁇ / ⁇ in Comparative Example 3, and comparison. In Example 4, it was 0.01 ⁇ / ⁇ .
- the volume resistivity of the conductive film was 15.4 ⁇ ⁇ cm in Example 11, 11.5 ⁇ ⁇ cm in Example 12, 3.6 ⁇ ⁇ cm in Example 13, 4.8 ⁇ ⁇ cm in Comparative Example 3, In Comparative Example 4, it was 7.3 ⁇ ⁇ cm.
- the proportion of Ag in the conductive film was 28.5% by volume in Example 11, 38.5% by volume in Example 12, 49.2% by volume in Example 13, and 54.9% by volume in Comparative Example 3.
- Comparative Example 4 it was 70.1% by volume.
- the communication distance at a frequency of 955 MHz was 3.8 m in Example 11, 4.1 m in Example 12, 4.2 m in Example 13, 4.2 m in Comparative Example 3, and 4.2 m in Comparative Example 4. It was. Further, the resistance deterioration rate was 100% after 10 times, 100 times, and 500 times in Example 11, and 100% after 10 times and 100 times in Example 12, and 125 after 500 times. In Example 13, 100% after 10 times, 150% after 100 times, 180% after 500 times, and in Comparative Example 3, 200% after 10 times, 400% after 100 times, 500% After 1400%. In Comparative Example 4, since the wire was disconnected within 10 times, the resistance deterioration rate could not be obtained.
- Comparative Examples 5-8 First, vinyl chloride copolymer latex, polyurethane thickener and propylene glycol were added to the Ag ink used in Examples 1 to 4, and 40% by mass of Ag particles (silver particles having an average particle size of 10 nm) and 33.8% by mass. An Ag ink containing a vinyl chloride copolymer latex, 2.0% by mass of polyurethane thickener, and 2.5% by mass of propylene glycol was prepared.
- the number of times of printing was 1 time (Comparative Example 5), 2 times (Comparative Example 6), 3 times (Comparative Example 7) and 4 times in the same manner as in Examples 1 to 4.
- an RFID tag chip mounted booster antenna and a bending test sample were prepared, and the film thickness, electrical resistance, and surface resistivity of the conductive film were measured, and the volume resistance of the conductive film was measured. The ratio and the ratio of Ag in the conductive film were calculated.
- the communication distance of the RFID tag chip-mounted booster antenna was measured by the same method as in Examples 1 to 4, and the resistance deterioration rate of the bending test sample was obtained.
- the film thickness of the conductive film was 1.5 ⁇ m in Comparative Example 5, 2.4 ⁇ m in Comparative Example 6, 3.6 ⁇ m in Comparative Example 7, and 5.0 ⁇ m in Comparative Example 8, and the electrical resistance of the conductive film was
- Comparative Example 5 measurement is impossible due to overload (OL), in Comparative Example 6 is 820.0 ⁇ , in Comparative Example 7 is 185.0 ⁇ , in Comparative Example 8 is 70.0 ⁇ , and the surface resistivity of the conductive film is Comparative Example In Example 5, measurement was impossible due to overload (OL), 114.0 ⁇ / ⁇ in Comparative Example 6, 35.5 ⁇ / ⁇ in Comparative Example 7, and 7.4 ⁇ / ⁇ in Comparative Example 8.
- the volume resistivity of the conductive film could not be calculated by overload (OL) in Comparative Example 5, was 4280 ⁇ ⁇ cm in Comparative Example 6, 1705 ⁇ ⁇ cm in Comparative Example 7, and 1140 ⁇ ⁇ cm in Comparative Example 8.
- the proportion of Ag in the conductive film was 5.7% by volume in Comparative Example 5, 6.4% by volume in Comparative Example 6, 5.9% by volume in Comparative Example 7, and 7.0% by volume in Comparative Example 8. Met.
- the communication distance at a frequency of 955 MHz was 0.0 m in Comparative Example 5, 0.0 m in Comparative Example 6, 0.7 m in Comparative Example 7, and 1.8 m in Comparative Example 8.
- Comparative Examples 9-10 Instead of the conductive films obtained in Examples 1 to 4, Ag foils with a thickness of 1.0 ⁇ m (Comparative Example 9) and 3.0 ⁇ m (Comparative Example 10) (manufactured by Takeuchi Metal Foil Industry Co., Ltd., 100 mm ⁇ 100 mm) ) Is used as a conductive film (the ratio of Ag in the conductive film is 100%) by the same method as in Examples 1 to 4, using a booster antenna mounted with an RFID tag chip, a sample for bending test, and for bending test A sample was prepared, and the electrical resistance and surface resistivity of the conductive film were measured, and the volume resistivity of the conductive film was calculated.
- the communication distance of the RFID tag chip-mounted booster antenna was measured by the same method as in Examples 1 to 4, and the resistance deterioration rate of the bending test sample was obtained.
- the electrical resistance of the conductive film was 0.3 ⁇ in Comparative Example 9 and 0.2 ⁇ in Comparative Example 10
- the surface resistivity of the conductive film was 0.01 ⁇ / ⁇ in Comparative Example 9 and in Comparative Example 10 It was 0.01 ⁇ / ⁇ .
- the volume resistivity of the conductive film was 1.6 ⁇ ⁇ cm in Comparative Example 9 and 1.9 ⁇ ⁇ cm in Comparative Example 10.
- the communication distance at a frequency of 955 MHz was 3.8 m in Comparative Example 9 and 4.2 m in Comparative Example 10.
- Comparative Example 11-13 Instead of the conductive films obtained in Examples 1 to 4, Al foils (Takeuchi Metal) having thicknesses of 3.0 ⁇ m (Comparative Example 11), 6.0 ⁇ m (Comparative Example 12) and 12.0 ⁇ m (Comparative Example 13), respectively.
- a booster antenna equipped with an RFID tag chip was manufactured in the same manner as in Examples 1 to 4, except that Haku Kogyo Co., Ltd.
- the volume resistivity of the conductive film was 3.8 ⁇ ⁇ cm in Comparative Example 11, 7.6 ⁇ ⁇ cm in Comparative Example 12, and 15.3 ⁇ ⁇ cm in Comparative Example 13.
- the communication distance at a frequency of 955 MHz was 4.2 m in Comparative Example 11, 4.0 m in Comparative Example 12, and 4.0 m in Comparative Example 13.
- the resistance deterioration rate was 167% after 10 times in the comparative example 11, 633% after 100 times, and disconnected after 500 times
- the comparative example 12 was 100% after 10 times, 100% after 100 times, It was 1200% after 500 times, and in Comparative Example 13, it was 100% after 10 times, 100% after 100 times, and 800% after 500 times.
- the conditions and results of these comparative examples 11 to 13 are shown in Tables 1 to 3. If the booster antenna by this invention is used as a booster antenna for RFID tags, the FEID tag provided with the booster antenna of practical communication distance can be manufactured.
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Abstract
Description
このようなRFIDタグは、物流管理などの様々な分野において様々な使用環境で広く利用されることが期待されており、大量生産により製造コストを低減して普及させることが望まれている。また、RFIDタグ用アンテナは、データ送受信可能距離(通信距離)を拡大し、送受信時のデータ損失を低減するために、電気抵抗が低いことが必要である。さらに、RFIDタグは、(例えば、輸送容器のトラッキング、トレーサビリティー、位置情報の管理や、ランドリータグのように衣類洗濯業者による衣類の管理などの)様々な物流管理などの分野において使用されることから、使用環境により繰り返し折り曲げられる場面が多いので、繰り返し折り曲げられても、アンテナの金属疲労による断線や電気抵抗の増大など、アンテナの特性の劣化によってRFIDタグとして使用することができなくなるのを防止する必要があるため、屈曲性が良好であることが必要である。
RFIDタグ用アンテナ回路(導電回路)を形成する方法として、銅線のコイルや針金をアンテナとして利用する方法、銅箔やアルミニウム箔などの金属箔を基材に転写する方法、プラスチックフィルムなどの基材に積層した金属箔に耐エッチング性インクをアンテナ回路パターン印刷してマスキングした後に金属箔をエッチングする方法などがある。
しかし、これらの方法では、生産性に制限があり、大量生産には向いていないことから、製造コストをさらに低減させるのが困難である。また、これらの方法のうち、金属箔を基材に転写する方法や金属箔をエッチングする方法では、金属箔が圧延などより製造されているが、金属箔中の金属の割合がほぼ100%と高い値であるため、金属箔によってアンテナ回路が形成されたRFIDタグは、電気特性が良好になるものの、屈曲性が悪くなるという問題がある。また、金属箔によってアンテナ回路が形成されたRFIDタグでは、一般に膜厚10~50μm程度の金属箔が使用されているが、金属箔が厚過ぎると、金属板の性質に近くなって基材との密着性が低下し、RFIDタグの屈曲時に金属箔が基材から剥離する可能性がある。さらに、金属箔中の金属の割合が高いため、RFIDタグの屈曲時に屈曲面に応力が集中してしまい、屈曲面にクラックが発生し易くなり、その結果、電気特性の悪化や断線が生じ、RFIDタグ用アンテナとして機能しなくなる。一方、RFIDタグの屈曲性を向上させるために、金属箔の代わりに、金属成分と樹脂成分からなる導電膜を使用して金属の割合を低下させると、一般に応力緩和により屈曲性を向上させることができるが、金属成分の量が低下することにより、電気抵抗が悪化して、RFIDタグ用アンテナとして十分な特性を満たさなくなる。
金属箔を使用しないで基材との密着性が良好な導電回路を形成するRFIDタグ用アンテナを製造する方法として、40質量%以下の銀粒子を含む水性導電性インクを、フレキソ印刷によりフィルム状基材の表面に塗布して乾燥させることによって、フィルム状基材の表面に厚さ0.1~0.5μmの導電膜を形成してRFIDタグの一種であるICタグ用のアンテナを製造する方法が提案されている(例えば、特開2010−268073号公報参照)。
しかし、特開2010−268073号公報の方法では、電気抵抗が低いICタグ用アンテナを大量生産して製造コストを低減することができるが、銀粒子の含有量が少ない導電性インクを使用して厚さ0.1~0.5μmの薄い導電膜を形成しており、導電膜中の銀の割合がほぼ100%と高いため、金属箔を基材に転写する方法や金属箔をエッチングする方法と同様に、屈曲性が悪いという問題がある。
また、アンテナが一体に形成されたRFIDタグチップでは、通信距離が短いという問題があるため、通信距離を延長することが望まれている。そのため、アンテナが一体に形成されたRFIDタグチップに(RFIDタグチップのアンテナと電磁結合するように形成された)ブースターアンテナを取り付けて通信距離を延長することが望まれている。
しかし、RFIDタグチップにブースターアンテナを取り付ける場合、RFIDタグチップに一体に形成されたアンテナと同様に、電気特性および屈曲性に優れ且つ安価に大量生産可能なブースターアンテナを取り付ける必要がある。
本発明者らは、上記課題を解決するために鋭意研究した結果、10~50体積%の銀粒子の焼結体を含み且つ体積抵抗率が3~100μΩ・cmの銀導電膜が基材上に形成されたブースターアンテナを製造することによって、電気特性および屈曲性に優れ且つ安価に大量生産可能なブースターアンテナを製造することができることを見出し、本発明を完成するに至った。
すなわち、本発明によるブースターアンテナは、10~50体積%の銀粒子の焼結体を含み且つ体積抵抗率が3~100μΩ・cmの銀導電膜が基材上に形成されていることを特徴とする。このブースターアンテナにおいて、銀導電膜の表面抵抗率が0.5Ω/□以下であるのが好ましく、厚さが1~6μmであるのが好ましい。
また、本発明によるブースターアンテナの製造方法は、50~70質量%の銀粒子を含む銀粒子分散液を基板に塗布した後に焼成することにより、上記の銀導電膜を基板上に形成することを特徴とする。このブースターアンテナの製造方法において、銀粒子分散液の基板への塗布が、フレキソ印刷によって行われるのが好ましい。また、銀粒子の平均粒径が20nm以下であるのが好ましい。
なお、本明細書中において、「銀粒子の平均粒径」とは、銀粒子の透過型電子顕微鏡写真(TEM像)による一次粒子径の平均値である一次粒子平均径をいう。
本発明によれば、電気特性および屈曲性に優れ且つ安価に大量生産可能なブースターアンテナを製造することができる。
Fig.2Aは、実施例および比較例において作成した導電膜を使用して作成したブースターアンテナの形状を示す図である。
Fig.2Bは、Fig.2AのブースターアンテナにRFIDタグチップを取り付けた状態を示す図である。
Fig.3は、実施例および比較例において使用した屈曲試験用サンプルを概略的に示す図である。
Fig.4は、実施例および比較例において行った屈曲試験を説明する図であり、(b)は(a)の点線の丸で囲まれた部分を拡大した屈曲試験用サンプルを概略的に示す図である。
また、銀導電膜の表面抵抗率は0.5Ω/□以下であるのが好ましい。銀導電膜の表面抵抗率が0.5Ω/□以下の範囲では、RFIDタグ用ブースターアンテナとして使用した場合に、通信距離を長くしてリーダライタとのRFIDタグのデータの送受信を確実に行うことができるため、ブースターアンテナによる送受信時のデータ損失が生じ難くなる。
さらに、銀導電膜の厚さは1~6μmであるのが好ましい。銀導電膜の厚さは、薄くなるほどコスト的に有利になるが、1μm未満になると、RFIDタグ用ブースターアンテナとして使用した場合に、表皮効果によりUHF帯における電気抵抗が増大して通信距離が短くなる。
また、本発明によるブースターアンテナの製造方法の実施の形態では、50~70質量%の銀粒子を含む銀粒子分散液を基板に塗布した後に焼成することにより、上記の銀導電膜を基板上に形成する。銀粒子分散液中の銀粒子の含有量が50質量%未満では、上記の銀導電膜を基板上に形成し難くなり、銀導電膜中の銀粒子の焼結体の量が少な過ぎるために導電性が悪化して電気抵抗が高くなり、70質量%を超えると、銀粒子分散液の粘度が高くなって、フレキソ印刷などにより塗布するのが困難になる。
このブースターアンテナの製造方法において、銀粒子分散液の基板への塗布が、フレキソ印刷によって行われるのが好ましく、フレキソ印刷を複数回繰り返してもよい。また、銀粒子の平均粒径が20nm以下であるのが好ましく、5~15nmであるのが好ましい。銀粒子の平均粒径が数nm~十数nm程度になると、比表面積が大きくなって融点が劇的に低下するため、300℃以下の低温で焼成しても銀粒子同士を焼結させることができる(すなわち、銀ナノ粒子の低温焼結性を得ることができる)が、銀粒子の平均粒径が20nmより大きくなると、銀ナノ粒子の低温焼結性を得ることが困難になる。
なお、銀粒子の平均粒径(一次粒子平均径)は、例えば、60質量%のAg粒子(平均粒径10nmの銀粒子)と3.0質量%の塩化ビニルコポリマーラテックスと2.0質量%のポリウレタンシックナーと2.5質量%のプロピレングリコールとを含むAgインク(ピーケム アソシエイツ インク社製のPFI−700型)などの銀粒子を含むAgインク2質量部をシクロヘキサン96質量部とオレイン酸2質量部の混合溶液に添加し、超音波によって分散させた後、得られた分散溶液を支持膜付きCuマイクログリッドに滴下して乾燥させ、このマイクログリッド上の銀粒子を透過型電子顕微鏡(日本電子株式会社製のJEM−100CXMark−II型)により加速電圧100kVとして明視野で観察した像を倍率300,000倍で撮影し、得られたTEM像から算出することができる。この銀粒子の一次粒子平均径の算出は、例えば、画像解析ソフト(旭化成エンジニアリング株式会社製のA像くん(登録商標))を使用して行うことができる。この画像解析ソフトは、色の濃淡で個々の粒子を識別して解析するものであり、例えば、300,000倍のTEM像に対して「粒子の明度」を「暗」、「雑音除去フィルタ」を「有」、「円形しきい値」を「20」、「重なり度」を「50」とする条件で円形粒子解析を行って、200個以上の粒子について一次粒子径を測定し、その数平均径を求めて一次粒子平均径とすることができる。なお、TEM像中に凝結粒子や異形粒子が多数ある場合には、測定不能とすればよい。
以下、本発明によるブースターアンテナおよびその製造方法の実施例について詳細に説明する。
まず、60質量%のAg粒子(平均粒径10nmの銀粒子)と、3.0質量%の塩化ビニルコポリマーラテックスと、2.0質量%のポリウレタンシックナーと、2.5質量%のプロピレングリコールとを含むAgインク(ピーケム アソシエイツ インク社製のPFI−700型)を用意した。
次に、フレキソ印刷機(日本電子精機株式会社製の多目的微細印刷機JEM Flex)と、フレキソ印刷版(株式会社渡辺護三堂製、印刷版の材質は旭化成株式会社製の板状感光性樹脂AWP グレードDEF、表面加工150ライン、96DOT%)を使用し、アニロックス容量8cc/m2(400線/インチ)、印刷速度20m/分、印刷回数をそれぞれ1回(実施例1)、2回(実施例2)、3回(実施例3)および4回(実施例4)として、基材(デュポンテイジンフィルム社製のPET(ポリエチレンテレフタレート)フィルム メリネックス545(Melinex:登録商標))10上に、Fig.1に示すように、3cm×15cm程度の大きさの略矩形の5枚の膜12を形成するように上記のAgインクを印刷した後、ホットプレート上で印刷物を140℃で30秒間熱処理して焼成することによって導電膜(銀導電膜)を得た。
次に、作製した導電膜を基板とともにFig.2Aに示す略J形に切断し、Fig.2Bに示すように、粘着性剥離フィルム(リンテック株式会社製の型式PET38)上に貼り付けてブースターアンテナ14を作製した後、このブースターアンテナ14上に(アンテナが一体に形成された)RFIDタグチップ(Impinj社製のTrap Monza3)16を(ブースターアンテナ14がRFIDタグチップ16のアンテナと電磁結合するように)取り付けた。
このようにして作製したRFIDタグチップ搭載ブースターアンテナについて、導電膜の膜厚、電気抵抗(ライン抵抗)および表面抵抗率を測定するとともに、導電膜の体積抵抗率および導電膜中の金属(Ag)の割合を算出した。
導電膜の膜厚は、レーザーマイクロスコープ(KEYENCE社製の型式VK−9700)を用いて、導電膜が形成された基材の表面と導電膜の表面との高低差を100箇所測定し、平均値を算出することによって求めた。その結果、導電膜の膜厚は、実施例1では1.4μm、実施例2では2.1μm、実施例3では3.0μm、実施例4では3.6μmであった。
導電膜の電気抵抗(ライン抵抗)は、ブースターアンテナの一方の導電膜の最長直線部(5.0mm×70mmの矩形部分)の長手方向の電気抵抗をテスター(CUSTOM社製の型式CDM−03D)により測定した。その結果、導電膜の電気抵抗は、実施例1では7.7Ω、実施例2では1.8Ω、実施例3では1.2Ω、実施例4では0.8Ωであった。
導電膜の表面抵抗率は、導電膜を2.0cm×2.0cmの大きさにカットし、表面抵抗率測定器(三菱化学アナリティック株式会社製のロレスターGP)を用いて、4端子法により測定した。その結果、導電膜の表面抵抗率は、実施例1では0.25Ω/□、実施例2では0.06Ω/□、実施例3では0.03Ω/□、実施例4では0.02Ω/□であった。
導電膜の体積抵抗率は、導電膜の膜厚、電気抵抗および面積(基材の表面に形成された面積)から求めた。その結果、導電膜の体積抵抗率は、実施例1では44.6μΩ・cm、実施例2では17.4μΩ・cm、実施例3では15.3μΩ・cm、実施例4では13.6μΩ・cmであった。
導電膜中の金属(Ag)の割合は、印刷面積2.6cm×13.1cmの導電膜を(既知の重量の)濃硝酸溶液に溶解し、溶液中のAg濃度をICP発光分析法より求めて、導電膜中のAgの重量(g)を算出した後、Agの密度10.5g/cm3からAgの体積(cm3)を求めるとともに、導電膜の膜厚と印刷面積(2.6cm×13.1cm)から導電膜の体積を求め、Agの体積(cm3)×100/導電膜の体積(cm3)から算出した。その結果、導電膜中のAgの割合は、実施例1では22、4体積%、実施例2では31.0体積%、実施例3では37.1体積%、実施例4では48.3体積%であった。
次に、作製したRFIDタグチップ搭載ブースターアンテナについて、電波暗箱(マイクロニクス社製のMY1530)中において、通信距離測定器(Voyantic社製のtagformance)を用いて、800MHz~1100MHzの周波数領域(ISO/IEC 18000−6C規格に準拠)の通信距離(Theoretical read range forward)を測定した。なお、この測定に先立って、この条件における環境設定(tagformance付属のリファレンスタグによる設定)を行った。その結果、周波数955MHzの通信距離は、実施例1では3.2m、実施例2では4.0m、実施例3では4.2m、実施例4では4.0mであった。
次に、Fig.3に示すように、本実施例で作製した導電膜を5.0mm×20.0mmの大きさの略矩形の導電膜12’に切断して、粘着性剥離フィルム(リンテック株式会社製の型式PET38)18上に貼り付けて屈曲試験用サンプル20を作製した。この屈曲試験用サンプル20の導電膜12’の部分を、Fig.4に示すように、R=0.5mmの鉄製の柱22に5.0Nの力で擦り付けて、90°屈曲させた状態で矢印方向に10cm動かす動作をそれぞれ10回、100回および500回行った後のライン抵抗(テスター)を測定し、それぞれの(動作後のライン抵抗×100/試験前のライン抵抗)から抵抗悪化率(ライン抵抗が変化しない場合では100%)を求めた。その結果、抵抗悪化率は、実施例1および2では10回後、100回後、500回後のいずれも100%であり、実施例3では10回後および100回後で100%、500回後で125%であり、実施例4では10回後で100%、100回後で150%、500回後で180%であった。
これらの実施例1~4の条件および結果を表1~表3に示す。
まず、実施例1~4で使用したAgインクに、塩化ビニルコポリマーラテックスとポリウレタンシックナーとプロピレングリコールを加えて、50質量%のAg粒子(平均粒径10nmの銀粒子)と、18.4質量%の塩化ビニルコポリマーラテックスと、2.0質量%のポリウレタンシックナーと、2.5質量%のプロピレングリコールとを含むAgインクを用意した。
このAgインクを用いた以外は、実施例1~4と同様の方法により、印刷回数をそれぞれ1回(比較例1)、2回(実施例5)、3回(実施例6)および4回(実施例7)として、導電膜を得た後、RFIDタグチップ搭載ブースターアンテナおよび屈曲試験用サンプルを作製し、導電膜の膜厚、電気抵抗および表面抵抗率を測定するとともに、導電膜の体積抵抗率および導電膜中のAgの割合を算出した。また、実施例1~4と同様の方法により、RFIDタグチップ搭載ブースターアンテナの通信距離を測定するとともに、屈曲試験用サンプルの抵抗悪化率を求めた。
その結果、導電膜の膜厚は、比較例1では1.7μm、実施例5では2.5μm、実施例6では3.4μm、実施例7では4.8μmであり、導電膜の電気抵抗は、比較例1ではオーバーロード(OL)で測定不能、実施例5では8.9Ω、実施例6では3.9Ω、実施例7では2.8Ωであり、導電膜の表面抵抗率は、比較例1ではオーバーロード(OL)で測定不能、実施例5では0.43Ω/□、実施例6では0.18Ω/□、実施例7では0.10Ω/□であった。また、導電膜の体積抵抗率は、比較例1ではオーバーロード(OL)で算出不能、実施例5では78.7μΩ・cm、実施例6では53.5μΩ・cm、実施例7では46.1μΩ・cmであった。また、導電膜中のAgの割合は、比較例1では8.5体積%、実施例5では15.5体積%、実施例6では17.5体積%、実施例7では18.8体積%であった。また、周波数955MHzの通信距離は、比較例1では0.0m、実施例5では2.7m、実施例6では3.5m、実施例7では3.4mであった。さらに、抵抗悪化率は、比較例1ではオーバーロード(OL)で算出不能であり、実施例5~7では10回後、100回後、500回後のいずれも100%であった。
これらの実施例5~7および比較例1の条件および結果を表1~表3に示す。
実施例8~10、比較例2
まず、実施例1~4で使用したAgインクを3000rpmで10分間遠心分離処理を行った後、上澄み液を除去して、Ag粒子の濃度を70質量%に調整したAgインクを用意した。
このAgインクを用いた以外は、実施例1~4と同様の方法により、印刷回数をそれぞれ1回(実施例8)、2回(実施例9)、3回(実施例10)および4回(比較例2)として、導電膜を得た後、RFIDタグチップ搭載ブースターアンテナおよび屈曲試験用サンプルを作製し、導電膜の膜厚、電気抵抗および表面抵抗率を測定するとともに、導電膜の体積抵抗率および導電膜中のAgの割合を算出した。また、実施例1~4と同様の方法により、RFIDタグチップ搭載ブースターアンテナの通信距離を測定するとともに、屈曲試験用サンプルの抵抗悪化率を求めた。
その結果、導電膜の膜厚は、実施例8では1.7μm、実施例9では2.5μm、実施例10では2.8μm、比較例2では3.1μmであり、導電膜の電気抵抗は、実施例8では5.5Ω、実施例9では1.8Ω、実施例10では1.0Ω、比較例2では0.6Ωであり、導電膜の表面抵抗率は、実施例8では0.19Ω/□、実施例9では0.06Ω/□、実施例10では0.03Ω/□、比較例2では0.01Ω/□であった。また、導電膜の体積抵抗率は、実施例8では32.8μΩ・cm、実施例9では17.4μΩ・cm、実施例10では10.8μΩ・cm、比較例2では7.9μΩ・cmであった。また、導電膜中のAgの割合は、実施例8では25.6体積%、実施例9では32.7体積%、実施例10では43.3体積%、比較例2では54.7体積%であった。また、周波数955MHzの通信距離は、実施例8では3.6m、実施例9では4.0m、実施例10では4.0m、比較例2では4.2mであった。さらに、抵抗悪化率は、実施例8では10回後、100回後、500回後のいずれも100%であり、実施例9では10回後および100回後で100%、500回後で120%であり、実施例10では10回後で100%、100回後で110%、500回後で150%であり、比較例2では10回後で100%、100回後で350%、500回後で1200%であった。
これらの実施例8~10および比較例2の条件および結果を表1~表3に示す。
実施例11~13、比較例3、4
アニロックス容量20cc/m2(150線/インチ)とした以外は、実施例1~4と同様の方法により、印刷回数をそれぞれ1回(実施例11)、2回(実施例12)、3回(実施例13)、4回(比較例3)および8回(比較例4)として、導電膜を得た後、RFIDタグチップ搭載ブースターアンテナおよび屈曲試験用サンプルを作製し、導電膜の膜厚、電気抵抗および表面抵抗率を測定するとともに、導電膜の体積抵抗率および導電膜中のAgの割合を算出した。また、実施例1~4と同様の方法により、RFIDタグチップ搭載ブースターアンテナの通信距離を測定するとともに、屈曲試験用サンプルの抵抗悪化率を求めた。
その結果、導電膜の膜厚は、実施例11では2.2μm、実施例12では3.6μm、実施例13では5.6μm、比較例3では7.5μm、比較例4では11.4μmであり、導電膜の電気抵抗は、実施例11では1.6Ω、実施例12では0.9Ω、実施例13では0.2Ω、比較例3では0.2Ω、比較例4では0.2Ωであり、導電膜の表面抵抗率は、実施例11では0.06Ω/□、実施例12では0.02Ω/□、実施例13では0.01Ω/□、比較例3では0.01Ω/□、比較例4では0.01Ω/□であった。また、導電膜の体積抵抗率は、実施例11では15.4μΩ・cm、実施例12では11.5μΩ・cm、実施例13では3.6μΩ・cm、比較例3では4.8μΩ・cm、比較例4では7.3μΩ・cmであった。また、導電膜中のAgの割合は、実施例11では28.5体積%、実施例12では38.5体積%、実施例13では49.2体積%、比較例3では54.9体積%、比較例4では70.1体積%であった。また、周波数955MHzの通信距離は、実施例11では3.8m、実施例12では4.1m、実施例13では4.2m、比較例3では4.2m、比較例4では4.2mであった。さらに、抵抗悪化率は、実施例11では10回後、100回後、500回後のいずれも100%であり、実施例12では10回後および100回後で100%、500回後で125%であり、実施例13では10回後で100%、100回後で150%、500回後で180%であり、比較例3では10回後で200%、100回後で400%、500回後で1400%であった。なお、比較例4では、10回以内に断線したため、抵抗悪化率を求めることができなかった。
これらの実施例11~13および比較例3~4の条件および結果を表1~表3に示す。
比較例5~8
まず、実施例1~4で使用したAgインクに、塩化ビニルコポリマーラテックスとポリウレタンシックナーとプロピレングリコールを加えて、40質量%のAg粒子(平均粒径10nmの銀粒子)と、33.8質量%の塩化ビニルコポリマーラテックスと、2.0質量%のポリウレタンシックナーと、2.5質量%のプロピレングリコールとを含むAgインクを用意した。
このAgインクを用いた以外は、実施例1~4と同様の方法により、印刷回数をそれぞれ1回(比較例5)、2回(比較例6)、3回(比較例7)および4回(比較例8)として、導電膜を得た後、RFIDタグチップ搭載ブースターアンテナおよび屈曲試験用サンプルを作製し、導電膜の膜厚、電気抵抗および表面抵抗率を測定するとともに、導電膜の体積抵抗率および導電膜中のAgの割合を算出した。また、実施例1~4と同様の方法により、RFIDタグチップ搭載ブースターアンテナの通信距離を測定するとともに、屈曲試験用サンプルの抵抗悪化率を求めた。
その結果、導電膜の膜厚は、比較例5では1.5μm、比較例6では2.4μm、比較例7では3.6μm、比較例8では5.0μmであり、導電膜の電気抵抗は、比較例5ではオーバーロード(OL)で測定不能、比較例6では820.0Ω、比較例7では185.0Ω、比較例8では70.0Ωであり、導電膜の表面抵抗率は、比較例5ではオーバーロード(OL)で測定不能、比較例6では114.0Ω/□、比較例7では35.5Ω/□、比較例8では7.4Ω/□であった。また、導電膜の体積抵抗率は、比較例5ではオーバーロード(OL)で算出不能、比較例6では4280μΩ・cm、比較例7では1705μΩ・cm、比較例8では1140μΩ・cmであった。また、導電膜中のAgの割合は、比較例5では5.7体積%、比較例6では6.4体積%、比較例7では5.9体積%、比較例8では7.0体積%であった。また、周波数955MHzの通信距離は、比較例5では0.0m、比較例6では0.0m、比較例7では0.7m、比較例8では1.8mであった。さらに、抵抗悪化率は、比較例5ではオーバーロード(OL)で算出不能であり、比較例6~8では10回後、100回後、500回後のいずれも100%であった。
これらの比較例5~8の条件および結果を表1~表3に示す。
比較例9~10
実施例1~4において得られた導電膜の代わりに、それぞれ厚さ1.0μm(比較例9)および3.0μm(比較例10)のAg箔(竹内金属箔工業株式会社製、100mm×100mm)を切断して導電膜(導電膜中のAgの割合は100%)として使用した以外は、実施例1~4と同様の方法により、RFIDタグチップ搭載ブースターアンテナおよび屈曲試験用サンプルおよび屈曲試験用サンプルを作製し、導電膜の電気抵抗および表面抵抗率を測定するとともに、導電膜の体積抵抗率を算出した。また、実施例1~4と同様の方法により、RFIDタグチップ搭載ブースターアンテナの通信距離を測定するとともに、屈曲試験用サンプルの抵抗悪化率を求めた。
その結果、導電膜の電気抵抗は、比較例9では0.3Ω、比較例10では0.2Ωであり、導電膜の表面抵抗率は、比較例9では0.01Ω/□、比較例10では0.01Ω/□であった。また、導電膜の体積抵抗率は、比較例9では1.6μΩ・cm、比較例10では1.9μΩ・cmであった。また、周波数955MHzの通信距離は、比較例9では3.8m、比較例10では4.2mであった。さらに、抵抗悪化率は、比較例9では10回後で100%、100回後で200%、500回後で800%であり、比較例10では10回後で100%、100回後で150%、500回後で400%であった。
これらの比較例9~10の条件および結果を表1~表3に示す。
比較例11~13
実施例1~4において得られた導電膜の代わりに、それぞれ厚さ3.0μm(比較例11)、6.0μm(比較例12)および12.0μm(比較例13)のAl箔(竹内金属箔工業株式会社製、100mm×100mm)を切断して導電膜(導電膜中のAlの割合は100%)として使用した以外は、実施例1~4と同様の方法により、RFIDタグチップ搭載ブースターアンテナおよび屈曲試験用サンプルおよび屈曲試験用サンプルを作製し、導電膜の電気抵抗および表面抵抗率を測定するとともに、導電膜の体積抵抗率を算出した。また、実施例1~4と同様の方法により、RFIDタグチップ搭載ブースターアンテナの通信距離を測定するとともに、屈曲試験用サンプルの抵抗悪化率を求めた。
その結果、導電膜の電気抵抗は、比較例11では0.3Ω、比較例12では0.2Ω、比較例13では0.2Ωであり、導電膜の表面抵抗率は、比較例11~13のいずれも0.01Ω/□であった。また、導電膜の体積抵抗率は、比較例11では3.8μΩ・cm、比較例12では7.6μΩ・cm、比較例13では15.3μΩ・cmであった。また、周波数955MHzの通信距離は、比較例11では4.2m、比較例12では4.0m、比較例13では4.0mであった。さらに、抵抗悪化率は、比較例11では10回後で167%、100回後で633%、500回後で断線し、比較例12では10回後で100%、100回後で100%、500回後で1200%であり、比較例13では10回後は100%、100回後で100%、500回後で800%であった。
これらの比較例11~13の条件および結果を表1~表3に示す。
本発明によるブースターアンテナをRFIDタグ用のブースターアンテナとして使用すれば、実用的な通信距離のブースターアンテナを備えたFEIDタグを製造することができる。
Claims (6)
- 10~50体積%の銀粒子の焼結体を含み且つ体積抵抗率が3~100μΩ・cmの銀導電膜が基板上に形成されていることを特徴とする、ブースターアンテナ。
- 前記銀導電膜の表面抵抗率が0.5Ω/□以下であることを特徴とする、請求項1に記載のブースターアンテナ。
- 前記銀導電膜の厚さが1~6μmであることを特徴とする、請求項1に記載のブースターアンテナ。
- 50~70質量%の銀粒子を含む銀粒子分散液を基板に塗布した後に焼成することにより、請求項1乃至3のいずれかに記載の銀導電膜を基板上に形成することを特徴とする、ブースターアンテナの製造方法。
- 前記銀粒子分散液の基板への塗布が、フレキソ印刷によって行われることを特徴とする、請求項4に記載のブースターアンテナの製造方法。
- 前記銀粒子の平均粒径が20nm以下であることを特徴とする、請求項4に記載のブースターアンテナの製造方法。
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US10020561B2 (en) | 2013-09-19 | 2018-07-10 | Pulse Finland Oy | Deposited three-dimensional antenna apparatus and methods |
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